SE9900446D0 - Semiconductor device with deep substrate contacts - Google Patents

Semiconductor device with deep substrate contacts

Info

Publication number
SE9900446D0
SE9900446D0 SE9900446A SE9900446A SE9900446D0 SE 9900446 D0 SE9900446 D0 SE 9900446D0 SE 9900446 A SE9900446 A SE 9900446A SE 9900446 A SE9900446 A SE 9900446A SE 9900446 D0 SE9900446 D0 SE 9900446D0
Authority
SE
Sweden
Prior art keywords
substrate
semiconductor device
connection
ground
substrate contacts
Prior art date
Application number
SE9900446A
Other languages
English (en)
Other versions
SE515158C2 (sv
SE9900446L (sv
Inventor
Ted Johansson
Christian Nystroem
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE9900446A priority Critical patent/SE515158C2/sv
Publication of SE9900446D0 publication Critical patent/SE9900446D0/sv
Priority to TW088102471A priority patent/TW466732B/zh
Priority to CA002356868A priority patent/CA2356868A1/en
Priority to PCT/SE2000/000207 priority patent/WO2000048248A1/en
Priority to JP2000599078A priority patent/JP2002536847A/ja
Priority to AU29530/00A priority patent/AU2953000A/en
Priority to EP00908157A priority patent/EP1169734A1/en
Priority to KR1020017009652A priority patent/KR100781826B1/ko
Priority to CNB008036888A priority patent/CN1160786C/zh
Priority to US09/500,994 priority patent/US6953981B1/en
Publication of SE9900446L publication Critical patent/SE9900446L/sv
Publication of SE515158C2 publication Critical patent/SE515158C2/sv
Priority to HK02106518.8A priority patent/HK1045024B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/535—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including internal interconnections, e.g. cross-under constructions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/60—Protection against electrostatic charges or discharges, e.g. Faraday shields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02—Bonding areas; Manufacturing methods related thereto
    • H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554—External layer
    • H01L2224/05599—Material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/4501—Shape
    • H01L2224/45012—Cross-sectional shape
    • H01L2224/45015—Cross-sectional shape being circular
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
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    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
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    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484—Connecting portions
    • H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48464—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area also being a ball bond, i.e. ball-to-ball
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
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    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491—Disposition
    • H01L2224/4912—Layout
    • H01L2224/49171—Fan-out arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/85399—Material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1305—Bipolar Junction Transistor [BJT]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1306—Field-effect transistor [FET]
    • H01L2924/13063—Metal-Semiconductor Field-Effect Transistor [MESFET]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1306—Field-effect transistor [FET]
    • H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/30107—Inductance
    • H—ELECTRICITY
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    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3011—Impedance
    • H—ELECTRICITY
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    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3025—Electromagnetic shielding

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Bipolar Transistors (AREA)
  • Lead Frames For Integrated Circuits (AREA)
SE9900446A 1999-02-10 1999-02-10 Halvledaranordning med jordanslutning via en ej genomgående plugg SE515158C2 (sv)

Priority Applications (11)

Application Number Priority Date Filing Date Title
SE9900446A SE515158C2 (sv) 1999-02-10 1999-02-10 Halvledaranordning med jordanslutning via en ej genomgående plugg
TW088102471A TW466732B (en) 1999-02-10 1999-11-17 Semiconductor device with deep substrate contacts
CNB008036888A CN1160786C (zh) 1999-02-10 2000-02-02 具有深衬底接触的半导体器件
JP2000599078A JP2002536847A (ja) 1999-02-10 2000-02-02 深い基板接触を有する半導体素子
PCT/SE2000/000207 WO2000048248A1 (en) 1999-02-10 2000-02-02 Semiconductor device with deep substrate contacts
CA002356868A CA2356868A1 (en) 1999-02-10 2000-02-02 Semiconductor device with deep substrate contacts
AU29530/00A AU2953000A (en) 1999-02-10 2000-02-02 Semiconductor device with deep substrate contacts
EP00908157A EP1169734A1 (en) 1999-02-10 2000-02-02 Semiconductor device with deep substrate contacts
KR1020017009652A KR100781826B1 (ko) 1999-02-10 2000-02-02 심층 기판 접촉부를 가진 반도체 디바이스
US09/500,994 US6953981B1 (en) 1999-02-10 2000-02-09 Semiconductor device with deep substrates contacts
HK02106518.8A HK1045024B (zh) 1999-02-10 2002-09-04 具有深襯底接觸的半導體器件

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9900446A SE515158C2 (sv) 1999-02-10 1999-02-10 Halvledaranordning med jordanslutning via en ej genomgående plugg

Publications (3)

