BRPI0402556A - Métodos para determinar a profundidade de defeitos - Google Patents

Métodos para determinar a profundidade de defeitos

Info

Publication number
BRPI0402556A
BRPI0402556A BR0402556-3A BRPI0402556A BRPI0402556A BR PI0402556 A BRPI0402556 A BR PI0402556A BR PI0402556 A BRPI0402556 A BR PI0402556A BR PI0402556 A BRPI0402556 A BR PI0402556A
Authority
BR
Brazil
Prior art keywords
component
infrared radiation
methods
radiation detector
depth
Prior art date
Application number
BR0402556-3A
Other languages
English (en)
Portuguese (pt)
Inventor
John William Devitt
Anthony S Bauco
Craig Alan Cantello
Kevin G Harding
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of BRPI0402556A publication Critical patent/BRPI0402556A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
BR0402556-3A 2003-06-30 2004-06-28 Métodos para determinar a profundidade de defeitos BRPI0402556A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/609,812 US6874932B2 (en) 2003-06-30 2003-06-30 Methods for determining the depth of defects

Publications (1)

Publication Number Publication Date
BRPI0402556A true BRPI0402556A (pt) 2005-05-03

Family

ID=33540927

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0402556-3A BRPI0402556A (pt) 2003-06-30 2004-06-28 Métodos para determinar a profundidade de defeitos

Country Status (6)

Country Link
US (1) US6874932B2 (https=)
EP (1) EP1505384A1 (https=)
JP (1) JP4504117B2 (https=)
BR (1) BRPI0402556A (https=)
CA (1) CA2471334C (https=)
SG (1) SG128465A1 (https=)

