SG11201405079PA - Critical angle optical sensor apparatus - Google Patents

Critical angle optical sensor apparatus

Info

Publication number
SG11201405079PA
SG11201405079PA SG11201405079PA SG11201405079PA SG11201405079PA SG 11201405079P A SG11201405079P A SG 11201405079PA SG 11201405079P A SG11201405079P A SG 11201405079PA SG 11201405079P A SG11201405079P A SG 11201405079PA SG 11201405079P A SG11201405079P A SG 11201405079PA
Authority
SG
Singapore
Prior art keywords
optical sensor
critical angle
sensor apparatus
angle optical
critical
Prior art date
Application number
SG11201405079PA
Other languages
English (en)
Inventor
Ronald Chiarello
Shad Pierson
Christopher Wacinski
Mark Arbore
Yevgeny Anoikin
Original Assignee
Entegris Jetalon Solutions Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Entegris Jetalon Solutions Inc filed Critical Entegris Jetalon Solutions Inc
Publication of SG11201405079PA publication Critical patent/SG11201405079PA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N21/431Dip refractometers, e.g. using optical fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N2021/434Dipping block in contact with sample, e.g. prism
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N2021/436Sensing resonant reflection
    • G01N2021/437Sensing resonant reflection with investigation of angle
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • G01N21/553Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SG11201405079PA 2012-02-21 2013-02-15 Critical angle optical sensor apparatus SG11201405079PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/401,765 US9024252B2 (en) 2012-02-21 2012-02-21 Optical sensor apparatus to detect light based on the refractive index of a sample
PCT/US2013/026329 WO2013126280A1 (en) 2012-02-21 2013-02-15 Critical angle optical sensor apparatus

Publications (1)

Publication Number Publication Date
SG11201405079PA true SG11201405079PA (en) 2014-09-26

Family

ID=48981571

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201405079PA SG11201405079PA (en) 2012-02-21 2013-02-15 Critical angle optical sensor apparatus

Country Status (9)

Country Link
US (2) US9024252B2 (ja)
EP (1) EP2817611B1 (ja)
JP (1) JP6153950B2 (ja)
KR (1) KR102138607B1 (ja)
CN (1) CN104272088B (ja)
FI (1) FI2817611T3 (ja)
SG (1) SG11201405079PA (ja)
TW (2) TWI534422B (ja)
WO (1) WO2013126280A1 (ja)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9024252B2 (en) 2012-02-21 2015-05-05 Entegris-Jetalon Solutions, Inc. Optical sensor apparatus to detect light based on the refractive index of a sample
US9733182B2 (en) * 2013-04-04 2017-08-15 Baker Hughes Incorporated Apparatus and method for determining a fluid property downhole using a bulk reading refractometer
AT14051U1 (de) * 2013-10-23 2015-03-15 Tecsense Gmbh Optochemischer Sensor
WO2015142805A1 (en) * 2014-03-17 2015-09-24 Entegris - Jetalon Solutions, Inc. Disposable liquid chemical sensor system
CN103868854A (zh) * 2014-04-02 2014-06-18 上海仪电物理光学仪器有限公司 一种多波长阿贝折射仪的光学系统
FI127243B (fi) * 2014-05-13 2018-02-15 Janesko Oy Menetelmä ja mittalaite Abben luvun jatkuvaksi mittaamiseksi
