SG158747A1 - Test head positioning system and method - Google Patents

Test head positioning system and method

Info

Publication number
SG158747A1
SG158747A1 SG200706423-1A SG2007064231A SG158747A1 SG 158747 A1 SG158747 A1 SG 158747A1 SG 2007064231 A SG2007064231 A SG 2007064231A SG 158747 A1 SG158747 A1 SG 158747A1
Authority
SG
Singapore
Prior art keywords
axis
load
positioning system
test head
head positioning
Prior art date
Application number
SG200706423-1A
Other languages
English (en)
Inventor
Christian Mueller
Original Assignee
Intest Ip Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Ip Corp filed Critical Intest Ip Corp
Publication of SG158747A1 publication Critical patent/SG158747A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Manipulator (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
SG200706423-1A 2003-03-31 2004-03-31 Test head positioning system and method SG158747A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US45901903P 2003-03-31 2003-03-31
US10/813,362 US7235964B2 (en) 2003-03-31 2004-03-30 Test head positioning system and method

Publications (1)

Publication Number Publication Date
SG158747A1 true SG158747A1 (en) 2010-02-26

Family

ID=33162197

Family Applications (2)

Application Number Title Priority Date Filing Date
SG200706423-1A SG158747A1 (en) 2003-03-31 2004-03-31 Test head positioning system and method
SG200706422-3A SG162618A1 (en) 2003-03-31 2004-03-31 Test head positioning system and method

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG200706422-3A SG162618A1 (en) 2003-03-31 2004-03-31 Test head positioning system and method

Country Status (8)

Country Link
US (3) US7235964B2 (ja)
EP (1) EP1618394A2 (ja)
JP (2) JP5183061B2 (ja)
KR (1) KR20050109615A (ja)
CN (2) CN101806817B (ja)
DE (1) DE04758607T1 (ja)
SG (2) SG158747A1 (ja)
WO (1) WO2004090558A2 (ja)

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US9610025B2 (en) 2014-07-01 2017-04-04 Medtronic, Inc. Method and apparatus for verifying discriminating of tachycardia events in a medical device having dual sensing vectors
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US10094854B2 (en) * 2015-10-23 2018-10-09 Teradyne, Inc. Manipulator in automatic test equipment
CN108780114B (zh) 2016-01-08 2021-11-16 雅赫测试系统公司 用于电子测试器中的器件的温度控制的方法和系统
JP2017151011A (ja) * 2016-02-26 2017-08-31 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
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CN107941542A (zh) * 2017-11-23 2018-04-20 广东恒鑫智能装备股份有限公司 自动配水机构
KR102465584B1 (ko) * 2018-06-15 2022-11-09 한국전기연구원 멀티프로버 시스템의 웨이퍼 카트리지 얼라인용 틸팅을 위한 가변 잠금장치
TWI676031B (zh) * 2018-09-06 2019-11-01 致茂電子股份有限公司 滑移式電子元件測試裝置
CN109633316B (zh) * 2018-12-19 2021-04-20 深圳市博瑞信科技有限公司 三轴无线充电器自动测试系统
CN109856554A (zh) * 2019-04-22 2019-06-07 星云智能装备（昆山）有限公司 一种自动对插机构及电池包测试装置
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JP7371885B2 (ja) * 2019-07-08 2023-10-31 ヤマハファインテック株式会社 電気検査装置及び保持ユニット
KR20210063164A (ko) * 2019-11-22 2021-06-01 (주)테크윙 테스터 결합부
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CN114113708B (zh) * 2021-11-29 2024-03-29 广东省华科应急管理技术服务有限公司 一种消防电气设施安全检测仪
CN117074939A (zh) * 2023-08-17 2023-11-17 潮州市汇能电机有限公司 一种水轮发电机组模拟试验系统

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Also Published As

Publication number Publication date
WO2004090558A2 (en) 2004-10-21
SG162618A1 (en) 2010-07-29
US20100264907A1 (en) 2010-10-21
JP2011149950A (ja) 2011-08-04
CN1768271A (zh) 2006-05-03
US8035406B2 (en) 2011-10-11
US20040227534A1 (en) 2004-11-18
EP1618394A2 (en) 2006-01-25
WO2004090558A3 (en) 2005-05-19
US7728579B2 (en) 2010-06-01
JP5564004B2 (ja) 2014-07-30
JP2007524814A (ja) 2007-08-30
CN101806817B (zh) 2014-01-08
JP5183061B2 (ja) 2013-04-17
KR20050109615A (ko) 2005-11-21
US20080122432A1 (en) 2008-05-29
US7235964B2 (en) 2007-06-26
CN1768271B (zh) 2010-05-05
DE04758607T1 (de) 2006-07-13
CN101806817A (zh) 2010-08-18

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