SG10201912259TA - Polishing apparatus and polishing method - Google Patents

Polishing apparatus and polishing method

Info

Publication number
SG10201912259TA
SG10201912259TA SG10201912259TA SG10201912259TA SG10201912259TA SG 10201912259T A SG10201912259T A SG 10201912259TA SG 10201912259T A SG10201912259T A SG 10201912259TA SG 10201912259T A SG10201912259T A SG 10201912259TA SG 10201912259T A SG10201912259T A SG 10201912259TA
Authority
SG
Singapore
Prior art keywords
polishing
polishing apparatus
polishing method
Prior art date
Application number
SG10201912259TA
Inventor
Togashi Shingo
Fukushima Makoto
Namiki Keisuke
Nabeya Osamu
Yamaki Satoru
Owada Tomoko
Kato Yoshikazu
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Publication of SG10201912259TA publication Critical patent/SG10201912259TA/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • B24B37/105Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
    • B24B37/107Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/12Lapping plates for working plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • B24B37/32Retaining rings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321After treatment
    • H01L21/32115Planarisation
    • H01L21/3212Planarisation by chemical mechanical polishing [CMP]

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
SG10201912259TA 2018-12-27 2019-12-16 Polishing apparatus and polishing method SG10201912259TA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018244440A JP7178259B2 (en) 2018-12-27 2018-12-27 Polishing device and polishing method

Publications (1)

Publication Number Publication Date
SG10201912259TA true SG10201912259TA (en) 2020-07-29

Family

ID=71123673

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201912259TA SG10201912259TA (en) 2018-12-27 2019-12-16 Polishing apparatus and polishing method

Country Status (6)

Country Link
US (1) US11731235B2 (en)
JP (1) JP7178259B2 (en)
KR (1) KR20200081245A (en)
CN (1) CN111376171B (en)
SG (1) SG10201912259TA (en)
TW (1) TWI826604B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11986923B2 (en) 2020-11-10 2024-05-21 Applied Materials, Inc. Polishing head with local wafer pressure

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5908530A (en) * 1995-05-18 1999-06-01 Obsidian, Inc. Apparatus for chemical mechanical polishing
US5738568A (en) * 1996-10-04 1998-04-14 International Business Machines Corporation Flexible tilted wafer carrier
JP3807807B2 (en) * 1997-02-27 2006-08-09 株式会社荏原製作所 Polishing device
US6110025A (en) * 1997-05-07 2000-08-29 Obsidian, Inc. Containment ring for substrate carrier apparatus
JP3065016B2 (en) * 1998-02-17 2000-07-12 日本電気株式会社 Polishing apparatus and polishing method
JPH11277406A (en) * 1998-03-27 1999-10-12 Ebara Corp Polishing device
KR100550034B1 (en) * 1998-04-06 2006-02-08 가부시키가이샤 에바라 세이사꾸쇼 Polishing device
JP2000005988A (en) * 1998-04-24 2000-01-11 Ebara Corp Polishing device
US6517422B2 (en) * 2000-03-07 2003-02-11 Toshiba Ceramics Co., Ltd. Polishing apparatus and method thereof
JP2001338901A (en) * 2000-05-26 2001-12-07 Hitachi Ltd Process method and equipment for planarization, and method for manufacturing semiconductor device
JP2002100593A (en) * 2000-09-21 2002-04-05 Nikon Corp Grinding device, method for producing semiconductor device while using the same and semiconductor device produced thereby
US6454637B1 (en) * 2000-09-26 2002-09-24 Lam Research Corporation Edge instability suppressing device and system
JP2002170795A (en) * 2000-12-04 2002-06-14 Tokyo Seimitsu Co Ltd Wafer polishing apparatus
TWI261009B (en) * 2001-05-02 2006-09-01 Hitoshi Suwabe Polishing machine
US6579151B2 (en) * 2001-08-02 2003-06-17 Taiwan Semiconductor Manufacturing Co., Ltd Retaining ring with active edge-profile control by piezoelectric actuator/sensors
CN100533675C (en) * 2004-07-30 2009-08-26 株式会社东芝 Baffle and wafer grinding appts.
JP4814677B2 (en) * 2006-03-31 2011-11-16 株式会社荏原製作所 Substrate holding device and polishing device
TWI674171B (en) * 2012-01-31 2019-10-11 日商荏原製作所股份有限公司 Substrate holding device, polishing device, and polishing method
US10702972B2 (en) * 2012-05-31 2020-07-07 Ebara Corporation Polishing apparatus
JP5976522B2 (en) * 2012-05-31 2016-08-23 株式会社荏原製作所 Polishing apparatus and polishing method
JP6445924B2 (en) * 2014-05-14 2018-12-26 株式会社荏原製作所 Polishing equipment
TWI656944B (en) * 2014-05-14 2019-04-21 日商荏原製作所股份有限公司 Polishing apparatus

Also Published As

Publication number Publication date
CN111376171B (en) 2023-06-20
JP2020104201A (en) 2020-07-09
JP7178259B2 (en) 2022-11-25
TWI826604B (en) 2023-12-21
US20200206867A1 (en) 2020-07-02
CN111376171A (en) 2020-07-07
TW202026103A (en) 2020-07-16
KR20200081245A (en) 2020-07-07
US11731235B2 (en) 2023-08-22

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