SG128465A1 - Methods for determining the depth of defects - Google Patents

Methods for determining the depth of defects

Info

Publication number
SG128465A1
SG128465A1 SG200403790A SG200403790A SG128465A1 SG 128465 A1 SG128465 A1 SG 128465A1 SG 200403790 A SG200403790 A SG 200403790A SG 200403790 A SG200403790 A SG 200403790A SG 128465 A1 SG128465 A1 SG 128465A1
Authority
SG
Singapore
Prior art keywords
component
component surface
depth
infrared radiation
radiation detector
Prior art date
Application number
SG200403790A
Other languages
English (en)
Inventor
John William Devitt
Anthony S Bauco
Craig Alan Cantello
Kevin G Harding
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of SG128465A1 publication Critical patent/SG128465A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/72Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SG200403790A 2003-06-30 2004-06-25 Methods for determining the depth of defects SG128465A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/609,812 US6874932B2 (en) 2003-06-30 2003-06-30 Methods for determining the depth of defects

Publications (1)

Publication Number Publication Date
SG128465A1 true SG128465A1 (en) 2007-01-30

Family

ID=33540927

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200403790A SG128465A1 (en) 2003-06-30 2004-06-25 Methods for determining the depth of defects

Country Status (6)

Country Link
US (1) US6874932B2 (https=)
EP (1) EP1505384A1 (https=)
JP (1) JP4504117B2 (https=)
BR (1) BRPI0402556A (https=)
CA (1) CA2471334C (https=)
SG (1) SG128465A1 (https=)

