SG11201906904YA - Removal of process effluents - Google Patents
Removal of process effluentsInfo
- Publication number
- SG11201906904YA SG11201906904YA SG11201906904YA SG11201906904YA SG11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA
- Authority
- SG
- Singapore
- Prior art keywords
- substrate
- international
- shields
- pct
- apparatuses
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/022—Cleaning travelling work
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B2203/00—Details of cleaning machines or methods involving the use or presence of liquid or steam
- B08B2203/002—Details of cleaning machines or methods involving the use or presence of liquid or steam the liquid being a degassed liquid
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B2203/00—Details of cleaning machines or methods involving the use or presence of liquid or steam
- B08B2203/02—Details of machines or methods for cleaning by the force of jets or sprays
- B08B2203/0264—Splash guards
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B2203/00—Details of cleaning machines or methods involving the use or presence of liquid or steam
- B08B2203/02—Details of machines or methods for cleaning by the force of jets or sprays
- B08B2203/027—Pump details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68728—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762455425P | 2017-02-06 | 2017-02-06 | |
US201762518297P | 2017-06-12 | 2017-06-12 | |
PCT/US2018/017014 WO2018145070A1 (fr) | 2017-02-06 | 2018-02-06 | Élimination d'effluents de traitement |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201906904YA true SG11201906904YA (en) | 2019-08-27 |
Family
ID=63041164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201906904YA SG11201906904YA (en) | 2017-02-06 | 2018-02-06 | Removal of process effluents |
Country Status (8)
Country | Link |
---|---|
US (1) | US10892172B2 (fr) |
EP (1) | EP3577681A4 (fr) |
JP (1) | JP6961015B2 (fr) |
KR (1) | KR102226086B1 (fr) |
CN (1) | CN110603628B (fr) |
SG (1) | SG11201906904YA (fr) |
TW (1) | TWI770115B (fr) |
WO (1) | WO2018145070A1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018145001A1 (fr) | 2017-02-06 | 2018-08-09 | Planar Semiconductor, Inc. | Mécanisme de nettoyage de substrat à base de lumière à niveau sous-nanométrique |
TWI770115B (zh) | 2017-02-06 | 2022-07-11 | 新加坡商平面半導體公司 | 加工汙水之去除 |
EP3577680A4 (fr) | 2017-02-06 | 2020-11-25 | Planar Semiconductor, Inc. | Mécanisme de nettoyage de substrat de niveau sous-nanométrique |
US11139183B2 (en) * | 2018-05-24 | 2021-10-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Systems and methods for dry wafer transport |
DE102018118067A1 (de) * | 2018-07-26 | 2020-01-30 | Ecoclean Gmbh | Reinigungsvorrichtung |
KR102387088B1 (ko) * | 2019-10-31 | 2022-04-15 | 세메스 주식회사 | 기판 처리 장치 |
CN114453359A (zh) * | 2022-01-21 | 2022-05-10 | 株洲时代新材料科技股份有限公司 | 一种快速加热去除刮胶盒残胶的装置和方法 |
CN114700306B (zh) * | 2022-04-02 | 2022-12-16 | 南通东西洗轮机机械有限公司 | 一种汽车零部件加工用冲洗装置 |
Family Cites Families (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3849906A (en) * | 1973-11-07 | 1974-11-26 | Ibm | Rotary fluid applicator |
US5531857A (en) | 1988-07-08 | 1996-07-02 | Cauldron Limited Partnership | Removal of surface contaminants by irradiation from a high energy source |
JPH04119524A (ja) | 1990-09-10 | 1992-04-21 | Fuji Electric Co Ltd | 回転表面処理装置 |
US5516816A (en) | 1993-02-12 | 1996-05-14 | Alliedsignal Inc. | Friction composition and friction element fabricated therefrom |
JPH07192996A (ja) | 1993-12-27 | 1995-07-28 | Dainippon Screen Mfg Co Ltd | 紫外線照射装置 |
JPH1064864A (ja) | 1996-08-21 | 1998-03-06 | Nikon Corp | 洗浄装置 |
JPH10242098A (ja) | 1997-03-03 | 1998-09-11 | Miyazaki Oki Electric Co Ltd | ウエハ清浄化装置及びウエハ清浄化方法 |
JPH1126410A (ja) | 1997-06-30 | 1999-01-29 | Nikon Corp | 洗浄装置 |
JPH11189499A (ja) | 1997-12-25 | 1999-07-13 | Japan Energy Corp | 化合物半導体単結晶の製造方法 |
JPH11242098A (ja) | 1998-02-25 | 1999-09-07 | Sumitomo Metal Ind Ltd | 溶解・造塊装置および溶解、造塊法 |
JP2000124181A (ja) | 1998-10-13 | 2000-04-28 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
US6516816B1 (en) | 1999-04-08 | 2003-02-11 | Applied Materials, Inc. | Spin-rinse-dryer |
JP2001113163A (ja) | 1999-10-20 | 2001-04-24 | Hoya Schott Kk | 紫外光照射装置及び方法 |
JP3620016B2 (ja) | 1999-10-25 | 2005-02-16 | 東京エレクトロン株式会社 | 基板処理装置 |
