SG11201810569WA - Hybrid structure for surface acoustic wave device - Google Patents
Hybrid structure for surface acoustic wave deviceInfo
- Publication number
- SG11201810569WA SG11201810569WA SG11201810569WA SG11201810569WA SG11201810569WA SG 11201810569W A SG11201810569W A SG 11201810569WA SG 11201810569W A SG11201810569W A SG 11201810569WA SG 11201810569W A SG11201810569W A SG 11201810569WA SG 11201810569W A SG11201810569W A SG 11201810569WA
- Authority
- SG
- Singapore
- Prior art keywords
- hybrid structure
- acoustic wave
- surface acoustic
- wave device
- layer
- Prior art date
Links
- 238000010897 surface acoustic wave method Methods 0.000 title abstract 3
- 239000000758 substrate Substances 0.000 abstract 2
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02834—Means for compensation or elimination of undesirable effects of temperature influence
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02559—Characteristics of substrate, e.g. cutting angles of lithium niobate or lithium-tantalate substrates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02566—Characteristics of substrate, e.g. cutting angles of semiconductor substrates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02574—Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02614—Treatment of substrates, e.g. curved, spherical, cylindrical substrates ensuring closed round-about circuits for the acoustical waves
- H03H9/02622—Treatment of substrates, e.g. curved, spherical, cylindrical substrates ensuring closed round-about circuits for the acoustical waves of the surface, including back surface
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/0296—Surface acoustic wave [SAW] devices having both acoustic and non-acoustic properties
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
- H10N30/073—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies by fusion of metals or by adhesives
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/50—Piezoelectric or electrostrictive devices having a stacked or multilayer structure
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
- H10N30/706—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
- H10N30/708—Intermediate layers, e.g. barrier, adhesion or growth control buffer layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/80—Constructional details
- H10N30/85—Piezoelectric or electrostrictive active materials
- H10N30/853—Ceramic compositions
- H10N30/8542—Alkali metal based oxides, e.g. lithium, sodium or potassium niobates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H2009/0019—Surface acoustic wave multichip
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Diaphragms For Electromechanical Transducers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1656191A FR3053532B1 (fr) | 2016-06-30 | 2016-06-30 | Structure hybride pour dispositif a ondes acoustiques de surface |
| PCT/FR2017/051701 WO2018002504A1 (fr) | 2016-06-30 | 2017-06-26 | Structure hybride pour dispositif a ondes acoustiques de surface |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11201810569WA true SG11201810569WA (en) | 2018-12-28 |
Family
ID=56684103
