SG11201906904YA - Removal of process effluents - Google Patents

Removal of process effluents

Info

Publication number
SG11201906904YA
SG11201906904YA SG11201906904YA SG11201906904YA SG11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA SG 11201906904Y A SG11201906904Y A SG 11201906904YA
Authority
SG
Singapore
Prior art keywords
substrate
international
shields
pct
apparatuses
Prior art date
Application number
SG11201906904YA
Other languages
English (en)
Inventor
Rubinder S Randhawa
Harry Christov
Original Assignee
Planar Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Planar Semiconductor Inc filed Critical Planar Semiconductor Inc
Publication of SG11201906904YA publication Critical patent/SG11201906904YA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/67034Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • B08B3/022Cleaning travelling work
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/6715Apparatus for applying a liquid, a resin, an ink or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/6719Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68764Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B2203/00Details of cleaning machines or methods involving the use or presence of liquid or steam
    • B08B2203/002Details of cleaning machines or methods involving the use or presence of liquid or steam the liquid being a degassed liquid
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B2203/00Details of cleaning machines or methods involving the use or presence of liquid or steam
    • B08B2203/02Details of machines or methods for cleaning by the force of jets or sprays
    • B08B2203/0264Splash guards
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B2203/00Details of cleaning machines or methods involving the use or presence of liquid or steam
    • B08B2203/02Details of machines or methods for cleaning by the force of jets or sprays
    • B08B2203/027Pump details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68728Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
SG11201906904YA 2017-02-06 2018-02-06 Removal of process effluents SG11201906904YA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762455425P 2017-02-06 2017-02-06
US201762518297P 2017-06-12 2017-06-12
PCT/US2018/017014 WO2018145070A1 (fr) 2017-02-06 2018-02-06 Élimination d'effluents de traitement

Publications (1)

Publication Number Publication Date
SG11201906904YA true SG11201906904YA (en) 2019-08-27

Family

ID=63041164

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201906904YA SG11201906904YA (en) 2017-02-06 2018-02-06 Removal of process effluents

Country Status (8)

Country Link
US (1) US10892172B2 (fr)
EP (1) EP3577681A4 (fr)
JP (1) JP6961015B2 (fr)
KR (1) KR102226086B1 (fr)
CN (1) CN110603628B (fr)
SG (1) SG11201906904YA (fr)
TW (1) TWI770115B (fr)
WO (1) WO2018145070A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018145001A1 (fr) 2017-02-06 2018-08-09 Planar Semiconductor, Inc. Mécanisme de nettoyage de substrat à base de lumière à niveau sous-nanométrique
TWI770115B (zh) 2017-02-06 2022-07-11 新加坡商平面半導體公司 加工汙水之去除
EP3577680A4 (fr) 2017-02-06 2020-11-25 Planar Semiconductor, Inc. Mécanisme de nettoyage de substrat de niveau sous-nanométrique
US11139183B2 (en) * 2018-05-24 2021-10-05 Taiwan Semiconductor Manufacturing Co., Ltd. Systems and methods for dry wafer transport
DE102018118067A1 (de) * 2018-07-26 2020-01-30 Ecoclean Gmbh Reinigungsvorrichtung
KR102387088B1 (ko) * 2019-10-31 2022-04-15 세메스 주식회사 기판 처리 장치
CN114453359A (zh) * 2022-01-21 2022-05-10 株洲时代新材料科技股份有限公司 一种快速加热去除刮胶盒残胶的装置和方法
CN114700306B (zh) * 2022-04-02 2022-12-16 南通东西洗轮机机械有限公司 一种汽车零部件加工用冲洗装置