JP6356563B2 (ja) * 2014-09-29 2018-07-11 京セラ株式会社 光センサモジュール
EP3213053B1 (en) 2014-12-23 2019-08-28 Apple Inc. Optical inspection system and method including accounting for variations of optical path length within a sample
US10103953B1 (en) 2015-05-12 2018-10-16 Palantir Technologies Inc. Methods and systems for analyzing entity performance
EP3344971B1 (en) * 2015-09-01 2022-10-26 Apple Inc. Reference switch architectures for noncontact sensing of substances
US10371624B2 (en) 2015-10-26 2019-08-06 Entegris, Inc. Index of refraction sensor system with dual mode temperature control
KR102573739B1 (ko) 2016-04-21 2023-08-31 애플 인크. 레퍼런스 스위칭을 위한 광학 시스템
EP3465294A4 (en) * 2016-06-03 2020-01-22 3M Innovative Properties Company OPTICAL FILTERS WITH SPATIALLY DIFFERENT MICROREPLICED LAYERS
TWI603069B (zh) 2016-09-05 2017-10-21 浚洸光學科技股份有限公司 液體濃度的檢測裝置
US9823192B1 (en) * 2016-10-17 2017-11-21 Ecolife Technologies, Llc Auto-calibration surface plasmon resonance biosensor
CA3069323C (en) * 2017-08-01 2022-06-07 Zoetis Services Llc Apparatus for analyzing a media, and associated egg identification apparatus and method
EP3688446A2 (en) 2017-09-29 2020-08-05 Apple Inc. Resolve path optical sampling architectures
WO2019099051A1 (en) * 2017-11-20 2019-05-23 Hewlett-Packard Development Company, L.P. Media sensing
DE102018200566B4 (de) * 2018-01-15 2021-07-15 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. System und Verfahren zur Überwachung der Fertigungsgenauigkeit bei der additiven Herstellung dreidimensionaler Bauteile
US10109473B1 (en) 2018-01-26 2018-10-23 Excelitas Technologies Corp. Mechanically sealed tube for laser sustained plasma lamp and production method for same
EP3752873A1 (en) 2018-02-13 2020-12-23 Apple Inc. Integrated photonics device having integrated edge outcouplers
US10330789B1 (en) * 2018-04-10 2019-06-25 Facebook Technologies, Llc Proximity sensor system with an infrared optical element
WO2020139504A1 (en) * 2018-12-26 2020-07-02 Entegris, Inc. Liner for an overpack assembly
DE102019108561A1 (de) * 2019-04-02 2020-10-08 Endress+Hauser Process Solutions (Deutschland) GmbH Refraktometer und Verfahren zur Bestimmung des Brechungsindex eines Prozessmediums mit einem Refraktometer
CN109896585A (zh) * 2019-04-26 2019-06-18 德州汉升光电科技有限公司 一种360度感光紫外线传感器
EP4078118A4 (en) * 2019-12-20 2023-10-18 Entegris, Inc. ACCURATE TEMPERATURE READING OF A LIQUID-NEAR INTERFACE
JP7532651B2 (ja) 2020-09-09 2024-08-13 アップル インコーポレイテッド ノイズ緩和のための光学システム
CN112630195A (zh) * 2020-12-24 2021-04-09 广州大学 一种角度调制型spr传感器及spr检测设备
KR102544841B1 (ko) * 2021-01-28 2023-06-20 (주)퀀텀테크 프리즘유닛과 이것을 이용한 액상케미컬 농도측정장치
CN115266645A (zh) * 2021-04-30 2022-11-01 瑞爱生医股份有限公司 具尿糖检测功能的排泄物装置
FR3126044A1 (fr) * 2021-08-05 2023-02-10 Benoit Boulant Dispositif de mesure de réfractométrie auto-étalonné et procédé d’étalonnage d’un tel dispositif de mesure
TWI792666B (zh) * 2021-11-08 2023-02-11 瑞愛生醫股份有限公司 可量測尿糖濃度裝置
US11879888B2 (en) 2021-12-30 2024-01-23 Taiwan Redeye Biomedical Inc. Glycosuria measurement device