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201810569WA SG11201810569WA (en) | 2016-06-30 | 2017-06-26 | Hybrid structure for surface acoustic wave device |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US11159140B2 (zh) |
| EP (3) | EP3694008B1 (zh) |
| JP (1) | JP7287786B2 (zh) |
| KR (1) | KR102367379B1 (zh) |
| CN (2) | CN109417124B (zh) |
| FI (1) | FI3859800T3 (zh) |
| FR (1) | FR3053532B1 (zh) |
| SG (1) | SG11201810569WA (zh) |
| TW (1) | TWI714785B (zh) |
| WO (1) | WO2018002504A1 (zh) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6549054B2 (ja) * | 2016-02-02 | 2019-07-24 | 信越化学工業株式会社 | 複合基板および複合基板の製造方法 |
| FR3079345B1 (fr) * | 2018-03-26 | 2020-02-21 | Soitec | Procede de fabrication d'un substrat pour dispositif radiofrequence |
| FR3079661A1 (fr) | 2018-03-29 | 2019-10-04 | Soitec | Procede de fabrication d'un substrat pour filtre radiofrequence |
| CN114815329A (zh) * | 2018-11-08 | 2022-07-29 | 日本碍子株式会社 | 电光元件用的复合基板及其制造方法 |
| DE102018131946A1 (de) * | 2018-12-12 | 2020-06-18 | RF360 Europe GmbH | Dünnfilm-SAW-Vorrichtung |
| JP7403960B2 (ja) * | 2019-03-13 | 2023-12-25 | 太陽誘電株式会社 | 弾性波デバイスおよびその製造方法、フィルタ並びにマルチプレクサ |
| DE102019109031A1 (de) * | 2019-04-05 | 2020-10-08 | RF360 Europe GmbH | SAW-Vorrichtung |
| WO2021002382A1 (ja) * | 2019-07-01 | 2021-01-07 | 株式会社村田製作所 | 弾性波装置 |
| FR3098642B1 (fr) * | 2019-07-12 | 2021-06-11 | Soitec Silicon On Insulator | procédé de fabrication d'une structure comprenant une couche mince reportée sur un support muni d’une couche de piégeage de charges |
| CN114342256A (zh) * | 2019-09-18 | 2022-04-12 | 福瑞斯恩系统 | 声波器件的换能器结构 |
| KR102479702B1 (ko) * | 2019-09-27 | 2022-12-21 | 가부시키가이샤 무라타 세이사쿠쇼 | 탄성파 장치 |
| KR102319996B1 (ko) * | 2020-01-03 | 2021-11-01 | (주)와이솔 | 표면탄성파 소자 및 표면탄성파 소자의 제조방법 |
| CN116601871A (zh) * | 2020-10-06 | 2023-08-15 | 株式会社村田制作所 | 弹性波装置 |
| CN112688658B (zh) * | 2020-12-25 | 2021-11-26 | 济南晶正电子科技有限公司 | 一种压电衬底、制备方法及电子元器件 |
| CN112750686B (zh) * | 2020-12-30 | 2021-12-07 | 济南晶正电子科技有限公司 | 一种多层衬底、电子元器件及多层衬底制备方法 |
| CN114070227B (zh) * | 2021-10-26 | 2023-07-25 | 中国科学院上海微系统与信息技术研究所 | 一种氮化铝声波谐振器的制备方法及谐振器 |
| FR3133514A1 (fr) * | 2022-03-08 | 2023-09-15 | Soitec | Procédé de correction d’épaisseur d’une couche piézoélectrique |
| FR3134238A1 (fr) * | 2022-03-30 | 2023-10-06 | Soitec | Substrat piézoélectrique sur isolant (POI) et procédé de fabrication d’un substrat piézoélectrique sur isolant (POI) |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61288506A (ja) * | 1985-06-14 | 1986-12-18 | Murata Mfg Co Ltd | 圧電部品素子およびそれを用いた圧電部品の製造方法 |
| JPH10297931A (ja) | 1997-04-24 | 1998-11-10 | Matsushita Electric Ind Co Ltd | 複合圧電基板の製造方法 |
| JP2002094355A (ja) * | 2000-09-13 | 2002-03-29 | Toshiba Corp | 表面弾性波素子及びその製造方法 |
| JP2002100958A (ja) * | 2000-09-26 | 2002-04-05 | Toshiba Corp | 弾性表面波素子及びその製造方法 |
| JP2002135076A (ja) * | 2000-10-27 | 2002-05-10 | Matsushita Electric Ind Co Ltd | 弾性表面波デバイスおよびその製造方法 |
| JP3892370B2 (ja) * | 2002-09-04 | 2007-03-14 | 富士通メディアデバイス株式会社 | 弾性表面波素子、フィルタ装置及びその製造方法 |
| US20070032040A1 (en) * | 2003-09-26 | 2007-02-08 | Dimitri Lederer | Method of manufacturing a multilayer semiconductor structure with reduced ohmic losses |
| JP2005229455A (ja) | 2004-02-16 | 2005-08-25 | Shin Etsu Chem Co Ltd | 複合圧電基板 |