Family Cites Families (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849906A (en) * 1973-11-07 1974-11-26 Ibm Rotary fluid applicator
US5531857A (en) 1988-07-08 1996-07-02 Cauldron Limited Partnership Removal of surface contaminants by irradiation from a high energy source
JPH04119524A (ja) 1990-09-10 1992-04-21 Fuji Electric Co Ltd 回転表面処理装置
US5516816A (en) 1993-02-12 1996-05-14 Alliedsignal Inc. Friction composition and friction element fabricated therefrom
JPH07192996A (ja) 1993-12-27 1995-07-28 Dainippon Screen Mfg Co Ltd 紫外線照射装置
JPH1064864A (ja) 1996-08-21 1998-03-06 Nikon Corp 洗浄装置
JPH10242098A (ja) 1997-03-03 1998-09-11 Miyazaki Oki Electric Co Ltd ウエハ清浄化装置及びウエハ清浄化方法
JPH1126410A (ja) 1997-06-30 1999-01-29 Nikon Corp 洗浄装置
JPH11189499A (ja) 1997-12-25 1999-07-13 Japan Energy Corp 化合物半導体単結晶の製造方法
JPH11242098A (ja) 1998-02-25 1999-09-07 Sumitomo Metal Ind Ltd 溶解・造塊装置および溶解、造塊法
JP2000124181A (ja) 1998-10-13 2000-04-28 Dainippon Screen Mfg Co Ltd 基板処理装置
US6516816B1 (en) 1999-04-08 2003-02-11 Applied Materials, Inc. Spin-rinse-dryer
JP2001113163A (ja) 1999-10-20 2001-04-24 Hoya Schott Kk 紫外光照射装置及び方法
JP3620016B2 (ja) 1999-10-25 2005-02-16 東京エレクトロン株式会社 基板処理装置
US6225235B1 (en) * 2000-02-18 2001-05-01 Horst Kunze-Concewitz Method and device for cleaning and etching individual wafers using wet chemistry
KR100348701B1 (ko) 2001-12-07 2002-08-13 주식회사 아이엠티 건식 표면 클리닝 장치
KR100457053B1 (ko) 2002-07-30 2004-11-10 삼성전자주식회사 웨이퍼 세정 장치
US20050170653A1 (en) 2003-01-06 2005-08-04 Fujitsu Limited Semiconductor manufacturing method and apparatus
WO2004061926A1 (fr) 2003-01-06 2004-07-22 Fujitsu Limited Procede et equipement destines a la fabrication d'un dispositif semi-conducteur
US20040224508A1 (en) 2003-05-06 2004-11-11 Applied Materials Israel Ltd Apparatus and method for cleaning a substrate using a homogenized and non-polarized radiation beam
US20050026455A1 (en) 2003-05-30 2005-02-03 Satomi Hamada Substrate processing apparatus and substrate processing method
EP1783822A4 (fr) 2004-06-21 2009-07-15 Nikon Corp Dispositif d"exposition, procédé de nettoyage d"élément de dispositif d"exposition, procédé de maintenance de dispositif d"exposition, dispositif de maintenance, et procédé de fabrication de dispositif
JP2006066501A (ja) * 2004-08-25 2006-03-09 Tokyo Seimitsu Co Ltd スピン洗浄乾燥装置及びスピン洗浄乾燥方法
US10179351B2 (en) 2005-02-07 2019-01-15 Planar Semiconductor, Inc. Method and apparatus for cleaning flat objects with pulsed liquid jet
US20090075060A1 (en) 2005-02-16 2009-03-19 Miller James R Adsorptive coating formulation
KR100749543B1 (ko) 2006-03-28 2007-08-14 세메스 주식회사 기판 세정 장치 및 그 세정 방법
KR100787996B1 (ko) * 2006-06-16 2007-12-21 세메스 주식회사 기판 처리 장치 및 상기 장치로부터 처리액을 회수하는방법
KR100757848B1 (ko) 2006-06-16 2007-09-11 세메스 주식회사 매엽식 기판 처리 장치
US9418831B2 (en) * 2007-07-30 2016-08-16 Planar Semiconductor, Inc. Method for precision cleaning and drying flat objects
JP2009147061A (ja) * 2007-12-13 2009-07-02 Realize Advanced Technology Ltd 基板処理方法
CN101540268B (zh) 2008-03-20 2012-12-05 盛美半导体设备(上海)有限公司 用于清洗半导体晶片的方法和装置
JP5151629B2 (ja) * 2008-04-03 2013-02-27 東京エレクトロン株式会社 基板洗浄方法、基板洗浄装置、現像方法、現像装置及び記憶媒体
US20110083696A1 (en) 2009-10-08 2011-04-14 Nuventys Inc. Laser Induced Shockwave Surface Cleaning
US20110147350A1 (en) 2010-12-03 2011-06-23 Uvtech Systems Inc. Modular apparatus for wafer edge processing
US9638179B2 (en) * 2012-12-04 2017-05-02 General Electric Company Hydraulic control system for a reverse osmosis hydraulic pump
US20140367898A1 (en) * 2013-06-12 2014-12-18 Firth Rixson Limited Cooling systems for heat-treated parts and methods of use
JP6234736B2 (ja) 2013-08-30 2017-11-22 芝浦メカトロニクス株式会社 スピン処理装置
JP6341035B2 (ja) * 2014-09-25 2018-06-13 東京エレクトロン株式会社 基板液処理方法、基板液処理装置、及び記憶媒体
EP3577680A4 (fr) 2017-02-06 2020-11-25 Planar Semiconductor, Inc. Mécanisme de nettoyage de substrat de niveau sous-nanométrique
TWI770115B (zh) 2017-02-06 2022-07-11 新加坡商平面半導體公司 加工汙水之去除
WO2018145001A1 (fr) 2017-02-06 2018-08-09 Planar Semiconductor, Inc. Mécanisme de nettoyage de substrat à base de lumière à niveau sous-nanométrique

Also Published As

Publication number Publication date
KR20200011407A (ko) 2020-02-03
TW201842609A (zh) 2018-12-01
US20190378729A1 (en) 2019-12-12
JP6961015B2 (ja) 2021-11-05
EP3577681A4 (fr) 2020-11-25
JP2020507936A (ja) 2020-03-12
TWI770115B (zh) 2022-07-11
KR102226086B1 (ko) 2021-03-09
US10892172B2 (en) 2021-01-12
WO2018145070A1 (fr) 2018-08-09
EP3577681A1 (fr) 2019-12-11
CN110603628A (zh) 2019-12-20
CN110603628B (zh) 2023-11-07

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