SG11201810733PA - Hybrid structure for surface acoustic wave device - Google Patents
Hybrid structure for surface acoustic wave deviceInfo
- Publication number
- SG11201810733PA SG11201810733PA SG11201810733PA SG11201810733PA SG11201810733PA SG 11201810733P A SG11201810733P A SG 11201810733PA SG 11201810733P A SG11201810733P A SG 11201810733PA SG 11201810733P A SG11201810733P A SG 11201810733PA SG 11201810733P A SG11201810733P A SG 11201810733PA
- Authority
- SG
- Singapore
- Prior art keywords
- hybrid structure
- acoustic wave
- wave device
- surface acoustic
- useful layer
- Prior art date
Links
- 238000010897 surface acoustic wave method Methods 0.000 title abstract 3
- 239000000463 material Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/50—Piezoelectric or electrostrictive devices having a stacked or multilayer structure
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
- H03H3/10—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves for obtaining desired frequency or temperature coefficient
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02574—Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
- H10N30/706—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
- H10N30/706—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
- H10N30/708—Intermediate layers, e.g. barrier, adhesion or growth control buffer layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/80—Constructional details
- H10N30/85—Piezoelectric or electrostrictive active materials
- H10N30/853—Ceramic compositions
- H10N30/8542—Alkali metal based oxides, e.g. lithium, sodium or potassium niobates
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Ceramic Engineering (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
HYBRID STRUCTURE FOR SURFACE ACOUSTIC WAVE DEVICE The invention relates to a hybrid structure (100) for a surface acoustic wave device, comprising a useful layer (10) of piezoelectric material having a first free 5 surface (1) and a second surface (2) disposed on a support substrate (20) that has a lower coefficient of thermal expansion than that of the useful layer (10). The hybrid structure is characterised in that the useful layer (10) comprises an area (30) of nanocavities (31). 10 Fig. 1
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1655030A FR3052298B1 (en) | 2016-06-02 | 2016-06-02 | HYBRID STRUCTURE FOR ACOUSTIC SURFACE WAVE DEVICE |
PCT/FR2017/051339 WO2017207911A1 (en) | 2016-06-02 | 2017-05-30 | Hybrid structure for a surface acoustic wave device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201810733PA true SG11201810733PA (en) | 2018-12-28 |
Family
ID=56322239
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201810733PA SG11201810733PA (en) | 2016-06-02 | 2017-05-30 | Hybrid structure for surface acoustic wave device |
Country Status (8)
Country | Link |
---|---|
US (2) | US11800803B2 (en) |
EP (1) | EP3465784B1 (en) |
JP (1) | JP7057288B2 (en) |
KR (1) | KR102410318B1 (en) |
CN (1) | CN109219896B (en) |
FR (1) | FR3052298B1 (en) |
SG (1) | SG11201810733PA (en) |
WO (1) | WO2017207911A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020098910A1 (en) * | 2018-11-13 | 2020-05-22 | Huawei Technologies Co., Ltd. | Surface acoustic wave device with phononic crystal |
DE102018131946A1 (en) | 2018-12-12 | 2020-06-18 | RF360 Europe GmbH | Thin film SAW device |
FR3091032B1 (en) * | 2018-12-20 | 2020-12-11 | Soitec Silicon On Insulator | Method of transferring a surface layer to cavities |
CN111490748B (en) * | 2020-02-28 | 2024-06-04 | 武汉敏声新技术有限公司 | Film bulk acoustic resonator |
EP3896850A1 (en) * | 2020-04-14 | 2021-10-20 | IQE plc | Layered structure with regions of localized strain in crystalline rare earth oxides |
CN113629182A (en) * | 2020-05-08 | 2021-11-09 | 济南晶正电子科技有限公司 | TC-SAW composite substrate and preparation method thereof |
CN112382559B (en) * | 2020-11-13 | 2024-06-11 | 中国科学院上海微系统与信息技术研究所 | Heterogeneous film structure and preparation method thereof |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004045181B4 (en) | 2004-09-17 | 2016-02-04 | Epcos Ag | SAW device with reduced temperature response and method of manufacture |
JP2008219720A (en) * | 2007-03-07 | 2008-09-18 | Matsushita Electric Ind Co Ltd | Surface acoustic wave device |
