JPS574133A - Device for pattern image pickup - Google Patents
Device for pattern image pickupInfo
- Publication number
- JPS574133A JPS574133A JP7823380A JP7823380A JPS574133A JP S574133 A JPS574133 A JP S574133A JP 7823380 A JP7823380 A JP 7823380A JP 7823380 A JP7823380 A JP 7823380A JP S574133 A JPS574133 A JP S574133A
- Authority
- JP
- Japan
- Prior art keywords
- detecting circuit
- image pickup
- image
- pattern
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
Abstract
PURPOSE:To obtain a clear picture frame even when chips are replaced by a method wherein the pattern image pickup device to be provided on an IC chip pellet is composed of a plurality of optical image pickup sections, the focus depth characteristic of which is differred by stages and also a device, with which the most clear height of focus depth is detected, is provided. CONSTITUTION:The pattern on the IC chip pellet 2, which is placed on a substrate 1, is image-formed on the surface 5 of an image pickup element 6 through the intermediary of an object lens 3 and a relay lens 4 located on the pattern image pickup device 10. In this constitution, a lens 4 is consisted of a group of lenses of nXm pieces having a slightly different focal distance respectively, and nXm pieces of patterns are image-formed on the element surface 5 also. Then, an image signal detecting circuit 11 to be used as a detecting system is provided, the image signal from this point is converted into a differential waveform and the image of the heghest level among the waveforms corresponded to the images of nXm pieces by a high level detecting circuit 13 is obtained by a frame detecting circuit 14. Subsequently, the address of the desired pad is detected using a pattern data detecting circuit 15 and a pattern position detecting circuit 16.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7823380A JPS574133A (en) | 1980-06-10 | 1980-06-10 | Device for pattern image pickup |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7823380A JPS574133A (en) | 1980-06-10 | 1980-06-10 | Device for pattern image pickup |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS574133A true JPS574133A (en) | 1982-01-09 |
Family
ID=13656317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7823380A Pending JPS574133A (en) | 1980-06-10 | 1980-06-10 | Device for pattern image pickup |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS574133A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006078713A (en) * | 2004-09-09 | 2006-03-23 | Hitachi High-Tech Electronics Engineering Co Ltd | Work identification information reading device and method |
JP2009103499A (en) * | 2007-10-22 | 2009-05-14 | Meidensha Corp | Abrasion amount measuring device of trolley wire |
JP2012532356A (en) * | 2009-07-06 | 2012-12-13 | コンティ テミック マイクロエレクトロニック ゲゼルシャフト ミット ベシュレンクテル ハフツング | Optical module for focusing simultaneously on two visible ranges |
US9335264B2 (en) | 2010-11-30 | 2016-05-10 | Conti Temic Microelectronic Gmbh | Detection of raindrops on a pane by means of a camera and lighting |
US10137842B2 (en) | 2011-06-03 | 2018-11-27 | Conti Temic Microelectronic Gmbh | Camera system for a vehicle |
KR20190045165A (en) | 2016-08-29 | 2019-05-02 | 신에쓰 가가꾸 고교 가부시끼가이샤 | Coating composition and coated article |
JP2020108161A (en) * | 2015-07-17 | 2020-07-09 | ソイテックSoitec | Method for manufacturing substrate |
-
1980
- 1980-06-10 JP JP7823380A patent/JPS574133A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006078713A (en) * | 2004-09-09 | 2006-03-23 | Hitachi High-Tech Electronics Engineering Co Ltd | Work identification information reading device and method |
JP2009103499A (en) * | 2007-10-22 | 2009-05-14 | Meidensha Corp | Abrasion amount measuring device of trolley wire |
JP2012532356A (en) * | 2009-07-06 | 2012-12-13 | コンティ テミック マイクロエレクトロニック ゲゼルシャフト ミット ベシュレンクテル ハフツング | Optical module for focusing simultaneously on two visible ranges |
US9040915B2 (en) | 2009-07-06 | 2015-05-26 | Conti Temic Microelectronic Gmbh | Optical module for simultaneously focusing on two fields of view |
US9335264B2 (en) | 2010-11-30 | 2016-05-10 | Conti Temic Microelectronic Gmbh | Detection of raindrops on a pane by means of a camera and lighting |
US10137842B2 (en) | 2011-06-03 | 2018-11-27 | Conti Temic Microelectronic Gmbh | Camera system for a vehicle |
JP2020108161A (en) * | 2015-07-17 | 2020-07-09 | ソイテックSoitec | Method for manufacturing substrate |
US10943778B2 (en) | 2015-07-17 | 2021-03-09 | Soitec | Method for manufacturing a substrate |
US11837463B2 (en) | 2015-07-17 | 2023-12-05 | Soitec | Method for manufacturing a substrate |
KR20190045165A (en) | 2016-08-29 | 2019-05-02 | 신에쓰 가가꾸 고교 가부시끼가이샤 | Coating composition and coated article |
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