SG10201908213VA - Method and system for graphene formation - Google Patents

Method and system for graphene formation

Info

Publication number
SG10201908213VA
SG10201908213VA SG10201908213VA SG10201908213VA SG 10201908213V A SG10201908213V A SG 10201908213VA SG 10201908213V A SG10201908213V A SG 10201908213VA SG 10201908213V A SG10201908213V A SG 10201908213VA
Authority
SG
Singapore
Prior art keywords
copper substrate
processing chamber
graphene formation
copper
providing
Prior art date
Application number
Other languages
English (en)
Inventor
David A Boyd
Original Assignee
California Inst Of Techn
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by California Inst Of Techn filed Critical California Inst Of Techn
Publication of SG10201908213VA publication Critical patent/SG10201908213VA/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/26Deposition of carbon only
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • C01B32/182Graphene
    • C01B32/184Preparation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J19/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J19/08Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • B01J19/087Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electric or magnetic energy
    • B01J19/088Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electric or magnetic energy giving rise to electric discharges
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J19/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J19/08Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • B01J19/12Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electromagnetic waves
    • B01J19/122Incoherent waves
    • B01J19/129Radiofrequency
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J19/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J19/18Stationary reactors having moving elements inside
    • B01J19/22Stationary reactors having moving elements inside in the form of endless belts
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • C01B32/182Graphene
    • C01B32/184Preparation
    • C01B32/186Preparation by chemical vapour deposition [CVD]
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/02Pretreatment of the material to be coated
    • C23C16/0227Pretreatment of the material to be coated by cleaning or etching
    • C23C16/0245Pretreatment of the material to be coated by cleaning or etching by etching with a plasma
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/52Controlling or regulating the coating process
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • C23C16/545Apparatus specially adapted for continuous coating for coating elongated substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • H01J37/32449Gas control, e.g. control of the gas flow
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32522Temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32816Pressure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02043Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H01L21/02046Dry cleaning only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/02425Conductive materials, e.g. metallic silicides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02524Group 14 semiconducting materials
    • H01L21/02527Carbon, e.g. diamond-like carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02656Special treatments
    • H01L21/02658Pretreatments
    • H01L21/02661In-situ cleaning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/16Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
    • H01L29/1606Graphene
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/30Semiconductor bodies ; Multistep manufacturing processes therefor characterised by physical imperfections; having polished or roughened surface
    • H01L29/32Semiconductor bodies ; Multistep manufacturing processes therefor characterised by physical imperfections; having polished or roughened surface the imperfections being within the semiconductor body
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J2219/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J2219/08Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • B01J2219/0873Materials to be treated
    • B01J2219/0879Solid
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J2219/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J2219/08Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • B01J2219/0894Processes carried out in the presence of a plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/335Cleaning

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Nanotechnology (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Inorganic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Ceramic Engineering (AREA)
  • Composite Materials (AREA)
  • Electromagnetism (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Chemical Vapour Deposition (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
SG10201908213V 2012-02-24 2013-02-22 Method and system for graphene formation SG10201908213VA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261603104P 2012-02-24 2012-02-24
US201261607337P 2012-03-06 2012-03-06
US201261677323P 2012-07-30 2012-07-30

Publications (1)

Publication Number Publication Date
SG10201908213VA true SG10201908213VA (en) 2019-10-30

Family

ID=49006226

Family Applications (3)

Application Number Title Priority Date Filing Date
SG10201908213V SG10201908213VA (en) 2012-02-24 2013-02-22 Method and system for graphene formation
SG10201607367UA SG10201607367UA (en) 2012-02-24 2013-02-22 Method and system for graphene formation
SG11201404775RA SG11201404775RA (en) 2012-02-24 2013-02-22 Method and system for graphene formation

Family Applications After (2)

Application Number Title Priority Date Filing Date
SG10201607367UA SG10201607367UA (en) 2012-02-24 2013-02-22 Method and system for graphene formation
SG11201404775RA SG11201404775RA (en) 2012-02-24 2013-02-22 Method and system for graphene formation

Country Status (8)