US8997320B2 (en) * | 2008-01-24 | 2015-04-07 | Murata Manufacturing Co., Ltd. | Method for manufacturing acoustic wave device |
KR100912553B1 (en) * | 2008-03-07 | 2009-08-19 | 오영주 | Piezoelectric substrate and surface acoustic wave filter using the same |
JP5429200B2 (en) * | 2010-05-17 | 2014-02-26 | 株式会社村田製作所 | Method for manufacturing composite piezoelectric substrate and piezoelectric device |
JP5695394B2 (en) | 2010-11-17 | 2015-04-01 | 日本碍子株式会社 | Composite substrate manufacturing method |
JP5814774B2 (en) * | 2010-12-22 | 2015-11-17 | 日本碍子株式会社 | Composite substrate and method for manufacturing composite substrate |
EP2658123B1 (en) * | 2010-12-24 | 2019-02-13 | Murata Manufacturing Co., Ltd. | Elastic wave device and method for manufacturing the same. |
FR3004289B1 (en) * | 2013-04-08 | 2015-05-15 | Soitec Silicon On Insulator | SURFACE ACOUSTIC WAVE COMPONENT AND METHOD OF MANUFACTURING THE SAME |
-
2016
- 2016-06-02 FR FR1655030A patent/FR3052298B1/en active Active
-
2017
- 2017-05-30 CN CN201780034366.2A patent/CN109219896B/en active Active
- 2017-05-30 JP JP2018563171A patent/JP7057288B2/en active Active
- 2017-05-30 KR KR1020197000090A patent/KR102410318B1/en active IP Right Grant
- 2017-05-30 SG SG11201810733PA patent/SG11201810733PA/en unknown
- 2017-05-30 EP EP17732512.3A patent/EP3465784B1/en active Active
- 2017-05-30 US US16/306,822 patent/US11800803B2/en active Active
- 2017-05-30 WO PCT/FR2017/051339 patent/WO2017207911A1/en unknown
-
2023
- 2023-10-12 US US18/485,899 patent/US20240040930A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US11800803B2 (en) | 2023-10-24 |
JP7057288B2 (en) | 2022-04-19 |
WO2017207911A1 (en) | 2017-12-07 |
EP3465784B1 (en) | 2020-04-08 |
US20190165252A1 (en) | 2019-05-30 |
EP3465784A1 (en) | 2019-04-10 |
KR20190014072A (en) | 2019-02-11 |
US20240040930A1 (en) | 2024-02-01 |
FR3052298A1 (en) | 2017-12-08 |
KR102410318B1 (en) | 2022-06-17 |
CN109219896B (en) | 2022-11-22 |
CN109219896A (en) | 2019-01-15 |
FR3052298B1 (en) | 2018-07-13 |
JP2019520753A (en) | 2019-07-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG11201810569WA (en) | Hybrid structure for surface acoustic wave device | |
SG11201810733PA (en) | Hybrid structure for surface acoustic wave device | |
SG11201805559YA (en) | Hybrid structure for a surface acoustic wave device | |
SG11201805398VA (en) | Substrate for a temperature-compensated surface acoustic wave device or bulk acoustic wave device | |
GB2580496B (en) | Acoustic wave device with high thermal conductivity layer on interdigital transducer | |
WO2014134507A3 (en) | Pedestal construction with low coefficient of thermal expansion top | |
MY186812A (en) | Iii-n devices in si trenches | |
IN2014MN01027A (en) | ||
MA40892B1 (en) | Device for producing a cold plasma at atmospheric pressure | |
GB2566188A (en) | Thermal interface material structures | |
TW200614420A (en) | Semiconductor structure and semiconductor process | |
EP2704216A3 (en) | Flexible semiconductor devices and methods of manufacturing the same | |
EP2886210A3 (en) | Ultrasonic sensor and measuring method using the same, and method of manufacturing ultrasonic sensor | |
TW200711004A (en) | Method of forming buried isolation regions in semiconductor substrates and semiconductor devices with buried isolation regions | |
SG11201908449QA (en) | Saw resonator comprising layers for attenuating parasitic waves | |
WO2013032691A3 (en) | Engineered substrates for semiconductor devices and associated systems and methods | |
GB2529953A (en) | Nanostructures and nanofeatures with Si (111) planes on Si (100) wafers for III-N epitaxy | |
JP2016076798A5 (en) | ||
MY173532A (en) | Semiconductor device and manufacturing method for the semiconductor device | |
WO2018002035A3 (en) | Method of processing wafer having protrusions on the back side | |
WO2008103331A3 (en) | Wide-bandgap semiconductor devices | |
SG144153A1 (en) | Lithographic apparatus and device manufacturing method | |
GB2526464A (en) | Methods of forming buried microelectricomechanical structures coupled with device substrates and structures formed thereby | |
MX2023004919A (en) | Method and device for promoting adhesion of metallic surfaces. | |
GB2507693A (en) | Saw filter having planar barrier layer and method of making |