SG10202102760UA - Polishing head system and polishing apparatus - Google Patents
Polishing head system and polishing apparatusInfo
- Publication number
- SG10202102760UA SG10202102760UA SG10202102760UA SG10202102760UA SG 10202102760U A SG10202102760U A SG 10202102760UA SG 10202102760U A SG10202102760U A SG 10202102760UA SG 10202102760U A SG10202102760U A SG 10202102760UA
- Authority
- SG
- Singapore
- Prior art keywords
- polishing
- head system
- polishing apparatus
- polishing head
- head
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/007—Cleaning of grinding wheels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
- B24B49/04—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020056240A JP7365282B2 (en) | 2020-03-26 | 2020-03-26 | Polishing head system and polishing equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10202102760UA true SG10202102760UA (en) | 2021-10-28 |
Family
ID=77809393
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202102760U SG10202102760UA (en) | 2020-03-26 | 2021-03-18 | Polishing head system and polishing apparatus |
Country Status (6)
Country | Link |
---|---|
US (1) | US11673222B2 (en) |
JP (1) | JP7365282B2 (en) |
KR (1) | KR20210120860A (en) |
CN (1) | CN113442054A (en) |
SG (1) | SG10202102760UA (en) |
TW (1) | TW202135983A (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2023517454A (en) * | 2020-06-24 | 2023-04-26 | アプライド マテリアルズ インコーポレイテッド | Polishing of carrier head by piezoelectric pressure control |
CN115151376B (en) * | 2020-07-08 | 2024-05-24 | 应用材料公司 | Multi-tooth magnetic control retaining ring |
US20230063687A1 (en) * | 2021-08-27 | 2023-03-02 | Taiwan Semiconductor Manufacturing Company Limited | Apparatus for polishing a wafer |
JP2023045831A (en) | 2021-09-22 | 2023-04-03 | 日亜化学工業株式会社 | Light-emitting device and manufacturing method of light-emitting device |
US20230219189A1 (en) * | 2022-01-07 | 2023-07-13 | Applied Materials, Inc. | Apparatus and method for selective material removal during polishing |
WO2023176611A1 (en) * | 2022-03-14 | 2023-09-21 | 株式会社荏原製作所 | Substrate polishing device, substrate polishing method, polishing device, and polishing method |
CN114800052B (en) * | 2022-03-18 | 2023-09-26 | 大连理工大学 | Grinding method for improving surface shape of optical wafer |
Family Cites Families (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09225820A (en) | 1996-02-23 | 1997-09-02 | Hitachi Ltd | Polishing device |
JPH10128655A (en) | 1996-10-31 | 1998-05-19 | Toshiba Corp | Polishing device |
US5868896A (en) * | 1996-11-06 | 1999-02-09 | Micron Technology, Inc. | Chemical-mechanical planarization machine and method for uniformly planarizing semiconductor wafers |
KR100475845B1 (en) * | 1997-04-04 | 2005-06-17 | 도쿄 세이미츄 코퍼레이션 리미티드 | Polishing device |
US6110025A (en) * | 1997-05-07 | 2000-08-29 | Obsidian, Inc. | Containment ring for substrate carrier apparatus |
US5888120A (en) * | 1997-09-29 | 1999-03-30 | Lsi Logic Corporation | Method and apparatus for chemical mechanical polishing |
US5997384A (en) * | 1997-12-22 | 1999-12-07 | Micron Technology, Inc. | Method and apparatus for controlling planarizing characteristics in mechanical and chemical-mechanical planarization of microelectronic substrates |
JP2000127024A (en) | 1998-10-27 | 2000-05-09 | Toshiba Corp | Polishing device and polishing method |
JP2000246628A (en) | 1999-02-23 | 2000-09-12 | Ebara Corp | Substrate holding device and polishing device |
TW436382B (en) * | 1999-03-12 | 2001-05-28 | Mitsubishi Materials Corp | Wafer holding head, wafer polishing apparatus, and method for making wafers |
US6290584B1 (en) * | 1999-08-13 | 2001-09-18 | Speedfam-Ipec Corporation | Workpiece carrier with segmented and floating retaining elements |
US6325696B1 (en) * | 1999-09-13 | 2001-12-04 | International Business Machines Corporation | Piezo-actuated CMP carrier |
JP3753577B2 (en) * | 1999-11-16 | 2006-03-08 | 株式会社荏原製作所 | Substrate holding device and polishing apparatus provided with the substrate holding device |
US6558232B1 (en) * | 2000-05-12 | 2003-05-06 | Multi-Planar Technologies, Inc. | System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control |
US6776695B2 (en) * | 2000-12-21 | 2004-08-17 | Lam Research Corporation | Platen design for improving edge performance in CMP applications |
US6863771B2 (en) * | 2001-07-25 | 2005-03-08 | Micron Technology, Inc. | Differential pressure application apparatus for use in polishing layers of semiconductor device structures and methods |
US6579151B2 (en) * | 2001-08-02 | 2003-06-17 | Taiwan Semiconductor Manufacturing Co., Ltd | Retaining ring with active edge-profile control by piezoelectric actuator/sensors |
DE10303407A1 (en) * | 2003-01-27 | 2004-08-19 | Friedrich-Schiller-Universität Jena | Method and device for high-precision processing of the surface of an object, in particular for polishing and lapping semiconductor substrates |
