SG10201908213VA - Method and system for graphene formation - Google Patents
Method and system for graphene formationInfo
- Publication number
- SG10201908213VA SG10201908213VA SG10201908213VA SG10201908213VA SG 10201908213V A SG10201908213V A SG 10201908213VA SG 10201908213V A SG10201908213V A SG 10201908213VA SG 10201908213V A SG10201908213V A SG 10201908213VA
- Authority
- SG
- Singapore
- Prior art keywords
- copper substrate
- processing chamber
- graphene formation
- copper
- providing
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title abstract 3
- 230000015572 biosynthetic process Effects 0.000 title abstract 2
- 229910021389 graphene Inorganic materials 0.000 title abstract 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract 5
- 229910052802 copper Inorganic materials 0.000 abstract 5
- 239000010949 copper Substances 0.000 abstract 5
- 239000000758 substrate Substances 0.000 abstract 4
- 239000000463 material Substances 0.000 abstract 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 1
- 229910052799 carbon Inorganic materials 0.000 abstract 1
- 229910001873 dinitrogen Inorganic materials 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 239000007789 gas Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/182—Graphene
- C01B32/184—Preparation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J19/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
- B01J19/087—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electric or magnetic energy
- B01J19/088—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electric or magnetic energy giving rise to electric discharges
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J19/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
- B01J19/12—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electromagnetic waves
- B01J19/122—Incoherent waves
- B01J19/129—Radiofrequency
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J19/18—Stationary reactors having moving elements inside
- B01J19/22—Stationary reactors having moving elements inside in the form of endless belts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/182—Graphene
- C01B32/184—Preparation
- C01B32/186—Preparation by chemical vapour deposition [CVD]
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0227—Pretreatment of the material to be coated by cleaning or etching
- C23C16/0245—Pretreatment of the material to be coated by cleaning or etching by etching with a plasma
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02046—Dry cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02425—Conductive materials, e.g. metallic silicides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02527—Carbon, e.g. diamond-like carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02658—Pretreatments
- H01L21/02661—In-situ cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
- H01L29/1606—Graphene
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/30—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by physical imperfections; having polished or roughened surface
- H01L29/32—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by physical imperfections; having polished or roughened surface the imperfections being within the semiconductor body
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J2219/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
- B01J2219/0873—Materials to be treated
- B01J2219/0879—Solid
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J2219/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
- B01J2219/0894—Processes carried out in the presence of a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/335—Cleaning
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Nanotechnology (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Ceramic Engineering (AREA)
- Composite Materials (AREA)
- Electromagnetism (AREA)
- Carbon And Carbon Compounds (AREA)