Country Link
US (3) US9150418B2 (fr)
EP (1) EP2817261A4 (fr)
JP (2) JP6262156B2 (fr)
KR (1) KR102107382B1 (fr)
CN (2) CN104136368B (fr)
SG (3) SG10201908213VA (fr)
TW (1) TWI552954B (fr)
WO (1) WO2013126671A1 (fr)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG10201908213VA (en) * 2012-02-24 2019-10-30 California Inst Of Techn Method and system for graphene formation
KR101954999B1 (ko) * 2013-01-14 2019-03-06 캘리포니아 인스티튜트 오브 테크놀로지 그라펜을 형성시키는 방법 및 시스템
US9242865B2 (en) 2013-03-05 2016-01-26 Lockheed Martin Corporation Systems and methods for production of graphene by plasma-enhanced chemical vapor deposition
US9458020B2 (en) * 2013-05-06 2016-10-04 Centre National De La Recherche Scientifique Process and device for forming a graphene layer
GB201318463D0 (en) * 2013-08-13 2013-12-04 Medical Res Council Graphene Modification
WO2015149116A1 (fr) * 2014-04-04 2015-10-08 Commonwealth Scientific And Industrial Research Organisation Procédé et produit de graphène
US10072355B2 (en) * 2014-04-15 2018-09-11 Board Of Regents, The University Of Texas System Methods of forming graphene single crystal domains on a low nucleation site density substrate
WO2016006943A1 (fr) * 2014-07-09 2016-01-14 재단법인대구경북과학기술원 Nanofil métallique ayant une structure coque-noyau revêtue de graphène, et son procédé de fabrication
CN104211054B (zh) * 2014-09-09 2016-05-18 中国科学院化学研究所 一种可控制备石墨烯的方法
CN104576457A (zh) * 2014-12-26 2015-04-29 常州二维碳素科技有限公司 一种对石墨烯制件进行表面处理的设备及其处理方法
KR101723521B1 (ko) * 2015-02-26 2017-04-05 주성엔지니어링(주) 그래핀 성장 장치
KR101717476B1 (ko) * 2015-02-27 2017-03-27 주성엔지니어링(주) 그래핀 성장 장치
TWI539043B (zh) 2015-07-21 2016-06-21 財團法人工業技術研究院 石墨烯花的形成方法
JP6661189B2 (ja) * 2015-10-02 2020-03-11 国立研究開発法人産業技術総合研究所 グラフェン膜の作製方法
CN105220128B (zh) * 2015-11-16 2018-03-16 哈尔滨工业大学 一种锆合金表面原位垂直生长石墨烯防腐层的制备方法
JP6652770B2 (ja) * 2016-04-04 2020-02-26 株式会社不二越 固体高分子形燃料電池用セパレータの製造方法
NO345837B1 (en) * 2016-05-04 2021-08-30 Cealtech As Apparatus for large scale producing 3D graphene and method describing the same
CN106248221A (zh) * 2016-07-19 2016-12-21 中国科学院重庆绿色智能技术研究院 一种基于石墨烯的非制冷红外探测器及原位制作方法
US9997334B1 (en) * 2017-02-09 2018-06-12 Lyten, Inc. Seedless particles with carbon allotropes
US10825586B2 (en) * 2017-08-30 2020-11-03 Ultra Conductive Copper Company, Inc. Method and system for forming a multilayer composite structure
ES2717199B2 (es) * 2017-12-19 2022-07-21 Pamies Javier Biela Planta de biogas
CN109975368A (zh) * 2019-03-21 2019-07-05 西南大学 一种用于气敏传感的石墨烯氧化锡复合材料的制备方法
CN109930133A (zh) * 2019-03-21 2019-06-25 西南大学 一种用于气敏传感的石墨烯氧化锆复合材料的制备方法
EP4100362A1 (fr) 2020-02-03 2022-12-14 CealTech AS Procédé et dispositif de production à grande échelle de graphène
JP2022007053A (ja) * 2020-06-25 2022-01-13 東京エレクトロン株式会社 成膜方法及び成膜装置
CN111847432B (zh) * 2020-07-24 2023-08-29 北京石墨烯研究院 大面积多层石墨烯及其制备方法
US11515163B2 (en) * 2021-01-06 2022-11-29 Applied Materials, Inc. Low temperature graphene growth
US20220254641A1 (en) * 2021-02-11 2022-08-11 Applied Materials, Inc. Method and apparatus of low temperature plasma enhanced chemical vapor deposition of graphene
WO2023079018A1 (fr) * 2021-11-04 2023-05-11 Universite Picardie Jules Verne Procédé de dépôt direct de graphène ou d'oxyde de graphène sur un substrat d'intérêt