| DE102004045181B4 (de) | 2004-09-17 | 2016-02-04 | Epcos Ag | SAW-Bauelement mit reduziertem Temperaturgang und Verfahren zur Herstellung |
| JP2007134889A (ja) * | 2005-11-09 | 2007-05-31 | Shin Etsu Chem Co Ltd | 複合圧電基板 |
| US7569976B2 (en) * | 2006-07-27 | 2009-08-04 | Koike Co., Ltd. | Piezo-electric substrate and manufacturing method of the same |
| CN101971491B (zh) * | 2008-01-24 | 2017-08-04 | 株式会社村田制作所 | 声波元件的制造方法 |
| FR2951336B1 (fr) * | 2009-10-09 | 2017-02-10 | Commissariat A L'energie Atomique | Dispositif a ondes acoustiques comprenant un filtre a ondes de surface et un filtre a ondes de volume et procede de fabrication |
| CN102624352B (zh) * | 2010-10-06 | 2015-12-09 | 日本碍子株式会社 | 复合基板的制造方法以及复合基板 |
| WO2014027538A1 (ja) * | 2012-08-17 | 2014-02-20 | 日本碍子株式会社 | 複合基板，弾性表面波デバイス及び複合基板の製造方法 |
| FR3029682B1 (fr) * | 2014-12-04 | 2017-12-29 | Soitec Silicon On Insulator | Substrat semi-conducteur haute resistivite et son procede de fabrication |
| US10381998B2 (en) * | 2015-07-28 | 2019-08-13 | Qorvo Us, Inc. | Methods for fabrication of bonded wafers and surface acoustic wave devices using same |
| US10541667B2 (en) * | 2015-08-25 | 2020-01-21 | Avago Technologies International Sales Pte. Limited | Surface acoustic wave (SAW) resonator having trap-rich region |
| US10020796B2 (en) * | 2015-08-25 | 2018-07-10 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Surface acoustic wave (SAW) resonator |
| JP6427712B2 (ja) * | 2016-03-25 | 2018-11-21 | 日本碍子株式会社 | 接合方法 |
-
2016
- 2016-06-30 FR FR1656191A patent/FR3053532B1/fr active Active
-
2017
- 2017-06-26 JP JP2018568396A patent/JP7287786B2/ja active Active
- 2017-06-26 EP EP20165678.2A patent/EP3694008B1/fr active Active
- 2017-06-26 CN CN201780040275.XA patent/CN109417124B/zh active Active
- 2017-06-26 WO PCT/FR2017/051701 patent/WO2018002504A1/fr unknown
- 2017-06-26 EP EP17745396.6A patent/EP3479421B1/fr active Active
- 2017-06-26 FI FIEP21161536.4T patent/FI3859800T3/en active
- 2017-06-26 CN CN202211307637.6A patent/CN115529021A/zh active Pending
- 2017-06-26 EP EP21161536.4A patent/EP3859800B1/fr active Active
- 2017-06-26 KR KR1020197002818A patent/KR102367379B1/ko active IP Right Grant
- 2017-06-26 SG SG11201810569WA patent/SG11201810569WA/en unknown
- 2017-06-26 US US16/313,804 patent/US11159140B2/en active Active
- 2017-06-27 TW TW106121443A patent/TWI714785B/zh active
-
2020
- 2020-07-07 US US16/922,758 patent/US20200336127A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP7287786B2 (ja) | 2023-06-06 |
| US20200336127A1 (en) | 2020-10-22 |
| EP3694008B1 (fr) | 2021-04-28 |
| FI3859800T3 (en) | 2023-05-05 |
| EP3859800B1 (fr) | 2023-02-15 |
| CN115529021A (zh) | 2022-12-27 |
| EP3479421A1 (fr) | 2019-05-08 |
| TWI714785B (zh) | 2021-01-01 |
| CN109417124A (zh) | 2019-03-01 |
| TW201803268A (zh) | 2018-01-16 |
| EP3479421B1 (fr) | 2020-05-13 |
| FR3053532B1 (fr) | 2018-11-16 |
| KR102367379B1 (ko) | 2022-02-23 |
| EP3859800A1 (fr) | 2021-08-04 |
| JP2019526194A (ja) | 2019-09-12 |
| FR3053532A1 (fr) | 2018-01-05 |
| US20190372552A1 (en) | 2019-12-05 |
| KR20190025649A (ko) | 2019-03-11 |
| CN109417124B (zh) | 2022-11-15 |
| US11159140B2 (en) | 2021-10-26 |
| WO2018002504A1 (fr) | 2018-01-04 |
| EP3694008A1 (fr) | 2020-08-12 |
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