- Chemical Vapour Deposition (AREA)
- Oil, Petroleum & Natural Gas (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261603104P | 2012-02-24 | 2012-02-24 | |
US201261607337P | 2012-03-06 | 2012-03-06 | |
US201261677323P | 2012-07-30 | 2012-07-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201908213VA true SG10201908213VA (en) | 2019-10-30 |
Family
ID=49006226
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201908213V SG10201908213VA (en) | 2012-02-24 | 2013-02-22 | Method and system for graphene formation |
SG10201607367UA SG10201607367UA (en) | 2012-02-24 | 2013-02-22 | Method and system for graphene formation |
SG11201404775RA SG11201404775RA (en) | 2012-02-24 | 2013-02-22 | Method and system for graphene formation |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201607367UA SG10201607367UA (en) | 2012-02-24 | 2013-02-22 | Method and system for graphene formation |
SG11201404775RA SG11201404775RA (en) | 2012-02-24 | 2013-02-22 | Method and system for graphene formation |
Country Status (8)
Country | Link |
---|---|
US (3) | US9150418B2 (fr) |
EP (1) | EP2817261A4 (fr) |
JP (2) | JP6262156B2 (fr) |
KR (1) | KR102107382B1 (fr) |
CN (2) | CN104136368B (fr) |
SG (3) | SG10201908213VA (fr) |
TW (1) | TWI552954B (fr) |
WO (1) | WO2013126671A1 (fr) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG10201908213VA (en) * | 2012-02-24 | 2019-10-30 | California Inst Of Techn | Method and system for graphene formation |
KR101954999B1 (ko) * | 2013-01-14 | 2019-03-06 | 캘리포니아 인스티튜트 오브 테크놀로지 | 그라펜을 형성시키는 방법 및 시스템 |
US9242865B2 (en) | 2013-03-05 | 2016-01-26 | Lockheed Martin Corporation | Systems and methods for production of graphene by plasma-enhanced chemical vapor deposition |
US9458020B2 (en) * | 2013-05-06 | 2016-10-04 | Centre National De La Recherche Scientifique | Process and device for forming a graphene layer |
GB201318463D0 (en) * | 2013-08-13 | 2013-12-04 | Medical Res Council | Graphene Modification |
WO2015149116A1 (fr) * | 2014-04-04 | 2015-10-08 | Commonwealth Scientific And Industrial Research Organisation | Procédé et produit de graphène |
US10072355B2 (en) * | 2014-04-15 | 2018-09-11 | Board Of Regents, The University Of Texas System | Methods of forming graphene single crystal domains on a low nucleation site density substrate |
WO2016006943A1 (fr) * | 2014-07-09 | 2016-01-14 | 재단법인대구경북과학기술원 | Nanofil métallique ayant une structure coque-noyau revêtue de graphène, et son procédé de fabrication |
CN104211054B (zh) * | 2014-09-09 | 2016-05-18 | 中国科学院化学研究所 | 一种可控制备石墨烯的方法 |
CN104576457A (zh) * | 2014-12-26 | 2015-04-29 | 常州二维碳素科技有限公司 | 一种对石墨烯制件进行表面处理的设备及其处理方法 |
KR101723521B1 (ko) * | 2015-02-26 | 2017-04-05 | 주성엔지니어링(주) | 그래핀 성장 장치 |
KR101717476B1 (ko) * | 2015-02-27 | 2017-03-27 | 주성엔지니어링(주) | 그래핀 성장 장치 |
TWI539043B (zh) | 2015-07-21 | 2016-06-21 | 財團法人工業技術研究院 | 石墨烯花的形成方法 |
JP6661189B2 (ja) * | 2015-10-02 | 2020-03-11 | 国立研究開発法人産業技術総合研究所 | グラフェン膜の作製方法 |
CN105220128B (zh) * | 2015-11-16 | 2018-03-16 | 哈尔滨工业大学 | 一种锆合金表面原位垂直生长石墨烯防腐层的制备方法 |
JP6652770B2 (ja) * | 2016-04-04 | 2020-02-26 | 株式会社不二越 | 固体高分子形燃料電池用セパレータの製造方法 |
NO345837B1 (en) * | 2016-05-04 | 2021-08-30 | Cealtech As | Apparatus for large scale producing 3D graphene and method describing the same |
CN106248221A (zh) * | 2016-07-19 | 2016-12-21 | 中国科学院重庆绿色智能技术研究院 | 一种基于石墨烯的非制冷红外探测器及原位制作方法 |
US9997334B1 (en) * | 2017-02-09 | 2018-06-12 | Lyten, Inc. | Seedless particles with carbon allotropes |
US10825586B2 (en) * | 2017-08-30 | 2020-11-03 | Ultra Conductive Copper Company, Inc. | Method and system for forming a multilayer composite structure |
ES2717199B2 (es) * | 2017-12-19 | 2022-07-21 | Pamies Javier Biela | Planta de biogas |
CN109975368A (zh) * | 2019-03-21 | 2019-07-05 | 西南大学 | 一种用于气敏传感的石墨烯氧化锡复合材料的制备方法 |
CN109930133A (zh) * | 2019-03-21 | 2019-06-25 | 西南大学 | 一种用于气敏传感的石墨烯氧化锆复合材料的制备方法 |
