SE8503456L - Forfarande for metning av beleggningsmengder - Google Patents

Forfarande for metning av beleggningsmengder

Info

Publication number
SE8503456L
SE8503456L SE8503456A SE8503456A SE8503456L SE 8503456 L SE8503456 L SE 8503456L SE 8503456 A SE8503456 A SE 8503456A SE 8503456 A SE8503456 A SE 8503456A SE 8503456 L SE8503456 L SE 8503456L
Authority
SE
Sweden
Prior art keywords
radiation
coating layer
procedure
detector
radiation source
Prior art date
Application number
SE8503456A
Other languages
Unknown language ( )
English (en)
Other versions
SE8503456D0 (sv
Inventor
H Veneleinen
R Rantanen
P Puumalainen
Original Assignee
Enso Gutzeit Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enso Gutzeit Oy filed Critical Enso Gutzeit Oy
Publication of SE8503456D0 publication Critical patent/SE8503456D0/sv
Publication of SE8503456L publication Critical patent/SE8503456L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Paper (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
SE8503456A 1978-11-21 1985-07-12 Forfarande for metning av beleggningsmengder SE8503456L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI783544A FI59489C (fi) 1978-11-21 1978-11-21 Foerfarande foer maetning av belaeggningsmaengder

Publications (2)

Publication Number Publication Date
SE8503456D0 SE8503456D0 (sv) 1985-07-12
SE8503456L true SE8503456L (sv) 1985-07-12

Family

ID=8512164

Family Applications (2)

Application Number Title Priority Date Filing Date
SE7909582A SE444084B (sv) 1978-11-21 1979-11-20 Sett att meta materialmengden i ett forsta och ett andra beleggningsskikt
SE8503456A SE8503456L (sv) 1978-11-21 1985-07-12 Forfarande for metning av beleggningsmengder

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SE7909582A SE444084B (sv) 1978-11-21 1979-11-20 Sett att meta materialmengden i ett forsta och ett andra beleggningsskikt

Country Status (9)

