SG10201913219RA - Method for manufacturing a substrate - Google Patents

Method for manufacturing a substrate

Info

Publication number
SG10201913219RA
SG10201913219RA SG10201913219RA SG10201913219RA SG10201913219RA SG 10201913219R A SG10201913219R A SG 10201913219RA SG 10201913219R A SG10201913219R A SG 10201913219RA SG 10201913219R A SG10201913219R A SG 10201913219RA SG 10201913219R A SG10201913219R A SG 10201913219RA
Authority
SG
Singapore
Prior art keywords
substrate
manufacturing
Prior art date
Application number
SG10201913219RA
Other languages
English (en)
Inventor
Pascal Guenard
Marcel Broekaart
Thierry Barge
Original Assignee
Soitec Silicon On Insulator
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Soitec Silicon On Insulator filed Critical Soitec Silicon On Insulator
Publication of SG10201913219RA publication Critical patent/SG10201913219RA/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/07Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
    • H10N30/072Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02436Intermediate layers between substrates and deposited layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/50Piezoelectric or electrostrictive devices having a stacked or multilayer structure
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/80Constructional details
    • H10N30/85Piezoelectric or electrostrictive active materials
    • H10N30/853Ceramic compositions
    • H10N30/8542Alkali metal based oxides, e.g. lithium, sodium or potassium niobates
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02543Characteristics of substrate, e.g. cutting angles
    • H03H9/02574Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Ceramic Engineering (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Pressure Welding/Diffusion-Bonding (AREA)
  • Laminated Bodies (AREA)
SG10201913219RA 2015-07-17 2016-07-13 Method for manufacturing a substrate SG10201913219RA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1501519A FR3039003B1 (fr) 2015-07-17 2015-07-17 Procede de fabrication d'un substrat

Publications (1)

Publication Number Publication Date
SG10201913219RA true SG10201913219RA (en) 2020-02-27

Family

ID=55129903

Family Applications (2)

Application Number Title Priority Date Filing Date
SG10201913219RA SG10201913219RA (en) 2015-07-17 2016-07-13 Method for manufacturing a substrate
SG11201800289QA SG11201800289QA (en) 2015-07-17 2016-07-13 Method for manufacturing a substrate

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG11201800289QA SG11201800289QA (en) 2015-07-17 2016-07-13 Method for manufacturing a substrate

Country Status (8)

Country Link
US (3) US10943778B2 (fr)
EP (1) EP3326195B1 (fr)
JP (2) JP6716838B2 (fr)
KR (1) KR102072549B1 (fr)
CN (1) CN107851552B (fr)
FR (1) FR3039003B1 (fr)
SG (2) SG10201913219RA (fr)
WO (1) WO2017012940A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3079659B1 (fr) * 2018-03-29 2020-03-13 Soitec Procede de fabrication d'un substrat donneur pour la realisation d'une structure integree en trois dimensions et procede de fabrication d'une telle structure integree

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS574133A (en) 1980-06-10 1982-01-09 Fujitsu Ltd Device for pattern image pickup
KR930011909B1 (ko) 1991-05-16 1993-12-22 재단법인 한국전자통신연구소 단결정 실리콘 기판상에 화합물 반도체층이 형성된 기판의 제조방법
JP3924810B2 (ja) 1995-07-19 2007-06-06 松下電器産業株式会社 圧電素子とその製造方法
JPH0982585A (ja) 1995-09-20 1997-03-28 Hamamatsu Photonics Kk シリコンウエハの貼り合わせ方法
JP2001127577A (ja) 1999-10-25 2001-05-11 Tdk Corp 圧電振動部品
EP1238388B1 (fr) * 1999-12-17 2005-03-02 Argillon GmbH Transducteur a ultrasons piezoelectrique comportant un boitier et une couche isolante
FR2817394B1 (fr) 2000-11-27 2003-10-31 Soitec Silicon On Insulator Procede de fabrication d'un substrat notamment pour l'optique, l'electronique ou l'optoelectronique et substrat obtenu par ce procede
JP2003124767A (ja) 2001-10-16 2003-04-25 Hitachi Ltd 弾性表面波素子とその製造方法
FR2855650B1 (fr) 2003-05-30 2006-03-03 Soitec Silicon On Insulator Substrats pour systemes contraints et procede de croissance cristalline sur un tel substrat
FR2857502B1 (fr) 2003-07-10 2006-02-24 Soitec Silicon On Insulator Substrats pour systemes contraints
JP5083865B2 (ja) * 2004-10-12 2012-11-28 日本碍子株式会社 光導波路基板および高調波発生デバイス
JP2008301066A (ja) * 2007-05-30 2008-12-11 Yamajiyu Ceramics:Kk タンタル酸リチウム(lt)又はニオブ酸リチウム(ln)単結晶複合基板
US8664747B2 (en) * 2008-04-28 2014-03-04 Toshiba Techno Center Inc. Trenched substrate for crystal growth and wafer bonding
FR2942911B1 (fr) 2009-03-09 2011-05-13 Soitec Silicon On Insulator Procede de realisation d'une heterostructure avec adaptation locale de coefficient de dilatation thermique
JP5601709B2 (ja) 2010-09-01 2014-10-08 日本碍子株式会社 光導波路デバイスおよび高調波発生デバイス
WO2014129979A1 (fr) 2013-02-22 2014-08-28 Agency For Science, Technology And Research Dispositif à ondes acoustiques de surface

Also Published As

Publication number Publication date
US20190088462A1 (en) 2019-03-21
FR3039003A1 (fr) 2017-01-20
EP3326195B1 (fr) 2022-09-14
US20240014027A1 (en) 2024-01-11
CN107851552B (zh) 2021-06-15
US20210066063A1 (en) 2021-03-04
KR20180017174A (ko) 2018-02-20
SG11201800289QA (en) 2018-04-27
WO2017012940A1 (fr) 2017-01-26
EP3326195A1 (fr) 2018-05-30
US11837463B2 (en) 2023-12-05
JP6834088B2 (ja) 2021-02-24
US10943778B2 (en) 2021-03-09
JP2018528639A (ja) 2018-09-27
JP2020108161A (ja) 2020-07-09
JP6716838B2 (ja) 2020-07-01
CN107851552A (zh) 2018-03-27
FR3039003B1 (fr) 2017-07-28
KR102072549B1 (ko) 2020-02-03

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