EP4100362A1 (fr) | 2020-02-03 | 2022-12-14 | CealTech AS | Procédé et dispositif de production à grande échelle de graphène |
JP2022007053A (ja) * | 2020-06-25 | 2022-01-13 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
CN111847432B (zh) * | 2020-07-24 | 2023-08-29 | 北京石墨烯研究院 | 大面积多层石墨烯及其制备方法 |
US11515163B2 (en) * | 2021-01-06 | 2022-11-29 | Applied Materials, Inc. | Low temperature graphene growth |
US20220254641A1 (en) * | 2021-02-11 | 2022-08-11 | Applied Materials, Inc. | Method and apparatus of low temperature plasma enhanced chemical vapor deposition of graphene |
WO2023079018A1 (fr) * | 2021-11-04 | 2023-05-11 | Universite Picardie Jules Verne | Procédé de dépôt direct de graphène ou d'oxyde de graphène sur un substrat d'intérêt |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55158275A (en) * | 1979-05-28 | 1980-12-09 | Hitachi Ltd | Corrosion preventing method for al and al alloy |
US4431499A (en) * | 1982-02-26 | 1984-02-14 | The United States Of America As Represented By The United States Department Of Energy | Method of sputter etching a surface |
JPH0225571A (ja) * | 1988-07-13 | 1990-01-29 | Kawasaki Steel Corp | 硬質炭素膜合成方法 |
JP3231426B2 (ja) * | 1992-10-28 | 2001-11-19 | 富士通株式会社 | 水素プラズマダウンフロー処理方法及び水素プラズマダウンフロー処理装置 |
US6547934B2 (en) * | 1998-05-18 | 2003-04-15 | Applied Materials, Inc. | Reduction of metal oxide in a dual frequency etch chamber |
JP2000096233A (ja) * | 1998-06-20 | 2000-04-04 | Nissin Electric Co Ltd | 炭素膜及びその形成方法並びに炭素膜被覆物品及びその製造方法 |
JP2001007117A (ja) * | 1999-06-24 | 2001-01-12 | Tokyo Electron Ltd | 処理装置及び処理方法 |
US7604708B2 (en) * | 2003-02-14 | 2009-10-20 | Applied Materials, Inc. | Cleaning of native oxide with hydrogen-containing radicals |
US20070184190A1 (en) * | 2003-08-27 | 2007-08-09 | Mineo Hiramatsu | Method for producing carbon nanowalls, carbon nanowall, and apparatus for producing carbon nanowalls |
JP4510707B2 (ja) * | 2004-09-08 | 2010-07-28 | 三星電子株式会社 | エピタキシャル膜の形成方法と、これを用いた薄膜形成方法、及び半導体装置の製造方法 |
JP2006135052A (ja) * | 2004-11-05 | 2006-05-25 | Renesas Technology Corp | 半導体装置の製造方法および半導体装置の製造システム |
JP4806296B2 (ja) * | 2006-05-26 | 2011-11-02 | 神港精機株式会社 | クリーニング装置 |
JP2009184892A (ja) * | 2008-02-08 | 2009-08-20 | Dainippon Screen Mfg Co Ltd | カーボンナノチューブ形成装置およびカーボンナノチューブ形成方法 |
JP5463282B2 (ja) * | 2008-03-26 | 2014-04-09 | 勝 堀 | グラフェンの製造方法 |
JP5453045B2 (ja) * | 2008-11-26 | 2014-03-26 | 株式会社日立製作所 | グラフェン層が成長された基板およびそれを用いた電子・光集積回路装置 |
KR20100090580A (ko) * | 2009-02-06 | 2010-08-16 | 에이비씨상사 주식회사 | 그라펜 물질의 제조방법 |
KR101174870B1 (ko) * | 2009-02-06 | 2012-08-17 | 에이비씨상사 주식회사 | 그라펜 복합체 조성물 및 이를 이용한 투명한 전도성 필름 |
JP2010212619A (ja) * | 2009-03-12 | 2010-09-24 | Toshiba Corp | グラフェンの作製方法、グラフェン、グラフェン作製装置及び半導体素子 |
FR2943660B1 (fr) * | 2009-03-25 | 2011-04-29 | Commissariat Energie Atomique | Procede d'elaboration de graphene |
US20100323113A1 (en) * | 2009-06-18 | 2010-12-23 | Ramappa Deepak A | Method to Synthesize Graphene |
US10167572B2 (en) * | 2009-08-07 | 2019-01-01 | Guardian Glass, LLC | Large area deposition of graphene via hetero-epitaxial growth, and products including the same |
US20120161098A1 (en) * | 2009-08-20 | 2012-06-28 | Nec Corporation | Substrate, manufacturing method of substrate, semiconductor element, and manufacturing method of semiconductor element |
KR101636442B1 (ko) * | 2009-11-10 | 2016-07-21 | 삼성전자주식회사 | 촉매합금을 이용한 그라핀의 제조방법 |
KR101279606B1 (ko) * | 2009-12-11 | 2013-07-05 | 한국전자통신연구원 | 그래핀 박막의 증착방법 |
JP5692794B2 (ja) * | 2010-03-17 | 2015-04-01 | 独立行政法人産業技術総合研究所 | 透明導電性炭素膜の製造方法 |
JP5660804B2 (ja) * | 2010-04-30 | 2015-01-28 | 東京エレクトロン株式会社 | カーボンナノチューブの形成方法及びカーボンナノチューブ成膜装置 |
KR20120012271A (ko) | 2010-07-30 | 2012-02-09 | 성균관대학교산학협력단 | 그래핀의 제조 방법, 그래핀 시트 및 이를 이용한 소자 |
WO2012051182A2 (fr) * | 2010-10-11 | 2012-04-19 | University Of Houston System | Fabrication de réseaux de graphène monocristallin |
CN102212794B (zh) * | 2011-04-13 | 2012-10-10 | 中国科学院上海微系统与信息技术研究所 | 一种基于电镀铜衬底制备大面积石墨烯薄膜的方法 |
