FR2517431B1 - Procede de mesure de taux de revetement d'un materiau - Google Patents
Procede de mesure de taux de revetement d'un materiauInfo
- Publication number
- FR2517431B1 FR2517431B1 FR8302410A FR8302410A FR2517431B1 FR 2517431 B1 FR2517431 B1 FR 2517431B1 FR 8302410 A FR8302410 A FR 8302410A FR 8302410 A FR8302410 A FR 8302410A FR 2517431 B1 FR2517431 B1 FR 2517431B1
- Authority
- FR
- France
- Prior art keywords
- coating rates
- measuring coating
- measuring
- rates
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000011248 coating agent Substances 0.000 title 1
- 238000000576 coating method Methods 0.000 title 1
- 239000000463 material Substances 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Emergency Protection Circuit Devices (AREA)
- Paper (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI783544A FI59489C (fi) | 1978-11-21 | 1978-11-21 | Foerfarande foer maetning av belaeggningsmaengder |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2517431A1 FR2517431A1 (fr) | 1983-06-03 |
FR2517431B1 true FR2517431B1 (fr) | 1985-10-04 |
Family
ID=8512164
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7928631A Granted FR2442443A1 (fr) | 1978-11-21 | 1979-11-20 | Procede de mesure de taux de revetement d'un materiau |
FR8302410A Expired FR2517431B1 (fr) | 1978-11-21 | 1983-02-15 | Procede de mesure de taux de revetement d'un materiau |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7928631A Granted FR2442443A1 (fr) | 1978-11-21 | 1979-11-20 | Procede de mesure de taux de revetement d'un materiau |
Country Status (9)
Country | Link |
---|---|
US (1) | US4377869A (fr) |
CA (1) | CA1147870A (fr) |
DE (1) | DE2946567A1 (fr) |
FI (1) | FI59489C (fr) |
FR (2) | FR2442443A1 (fr) |
GB (2) | GB2040037B (fr) |
IT (1) | IT1162690B (fr) |
NO (1) | NO793755L (fr) |
SE (2) | SE444084B (fr) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5758300U (fr) * | 1980-09-22 | 1982-04-06 | ||
FI62420C (fi) * | 1981-05-29 | 1982-12-10 | Enso Gutzeit Oy | Foerfarande foer att maeta belaeggningsmaengd |
US4458360A (en) * | 1982-05-26 | 1984-07-03 | Enso-Gutzeit Oy | Procedure for determining coating rates |
FI68320C (fi) * | 1982-12-01 | 1985-08-12 | Valtion Teknillinen | Foerfarande foer att medelst straolning fraon en radioisotopkaella utan att foerstoera provet maeta foerdelningen av fyll-och/eller belaeggningsmedel i tjockleksriktningen av papp erartong eller liknande och halten av dessa medel anordnin rgafoer tillaempande av foerfarandet samt anvaendningar av erfoarandet och anordningarna |
FI68321C (fi) * | 1982-12-01 | 1985-08-12 | Valtion Teknillinen | Foerfarande foer att medelst straolning utsaend av ett roentgenroer utan att foerstoera provet maeta foerdelningen av fyll- och/eller belaeggningsmedel i tjockleksriktningen av papper kartong eller liknande och halten av dessa medel anordningar foer tillaempande av foerfarandet samt anvaendningar av foerfarandet och anordningarna |
FI68322C (fi) * | 1983-06-28 | 1985-08-12 | Enso Gutzeit Oy | Foerfarande och anordning foer maetning av maengden av siliciumbelaeggning vid papper eller kartong |
US4748647A (en) * | 1985-08-12 | 1988-05-31 | General Electric Company | Fuel tube barrier gauge |
JPH07119594B2 (ja) * | 1988-07-01 | 1995-12-20 | 富士写真フイルム株式会社 | 磁気記録媒体の膜厚測定方法 |
NO171524C (no) * | 1990-10-18 | 1993-03-24 | Dag Brune | Fremgangsmaate for paavisning av korrosjonsangrep i metalloverflater |
GB2260403B (en) * | 1991-09-19 | 1995-10-11 | Rigaku Ind Corp | Method of and apparatus for the quantitative measurement of paint coating |
DE4303878A1 (de) * | 1993-02-10 | 1994-09-01 | Amtec Analysenmestechnik Gmbh | Verfahren zur Schichtanalyse nach dem Röntgenfluoreszenzverfahren unter Berücksichtigung unterschiedlicher Grund- und Schichtwerkstoffe |
FI109215B (fi) | 1996-10-28 | 2002-06-14 | Metso Paper Inc | Menetelmä ja sovitelma liikkuvan paperi- tai kartonkiradan päällystämiseksi |