US6225235B1 (en) * | 2000-02-18 | 2001-05-01 | Horst Kunze-Concewitz | Method and device for cleaning and etching individual wafers using wet chemistry |
KR100348701B1 (ko) | 2001-12-07 | 2002-08-13 | 주식회사 아이엠티 | 건식 표면 클리닝 장치 |
KR100457053B1 (ko) | 2002-07-30 | 2004-11-10 | 삼성전자주식회사 | 웨이퍼 세정 장치 |
US20050170653A1 (en) | 2003-01-06 | 2005-08-04 | Fujitsu Limited | Semiconductor manufacturing method and apparatus |
WO2004061926A1 (fr) | 2003-01-06 | 2004-07-22 | Fujitsu Limited | Procede et equipement destines a la fabrication d'un dispositif semi-conducteur |
US20040224508A1 (en) | 2003-05-06 | 2004-11-11 | Applied Materials Israel Ltd | Apparatus and method for cleaning a substrate using a homogenized and non-polarized radiation beam |
US20050026455A1 (en) | 2003-05-30 | 2005-02-03 | Satomi Hamada | Substrate processing apparatus and substrate processing method |
EP1783822A4 (fr) | 2004-06-21 | 2009-07-15 | Nikon Corp | Dispositif d"exposition, procédé de nettoyage d"élément de dispositif d"exposition, procédé de maintenance de dispositif d"exposition, dispositif de maintenance, et procédé de fabrication de dispositif |
JP2006066501A (ja) * | 2004-08-25 | 2006-03-09 | Tokyo Seimitsu Co Ltd | スピン洗浄乾燥装置及びスピン洗浄乾燥方法 |
US10179351B2 (en) | 2005-02-07 | 2019-01-15 | Planar Semiconductor, Inc. | Method and apparatus for cleaning flat objects with pulsed liquid jet |
US20090075060A1 (en) | 2005-02-16 | 2009-03-19 | Miller James R | Adsorptive coating formulation |
KR100749543B1 (ko) | 2006-03-28 | 2007-08-14 | 세메스 주식회사 | 기판 세정 장치 및 그 세정 방법 |
KR100787996B1 (ko) * | 2006-06-16 | 2007-12-21 | 세메스 주식회사 | 기판 처리 장치 및 상기 장치로부터 처리액을 회수하는방법 |
KR100757848B1 (ko) | 2006-06-16 | 2007-09-11 | 세메스 주식회사 | 매엽식 기판 처리 장치 |
US9418831B2 (en) * | 2007-07-30 | 2016-08-16 | Planar Semiconductor, Inc. | Method for precision cleaning and drying flat objects |
JP2009147061A (ja) * | 2007-12-13 | 2009-07-02 | Realize Advanced Technology Ltd | 基板処理方法 |
CN101540268B (zh) | 2008-03-20 | 2012-12-05 | 盛美半导体设备(上海)有限公司 | 用于清洗半导体晶片的方法和装置 |
JP5151629B2 (ja) * | 2008-04-03 | 2013-02-27 | 東京エレクトロン株式会社 | 基板洗浄方法、基板洗浄装置、現像方法、現像装置及び記憶媒体 |
US20110083696A1 (en) | 2009-10-08 | 2011-04-14 | Nuventys Inc. | Laser Induced Shockwave Surface Cleaning |
US20110147350A1 (en) | 2010-12-03 | 2011-06-23 | Uvtech Systems Inc. | Modular apparatus for wafer edge processing |
US9638179B2 (en) * | 2012-12-04 | 2017-05-02 | General Electric Company | Hydraulic control system for a reverse osmosis hydraulic pump |
US20140367898A1 (en) * | 2013-06-12 | 2014-12-18 | Firth Rixson Limited | Cooling systems for heat-treated parts and methods of use |
JP6234736B2 (ja) | 2013-08-30 | 2017-11-22 | 芝浦メカトロニクス株式会社 | スピン処理装置 |
JP6341035B2 (ja) * | 2014-09-25 | 2018-06-13 | 東京エレクトロン株式会社 | 基板液処理方法、基板液処理装置、及び記憶媒体 |
EP3577680A4 (fr) | 2017-02-06 | 2020-11-25 | Planar Semiconductor, Inc. | Mécanisme de nettoyage de substrat de niveau sous-nanométrique |
TWI770115B (zh) | 2017-02-06 | 2022-07-11 | 新加坡商平面半導體公司 | 加工汙水之去除 |
WO2018145001A1 (fr) | 2017-02-06 | 2018-08-09 | Planar Semiconductor, Inc. | Mécanisme de nettoyage de substrat à base de lumière à niveau sous-nanométrique |
-
2018
- 2018-02-05 TW TW107104052A patent/TWI770115B/zh active
- 2018-02-06 CN CN201880023301.2A patent/CN110603628B/zh active Active
- 2018-02-06 JP JP2019563336A patent/JP6961015B2/ja active Active
- 2018-02-06 KR KR1020197026006A patent/KR102226086B1/ko active IP Right Grant
- 2018-02-06 WO PCT/US2018/017014 patent/WO2018145070A1/fr active Application Filing
- 2018-02-06 SG SG11201906904YA patent/SG11201906904YA/en unknown
- 2018-02-06 US US16/478,407 patent/US10892172B2/en active Active
- 2018-02-06 EP EP18748256.7A patent/EP3577681A4/fr active Pending
Also Published As
Publication number | Publication date |
---|---|
KR20200011407A (ko) | 2020-02-03 |
TW201842609A (zh) | 2018-12-01 |
US20190378729A1 (en) | 2019-12-12 |
JP6961015B2 (ja) | 2021-11-05 |
EP3577681A4 (fr) | 2020-11-25 |
JP2020507936A (ja) | 2020-03-12 |
TWI770115B (zh) | 2022-07-11 |
KR102226086B1 (ko) | 2021-03-09 |
US10892172B2 (en) | 2021-01-12 |
WO2018145070A1 (fr) | 2018-08-09 |
EP3577681A1 (fr) | 2019-12-11 |
CN110603628A (zh) | 2019-12-20 |
CN110603628B (zh) | 2023-11-07 |
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