Families Citing this family (58)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7591583B2 (en) * 2005-05-18 2009-09-22 Federal-Mogul World Wide, Inc. Transient defect detection algorithm
US7467049B2 (en) * 2005-05-27 2008-12-16 American Electric Power Company, Inc. System and method for detecting impaired electric power equipment
US7632012B2 (en) * 2005-09-01 2009-12-15 Siemens Energy, Inc. Method of measuring in situ differential emissivity and temperature
US7553070B2 (en) * 2006-11-06 2009-06-30 The Boeing Company Infrared NDI for detecting shallow irregularities
JP5027606B2 (ja) * 2007-09-26 2012-09-19 株式会社キーエンス レーザ加工装置、加工データ生成方法及びコンピュータプログラム
US8393784B2 (en) * 2008-03-31 2013-03-12 General Electric Company Characterization of flaws in composites identified by thermography
US7881965B2 (en) 2008-10-02 2011-02-01 ecoATM, Inc. Secondary market and vending system for devices
US20130124426A1 (en) * 2008-10-02 2013-05-16 ecoATM, Inc. Method And Apparatus For Recycling Electronic Devices
US10853873B2 (en) 2008-10-02 2020-12-01 Ecoatm, Llc Kiosks for evaluating and purchasing used electronic devices and related technology
US11010841B2 (en) 2008-10-02 2021-05-18 Ecoatm, Llc Kiosk for recycling electronic devices
CN105303699B (zh) * 2008-10-02 2018-10-09 埃科亚特姆公司 针对设备的二手市场和自动售货系统
US9881284B2 (en) 2008-10-02 2018-01-30 ecoATM, Inc. Mini-kiosk for recycling electronic devices
US20100140236A1 (en) * 2008-12-04 2010-06-10 General Electric Company Laser machining system and method
WO2010106639A1 (ja) * 2009-03-17 2010-09-23 西日本高速道路エンジニアリング四国株式会社 構造物の損傷深さ判定方法とその装置及び構造物の損傷処置判定方法とその装置
JP5414058B2 (ja) * 2010-03-10 2014-02-12 独立行政法人産業技術総合研究所 熱拡散率測定装置
CA3210819A1 (en) 2011-04-06 2012-10-11 Ecoatm, Llc Method and kiosk for recycling electronic devices
US8755044B2 (en) * 2011-08-15 2014-06-17 Kla-Tencor Corporation Large particle detection for multi-spot surface scanning inspection systems
KR101429348B1 (ko) * 2012-09-05 2014-08-13 한국원자력연구원 시편의 내부결함 검출을 위한 비접촉식 영상 검사 방법 및 장치
US9041408B2 (en) * 2013-01-16 2015-05-26 Hrl Laboratories, Llc Removable surface-wave networks for in-situ material health monitoring
US8759770B1 (en) * 2013-04-08 2014-06-24 General Electric Company System and method for qualifying usability risk associated with subsurface defects in a multilayer coating
KR101580844B1 (ko) * 2014-05-08 2015-12-30 한국수력원자력(주) 발전소 가열 및 냉각 운전 과도사건의 피로평가에서 보정계수 산출방법
JP6304880B2 (ja) * 2014-06-17 2018-04-04 株式会社Ihi 非破壊検査装置
US20170307360A1 (en) * 2014-09-25 2017-10-26 Nec Corporation Status determination device and status determination method
US10401411B2 (en) 2014-09-29 2019-09-03 Ecoatm, Llc Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices
WO2016053378A1 (en) 2014-10-02 2016-04-07 ecoATM, Inc. Wireless-enabled kiosk for recycling consumer devices
EP3859697A1 (en) 2014-10-02 2021-08-04 ecoATM, LLC Application for device evaluation and other processes associated with device recycling
US10445708B2 (en) 2014-10-03 2019-10-15 Ecoatm, Llc System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods
WO2016069738A1 (en) 2014-10-31 2016-05-06 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
US20170169401A1 (en) 2015-12-11 2017-06-15 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
WO2016069742A1 (en) 2014-10-31 2016-05-06 ecoATM, Inc. Methods and systems for facilitating processes associated with insurance services and/or other services for electronic devices
EP4560549A3 (en) 2014-11-06 2025-06-18 ecoATM, LLC Methods and systems for evaluating and recycling electronic devices
WO2016094789A1 (en) 2014-12-12 2016-06-16 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
CN105784754A (zh) * 2016-02-25 2016-07-20 山西省交通科学研究院 一种预应力混凝土结构预应力孔道密实度检测系统及方法
FR3049701B1 (fr) * 2016-03-31 2018-04-27 Espci Procede, methode et dispositif de determination de la profondeur d'une fissure dans un solide
US10127647B2 (en) 2016-04-15 2018-11-13 Ecoatm, Llc Methods and systems for detecting cracks in electronic devices
US9885672B2 (en) 2016-06-08 2018-02-06 ecoATM, Inc. Methods and systems for detecting screen covers on electronic devices
US10269110B2 (en) 2016-06-28 2019-04-23 Ecoatm, Llc Methods and systems for detecting cracks in illuminated electronic device screens
FR3053469B1 (fr) * 2016-06-30 2018-08-17 Areva Np Procede d'inspection d'une surface metallique et dispositif associe
GB201711412D0 (en) * 2016-12-30 2017-08-30 Maxu Tech Inc Early entry
US10241036B2 (en) * 2017-05-08 2019-03-26 Siemens Energy, Inc. Laser thermography
CN108254410B (zh) * 2017-12-27 2020-04-03 中国人民解放军陆军装甲兵学院 基于红外检测的喷涂层接触疲劳寿命预测方法及装置
US10551327B2 (en) * 2018-04-11 2020-02-04 General Electric Company Cooling hole inspection system
CN109614892A (zh) * 2018-11-26 2019-04-12 青岛小鸟看看科技有限公司 一种疲劳驾驶检测方法、装置和电子设备
US12322259B2 (en) 2018-12-19 2025-06-03 Ecoatm, Llc Systems and methods for vending and/or purchasing mobile phones and other electronic devices
KR102942007B1 (ko) 2018-12-19 2026-03-19 에코에이티엠, 엘엘씨 이동 전화기 및 다른 전자 디바이스의 판매 및/또는 구매를 위한 시스템 및 방법
EP3924918B1 (en) 2019-02-12 2026-04-01 ecoATM, LLC Kiosk for evaluating and purchasing used electronic devices
US11462868B2 (en) 2019-02-12 2022-10-04 Ecoatm, Llc Connector carrier for electronic device kiosk
US11798250B2 (en) 2019-02-18 2023-10-24 Ecoatm, Llc Neural network based physical condition evaluation of electronic devices, and associated systems and methods
JP2023508903A (ja) 2019-12-18 2023-03-06 エコエーティーエム, エルエルシー 携帯電話および他の電子デバイスを販売および/または買取するためのシステムならびに方法
US11922467B2 (en) 2020-08-17 2024-03-05 ecoATM, Inc. Evaluating an electronic device using optical character recognition
US12271929B2 (en) 2020-08-17 2025-04-08 Ecoatm Llc Evaluating an electronic device using a wireless charger
WO2022040667A1 (en) 2020-08-17 2022-02-24 Ecoatm, Llc Evaluating an electronic device using a wireless charger
EP4197083B1 (en) 2020-08-17 2024-10-09 ecoATM, LLC Connector carrier for electronic device kiosk
EP4738801A2 (en) 2020-08-25 2026-05-06 ecoATM, LLC Evaluating and recycling electronic devices
US11603593B2 (en) 2020-09-04 2023-03-14 General Electric Company Systems and methods for automatic detection of coating defects
US11810288B2 (en) 2020-09-04 2023-11-07 General Electric Company Systems and methods for generating a single observation image to analyze coating defects
US12462635B2 (en) 2021-07-09 2025-11-04 Ecoatm, Llc Identifying electronic devices using temporally changing information
DE102021124565A1 (de) * 2021-09-22 2023-03-23 Infineon Technologies Ag Vorrichtung und verfahren zum aufspüren von rissen in proben mit hilfe von infrarotstrahlung

