SG147432A1 - Novel photosensitive resin compositions - Google Patents
Novel photosensitive resin compositionsInfo
- Publication number
- SG147432A1 SG147432A1 SG200807601-0A SG2008076010A SG147432A1 SG 147432 A1 SG147432 A1 SG 147432A1 SG 2008076010 A SG2008076010 A SG 2008076010A SG 147432 A1 SG147432 A1 SG 147432A1
- Authority
- SG
- Singapore
- Prior art keywords
- photosensitive resin
- resin compositions
- compound
- novel photosensitive
- naphthoquinone diazide
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Materials For Photolithography (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US51119803P | 2003-10-15 | 2003-10-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG147432A1 true SG147432A1 (en) | 2008-11-28 |
Family
ID=34465196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200807601-0A SG147432A1 (en) | 2003-10-15 | 2004-10-15 | Novel photosensitive resin compositions |
Country Status (7)
Country | Link |
---|---|
US (2) | US7416830B2 (ko) |
EP (1) | EP1680711A4 (ko) |
JP (1) | JP4522412B2 (ko) |
KR (1) | KR20070007026A (ko) |
SG (1) | SG147432A1 (ko) |
TW (1) | TWI363249B (ko) |
WO (1) | WO2005038524A2 (ko) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI402616B (zh) * | 2005-06-03 | 2013-07-21 | Fujifilm Electronic Materials | 新穎的光敏性樹脂組成物 |
US7803510B2 (en) * | 2005-08-17 | 2010-09-28 | Fujifilm Electronic Materials U.S.A., Inc. | Positive photosensitive polybenzoxazole precursor compositions |
EP2110708B1 (en) * | 2007-02-13 | 2012-12-05 | Toray Industries, Inc. | Positive-type photosensitive resin composition |
US20090111050A1 (en) * | 2007-10-16 | 2009-04-30 | Naiini Ahmad A | Novel Photosensitive Resin Compositions |
KR100932765B1 (ko) * | 2008-02-28 | 2009-12-21 | 한양대학교 산학협력단 | 폴리이미드-폴리벤조옥사졸 공중합체, 이의 제조방법, 및이를 포함하는 기체 분리막 |
CA2640517A1 (en) * | 2008-05-19 | 2009-11-19 | Industry-University Cooperation Foundation, Hanyang University | Polyamic acids dope composition, preparation method of hollow fiber using the same and hollow fiber prepared therefrom |
KR101023089B1 (ko) | 2008-09-29 | 2011-03-24 | 제일모직주식회사 | 포지티브형 감광성 수지 조성물 |
US8013103B2 (en) * | 2008-10-10 | 2011-09-06 | Industry-University Cooperation Foundation, Hanyang University | Polymer compounds and a preparation method thereof |
US8487064B2 (en) | 2008-10-10 | 2013-07-16 | Industry-University Cooperation Foundation, Hanyang University | Polymer compounds and a preparation method thereof |
KR101233382B1 (ko) * | 2008-11-17 | 2013-02-14 | 제일모직주식회사 | 포지티브형 감광성 수지 조성물 |
JP5515419B2 (ja) * | 2009-05-26 | 2014-06-11 | 日立化成デュポンマイクロシステムズ株式会社 | ポジ型感光性樹脂組成物、該樹脂組成物を用いたパターン硬化膜の製造方法並びに電子部品及びその製造方法 |
JP2011053458A (ja) * | 2009-09-02 | 2011-03-17 | Hitachi Chemical Dupont Microsystems Ltd | 感光性樹脂組成物、該樹脂組成物を用いたパターン硬化膜の製造方法及び電子部品 |
KR101005818B1 (ko) * | 2009-12-10 | 2011-01-05 | 신미영 | 주방용기의 연결구조 |
KR101333704B1 (ko) * | 2009-12-29 | 2013-11-27 | 제일모직주식회사 | 포지티브형 감광성 수지 조성물 |
KR101400192B1 (ko) | 2010-12-31 | 2014-05-27 | 제일모직 주식회사 | 포지티브형 감광성 수지 조성물, 이를 사용하여 제조된 감광성 수지막 및 상기 감광성 수지막을 포함하는 반도체 소자 |
JP5488752B1 (ja) * | 2013-09-03 | 2014-05-14 | 住友ベークライト株式会社 | 感光性樹脂材料および樹脂膜 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2931297A1 (de) | 1979-08-01 | 1981-02-19 | Siemens Ag | Waermebestaendige positivresists und verfahren zur herstellung waermebestaendiger reliefstrukturen |
DE3021748A1 (de) | 1980-06-10 | 1981-12-17 | Siemens AG, 1000 Berlin und 8000 München | Strahlungsreaktive vorstufen hochwaermebestaendiger polymerer |
