SG164358A1 - Vision inspection apparatus - Google Patents

Vision inspection apparatus

Info

Publication number
SG164358A1
SG164358A1 SG201001343-1A SG2010013431A SG164358A1 SG 164358 A1 SG164358 A1 SG 164358A1 SG 2010013431 A SG2010013431 A SG 2010013431A SG 164358 A1 SG164358 A1 SG 164358A1
Authority
SG
Singapore
Prior art keywords
trays
vision inspection
inspection apparatus
electronic components
vision
Prior art date
Application number
SG201001343-1A
Other languages
English (en)
Inventor
Hong-Jun Yoo
Woon-Joung Yoon
Original Assignee
Jt Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jt Corp filed Critical Jt Corp
Publication of SG164358A1 publication Critical patent/SG164358A1/en

Links

SG201001343-1A 2009-03-05 2010-03-01 Vision inspection apparatus SG164358A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020090018947A KR101134985B1 (ko) 2009-03-05 2009-03-05 비전검사장치

Publications (1)

Publication Number Publication Date
SG164358A1 true SG164358A1 (en) 2010-09-29

Family

ID=42690311

Family Applications (1)

Application Number Title Priority Date Filing Date
SG201001343-1A SG164358A1 (en) 2009-03-05 2010-03-01 Vision inspection apparatus

Country Status (4)

Country Link
KR (1) KR101134985B1 (zh)
CN (1) CN101826476B (zh)
SG (1) SG164358A1 (zh)
TW (1) TWI448680B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI624660B (zh) * 2015-02-10 2018-05-21 宰体有限公司 元件處理器及視覺檢測方法
KR101940986B1 (ko) * 2017-04-25 2019-01-22 주식회사 파워로직스 카메라 모듈용 브라켓 체결 장치
KR101908436B1 (ko) 2018-06-21 2018-10-16 (주)풍진솔루션 차량용 에어백 커버하우징의 인서트부품 자동 검출시스템
KR102122760B1 (ko) * 2018-11-21 2020-06-26 정성욱 트레이 교체 시스템
CN109444157A (zh) * 2018-12-25 2019-03-08 苏州凡目视觉科技有限公司 一种划痕检测装置与方法
CN111620118A (zh) * 2020-05-29 2020-09-04 苏州天准科技股份有限公司 下料设备及摄像头保护模块检测系统
KR102600760B1 (ko) * 2021-03-23 2023-11-14 동원시스템즈 주식회사 소형 건전지 캔의 자동 검사장치
KR102367414B1 (ko) * 2021-11-09 2022-02-25 주식회사 엔시스 이차전지 선별장치

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01183826A (ja) * 1988-01-19 1989-07-21 Toshiba Corp 電子部品の供給方法およびその装置
US6956963B2 (en) * 1998-07-08 2005-10-18 Ismeca Europe Semiconductor Sa Imaging for a machine-vision system
KR200339601Y1 (ko) * 2003-10-13 2004-01-24 한미반도체 주식회사 반도체 소자 비전 검사장치
US6919718B2 (en) * 2003-11-10 2005-07-19 Unisys Corporation System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically
KR100638311B1 (ko) * 2005-01-31 2006-10-25 (주) 인텍플러스 반도체 소자 검사장치 및 그를 이용한 반도체 소자의 분류 방법
KR100705655B1 (ko) * 2005-10-19 2007-04-09 (주) 인텍플러스 반도체 패키지의 분류 방법
TWI311542B (en) * 2006-06-27 2009-07-01 Hon Tech Inc Testing machine for electronic element
US7514914B2 (en) * 2007-04-12 2009-04-07 Chroma Ate Inc Test circuits of an apparatus for testing system-in-package devices
KR100867386B1 (ko) * 2007-06-29 2008-11-06 (주) 인텍플러스 반도체 소자 비전 검사 시스템
CN101396692B (zh) * 2007-09-28 2012-02-29 鸿劲科技股份有限公司 可自动化进行电子元件外观检测的装置

Also Published As

Publication number Publication date
TWI448680B (zh) 2014-08-11
KR101134985B1 (ko) 2012-04-09
CN101826476A (zh) 2010-09-08
KR20100100198A (ko) 2010-09-15
TW201033601A (en) 2010-09-16
CN101826476B (zh) 2012-10-10

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