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55158275A (en) * 1979-05-28 1980-12-09 Hitachi Ltd Corrosion preventing method for al and al alloy
US4431499A (en) * 1982-02-26 1984-02-14 The United States Of America As Represented By The United States Department Of Energy Method of sputter etching a surface
JPH0225571A (ja) * 1988-07-13 1990-01-29 Kawasaki Steel Corp 硬質炭素膜合成方法
JP3231426B2 (ja) * 1992-10-28 2001-11-19 富士通株式会社 水素プラズマダウンフロー処理方法及び水素プラズマダウンフロー処理装置
US6547934B2 (en) * 1998-05-18 2003-04-15 Applied Materials, Inc. Reduction of metal oxide in a dual frequency etch chamber
JP2000096233A (ja) * 1998-06-20 2000-04-04 Nissin Electric Co Ltd 炭素膜及びその形成方法並びに炭素膜被覆物品及びその製造方法
JP2001007117A (ja) * 1999-06-24 2001-01-12 Tokyo Electron Ltd 処理装置及び処理方法
US7604708B2 (en) * 2003-02-14 2009-10-20 Applied Materials, Inc. Cleaning of native oxide with hydrogen-containing radicals
US20070184190A1 (en) * 2003-08-27 2007-08-09 Mineo Hiramatsu Method for producing carbon nanowalls, carbon nanowall, and apparatus for producing carbon nanowalls
JP4510707B2 (ja) * 2004-09-08 2010-07-28 三星電子株式会社 エピタキシャル膜の形成方法と、これを用いた薄膜形成方法、及び半導体装置の製造方法
JP2006135052A (ja) * 2004-11-05 2006-05-25 Renesas Technology Corp 半導体装置の製造方法および半導体装置の製造システム
JP4806296B2 (ja) * 2006-05-26 2011-11-02 神港精機株式会社 クリーニング装置
JP2009184892A (ja) * 2008-02-08 2009-08-20 Dainippon Screen Mfg Co Ltd カーボンナノチューブ形成装置およびカーボンナノチューブ形成方法
JP5463282B2 (ja) * 2008-03-26 2014-04-09 勝 堀 グラフェンの製造方法
JP5453045B2 (ja) * 2008-11-26 2014-03-26 株式会社日立製作所 グラフェン層が成長された基板およびそれを用いた電子・光集積回路装置
KR20100090580A (ko) * 2009-02-06 2010-08-16 에이비씨상사 주식회사 그라펜 물질의 제조방법
KR101174870B1 (ko) * 2009-02-06 2012-08-17 에이비씨상사 주식회사 그라펜 복합체 조성물 및 이를 이용한 투명한 전도성 필름
JP2010212619A (ja) * 2009-03-12 2010-09-24 Toshiba Corp グラフェンの作製方法、グラフェン、グラフェン作製装置及び半導体素子
FR2943660B1 (fr) * 2009-03-25 2011-04-29 Commissariat Energie Atomique Procede d'elaboration de graphene
US20100323113A1 (en) * 2009-06-18 2010-12-23 Ramappa Deepak A Method to Synthesize Graphene
US10167572B2 (en) * 2009-08-07 2019-01-01 Guardian Glass, LLC Large area deposition of graphene via hetero-epitaxial growth, and products including the same
US20120161098A1 (en) * 2009-08-20 2012-06-28 Nec Corporation Substrate, manufacturing method of substrate, semiconductor element, and manufacturing method of semiconductor element
KR101636442B1 (ko) * 2009-11-10 2016-07-21 삼성전자주식회사 촉매합금을 이용한 그라핀의 제조방법
KR101279606B1 (ko) * 2009-12-11 2013-07-05 한국전자통신연구원 그래핀 박막의 증착방법
JP5692794B2 (ja) * 2010-03-17 2015-04-01 独立行政法人産業技術総合研究所 透明導電性炭素膜の製造方法
JP5660804B2 (ja) * 2010-04-30 2015-01-28 東京エレクトロン株式会社 カーボンナノチューブの形成方法及びカーボンナノチューブ成膜装置
KR20120012271A (ko) 2010-07-30 2012-02-09 성균관대학교산학협력단 그래핀의 제조 방법, 그래핀 시트 및 이를 이용한 소자
WO2012051182A2 (fr) * 2010-10-11 2012-04-19 University Of Houston System Fabrication de réseaux de graphène monocristallin
CN102212794B (zh) * 2011-04-13 2012-10-10 中国科学院上海微系统与信息技术研究所 一种基于电镀铜衬底制备大面积石墨烯薄膜的方法
CN103764750B (zh) 2011-08-24 2016-08-17 旭化成株式会社 树脂密封片和太阳能电池模块
SG10201908213VA (en) * 2012-02-24 2019-10-30 California Inst Of Techn Method and system for graphene formation