Country Link
US (1) US4377869A (sv)
CA (1) CA1147870A (sv)
DE (1) DE2946567A1 (sv)
FI (1) FI59489C (sv)
FR (2) FR2442443A1 (sv)
GB (2) GB2040037B (sv)
IT (1) IT1162690B (sv)
NO (1) NO793755L (sv)
SE (2) SE444084B (sv)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5758300U (sv) * 1980-09-22 1982-04-06
FI62420C (fi) * 1981-05-29 1982-12-10 Enso Gutzeit Oy Foerfarande foer att maeta belaeggningsmaengd
US4458360A (en) * 1982-05-26 1984-07-03 Enso-Gutzeit Oy Procedure for determining coating rates
FI68320C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning fraon en radioisotopkaella utan att foerstoera provet maeta foerdelningen av fyll-och/eller belaeggningsmedel i tjockleksriktningen av papp erartong eller liknande och halten av dessa medel anordnin rgafoer tillaempande av foerfarandet samt anvaendningar av erfoarandet och anordningarna
FI68321C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning utsaend av ett roentgenroer utan att foerstoera provet maeta foerdelningen av fyll- och/eller belaeggningsmedel i tjockleksriktningen av papper kartong eller liknande och halten av dessa medel anordningar foer tillaempande av foerfarandet samt anvaendningar av foerfarandet och anordningarna
FI68322C (fi) * 1983-06-28 1985-08-12 Enso Gutzeit Oy Foerfarande och anordning foer maetning av maengden av siliciumbelaeggning vid papper eller kartong
US4748647A (en) * 1985-08-12 1988-05-31 General Electric Company Fuel tube barrier gauge
JPH07119594B2 (ja) * 1988-07-01 1995-12-20 富士写真フイルム株式会社 磁気記録媒体の膜厚測定方法
NO171524C (no) * 1990-10-18 1993-03-24 Dag Brune Fremgangsmaate for paavisning av korrosjonsangrep i metalloverflater
GB2260403B (en) * 1991-09-19 1995-10-11 Rigaku Ind Corp Method of and apparatus for the quantitative measurement of paint coating
DE4303878A1 (de) * 1993-02-10 1994-09-01 Amtec Analysenmestechnik Gmbh Verfahren zur Schichtanalyse nach dem Röntgenfluoreszenzverfahren unter Berücksichtigung unterschiedlicher Grund- und Schichtwerkstoffe
FI109215B (sv) 1996-10-28 2002-06-14 Metso Paper Inc Förfarande och anordning för bestrykning av pappers- eller kartongbana
DE10034747A1 (de) * 2000-07-18 2002-02-07 Manfred Liphardt Verfahren und Vorrichtung zur Feststellung der Dicke eines Beschichtungswerkstoffs auf einem Trägerwerkstoff
US8668342B2 (en) 2011-11-30 2014-03-11 Izi Medical Products Material thickness control over retro-reflective marker
US8661573B2 (en) 2012-02-29 2014-03-04 Izi Medical Products Protective cover for medical device having adhesive mechanism
US9632043B2 (en) * 2014-05-13 2017-04-25 Bruker Jv Israel Ltd. Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF
US9829448B2 (en) 2014-10-30 2017-11-28 Bruker Jv Israel Ltd. Measurement of small features using XRF
JP2022178427A (ja) * 2021-05-20 2022-12-02 株式会社ディスコ 保護膜の厚み測定方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2711480A (en) * 1948-06-29 1955-06-21 Friedman Herbert Method of measuring thickness of thin layers
US2925497A (en) * 1956-08-09 1960-02-16 Philips Corp Fluorescence analysis
US3417243A (en) * 1965-10-28 1968-12-17 Minnesota Mining & Mfg Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
FI40753B (sv) * 1968-04-03 1969-01-31 Valmet Oy
US3631526A (en) * 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
DE2254969A1 (de) * 1972-11-10 1974-05-30 Frieseke & Hoepfner Gmbh Verfahren und einrichtung zur messung der durchschnittsfeuchte einer eine trocknungsstrecke verlassenden messgutbahn
US3984679A (en) * 1975-02-18 1976-10-05 Gte Laboratories Incorporated Coating thickness monitor for multiple layers
CA1086870A (en) * 1976-05-18 1980-09-30 Western Electric Company, Incorporated X-ray-fluorescence measurement of thin film thicknesses
US4162528A (en) * 1976-05-18 1979-07-24 Bell Telephone Laboratories, Incorporated X-ray-fluorescence measurement of thin film thicknesses
JPS538165A (en) * 1976-07-12 1978-01-25 Seiko Instr & Electronics Ltd Thickness measuring method of thin film material and thin film material thickness measuring apparatus
US4147931A (en) * 1976-12-13 1979-04-03 Pertti Puumalainen Procedure for measuring unit area weights
FI53757C (fi) * 1976-12-13 1978-07-10 Pertti Puumalainen Foerfarande foer maetning av ytvikterna

Also Published As

Publication number Publication date
NO793755L (no) 1980-05-22
FR2442443B1 (sv) 1984-11-09
SE7909582L (sv) 1980-05-22
DE2946567A1 (de) 1980-06-04
GB2115140B (en) 1984-02-08
FR2517431B1 (fr) 1985-10-04
US4377869A (en) 1983-03-22
FI59489B (fi) 1981-04-30
FI59489C (fi) 1981-08-10
SE444084B (sv) 1986-03-17
GB2040037B (en) 1983-08-17
GB2115140A (en) 1983-09-01
SE8503456D0 (sv) 1985-07-12
FI783544A (fi) 1980-05-22
FR2517431A1 (fr) 1983-06-03
CA1147870A (en) 1983-06-07
FR2442443A1 (fr) 1980-06-20
IT7950860A0 (it) 1979-11-20
GB2040037A (en) 1980-08-20
IT1162690B (it) 1987-04-01

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