DE10034747A1 (de) * | 2000-07-18 | 2002-02-07 | Manfred Liphardt | Verfahren und Vorrichtung zur Feststellung der Dicke eines Beschichtungswerkstoffs auf einem Trägerwerkstoff |
US8668342B2 (en) | 2011-11-30 | 2014-03-11 | Izi Medical Products | Material thickness control over retro-reflective marker |
US8661573B2 (en) | 2012-02-29 | 2014-03-04 | Izi Medical Products | Protective cover for medical device having adhesive mechanism |
US9632043B2 (en) * | 2014-05-13 | 2017-04-25 | Bruker Jv Israel Ltd. | Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF |
US9829448B2 (en) | 2014-10-30 | 2017-11-28 | Bruker Jv Israel Ltd. | Measurement of small features using XRF |
JP2022178427A (ja) * | 2021-05-20 | 2022-12-02 | 株式会社ディスコ | 保護膜の厚み測定方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2711480A (en) * | 1948-06-29 | 1955-06-21 | Friedman Herbert | Method of measuring thickness of thin layers |
US2925497A (en) * | 1956-08-09 | 1960-02-16 | Philips Corp | Fluorescence analysis |
US3417243A (en) * | 1965-10-28 | 1968-12-17 | Minnesota Mining & Mfg | Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base |
FI40753B (fr) * | 1968-04-03 | 1969-01-31 | Valmet Oy | |
US3631526A (en) * | 1969-11-05 | 1971-12-28 | Brun Sensor Systems Inc | Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements |
DE2254969A1 (de) * | 1972-11-10 | 1974-05-30 | Frieseke & Hoepfner Gmbh | Verfahren und einrichtung zur messung der durchschnittsfeuchte einer eine trocknungsstrecke verlassenden messgutbahn |
US3984679A (en) * | 1975-02-18 | 1976-10-05 | Gte Laboratories Incorporated | Coating thickness monitor for multiple layers |
CA1086870A (fr) * | 1976-05-18 | 1980-09-30 | Western Electric Company, Incorporated | Mesure de l'epaisseur de couches minces au moyen d'un systeme a fluorescence excitee par rayons x |
US4162528A (en) * | 1976-05-18 | 1979-07-24 | Bell Telephone Laboratories, Incorporated | X-ray-fluorescence measurement of thin film thicknesses |
JPS538165A (en) * | 1976-07-12 | 1978-01-25 | Seiko Instr & Electronics Ltd | Thickness measuring method of thin film material and thin film material thickness measuring apparatus |
US4147931A (en) * | 1976-12-13 | 1979-04-03 | Pertti Puumalainen | Procedure for measuring unit area weights |
FI53757C (fi) * | 1976-12-13 | 1978-07-10 | Pertti Puumalainen | Foerfarande foer maetning av ytvikterna |
-
1978
- 1978-11-21 FI FI783544A patent/FI59489C/fi not_active IP Right Cessation
-
1979
- 1979-11-17 DE DE19792946567 patent/DE2946567A1/de not_active Withdrawn
- 1979-11-20 IT IT50860/79A patent/IT1162690B/it active
- 1979-11-20 SE SE7909582A patent/SE444084B/sv not_active IP Right Cessation
- 1979-11-20 NO NO793755A patent/NO793755L/no unknown
- 1979-11-20 CA CA000340244A patent/CA1147870A/fr not_active Expired
- 1979-11-20 FR FR7928631A patent/FR2442443A1/fr active Granted
- 1979-11-21 GB GB7940249A patent/GB2040037B/en not_active Expired
-
1981
- 1981-05-01 US US06/259,496 patent/US4377869A/en not_active Expired - Lifetime
-
1982
- 1982-09-21 GB GB08226835A patent/GB2115140B/en not_active Expired
-
1983
- 1983-02-15 FR FR8302410A patent/FR2517431B1/fr not_active Expired
-
1985
- 1985-07-12 SE SE8503456A patent/SE8503456L/ unknown
Also Published As
Publication number | Publication date |
---|---|
GB2115140B (en) | 1984-02-08 |
GB2040037B (en) | 1983-08-17 |
GB2115140A (en) | 1983-09-01 |
DE2946567A1 (de) | 1980-06-04 |
IT1162690B (it) | 1987-04-01 |
CA1147870A (fr) | 1983-06-07 |
NO793755L (no) | 1980-05-22 |
FR2517431A1 (fr) | 1983-06-03 |
FI783544A (fi) | 1980-05-22 |
FI59489B (fi) | 1981-04-30 |
FR2442443B1 (fr) | 1984-11-09 |
US4377869A (en) | 1983-03-22 |
SE8503456D0 (sv) | 1985-07-12 |
GB2040037A (en) | 1980-08-20 |
FR2442443A1 (fr) | 1980-06-20 |
SE444084B (sv) | 1986-03-17 |
IT7950860A0 (it) | 1979-11-20 |
FI59489C (fi) | 1981-08-10 |
SE7909582L (sv) | 1980-05-22 |
SE8503456L (sv) | 1985-07-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |