SG11201505095RA - Warped silicon-chip adsorption device and adsorption method thereof - Google Patents
Warped silicon-chip adsorption device and adsorption method thereofInfo
- Publication number
- SG11201505095RA SG11201505095RA SG11201505095RA SG11201505095RA SG11201505095RA SG 11201505095R A SG11201505095R A SG 11201505095RA SG 11201505095R A SG11201505095R A SG 11201505095RA SG 11201505095R A SG11201505095R A SG 11201505095RA SG 11201505095R A SG11201505095R A SG 11201505095RA
- Authority
- SG
- Singapore
- Prior art keywords
- adsorption
- chip
- warped silicon
- adsorption device
- warped
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/707—Chucks, e.g. chucking or un-chucking operations or structural details
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70783—Handling stress or warp of chucks, masks or workpieces, e.g. to compensate for imaging errors or considerations related to warpage of masks or workpieces due to their own weight
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T279/00—Chucks or sockets
- Y10T279/11—Vacuum
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210586817.2A CN103904011B (en) | 2012-12-28 | 2012-12-28 | Warpage silicon-chip absorption device and absorption method thereof |
PCT/CN2013/090565 WO2014101795A1 (en) | 2012-12-28 | 2013-12-26 | Warped silicon-chip adsorption device and adsorption method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201505095RA true SG11201505095RA (en) | 2015-08-28 |
Family
ID=50995275
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201608644YA SG10201608644YA (en) | 2012-12-28 | 2013-12-26 | Warped silicon-chip adsorption device and adsorption method thereof |
SG11201505095RA SG11201505095RA (en) | 2012-12-28 | 2013-12-26 | Warped silicon-chip adsorption device and adsorption method thereof |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201608644YA SG10201608644YA (en) | 2012-12-28 | 2013-12-26 | Warped silicon-chip adsorption device and adsorption method thereof |
Country Status (6)
Country | Link |
---|---|
US (1) | US20150357217A1 (en) |
KR (1) | KR20150103153A (en) |
CN (1) | CN103904011B (en) |
SG (2) | SG10201608644YA (en) |
TW (1) | TW201427796A (en) |
WO (1) | WO2014101795A1 (en) |
Families Citing this family (30)
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JP6316181B2 (en) * | 2014-12-18 | 2018-04-25 | 東京エレクトロン株式会社 | Substrate holding stage |
US10381256B2 (en) * | 2015-03-12 | 2019-08-13 | Kla-Tencor Corporation | Apparatus and method for chucking warped wafers |
CN106252791B (en) * | 2015-06-12 | 2019-02-19 | 睿励科学仪器(上海)有限公司 | Silicon wafer sucking disc |
CN104992921B (en) * | 2015-07-16 | 2017-09-01 | 北京工业大学 | A kind of clamping device of large-size ultra-thin wafer |
CN106887401A (en) * | 2015-12-15 | 2017-06-23 | 浙江鸿禧能源股份有限公司 | A kind of new classification and Detection board rectifier sucker |
TWI630059B (en) * | 2015-12-25 | 2018-07-21 | 日商三星鑽石工業股份有限公司 | Substrate adsorption device and workbench |
CN105842996B (en) * | 2016-05-30 | 2017-12-08 | 上海华力微电子有限公司 | A kind of wafer carrying adsorptive pressure optimization method of litho machine |
CN107452643B (en) * | 2016-05-31 | 2020-11-13 | 弘塑科技股份有限公司 | Substrate flattening apparatus and semiconductor manufacturing method using the same |
TWI584408B (en) * | 2016-09-06 | 2017-05-21 | Long turn nozzle device | |
CN108242418A (en) * | 2016-12-23 | 2018-07-03 | 上海微电子装备(集团)股份有限公司 | A kind of substrate adsorbing mechanism, substrate connection device and method |
CN109427640B (en) * | 2017-08-22 | 2020-08-04 | 京东方科技集团股份有限公司 | Adsorption device and adsorption method |
CN108305849B (en) * | 2018-01-31 | 2020-08-04 | 徐州诚凯知识产权服务有限公司 | Chip and mounting substrate alignment device and alignment mounting method |
CN108435714B (en) * | 2018-04-12 | 2023-08-29 | 环维电子(上海)有限公司 | Novel dry ice cleaning base and cleaning method thereof |
CN109244028B (en) * | 2018-09-28 | 2022-11-18 | 上海微松工业自动化有限公司 | Wafer flattening and fixing method |
CN109484069B (en) * | 2018-10-30 | 2020-12-08 | 周菊青 | Novel inkstone ink grinding device capable of achieving intermittent water inlet synchronous grinding |
TWI701090B (en) * | 2019-01-17 | 2020-08-11 | 日月光半導體製造股份有限公司 | Panel handling apparatus and method thereof and multistage suction device |
CN110620067B (en) * | 2019-09-24 | 2022-03-25 | 中国科学院微电子研究所 | Method for improving warping of silicon wafer by adjusting suction force distribution of sucking disc |
CN111085954A (en) * | 2019-12-24 | 2020-05-01 | 深圳市华星光电半导体显示技术有限公司 | Substrate adsorption device |
TWI810445B (en) * | 2020-03-27 | 2023-08-01 | 由田新技股份有限公司 | A semiconductor wafer leveling device and leveling method thereof |
CN114454023B (en) * | 2021-03-01 | 2022-12-16 | 华中科技大学 | Wafer grinding adsorption platform based on standard cylinder |
CN113066751A (en) * | 2021-03-25 | 2021-07-02 | 深圳中科飞测科技股份有限公司 | Bearing device and bearing system |
CN113078094A (en) * | 2021-03-25 | 2021-07-06 | 深圳中科飞测科技股份有限公司 | Warpage correction method, bearing device and bearing system |
CN113650045B (en) * | 2021-09-17 | 2022-12-20 | 长江存储科技有限责任公司 | Manipulator for picking up wafer |
CN113983286A (en) * | 2021-09-25 | 2022-01-28 | 安徽和邦纺织科技有限公司 | Gauze embroidery feeding monitoring device |
CN113859968B (en) * | 2021-09-26 | 2022-12-30 | 博众精工科技股份有限公司 | Material taking module |
CN114211520B (en) * | 2022-02-21 | 2022-05-17 | 鹰星精密工业(深圳)有限公司 | High-precision linear manipulator and application method |
CN115352877A (en) * | 2022-08-31 | 2022-11-18 | 京东方科技集团股份有限公司 | Screen fixing device and control method and equipment thereof |
CN115338802B (en) * | 2022-09-06 | 2023-10-10 | 无锡福田包装制品有限公司 | Electric motor car shell surface applique positioning fixture |
CN116331845B (en) * | 2023-05-30 | 2023-08-15 | 泰州恒润玻璃有限公司 | Toughened glass handling device |
CN116588683B (en) * | 2023-07-19 | 2023-09-12 | 常州协创智联电子有限公司 | Suction nozzle assembly for carrying battery cell, carrying mechanism using suction nozzle assembly and carrying method |
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CN102569147B (en) * | 2010-12-28 | 2015-11-25 | 上海微电子装备有限公司 | Silicon wafer adsorption mechanism and using method thereof |
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-
2012
- 2012-12-28 CN CN201210586817.2A patent/CN103904011B/en active Active
-
2013
- 2013-12-26 US US14/655,465 patent/US20150357217A1/en not_active Abandoned
- 2013-12-26 KR KR1020157020394A patent/KR20150103153A/en not_active Application Discontinuation
- 2013-12-26 SG SG10201608644YA patent/SG10201608644YA/en unknown
- 2013-12-26 SG SG11201505095RA patent/SG11201505095RA/en unknown
- 2013-12-26 WO PCT/CN2013/090565 patent/WO2014101795A1/en active Application Filing
- 2013-12-27 TW TW102148651A patent/TW201427796A/en unknown
Also Published As
Publication number | Publication date |
---|---|
US20150357217A1 (en) | 2015-12-10 |
CN103904011A (en) | 2014-07-02 |
WO2014101795A1 (en) | 2014-07-03 |
TWI495541B (en) | 2015-08-11 |
KR20150103153A (en) | 2015-09-09 |
TW201427796A (en) | 2014-07-16 |
CN103904011B (en) | 2016-12-28 |
SG10201608644YA (en) | 2016-12-29 |
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