US7131891B2 (en) | 2003-04-28 | 2006-11-07 | Micron Technology, Inc. | Systems and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces |
US7150673B2 (en) * | 2004-07-09 | 2006-12-19 | Ebara Corporation | Method for estimating polishing profile or polishing amount, polishing method and polishing apparatus |
JP2006048302A (en) * | 2004-08-03 | 2006-02-16 | Sony Corp | Piezoelectric complex unit, its manufacturing method, its handling method, its control method, input/output device and electronic equipment |
US7048621B2 (en) * | 2004-10-27 | 2006-05-23 | Applied Materials Inc. | Retaining ring deflection control |
CN104044057B (en) * | 2004-11-01 | 2017-05-17 | 株式会社荏原制作所 | Polishing device |
CN100548577C (en) * | 2005-01-21 | 2009-10-14 | 株式会社荏原制作所 | The method and apparatus of substrate polishing |
TWI386989B (en) * | 2005-02-25 | 2013-02-21 | Ebara Corp | Polishing apparatus and polishing method |
JP4762647B2 (en) | 2005-02-25 | 2011-08-31 | 株式会社荏原製作所 | Polishing apparatus and polishing method |
JP5464820B2 (en) * | 2007-10-29 | 2014-04-09 | 株式会社荏原製作所 | Polishing equipment |
JP5148259B2 (en) * | 2007-12-14 | 2013-02-20 | 株式会社 東北テクノアーチ | Processing equipment |
US20090311945A1 (en) * | 2008-06-17 | 2009-12-17 | Roland Strasser | Planarization System |
JP5980476B2 (en) | 2010-12-27 | 2016-08-31 | 株式会社荏原製作所 | Polishing apparatus and polishing method |
EP2771968B1 (en) * | 2011-10-25 | 2017-12-13 | Robert Bosch GmbH | Actuating device |
US20140273766A1 (en) * | 2013-03-15 | 2014-09-18 | Applied Materials, Inc. | Polishing System with Front Side Pressure Control |
JP6145342B2 (en) * | 2013-07-12 | 2017-06-07 | 株式会社荏原製作所 | Film thickness measuring apparatus, film thickness measuring method, and polishing apparatus equipped with film thickness measuring apparatus |
JP6454326B2 (en) * | 2014-04-18 | 2019-01-16 | 株式会社荏原製作所 | Substrate processing apparatus, substrate processing system, and substrate processing method |
US9878421B2 (en) * | 2014-06-16 | 2018-01-30 | Applied Materials, Inc. | Chemical mechanical polishing retaining ring with integrated sensor |
JP6562779B2 (en) | 2015-09-02 | 2019-08-21 | 株式会社荏原製作所 | Polishing apparatus and polishing method |
JP6585445B2 (en) * | 2015-09-28 | 2019-10-02 | 株式会社荏原製作所 | Polishing method |
JP6818614B2 (en) | 2017-03-31 | 2021-01-20 | 株式会社荏原製作所 | Substrate processing equipment and substrate processing system including substrate processing equipment |
-
2020
- 2020-03-26 JP JP2020056240A patent/JP7365282B2/en active Active
-
2021
- 2021-03-18 SG SG10202102760U patent/SG10202102760UA/en unknown
- 2021-03-19 US US17/206,652 patent/US11673222B2/en active Active
- 2021-03-19 TW TW110109986A patent/TW202135983A/en unknown
- 2021-03-22 KR KR1020210036408A patent/KR20210120860A/en unknown
- 2021-03-24 CN CN202110313239.4A patent/CN113442054A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
JP7365282B2 (en) | 2023-10-19 |
CN113442054A (en) | 2021-09-28 |
TW202135983A (en) | 2021-10-01 |
KR20210120860A (en) | 2021-10-07 |
JP2021154421A (en) | 2021-10-07 |
US20210308823A1 (en) | 2021-10-07 |
US11673222B2 (en) | 2023-06-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG10202102760UA (en) | Polishing head system and polishing apparatus | |
SG10202100222WA (en) | Polishing head system and polishing apparatus | |
SG11202112274SA (en) | Responding method and apparatus | |
SG10201907132SA (en) | Apparatus for polishing and method for polishing | |
GB2586060B (en) | Surface characterisation apparatus and system | |
SG10201912536RA (en) | Polishing apparatus and polishing member dressing method | |
SG10201906330YA (en) | Polishing apparatus and polishing method | |
SG10202010318TA (en) | Polishing method and polishing apparatus | |
EP3745924A4 (en) | Wraparound inflatable headboard apparatus and inflatable bed system | |
SG10201906162WA (en) | Polishing apparatus and calibration method | |
SG10202101299QA (en) | Polishing apparatus and polishing method | |
SG10201907130YA (en) | Apparatus for polishing and method for polishing | |
GB2583742B (en) | Activity identification method and apparatus | |
SG10202012033VA (en) | Polishing method and polishing apparatus | |
EP4101588A4 (en) | Polishing head and polishing device | |
SG10202100330YA (en) | Grinding apparatus | |
SG10201912259TA (en) | Polishing apparatus and polishing method | |
KR102213854B9 (en) | Imprinting head and imprinting apparatus comprising the same | |
SG10202005366QA (en) | Polishing method and polishing apparatus | |
SG10202004630TA (en) | Polishing apparatus and polishing method | |
SG10202001455RA (en) | Polishing method and polishing apparatus | |
SG10202000998WA (en) | Polishing apparatus and polishing method | |
ZA202100815B (en) | Apparatus and method for controlled alumina supply | |
EP3914123C0 (en) | Nail polish application and solidification apparatus | |
GB2588883B (en) | Sensory substitution apparatus and method |