Families Citing this family (58)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7591583B2 (en) * 2005-05-18 2009-09-22 Federal-Mogul World Wide, Inc. Transient defect detection algorithm
US7467049B2 (en) * 2005-05-27 2008-12-16 American Electric Power Company, Inc. System and method for detecting impaired electric power equipment
US7632012B2 (en) * 2005-09-01 2009-12-15 Siemens Energy, Inc. Method of measuring in situ differential emissivity and temperature
US7553070B2 (en) * 2006-11-06 2009-06-30 The Boeing Company Infrared NDI for detecting shallow irregularities
JP5027606B2 (ja) * 2007-09-26 2012-09-19 株式会社キーエンス レーザ加工装置、加工データ生成方法及びコンピュータプログラム
US8393784B2 (en) * 2008-03-31 2013-03-12 General Electric Company Characterization of flaws in composites identified by thermography
US7881965B2 (en) 2008-10-02 2011-02-01 ecoATM, Inc. Secondary market and vending system for devices
US20130124426A1 (en) * 2008-10-02 2013-05-16 ecoATM, Inc. Method And Apparatus For Recycling Electronic Devices
US10853873B2 (en) 2008-10-02 2020-12-01 Ecoatm, Llc Kiosks for evaluating and purchasing used electronic devices and related technology
US11010841B2 (en) 2008-10-02 2021-05-18 Ecoatm, Llc Kiosk for recycling electronic devices
CN105303699B (zh) * 2008-10-02 2018-10-09 埃科亚特姆公司 针对设备的二手市场和自动售货系统
US9881284B2 (en) 2008-10-02 2018-01-30 ecoATM, Inc. Mini-kiosk for recycling electronic devices
US20100140236A1 (en) * 2008-12-04 2010-06-10 General Electric Company Laser machining system and method
WO2010106639A1 (ja) * 2009-03-17 2010-09-23 西日本高速道路エンジニアリング四国株式会社 構造物の損傷深さ判定方法とその装置及び構造物の損傷処置判定方法とその装置
JP5414058B2 (ja) * 2010-03-10 2014-02-12 独立行政法人産業技術総合研究所 熱拡散率測定装置
CA3210819A1 (en) 2011-04-06 2012-10-11 Ecoatm, Llc Method and kiosk for recycling electronic devices
US8755044B2 (en) * 2011-08-15 2014-06-17 Kla-Tencor Corporation Large particle detection for multi-spot surface scanning inspection systems
KR101429348B1 (ko) * 2012-09-05 2014-08-13 한국원자력연구원 시편의 내부결함 검출을 위한 비접촉식 영상 검사 방법 및 장치
US9041408B2 (en) * 2013-01-16 2015-05-26 Hrl Laboratories, Llc Removable surface-wave networks for in-situ material health monitoring
US8759770B1 (en) * 2013-04-08 2014-06-24 General Electric Company System and method for qualifying usability risk associated with subsurface defects in a multilayer coating
KR101580844B1 (ko) * 2014-05-08 2015-12-30 한국수력원자력(주) 발전소 가열 및 냉각 운전 과도사건의 피로평가에서 보정계수 산출방법
JP6304880B2 (ja) * 2014-06-17 2018-04-04 株式会社Ihi 非破壊検査装置
US20170307360A1 (en) * 2014-09-25 2017-10-26 Nec Corporation Status determination device and status determination method
US10401411B2 (en) 2014-09-29 2019-09-03 Ecoatm, Llc Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices
WO2016053378A1 (en) 2014-10-02 2016-04-07 ecoATM, Inc. Wireless-enabled kiosk for recycling consumer devices
EP3859697A1 (en) 2014-10-02 2021-08-04 ecoATM, LLC Application for device evaluation and other processes associated with device recycling
US10445708B2 (en) 2014-10-03 2019-10-15 Ecoatm, Llc System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods
WO2016069738A1 (en) 2014-10-31 2016-05-06 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
US20170169401A1 (en) 2015-12-11 2017-06-15 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
WO2016069742A1 (en) 2014-10-31 2016-05-06 ecoATM, Inc. Methods and systems for facilitating processes associated with insurance services and/or other services for electronic devices
EP4560549A3 (en) 2014-11-06 2025-06-18 ecoATM, LLC Methods and systems for evaluating and recycling electronic devices
WO2016094789A1 (en) 2014-12-12 2016-06-16 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
CN105784754A (zh) * 2016-02-25 2016-07-20 山西省交通科学研究院 一种预应力混凝土结构预应力孔道密实度检测系统及方法
FR3049701B1 (fr) * 2016-03-31 2018-04-27 Espci Procede, methode et dispositif de determination de la profondeur d'une fissure dans un solide
US10127647B2 (en) 2016-04-15 2018-11-13 Ecoatm, Llc Methods and systems for detecting cracks in electronic devices
US9885672B2 (en) 2016-06-08 2018-02-06 ecoATM, Inc. Methods and systems for detecting screen covers on electronic devices
US10269110B2 (en) 2016-06-28 2019-04-23 Ecoatm, Llc Methods and systems for detecting cracks in illuminated electronic device screens
FR3053469B1 (fr) * 2016-06-30 2018-08-17 Areva Np Procede d'inspection d'une surface metallique et dispositif associe
GB201711412D0 (en) * 2016-12-30 2017-08-30 Maxu Tech Inc Early entry
US10241036B2 (en) * 2017-05-08 2019-03-26 Siemens Energy, Inc. Laser thermography
CN108254410B (zh) * 2017-12-27 2020-04-03 中国人民解放军陆军装甲兵学院 基于红外检测的喷涂层接触疲劳寿命预测方法及装置
US10551327B2 (en) * 2018-04-11 2020-02-04 General Electric Company Cooling hole inspection system
CN109614892A (zh) * 2018-11-26 2019-04-12 青岛小鸟看看科技有限公司 一种疲劳驾驶检测方法、装置和电子设备
US12322259B2 (en) 2018-12-19 2025-06-03 Ecoatm, Llc Systems and methods for vending and/or purchasing mobile phones and other electronic devices
KR102942007B1 (ko) 2018-12-19 2026-03-19 에코에이티엠, 엘엘씨 이동 전화기 및 다른 전자 디바이스의 판매 및/또는 구매를 위한 시스템 및 방법
EP3924918B1 (en) 2019-02-12 2026-04-01 ecoATM, LLC Kiosk for evaluating and purchasing used electronic devices
US11462868B2 (en) 2019-02-12 2022-10-04 Ecoatm, Llc Connector carrier for electronic device kiosk
US11798250B2 (en) 2019-02-18 2023-10-24 Ecoatm, Llc Neural network based physical condition evaluation of electronic devices, and associated systems and methods
JP2023508903A (ja) 2019-12-18 2023-03-06 エコエーティーエム， エルエルシー 携帯電話および他の電子デバイスを販売および／または買取するためのシステムならびに方法
US11922467B2 (en) 2020-08-17 2024-03-05 ecoATM, Inc. Evaluating an electronic device using optical character recognition
US12271929B2 (en) 2020-08-17 2025-04-08 Ecoatm Llc Evaluating an electronic device using a wireless charger
WO2022040667A1 (en) 2020-08-17 2022-02-24 Ecoatm, Llc Evaluating an electronic device using a wireless charger
EP4197083B1 (en) 2020-08-17 2024-10-09 ecoATM, LLC Connector carrier for electronic device kiosk
EP4738801A2 (en) 2020-08-25 2026-05-06 ecoATM, LLC Evaluating and recycling electronic devices
US11603593B2 (en) 2020-09-04 2023-03-14 General Electric Company Systems and methods for automatic detection of coating defects
US11810288B2 (en) 2020-09-04 2023-11-07 General Electric Company Systems and methods for generating a single observation image to analyze coating defects
US12462635B2 (en) 2021-07-09 2025-11-04 Ecoatm, Llc Identifying electronic devices using temporally changing information
DE102021124565A1 (de) * 2021-09-22 2023-03-23 Infineon Technologies Ag Vorrichtung und verfahren zum aufspüren von rissen in proben mit hilfe von infrarotstrahlung

