SG171512A1 - Method for pulling a single crystal composed of silicon with a section having a diameter that remains constant - Google Patents
Method for pulling a single crystal composed of silicon with a section having a diameter that remains constantInfo
- Publication number
- SG171512A1 SG171512A1 SG201006946-6A SG2010069466A SG171512A1 SG 171512 A1 SG171512 A1 SG 171512A1 SG 2010069466 A SG2010069466 A SG 2010069466A SG 171512 A1 SG171512 A1 SG 171512A1
- Authority
- SG
- Singapore
- Prior art keywords
- diameter
- single crystal
- pulling
- section
- remains constant
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B30/00—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions
- C30B30/04—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions using magnetic fields
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE200910056638 DE102009056638B4 (de) | 2009-12-02 | 2009-12-02 | Verfahren zum Ziehen eines Einkristalls aus Silizium mit einem Abschnitt mit gleich bleibendem Durchmesser |
Publications (1)
Publication Number | Publication Date |
---|---|
SG171512A1 true SG171512A1 (en) | 2011-06-29 |
Family
ID=43972181
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG201006946-6A SG171512A1 (en) | 2009-12-02 | 2010-09-23 | Method for pulling a single crystal composed of silicon with a section having a diameter that remains constant |
SG2013035761A SG191568A1 (en) | 2009-12-02 | 2010-09-23 | Method for pulling a single crystal composed of silicon with a section having a diameter that remains constant |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG2013035761A SG191568A1 (en) | 2009-12-02 | 2010-09-23 | Method for pulling a single crystal composed of silicon with a section having a diameter that remains constant |
Country Status (7)
Country | Link |
---|---|
US (1) | US8906157B2 (de) |
JP (1) | JP5743511B2 (de) |
KR (1) | KR101340804B1 (de) |
CN (1) | CN102134741B (de) |
DE (1) | DE102009056638B4 (de) |
SG (2) | SG171512A1 (de) |
TW (1) | TWI473915B (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012204000A1 (de) | 2012-03-14 | 2013-09-19 | Siltronic Ag | Ringförmiger Widerstandsheizer und Verfahren zum Zuführen von Wärme zu einem kristallisierenden Einkristall |
DE102013210687B4 (de) | 2013-06-07 | 2018-12-06 | Siltronic Ag | Verfahren zur Regelung des Durchmessers eines Einkristalls auf einen Solldurchmesser |
CN103834991A (zh) * | 2014-03-10 | 2014-06-04 | 马鞍山明鑫电气科技有限公司 | 无温度信号处理开环式功率自控晶体生长控制方法 |
CN107151817A (zh) * | 2016-03-03 | 2017-09-12 | 上海新昇半导体科技有限公司 | 单晶硅的生长方法及其制备的单晶硅锭 |
DE102019101991A1 (de) | 2019-01-28 | 2020-07-30 | Pva Tepla Ag | Verfahren zum Ziehen eines zylindrischen Kristalls aus einer Schmelze |
DE102019211609A1 (de) | 2019-08-01 | 2021-02-04 | Siltronic Ag | Verfahren zum Ziehen eines Einkristalls aus Silizium gemäß der Czochralski-Methode aus einer Schmelze |
CN111020691A (zh) * | 2019-12-03 | 2020-04-17 | 徐州鑫晶半导体科技有限公司 | 拉制晶棒的系统和控制方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5964592A (ja) * | 1982-09-30 | 1984-04-12 | Fujitsu Ltd | 結晶成長方法 |
JPH10101482A (ja) * | 1996-10-01 | 1998-04-21 | Komatsu Electron Metals Co Ltd | 単結晶シリコンの製造装置および製造方法 |
DE19711922A1 (de) * | 1997-03-21 | 1998-09-24 | Wacker Siltronic Halbleitermat | Vorrichtung und Verfahren zum Ziehen eines Einkristalls |
DE19756613A1 (de) | 1997-12-18 | 1999-07-01 | Wacker Siltronic Halbleitermat | Verfahren und Vorrichtung zur Herstellung eines Einkristalls |
US6776840B1 (en) | 1999-03-22 | 2004-08-17 | Memc Electronic Materials, Inc. | Method and apparatus for controlling diameter of a silicon crystal in a locked seed lift growth process |
JP4035924B2 (ja) * | 1999-07-12 | 2008-01-23 | 株式会社Sumco | 単結晶直径の制御方法及び結晶成長装置 |
JP2003521432A (ja) | 2000-02-01 | 2003-07-15 | エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッド | 成長速度および径の偏差を最小にするためにシリコン結晶の成長を制御するための方法 |
DE60111071T2 (de) * | 2000-11-03 | 2005-10-20 | Memc Electronic Materials, Inc. | Verfahren zur herstellung von silicium mit niedriger defektdichte |
WO2004018742A1 (ja) | 2002-07-05 | 2004-03-04 | Sumitomo Mitsubishi Silicon Corporation | シリコン単結晶を製造する方法 |
DE10339792B4 (de) * | 2003-03-27 | 2014-02-27 | Siltronic Ag | Verfahren und Vorrichtung zur Herstellung eines Einkristalls aus Silicium |
KR100588425B1 (ko) * | 2003-03-27 | 2006-06-12 | 실트로닉 아게 | 실리콘 단결정, 결정된 결함분포를 가진 실리콘 단결정 및 실리콘 반도체 웨이퍼의 제조방법 |
JP4701738B2 (ja) * | 2005-02-17 | 2011-06-15 | 株式会社Sumco | 単結晶の引上げ方法 |
JP5073257B2 (ja) * | 2006-09-27 | 2012-11-14 | Sumco Techxiv株式会社 | 単結晶製造装置及び方法 |
DE102007005346B4 (de) * | 2007-02-02 | 2015-09-17 | Siltronic Ag | Halbleiterscheiben aus Silicium und Verfahren zu deren Herstellung |
US8221545B2 (en) * | 2008-07-31 | 2012-07-17 | Sumco Phoenix Corporation | Procedure for in-situ determination of thermal gradients at the crystal growth front |
-
2009
- 2009-12-02 DE DE200910056638 patent/DE102009056638B4/de active Active
-
2010
- 2010-09-23 SG SG201006946-6A patent/SG171512A1/en unknown
- 2010-09-23 SG SG2013035761A patent/SG191568A1/en unknown
- 2010-10-15 KR KR1020100100999A patent/KR101340804B1/ko active IP Right Grant
- 2010-10-28 US US12/913,964 patent/US8906157B2/en active Active
- 2010-11-18 TW TW99139723A patent/TWI473915B/zh active
- 2010-12-02 CN CN201010576496.9A patent/CN102134741B/zh active Active
- 2010-12-02 JP JP2010269535A patent/JP5743511B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
TWI473915B (zh) | 2015-02-21 |
JP5743511B2 (ja) | 2015-07-01 |
CN102134741B (zh) | 2014-02-26 |
SG191568A1 (en) | 2013-07-31 |
US8906157B2 (en) | 2014-12-09 |
KR20110063287A (ko) | 2011-06-10 |
CN102134741A (zh) | 2011-07-27 |
JP2011116643A (ja) | 2011-06-16 |
US20110126757A1 (en) | 2011-06-02 |
TW201120258A (en) | 2011-06-16 |
DE102009056638B4 (de) | 2013-08-01 |
KR101340804B1 (ko) | 2013-12-11 |
DE102009056638A1 (de) | 2011-06-09 |
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