CN103764750B (zh) | 2011-08-24 | 2016-08-17 | 旭化成株式会社 | 树脂密封片和太阳能电池模块 |
SG10201908213VA (en) * | 2012-02-24 | 2019-10-30 | California Inst Of Techn | Method and system for graphene formation |
-
2013
- 2013-02-22 SG SG10201908213V patent/SG10201908213VA/en unknown
- 2013-02-22 CN CN201380010837.8A patent/CN104136368B/zh active Active
- 2013-02-22 EP EP13751679.5A patent/EP2817261A4/fr active Pending
- 2013-02-22 KR KR1020147025067A patent/KR102107382B1/ko active IP Right Grant
- 2013-02-22 WO PCT/US2013/027284 patent/WO2013126671A1/fr active Application Filing
- 2013-02-22 JP JP2014558853A patent/JP6262156B2/ja active Active
- 2013-02-22 US US13/774,188 patent/US9150418B2/en active Active
- 2013-02-22 SG SG10201607367UA patent/SG10201607367UA/en unknown
- 2013-02-22 CN CN201611162591.8A patent/CN106744866B/zh active Active
- 2013-02-22 SG SG11201404775RA patent/SG11201404775RA/en unknown
- 2013-02-23 TW TW102106432A patent/TWI552954B/zh active
-
2015
- 2015-08-27 US US14/838,202 patent/US20150368111A1/en not_active Abandoned
-
2016
- 2016-08-24 US US15/246,427 patent/US20170044018A1/en not_active Abandoned
-
2017
- 2017-12-13 JP JP2017238223A patent/JP6562996B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
TW201336784A (zh) | 2013-09-16 |
CN106744866A (zh) | 2017-05-31 |
US20170044018A1 (en) | 2017-02-16 |
KR20140135725A (ko) | 2014-11-26 |
CN104136368A (zh) | 2014-11-05 |
WO2013126671A1 (fr) | 2013-08-29 |
JP2015510489A (ja) | 2015-04-09 |
JP6562996B2 (ja) | 2019-08-21 |
SG11201404775RA (en) | 2014-09-26 |
EP2817261A1 (fr) | 2014-12-31 |
CN106744866B (zh) | 2021-01-01 |
TWI552954B (zh) | 2016-10-11 |
US20140044885A1 (en) | 2014-02-13 |
JP6262156B2 (ja) | 2018-01-17 |
JP2018074171A (ja) | 2018-05-10 |
US9150418B2 (en) | 2015-10-06 |
CN104136368B (zh) | 2017-02-22 |
US20150368111A1 (en) | 2015-12-24 |
EP2817261A4 (fr) | 2015-10-28 |
SG10201607367UA (en) | 2016-10-28 |
KR102107382B1 (ko) | 2020-05-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG10201908213VA (en) | Method and system for graphene formation | |
WO2014110446A3 (fr) | Procédé et système de formation de graphène | |
TW201614725A (en) | Methods for high precision plasma etching of substrates | |
GB201121034D0 (en) | Apparatus and method for depositing a layer onto a substrate | |
TW200614365A (en) | Method for providing uniform removal of organic material | |
WO2011081921A3 (fr) | Gravure de couche atomique avec plasmas pulsés | |
WO2012087737A3 (fr) | Traitement au plasma de densité variable de substrats semi-conducteurs | |
WO2013104583A3 (fr) | Appareil et procédé pour traitement de surface de substrat | |
TW201614883A (en) | Method for treating workpieces | |
JP2015510489A5 (fr) | ||
WO2011026127A3 (fr) | Agencement de confinement de plasma local et de commande de pression, et procédés associés | |
WO2009044693A1 (fr) | Appareil de traitement au plasma et procédé de traitement au plasma | |
MX2015014659A (es) | Proceso y aparato para endurecer termoquimicamente piezas a trabajar. | |
MX2012002918A (es) | Proceso para eliminar metales de gasoleos de vacio. | |
MX2012007328A (es) | Proceso para eliminar nitrogeno de gasoleos de vacio. | |
WO2012073142A3 (fr) | Procédé et dispositif d'implantation ionique | |
MY178015A (en) | Purification method for off-gas and apparatus for purification of off-gas | |
WO2009104918A3 (fr) | Appareil et procédé pour traitement de substrat | |
TW200943468A (en) | Plasma processing device | |
JP2015018885A5 (fr) | ||
IN2015DN01149A (fr) | ||
MX2020002072A (es) | Nanocintas de carbono, nanolaminillas de carbono y mezclas de las mismas y metodos de sintesis. | |
WO2008090763A1 (fr) | Procédé de fabrication d'un dispositif semi-conducteur et appareil de fabrication de semi-conducteur | |
JP2013120810A5 (fr) | ||
WO2012154747A3 (fr) | Procédé de gravure de chanfrein à haute pression |