Also Published As

Publication number Publication date
TW201336784A (zh) 2013-09-16
CN106744866A (zh) 2017-05-31
US20170044018A1 (en) 2017-02-16
KR20140135725A (ko) 2014-11-26
CN104136368A (zh) 2014-11-05
WO2013126671A1 (fr) 2013-08-29
JP2015510489A (ja) 2015-04-09
JP6562996B2 (ja) 2019-08-21
SG11201404775RA (en) 2014-09-26
EP2817261A1 (fr) 2014-12-31
CN106744866B (zh) 2021-01-01
TWI552954B (zh) 2016-10-11
US20140044885A1 (en) 2014-02-13
JP6262156B2 (ja) 2018-01-17
JP2018074171A (ja) 2018-05-10
US9150418B2 (en) 2015-10-06
CN104136368B (zh) 2017-02-22
US20150368111A1 (en) 2015-12-24
EP2817261A4 (fr) 2015-10-28
SG10201607367UA (en) 2016-10-28
KR102107382B1 (ko) 2020-05-07

Similar Documents

Publication Publication Date Title
SG10201908213VA (en) Method and system for graphene formation
WO2014110446A3 (fr) Procédé et système de formation de graphène
TW201614725A (en) Methods for high precision plasma etching of substrates
GB201121034D0 (en) Apparatus and method for depositing a layer onto a substrate
TW200614365A (en) Method for providing uniform removal of organic material
WO2011081921A3 (fr) Gravure de couche atomique avec plasmas pulsés
WO2012087737A3 (fr) Traitement au plasma de densité variable de substrats semi-conducteurs
WO2013104583A3 (fr) Appareil et procédé pour traitement de surface de substrat
TW201614883A (en) Method for treating workpieces
JP2015510489A5 (fr)
WO2011026127A3 (fr) Agencement de confinement de plasma local et de commande de pression, et procédés associés
WO2009044693A1 (fr) Appareil de traitement au plasma et procédé de traitement au plasma
MX2015014659A (es) Proceso y aparato para endurecer termoquimicamente piezas a trabajar.
MX2012002918A (es) Proceso para eliminar metales de gasoleos de vacio.
MX2012007328A (es) Proceso para eliminar nitrogeno de gasoleos de vacio.
WO2012073142A3 (fr) Procédé et dispositif d'implantation ionique
MY178015A (en) Purification method for off-gas and apparatus for purification of off-gas
WO2009104918A3 (fr) Appareil et procédé pour traitement de substrat
TW200943468A (en) Plasma processing device
JP2015018885A5 (fr)
IN2015DN01149A (fr)
MX2020002072A (es) Nanocintas de carbono, nanolaminillas de carbono y mezclas de las mismas y metodos de sintesis.
WO2008090763A1 (fr) Procédé de fabrication d'un dispositif semi-conducteur et appareil de fabrication de semi-conducteur
JP2013120810A5 (fr)
WO2012154747A3 (fr) Procédé de gravure de chanfrein à haute pression