SG164358A1 - Vision inspection apparatus - Google Patents
Vision inspection apparatusInfo
- Publication number
- SG164358A1 SG164358A1 SG201001343-1A SG2010013431A SG164358A1 SG 164358 A1 SG164358 A1 SG 164358A1 SG 2010013431 A SG2010013431 A SG 2010013431A SG 164358 A1 SG164358 A1 SG 164358A1
- Authority
- SG
- Singapore
- Prior art keywords
- trays
- vision inspection
- inspection apparatus
- electronic components
- vision
- Prior art date
Links
Landscapes
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
Disclosed is a vision inspection apparatus, and particularly, to a capable of inspecting external appearance of electronic components stacked on trays. The vision inspection apparatus comprises: two or more trays loaded with electronic components thereon; a vision inspection unit for vision-inspecting the electronic components loaded in the trays; and a dumping unit for exchanging good products and bad products with each other between the trays according to a result of the vision inspection, wherein the dumping unit places good electronic component in one or more trays, and places bad electronic component in the remained one or more trays.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090018947A KR101134985B1 (en) | 2009-03-05 | 2009-03-05 | Vision inspection apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
SG164358A1 true SG164358A1 (en) | 2010-09-29 |
Family
ID=42690311
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG201001343-1A SG164358A1 (en) | 2009-03-05 | 2010-03-01 | Vision inspection apparatus |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR101134985B1 (en) |
CN (1) | CN101826476B (en) |
SG (1) | SG164358A1 (en) |
TW (1) | TWI448680B (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI624660B (en) * | 2015-02-10 | 2018-05-21 | 宰体有限公司 | Device handler, and vision inspection method |
KR101940986B1 (en) * | 2017-04-25 | 2019-01-22 | 주식회사 파워로직스 | Apparatus for coupling bracket for comera module |
KR101908436B1 (en) | 2018-06-21 | 2018-10-16 | (주)풍진솔루션 | Automatic Detection System for Insert Parts of Airbag Cover Housing for Vehicle |
KR102122760B1 (en) * | 2018-11-21 | 2020-06-26 | 정성욱 | System for changing tray |
CN109444157A (en) * | 2018-12-25 | 2019-03-08 | 苏州凡目视觉科技有限公司 | A kind of scratch detection apparatus and method |
CN111620118A (en) * | 2020-05-29 | 2020-09-04 | 苏州天准科技股份有限公司 | Blanking equipment and camera protection module detection system |
KR102600760B1 (en) * | 2021-03-23 | 2023-11-14 | 동원시스템즈 주식회사 | Automatic inspection apparatus for small battery can |
KR102367414B1 (en) * | 2021-11-09 | 2022-02-25 | 주식회사 엔시스 | Secondary battery sorting equipment |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01183826A (en) * | 1988-01-19 | 1989-07-21 | Toshiba Corp | Method of supplying electronic component |
US6956963B2 (en) * | 1998-07-08 | 2005-10-18 | Ismeca Europe Semiconductor Sa | Imaging for a machine-vision system |
KR200339601Y1 (en) * | 2003-10-13 | 2004-01-24 | 한미반도체 주식회사 | apparatus for vision inspection of semiconductor devices |
US6919718B2 (en) * | 2003-11-10 | 2005-07-19 | Unisys Corporation | System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically |
KR100638311B1 (en) * | 2005-01-31 | 2006-10-25 | (주) 인텍플러스 | Apparatus for inspecting semiconductor device and method for a classification semiconductor device using the same |
KR100705655B1 (en) * | 2005-10-19 | 2007-04-09 | (주) 인텍플러스 | Sorting method of semiconductor package |
TWI311542B (en) * | 2006-06-27 | 2009-07-01 | Hon Tech Inc | Testing machine for electronic element |
US7514914B2 (en) * | 2007-04-12 | 2009-04-07 | Chroma Ate Inc | Test circuits of an apparatus for testing system-in-package devices |
KR100867386B1 (en) * | 2007-06-29 | 2008-11-06 | (주) 인텍플러스 | System for vision inspection of semiconductor device |
CN101396692B (en) * | 2007-09-28 | 2012-02-29 | 鸿劲科技股份有限公司 | Device capable of automatically detecting the electronic component appearance |
-
2009
- 2009-03-05 KR KR1020090018947A patent/KR101134985B1/en not_active IP Right Cessation
-
2010
- 2010-03-01 SG SG201001343-1A patent/SG164358A1/en unknown
- 2010-03-03 TW TW099106198A patent/TWI448680B/en not_active IP Right Cessation
- 2010-03-05 CN CN201010127628XA patent/CN101826476B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TWI448680B (en) | 2014-08-11 |
KR101134985B1 (en) | 2012-04-09 |
CN101826476A (en) | 2010-09-08 |
KR20100100198A (en) | 2010-09-15 |
TW201033601A (en) | 2010-09-16 |
CN101826476B (en) | 2012-10-10 |
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