Publication Number Publication Date
SE9900446D0 true SE9900446D0 (sv) 1999-02-10
SE9900446L SE9900446L (sv) 2000-08-11
SE515158C2 SE515158C2 (sv) 2001-06-18

Family

ID=20414420

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9900446A SE515158C2 (sv) 1999-02-10 1999-02-10 Halvledaranordning med jordanslutning via en ej genomgående plugg

Country Status (11)

Country Link
US (1) US6953981B1 (sv)
EP (1) EP1169734A1 (sv)
JP (1) JP2002536847A (sv)
KR (1) KR100781826B1 (sv)
CN (1) CN1160786C (sv)
AU (1) AU2953000A (sv)
CA (1) CA2356868A1 (sv)
HK (1) HK1045024B (sv)
SE (1) SE515158C2 (sv)
TW (1) TW466732B (sv)
WO (1) WO2000048248A1 (sv)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7078743B2 (en) 2003-05-15 2006-07-18 Matsushita Electric Industrial Co., Ltd. Field effect transistor semiconductor device
US7227237B2 (en) * 2003-12-22 2007-06-05 Palo Alto Research Center Incorporated Systems and methods for biasing high fill-factor sensor arrays and the like
US7589417B2 (en) 2004-02-12 2009-09-15 Intel Corporation Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same
US7598521B2 (en) * 2004-03-29 2009-10-06 Sanyo Electric Co., Ltd. Semiconductor device in which the emitter resistance is reduced
JP2006086398A (ja) 2004-09-17 2006-03-30 Matsushita Electric Ind Co Ltd 半導体装置及びその製造方法
US7651897B2 (en) * 2004-12-07 2010-01-26 National Semiconductor Corporation Integrated circuit with metal heat flow path coupled to transistor and method for manufacturing such circuit
EP1788624B1 (en) * 2005-11-16 2010-06-09 STMicroelectronics Srl Process for manufacturing deep through vias in a semiconductor device, and semiconductor device made thereby.
JP2007243140A (ja) * 2006-02-09 2007-09-20 Renesas Technology Corp 半導体装置、電子装置および半導体装置の製造方法
JP5319084B2 (ja) * 2007-06-19 2013-10-16 ルネサスエレクトロニクス株式会社 半導体装置
EP2180517A1 (en) * 2008-10-24 2010-04-28 Epcos Ag Pnp bipolar transistor with lateral collector and method of production
US9130006B2 (en) * 2013-10-07 2015-09-08 Freescale Semiconductor, Inc. Semiconductor device with buried conduction path
CN104576715A (zh) * 2014-07-24 2015-04-29 上海华虹宏力半导体制造有限公司 锗硅异质结双极晶体管及制造方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT8048031A0 (it) * 1979-04-09 1980-02-28 Raytheon Co Perfezionamento nei dispositivi a semiconduttore ad effetto di campo
US5240867A (en) * 1989-02-09 1993-08-31 Fujitsu Limited Semiconductor integrated circuit having interconnection with improved design flexibility, and method of production
JPH063840B2 (ja) * 1989-03-31 1994-01-12 株式会社東芝 半導体装置
US5202752A (en) * 1990-05-16 1993-04-13 Nec Corporation Monolithic integrated circuit device
DE4118255A1 (de) * 1991-06-04 1992-12-10 Itt Ind Gmbh Deutsche Monolithisch integrierter sensorschaltkreis in cmos-technik
AU2187397A (en) * 1996-03-22 1997-10-10 Telefonaktiebolaget Lm Ericsson (Publ) Semiconductor device shielded by an array of electrically conducting pins and a method to manufacture such a device
US5841166A (en) * 1996-09-10 1998-11-24 Spectrian, Inc. Lateral DMOS transistor for RF/microwave applications
US6063678A (en) * 1998-05-04 2000-05-16 Xemod, Inc. Fabrication of lateral RF MOS devices with enhanced RF properties

Also Published As

Publication number Publication date
CA2356868A1 (en) 2000-08-17
HK1045024B (zh) 2005-04-29
KR20010110426A (ko) 2001-12-13
AU2953000A (en) 2000-08-29
WO2000048248A1 (en) 2000-08-17
JP2002536847A (ja) 2002-10-29
EP1169734A1 (en) 2002-01-09
HK1045024A1 (en) 2002-11-08
TW466732B (en) 2001-12-01
SE515158C2 (sv) 2001-06-18
CN1340211A (zh) 2002-03-13
KR100781826B1 (ko) 2007-12-03
CN1160786C (zh) 2004-08-04
US6953981B1 (en) 2005-10-11
SE9900446L (sv) 2000-08-11

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