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4699511A (en) 1985-04-03 1987-10-13 Seaver George A Refraction sensor
US5101099A (en) * 1990-06-15 1992-03-31 Fuji Xerox Co., Ltd. Image reading device with different reflectivity coefficients in a transparent layer and a substrate
JP3155569B2 (ja) * 1991-09-17 2001-04-09 オリンパス光学工業株式会社 分散分布測定方法
US5309214A (en) 1991-09-17 1994-05-03 Olympus Optical Co., Ltd. Method for measuring distributed dispersion of gradient-index optical elements and optical system to be used for carrying out the method
US5373366A (en) 1991-11-22 1994-12-13 Scitex Digital Printing, Inc Ink concentration measuring and control and control circuit
EP0598341B1 (en) 1992-11-17 1998-09-23 Hoechst Aktiengesellschaft Optical sensor for detecting chemical species
JPH07209183A (ja) * 1994-01-18 1995-08-11 Kyoto Electron Mfg Co Ltd 屈折率計
US5439647A (en) * 1994-02-25 1995-08-08 Fiberchem, Inc. Chip level waveguide sensor
JP3071644B2 (ja) * 1994-09-21 2000-07-31 株式会社ジャパンエナジー 全反射型屈折率センサ
US5694210A (en) 1996-06-28 1997-12-02 The Board Of Trustees Of The University Of Illinois Multi-purpose sensor system and sensing method using internally reflected light beams
JP3641076B2 (ja) * 1996-07-19 2005-04-20 株式会社ジャパンエナジー 温度計及び温度測定方法
EP0929803B1 (en) 1996-09-30 2002-04-03 Celanese Ventures GmbH Optical sensor for detecting chemical substances dissolved or dispersed in water
JPH10123048A (ja) 1996-10-01 1998-05-15 Texas Instr Inc <Ti> 集積化されたセンサおよび生化学的サンプルを検出する方法
JP2000155096A (ja) * 1998-07-09 2000-06-06 Omron Corp 水分検出装置
TW408220B (en) 1998-09-22 2000-10-11 Su De Chin Liquid refractometer based on heterodyne interferometry
US6549276B1 (en) 1998-10-30 2003-04-15 Research Foundation Of State University Of New York Method and apparatus for optical measurement of concentration and temperature of liquids
US6594018B1 (en) 2000-02-01 2003-07-15 Texas Instruments Incorporated Miniature integrated multiple channel surface plasmon resonance liquid sensor
DE10008517C2 (de) 2000-02-24 2002-09-26 Eppendorf Ag Optisches Meßsystem
US6762832B2 (en) 2001-07-18 2004-07-13 Air Liquide America, L.P. Methods and systems for controlling the concentration of a component in a composition with absorption spectroscopy
JP2004150923A (ja) 2002-10-30 2004-05-27 Atago:Kk 屈折計
US6885455B2 (en) * 2002-11-22 2005-04-26 Dwight U. Bartholomew Self-calibration of an optical-based sensor using a total internal reflection (TIR) signature
DE10257716B4 (de) 2002-12-11 2005-12-29 Institut für Textilchemie der Deutschen Institute für Textil- und Faserforschung Stuttgart Optischer Sensor zur Bestimmung von Farbstoffkonzentrationen in flüssigen Medien und Verfahren zu dessen Betrieb
US6931219B2 (en) 2003-06-26 2005-08-16 Xerox Corporation Led color specific optical toner concentration sensor
TWI226436B (en) 2003-08-15 2005-01-11 Nat Huwei Institue Of Technolo Optical fiber sensor measuring system
JP4231051B2 (ja) 2003-08-29 2009-02-25 株式会社東芝 測定対象物質の濃度測定方法、測定対象物質の濃度測定用キット及びセンサチップ
US7271883B2 (en) 2004-07-13 2007-09-18 Newell Benjamin E Refractive index sensor using internally reflective light beams
US7221440B2 (en) 2004-07-22 2007-05-22 Eastman Kodak Company System and method for controlling ink concentration using a refractometer
US7194216B2 (en) 2004-11-18 2007-03-20 Xerox Corporation Method and apparatus for measuring toner concentration
US7319523B2 (en) 2005-09-26 2008-01-15 Jetalon Solutions, Inc. Apparatus for a liquid chemical concentration analysis system
WO2007038411A2 (en) * 2005-09-26 2007-04-05 Jetalon Solutions, Inc. Method and apparatus for a liquid chemical concentration analysis system
KR100790826B1 (ko) 2006-06-30 2008-01-02 삼성전자주식회사 오버레이 계측방법 및 그가 사용되는 반도체 제조설비의관리시스템
CN101490534A (zh) * 2006-07-20 2009-07-22 皇家飞利浦电子股份有限公司 使用消逝场激发的辐射探测器
US7652767B2 (en) 2006-10-19 2010-01-26 Sporian Microsystems, Inc. Optical sensor with chemically reactive surface
US7602496B2 (en) 2006-10-19 2009-10-13 Sporian Microsystems, Inc. Optical sensor with biologically reactive surface
US7688450B2 (en) 2007-05-25 2010-03-30 Intel Corporation Hydrogel-actuated micromirrors for optical sensing
JP2009047436A (ja) 2007-08-13 2009-03-05 Atago:Kk 屈折計
DE102008030277B4 (de) 2008-06-25 2014-05-28 Lre Medical Gmbh Verfahren und Vorrichtung zum Bestimmen der Konzentration einer Substanz in einer Flüssigkeit
GB2460305B (en) 2008-11-11 2010-06-16 Univ Montfort Determining the particle size distribution of a suspension
US8300993B2 (en) 2009-03-02 2012-10-30 Mbio Diagnostics, Inc. Waveguide with integrated lens
US8602640B2 (en) * 2009-05-20 2013-12-10 Entegris—Jetalon Solutions, Inc. Sensing system and method
KR101216052B1 (ko) * 2010-12-10 2012-12-27 국립대학법인 울산과학기술대학교 산학협력단 질소가 도핑된 그래핀의 제조 방법 및 이에 의하여 제조되는 질소가 도핑된 그래핀
US9024252B2 (en) 2012-02-21 2015-05-05 Entegris-Jetalon Solutions, Inc. Optical sensor apparatus to detect light based on the refractive index of a sample

Also Published As

Publication number Publication date
US20150042985A1 (en) 2015-02-12
US9632024B2 (en) 2017-04-25
FI2817611T3 (fi) 2023-02-17
TWI534422B (zh) 2016-05-21
KR102138607B1 (ko) 2020-07-28
JP2015508178A (ja) 2015-03-16
JP6153950B2 (ja) 2017-06-28
US9024252B2 (en) 2015-05-05
KR20140130702A (ko) 2014-11-11
EP2817611A4 (en) 2015-08-19
TW201350826A (zh) 2013-12-16
CN104272088B (zh) 2017-05-31
EP2817611A1 (en) 2014-12-31
CN104272088A (zh) 2015-01-07
US20130214138A1 (en) 2013-08-22
TW201506379A (zh) 2015-02-16
WO2013126280A1 (en) 2013-08-29
TWI503532B (zh) 2015-10-11
EP2817611B1 (en) 2022-11-23

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