SG164358A1 - Vision inspection apparatus - Google Patents
Vision inspection apparatusInfo
- Publication number
- SG164358A1 SG164358A1 SG201001343-1A SG2010013431A SG164358A1 SG 164358 A1 SG164358 A1 SG 164358A1 SG 2010013431 A SG2010013431 A SG 2010013431A SG 164358 A1 SG164358 A1 SG 164358A1
- Authority
- SG
- Singapore
- Prior art keywords
- trays
- vision inspection
- inspection apparatus
- electronic components
- vision
- Prior art date
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090018947A KR101134985B1 (ko) | 2009-03-05 | 2009-03-05 | 비전검사장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG164358A1 true SG164358A1 (en) | 2010-09-29 |
Family
ID=42690311
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG201001343-1A SG164358A1 (en) | 2009-03-05 | 2010-03-01 | Vision inspection apparatus |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR101134985B1 (zh) |
CN (1) | CN101826476B (zh) |
SG (1) | SG164358A1 (zh) |
TW (1) | TWI448680B (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI624660B (zh) * | 2015-02-10 | 2018-05-21 | 宰体有限公司 | 元件處理器及視覺檢測方法 |
KR101940986B1 (ko) * | 2017-04-25 | 2019-01-22 | 주식회사 파워로직스 | 카메라 모듈용 브라켓 체결 장치 |
KR101908436B1 (ko) | 2018-06-21 | 2018-10-16 | (주)풍진솔루션 | 차량용 에어백 커버하우징의 인서트부품 자동 검출시스템 |
KR102122760B1 (ko) * | 2018-11-21 | 2020-06-26 | 정성욱 | 트레이 교체 시스템 |
CN109444157A (zh) * | 2018-12-25 | 2019-03-08 | 苏州凡目视觉科技有限公司 | 一种划痕检测装置与方法 |
CN111620118A (zh) * | 2020-05-29 | 2020-09-04 | 苏州天准科技股份有限公司 | 下料设备及摄像头保护模块检测系统 |
KR102600760B1 (ko) * | 2021-03-23 | 2023-11-14 | 동원시스템즈 주식회사 | 소형 건전지 캔의 자동 검사장치 |
KR102367414B1 (ko) * | 2021-11-09 | 2022-02-25 | 주식회사 엔시스 | 이차전지 선별장치 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01183826A (ja) * | 1988-01-19 | 1989-07-21 | Toshiba Corp | 電子部品の供給方法およびその装置 |
US6956963B2 (en) * | 1998-07-08 | 2005-10-18 | Ismeca Europe Semiconductor Sa | Imaging for a machine-vision system |
KR200339601Y1 (ko) * | 2003-10-13 | 2004-01-24 | 한미반도체 주식회사 | 반도체 소자 비전 검사장치 |
US6919718B2 (en) * | 2003-11-10 | 2005-07-19 | Unisys Corporation | System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically |
KR100638311B1 (ko) * | 2005-01-31 | 2006-10-25 | (주) 인텍플러스 | 반도체 소자 검사장치 및 그를 이용한 반도체 소자의 분류 방법 |
KR100705655B1 (ko) * | 2005-10-19 | 2007-04-09 | (주) 인텍플러스 | 반도체 패키지의 분류 방법 |
TWI311542B (en) * | 2006-06-27 | 2009-07-01 | Hon Tech Inc | Testing machine for electronic element |
US7514914B2 (en) * | 2007-04-12 | 2009-04-07 | Chroma Ate Inc | Test circuits of an apparatus for testing system-in-package devices |
KR100867386B1 (ko) * | 2007-06-29 | 2008-11-06 | (주) 인텍플러스 | 반도체 소자 비전 검사 시스템 |
CN101396692B (zh) * | 2007-09-28 | 2012-02-29 | 鸿劲科技股份有限公司 | 可自动化进行电子元件外观检测的装置 |
-
2009
- 2009-03-05 KR KR1020090018947A patent/KR101134985B1/ko not_active IP Right Cessation
-
2010
- 2010-03-01 SG SG201001343-1A patent/SG164358A1/en unknown
- 2010-03-03 TW TW099106198A patent/TWI448680B/zh not_active IP Right Cessation
- 2010-03-05 CN CN201010127628XA patent/CN101826476B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TWI448680B (zh) | 2014-08-11 |
KR101134985B1 (ko) | 2012-04-09 |
CN101826476A (zh) | 2010-09-08 |
KR20100100198A (ko) | 2010-09-15 |
TW201033601A (en) | 2010-09-16 |
CN101826476B (zh) | 2012-10-10 |
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