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5111048A (en) * 1990-09-27 1992-05-05 General Electric Company Apparatus and method for detecting fatigue cracks using infrared thermography
US6419387B1 (en) * 1997-03-05 2002-07-16 Framatome Method and device for the inspection of a material by thermal imaging

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US511048A (en) * 1893-12-19 Work-bench for saloons
USRE32166E (en) 1979-01-17 1986-06-03 Elkem A/S Detection of flaws in metal members
US4266185A (en) 1979-02-16 1981-05-05 Dover & Partners Limited Probes and apparatus for and methods of measuring crack depths
US4345457A (en) 1979-12-27 1982-08-24 Kuroki Kogyosho Co., Ltd. Method for detecting the depth of cracks in rolls used for transferring hot steel ingot bloom and rolls used therefor
DE3034944C2 (de) 1980-09-01 1985-01-17 Gerhard Dr. 8029 Sauerlach Busse Verfahren und Einrichtung zur photothermischen Struktur-Untersuchung fester Körper
US4647220A (en) 1984-07-09 1987-03-03 Lockheed Corporation Method of and apparatus for detecting corrosion utilizing infrared analysis
JPS62126339A (ja) * 1985-11-28 1987-06-08 Komatsu Ltd 内部欠陥の検出方法および装置
GB2197465B (en) 1986-09-17 1990-05-30 Atomic Energy Authority Uk Crack sizing
US4760304A (en) 1986-11-24 1988-07-26 General Electric Company Dark field coaxial ultrasonic transducer
JPH01151246A (ja) * 1987-12-08 1989-06-14 Ricoh Co Ltd 半導体集積回路装置の多層配線
US4983836A (en) * 1988-06-30 1991-01-08 Nkk Corporation Method for detecting thinned out portion on inner surface or outer surface of pipe
JPH0212044A (ja) * 1988-06-30 1990-01-17 Nkk Corp 赤外線カメラによる欠陥部の検出方法
US5131758A (en) * 1990-05-16 1992-07-21 Administrator Of The National Aeronautics And Space Administration Method of remotely characterizing thermal properties of a sample
US5748003A (en) 1991-07-29 1998-05-05 Colorado State University Research Foundation Microwaves used for determining fatigue and surface crack features on metal surfaces
JPH05296956A (ja) * 1992-04-24 1993-11-12 Toshiba Corp 表面探傷装置
US5302830A (en) * 1993-03-05 1994-04-12 General Research Corporation Method for measuring thermal differences in infrared emissions from micro devices
US5810477A (en) * 1993-04-30 1998-09-22 International Business Machines Corporation System for identifying surface conditions of a moving medium
US20020018510A1 (en) * 1996-07-31 2002-02-14 Murphy John C. Thermal-based methods for nondestructive evaluation
JPH11337511A (ja) * 1998-05-25 1999-12-10 Advantest Corp 回路検査装置および方法
US7083327B1 (en) * 1999-04-06 2006-08-01 Thermal Wave Imaging, Inc. Method and apparatus for detecting kissing unbond defects
US6236049B1 (en) * 1999-09-16 2001-05-22 Wayne State University Infrared imaging of ultrasonically excited subsurface defects in materials
US6437334B1 (en) * 1999-09-16 2002-08-20 Wayne State University System and method for detecting cracks in a tooth by ultrasonically exciting and thermally imaging the tooth
US6751342B2 (en) * 1999-12-02 2004-06-15 Thermal Wave Imaging, Inc. System for generating thermographic images using thermographic signal reconstruction
DE10158095B4 (de) * 2001-05-05 2012-03-22 Lpkf Laser & Electronics Ag Vorrichtung zur Kontrolle einer Schweißnaht in einem aus schweißfähigem Kunststoff bestehenden Werkstück