DE3411659A1 (de) | 1984-03-29 | 1985-10-03 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur herstellung von polyoxazol- und polythiazol-vorstufen |
US4818658A (en) | 1987-04-17 | 1989-04-04 | Shipley Company Inc. | Photoactive esterification product of a diazooxide compound and a curcumin dye and photoresist materials with product |
EP0391196A3 (de) | 1989-04-06 | 1991-02-27 | Siemens Aktiengesellschaft | Herstellung von Hydroxypolyamiden |
DD289265A5 (de) | 1989-11-30 | 1991-04-25 | Veb Fotochemische Werke Berlin,De | Verfahren zur selektiven herstellung von definierten mit 1,2-naphthochinon-2-diazid-4-sulfonsaeure und 1,2-naphthochinon-2-diazid-5-sulfonsaeure gemischt veresterten trihydroxy-alkoxycarbonyl-benzenen |
DE69131529T2 (de) * | 1990-05-29 | 2000-01-20 | Sumitomo Bakelite Co. Ltd., Tokio/Tokyo | Positiv arbeitende lichtempfindliche Harzzusammensetzung |
US5362599A (en) * | 1991-11-14 | 1994-11-08 | International Business Machines Corporations | Fast diazoquinone positive resists comprising mixed esters of 4-sulfonate and 5-sulfonate compounds |
US5612164A (en) * | 1995-02-09 | 1997-03-18 | Hoechst Celanese Corporation | Positive photoresist composition comprising a mixed ester of trishydroxyphenyl ethane and a mixed ester of trihydroxybenzophenone |
JP3449926B2 (ja) * | 1997-09-02 | 2003-09-22 | 住友ベークライト株式会社 | ポジ型感光性樹脂組成物 |
US6177225B1 (en) * | 1998-10-01 | 2001-01-23 | Arch Specialty Chemicals, Inc. | Photosensitive resin compositions |
US6127086A (en) * | 1998-10-01 | 2000-10-03 | Arch Specialty Chemicals, Inc. | Photosensitive resin compositions |
JP4068253B2 (ja) * | 1999-01-27 | 2008-03-26 | Azエレクトロニックマテリアルズ株式会社 | ポジ型感光性樹脂組成物 |
ATE366952T1 (de) | 1999-06-01 | 2007-08-15 | Toray Industries | Positiv arbeitende lichtempfindliche polyimidvorstufen-zusammensetzung |
JP4665333B2 (ja) * | 2000-11-27 | 2011-04-06 | 東レ株式会社 | ポジ型感光性樹脂前駆体組成物 |
WO2004081663A2 (en) | 2003-03-11 | 2004-09-23 | Arch Specialty Chemicals, Inc. | Novel photosensitive resin compositions |
EP1611483A4 (en) * | 2003-03-11 | 2009-12-16 | Fujifilm Electronic Materials | NEW PHOTOSENSITIVE RESIN COMPOSITIONS |
JP2007525545A (ja) * | 2003-03-11 | 2007-09-06 | フジフィルム・エレクトロニック・マテリアルズ・ユーエスエイ・インコーポレイテッド | 新規な感光性樹脂組成物 |
-
2004
- 2004-10-14 TW TW093131183A patent/TWI363249B/zh not_active IP Right Cessation
- 2004-10-15 SG SG200807601-0A patent/SG147432A1/en unknown
- 2004-10-15 EP EP04795072A patent/EP1680711A4/en not_active Withdrawn
- 2004-10-15 JP JP2006535640A patent/JP4522412B2/ja not_active Expired - Fee Related
- 2004-10-15 WO PCT/US2004/033861 patent/WO2005038524A2/en active Search and Examination
- 2004-10-15 KR KR1020067007348A patent/KR20070007026A/ko not_active Application Discontinuation
- 2004-10-15 US US10/966,349 patent/US7416830B2/en not_active Expired - Fee Related
-
2008
- 2008-08-21 US US12/195,702 patent/US20090004444A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP4522412B2 (ja) | 2010-08-11 |
TWI363249B (en) | 2012-05-01 |
WO2005038524A3 (en) | 2006-06-22 |
TW200527134A (en) | 2005-08-16 |
EP1680711A2 (en) | 2006-07-19 |
US20050181297A1 (en) | 2005-08-18 |
EP1680711A4 (en) | 2010-04-07 |
KR20070007026A (ko) | 2007-01-12 |
WO2005038524A2 (en) | 2005-04-28 |
US7416830B2 (en) | 2008-08-26 |
US20090004444A1 (en) | 2009-01-01 |
JP2007509371A (ja) | 2007-04-12 |
US20060063095A9 (en) | 2006-03-23 |
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