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US511048A (en) * 1893-12-19 Work-bench for saloons
USRE32166E (en) 1979-01-17 1986-06-03 Elkem A/S Detection of flaws in metal members
US4266185A (en) 1979-02-16 1981-05-05 Dover & Partners Limited Probes and apparatus for and methods of measuring crack depths
US4345457A (en) 1979-12-27 1982-08-24 Kuroki Kogyosho Co., Ltd. Method for detecting the depth of cracks in rolls used for transferring hot steel ingot bloom and rolls used therefor
DE3034944C2 (de) 1980-09-01 1985-01-17 Gerhard Dr. 8029 Sauerlach Busse Verfahren und Einrichtung zur photothermischen Struktur-Untersuchung fester Körper
US4647220A (en) 1984-07-09 1987-03-03 Lockheed Corporation Method of and apparatus for detecting corrosion utilizing infrared analysis
JPS62126339A (ja) * 1985-11-28 1987-06-08 Komatsu Ltd 内部欠陥の検出方法および装置
GB2197465B (en) 1986-09-17 1990-05-30 Atomic Energy Authority Uk Crack sizing
US4760304A (en) 1986-11-24 1988-07-26 General Electric Company Dark field coaxial ultrasonic transducer
JPH01151246A (ja) * 1987-12-08 1989-06-14 Ricoh Co Ltd 半導体集積回路装置の多層配線
US4983836A (en) * 1988-06-30 1991-01-08 Nkk Corporation Method for detecting thinned out portion on inner surface or outer surface of pipe
JPH0212044A (ja) * 1988-06-30 1990-01-17 Nkk Corp 赤外線カメラによる欠陥部の検出方法
US5131758A (en) * 1990-05-16 1992-07-21 Administrator Of The National Aeronautics And Space Administration Method of remotely characterizing thermal properties of a sample
US5111048A (en) 1990-09-27 1992-05-05 General Electric Company Apparatus and method for detecting fatigue cracks using infrared thermography
US5748003A (en) 1991-07-29 1998-05-05 Colorado State University Research Foundation Microwaves used for determining fatigue and surface crack features on metal surfaces
JPH05296956A (ja) * 1992-04-24 1993-11-12 Toshiba Corp 表面探傷装置
US5302830A (en) * 1993-03-05 1994-04-12 General Research Corporation Method for measuring thermal differences in infrared emissions from micro devices
US5810477A (en) * 1993-04-30 1998-09-22 International Business Machines Corporation System for identifying surface conditions of a moving medium
US20020018510A1 (en) * 1996-07-31 2002-02-14 Murphy John C. Thermal-based methods for nondestructive evaluation
FR2760528B1 (fr) * 1997-03-05 1999-05-21 Framatome Sa Procede et dispositif d'examen photothermique d'un materiau
JPH11337511A (ja) * 1998-05-25 1999-12-10 Advantest Corp 回路検査装置および方法
US7083327B1 (en) * 1999-04-06 2006-08-01 Thermal Wave Imaging, Inc. Method and apparatus for detecting kissing unbond defects
US6236049B1 (en) * 1999-09-16 2001-05-22 Wayne State University Infrared imaging of ultrasonically excited subsurface defects in materials
US6437334B1 (en) * 1999-09-16 2002-08-20 Wayne State University System and method for detecting cracks in a tooth by ultrasonically exciting and thermally imaging the tooth
US6751342B2 (en) * 1999-12-02 2004-06-15 Thermal Wave Imaging, Inc. System for generating thermographic images using thermographic signal reconstruction
DE10158095B4 (de) * 2001-05-05 2012-03-22 Lpkf Laser & Electronics Ag Vorrichtung zur Kontrolle einer Schweißnaht in einem aus schweißfähigem Kunststoff bestehenden Werkstück

Also Published As

Publication number Publication date
CA2471334C (en) 2010-02-09
CA2471334A1 (en) 2004-12-30
US20040262521A1 (en) 2004-12-30
US6874932B2 (en) 2005-04-05
SG128465A1 (en) 2007-01-30
EP1505384A1 (en) 2005-02-09
JP4504117B2 (ja) 2010-07-14
JP2005024556A (ja) 2005-01-27

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 11A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2312 DE 28-04-2015 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.