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5111048A (en) * 1990-09-27 1992-05-05 General Electric Company Apparatus and method for detecting fatigue cracks using infrared thermography
US6419387B1 (en) * 1997-03-05 2002-07-16 Framatome Method and device for the inspection of a material by thermal imaging

Also Published As

Publication number Publication date
CA2471334C (en) 2010-02-09
CA2471334A1 (en) 2004-12-30
US20040262521A1 (en) 2004-12-30
US6874932B2 (en) 2005-04-05
EP1505384A1 (en) 2005-02-09
BRPI0402556A (pt) 2005-05-03
JP4504117B2 (ja) 2010-07-14
JP2005024556A (ja) 2005-01-27

Similar Documents

Publication Publication Date Title
SG128465A1 (en) Methods for determining the depth of defects
US20070036199A1 (en) Thermal imaging method and apparatus
WO2003063233A3 (en) Systems and methods for closed loop defect reduction
Ludwig et al. Moisture detection in wood and plaster by IR thermography
ATE336720T1 (de) Analytisches system und verfahren zum messen und steuern eines herstellungsverfahrens
WO2003046531A3 (en) Method for detecting defects in substrates
CN110849815B (zh) 一种预测光学元件表面激光损伤性能的方法和系统
CN103383358A (zh) 点阵式热传导测温无损裂纹检测法
US4302678A (en) Fluorescent standard for scanning devices
US10690581B2 (en) Infrared thermographic porosity quantification in composite structures
Jung et al. A Study on Crack Depth Measurement in Steel Structures Using Image‐Based Intensity Differences
Dufour et al. Analysis of thermograms for the estimation of dimensions of cracks in building envelope
FR2854460A1 (fr) Procede et dispositif pour l'inspection a chaud d'objets creux translucides ou transparents
Shepard et al. Automated thermographic defect recognition and measurement
JPS6298243A (ja) 建築物等の外壁状態検査方法
Štarman et al. Automated system for crack detection using infrared thermographic testing
KR101112582B1 (ko) 석조문화재 박리부의 보존처리 분석방법
KR100294510B1 (ko) 재료의 비파괴식 함수율 측정방법
JP2006125933A (ja) 皮膜検査方法、皮膜検査装置および皮膜検査システム
JPH05240815A (ja) 誘導加熱探傷法および誘導加熱探傷装置
Shepard Validating Thermography System Performance
Zong et al. Quantitative detection of subsurface defects by pulse-heating infrared thermography
Sun et al. Measurement of delamination size and depth in ceramic matrix composites using pulsed thermal imaging
Turudija et al. Estimation for Pipeline Applications
Kumara et al. Dynamic Inspection of Surface-Breaking Defects using Induction Thermography