SG11202103130RA - Method for producing organic solvent solution of quaternary ammonium hydroxide - Google Patents
Method for producing organic solvent solution of quaternary ammonium hydroxideInfo
- Publication number
- SG11202103130RA SG11202103130RA SG11202103130RA SG11202103130RA SG11202103130RA SG 11202103130R A SG11202103130R A SG 11202103130RA SG 11202103130R A SG11202103130R A SG 11202103130RA SG 11202103130R A SG11202103130R A SG 11202103130RA SG 11202103130R A SG11202103130R A SG 11202103130RA
- Authority
- SG
- Singapore
- Prior art keywords
- organic solvent
- quaternary ammonium
- ammonium hydroxide
- solvent solution
- producing organic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/322—Aqueous alkaline compositions
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C211/00—Compounds containing amino groups bound to a carbon skeleton
- C07C211/62—Quaternary ammonium compounds
- C07C211/63—Quaternary ammonium compounds having quaternised nitrogen atoms bound to acyclic carbon atoms
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D3/00—Distillation or related exchange processes in which liquids are contacted with gaseous media, e.g. stripping
- B01D3/10—Vacuum distillation
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C209/00—Preparation of compounds containing amino groups bound to a carbon skeleton
- C07C209/82—Purification; Separation; Stabilisation; Use of additives
- C07C209/84—Purification
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C209/00—Preparation of compounds containing amino groups bound to a carbon skeleton
- C07C209/82—Purification; Separation; Stabilisation; Use of additives
- C07C209/86—Separation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
- G03F7/2043—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means with the production of a chemical active agent from a fluid, e.g. an etching agent; with meterial deposition from the fluid phase, e.g. contamination resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/422—Stripping or agents therefor using liquids only
- G03F7/425—Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018183274 | 2018-09-28 | ||
JP2019009734 | 2019-01-23 | ||
JP2019035854 | 2019-02-28 | ||
PCT/JP2019/038008 WO2020067365A1 (ja) | 2018-09-28 | 2019-09-26 | 水酸化第4級アンモニウムの有機溶媒溶液の製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202103130RA true SG11202103130RA (en) | 2021-04-29 |
Family
ID=69950645
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202103130RA SG11202103130RA (en) | 2018-09-28 | 2019-09-26 | Method for producing organic solvent solution of quaternary ammonium hydroxide |
Country Status (6)
Country | Link |
---|---|
US (1) | US20220033343A1 (ko) |
KR (1) | KR20210066818A (ko) |
CN (1) | CN112752746B (ko) |
SG (1) | SG11202103130RA (ko) |
TW (1) | TWI821419B (ko) |
WO (1) | WO2020067365A1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113041637A (zh) * | 2021-04-01 | 2021-06-29 | 沧州信联化工有限公司 | 一种四甲基氢氧化铵生产用蒸馏装置及其使用方法 |
CN114195655A (zh) * | 2021-11-03 | 2022-03-18 | 华南理工大学 | 一种五水四甲基氢氧化铵晶体的脱水方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6472155A (en) * | 1987-09-12 | 1989-03-17 | Tama Kagaku Kogyo Kk | Developing solution for positive type photoresist |
US5868916A (en) * | 1997-02-12 | 1999-02-09 | Sachem, Inc. | Process for recovering organic hydroxides from waste solutions |
JP3490604B2 (ja) * | 1998-01-26 | 2004-01-26 | 多摩化学工業株式会社 | 第四アンモニウム塩基型半導体表面処理剤の製造方法 |
JP4224651B2 (ja) | 1999-02-25 | 2009-02-18 | 三菱瓦斯化学株式会社 | レジスト剥離剤およびそれを用いた半導体素子の製造方法 |
JP4012866B2 (ja) * | 2003-08-22 | 2007-11-21 | 多摩化学工業株式会社 | 第四アンモニウム塩基型半導体表面処理剤及びその製造方法 |
JP4678673B2 (ja) | 2005-05-12 | 2011-04-27 | 東京応化工業株式会社 | ホトレジスト用剥離液 |
CN101910109B (zh) | 2008-12-26 | 2014-08-27 | 神户天然物化学株式会社 | 具有低水含量的光刻胶-去膜液的浓缩溶液的生产方法 |
SG177755A1 (en) | 2009-07-30 | 2012-03-29 | Basf Se | Post ion implant stripper for advanced semiconductor application |
JP5808221B2 (ja) * | 2011-10-28 | 2015-11-10 | 株式会社トクヤマ | テトラアルキルアンモニウム塩溶液の製造方法 |
JP2017026645A (ja) * | 2013-12-03 | 2017-02-02 | Jsr株式会社 | レジスト除去剤およびレジスト除去方法 |
JP6385857B2 (ja) | 2015-02-27 | 2018-09-05 | 京セラ株式会社 | 電力管理装置及びその制御方法 |
KR102129745B1 (ko) * | 2016-02-12 | 2020-07-03 | 후지필름 가부시키가이샤 | 패턴 형성 방법 및 전자 디바이스의 제조 방법 |
JP6072960B1 (ja) | 2016-03-24 | 2017-02-01 | 株式会社バンダイ | 人形玩具の手首関節構造及び人形玩具 |
JP6759174B2 (ja) * | 2016-11-07 | 2020-09-23 | 富士フイルム株式会社 | 処理液及びパターン形成方法 |
-
2019
- 2019-09-26 US US17/280,328 patent/US20220033343A1/en not_active Abandoned
- 2019-09-26 KR KR1020217008424A patent/KR20210066818A/ko not_active Application Discontinuation
- 2019-09-26 CN CN201980062734.3A patent/CN112752746B/zh active Active
- 2019-09-26 WO PCT/JP2019/038008 patent/WO2020067365A1/ja active Application Filing
- 2019-09-26 SG SG11202103130RA patent/SG11202103130RA/en unknown
- 2019-09-27 TW TW108134986A patent/TWI821419B/zh active
Also Published As
Publication number | Publication date |
---|---|
WO2020067365A1 (ja) | 2020-04-02 |
US20220033343A1 (en) | 2022-02-03 |
CN112752746A (zh) | 2021-05-04 |
KR20210066818A (ko) | 2021-06-07 |
TW202026274A (zh) | 2020-07-16 |
TWI821419B (zh) | 2023-11-11 |
CN112752746B (zh) | 2023-07-28 |
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