SE523321C2 - Sätt och anordning för avkänning och indikering av akustisk emission - Google Patents

Sätt och anordning för avkänning och indikering av akustisk emission

Info

Publication number
SE523321C2
SE523321C2 SE0201927A SE0201927A SE523321C2 SE 523321 C2 SE523321 C2 SE 523321C2 SE 0201927 A SE0201927 A SE 0201927A SE 0201927 A SE0201927 A SE 0201927A SE 523321 C2 SE523321 C2 SE 523321C2
Authority
SE
Sweden
Prior art keywords
coil
elements
band
coils
atomic
Prior art date
Application number
SE0201927A
Other languages
English (en)
Swedish (sv)
Other versions
SE0201927D0 (sv
SE0201927L (sv
Inventor
Tord Cedell
Original Assignee
Covial Device Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Covial Device Ab filed Critical Covial Device Ab
Priority to SE0201927A priority Critical patent/SE523321C2/sv
Publication of SE0201927D0 publication Critical patent/SE0201927D0/xx
Priority to AU2003238987A priority patent/AU2003238987B2/en
Priority to CA2489171A priority patent/CA2489171C/en
Priority to EA200401567A priority patent/EA009475B1/ru
Priority to MXPA04012921A priority patent/MXPA04012921A/es
Priority to EP03733699A priority patent/EP1514082A1/en
Priority to JP2004515286A priority patent/JP4233523B2/ja
Priority to CNB038143925A priority patent/CN100489471C/zh
Priority to KR1020047020796A priority patent/KR101046539B1/ko
Priority to BR0312434-7A priority patent/BR0312434A/pt
Priority to PCT/SE2003/000871 priority patent/WO2004001353A1/en
Priority to US10/518,126 priority patent/US7282822B2/en
Publication of SE0201927L publication Critical patent/SE0201927L/xx
Publication of SE523321C2 publication Critical patent/SE523321C2/sv
Priority to NO20045350A priority patent/NO329969B1/no
Priority to ZA200409956A priority patent/ZA200409956B/en
Priority to IL16577404A priority patent/IL165774A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0885—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by magnetostrictive pick-up
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H11/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties
    • G01H11/02—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by magnetic means, e.g. reluctance
    • G01H11/04—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by magnetic means, e.g. reluctance using magnetostrictive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/24—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/12—Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00—Manufacture or treatment of nanostructures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
SE0201927A 2002-06-20 2002-06-20 Sätt och anordning för avkänning och indikering av akustisk emission SE523321C2 (sv)

Priority Applications (15)

Application Number Priority Date Filing Date Title
SE0201927A SE523321C2 (sv) 2002-06-20 2002-06-20 Sätt och anordning för avkänning och indikering av akustisk emission
US10/518,126 US7282822B2 (en) 2002-06-20 2003-05-28 Sensor
JP2004515286A JP4233523B2 (ja) 2002-06-20 2003-05-28 永久状態偏差を感知する方法及び装置
KR1020047020796A KR101046539B1 (ko) 2002-06-20 2003-05-28 센서
EA200401567A EA009475B1 (ru) 2002-06-20 2003-05-28 Датчик
MXPA04012921A MXPA04012921A (es) 2002-06-20 2003-05-28 Sensor.
EP03733699A EP1514082A1 (en) 2002-06-20 2003-05-28 Sensor
AU2003238987A AU2003238987B2 (en) 2002-06-20 2003-05-28 Sensor
CNB038143925A CN100489471C (zh) 2002-06-20 2003-05-28 传感器
CA2489171A CA2489171C (en) 2002-06-20 2003-05-28 Method and apparatus for sensing permanent state deviations
BR0312434-7A BR0312434A (pt) 2002-06-20 2003-05-28 Método e aparelho para determinar desvios de estado permanente
PCT/SE2003/000871 WO2004001353A1 (en) 2002-06-20 2003-05-28 Sensor
NO20045350A NO329969B1 (no) 2002-06-20 2004-12-07 Metode og apparat for avfoling og angivelse av akustisk emisjon
ZA200409956A ZA200409956B (en) 2002-06-20 2004-12-08 Sensor
IL16577404A IL165774A0 (en) 2002-06-20 2004-12-14 Sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0201927A SE523321C2 (sv) 2002-06-20 2002-06-20 Sätt och anordning för avkänning och indikering av akustisk emission

Publications (3)

Publication Number Publication Date
SE0201927D0 SE0201927D0 (sv) 2002-06-20
SE0201927L SE0201927L (sv) 2003-12-21
SE523321C2 true SE523321C2 (sv) 2004-04-13

Family

ID=20288285

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0201927A SE523321C2 (sv) 2002-06-20 2002-06-20 Sätt och anordning för avkänning och indikering av akustisk emission

Country Status (14)

Country Link
US (1) US7282822B2 (OSRAM)
EP (1) EP1514082A1 (OSRAM)
JP (1) JP4233523B2 (OSRAM)
KR (1) KR101046539B1 (OSRAM)
CN (1) CN100489471C (OSRAM)
BR (1) BR0312434A (OSRAM)
CA (1) CA2489171C (OSRAM)
EA (1) EA009475B1 (OSRAM)
IL (1) IL165774A0 (OSRAM)
MX (1) MXPA04012921A (OSRAM)
NO (1) NO329969B1 (OSRAM)
SE (1) SE523321C2 (OSRAM)
WO (1) WO2004001353A1 (OSRAM)
ZA (1) ZA200409956B (OSRAM)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004078367A1 (en) * 2003-03-03 2004-09-16 Adaptive Materials Technology Oy A damping and actuating apparatus comprising magnetostrictive material, a vibration dampening device and use of said apparatus
KR101592950B1 (ko) * 2009-02-27 2016-02-11 연세대학교 산학협력단 자성체를 함유하는 구조물의 변형률 측정용 도료, 이를 포함하는 테이프 및 이를 이용한 구조물의 변형률 측정방법
CN101650217B (zh) * 2009-09-23 2011-02-02 上海交通大学 非接触式共轴磁弹性传感器
CN104316225B (zh) * 2014-11-07 2016-04-20 山东科技大学 一种磁流变弹性体压力传感器
ITUA20162508A1 (it) * 2016-04-12 2017-10-12 Safecertifiedstructure Ingegneria S R L Metodo e dispositivo d’indagine per la misurazione di tensioni in una struttura di agglomerato
CN107063073B (zh) * 2017-04-12 2020-03-20 爱德森（厦门）电子有限公司 一种物体形变电磁监测装置及方法
CN109900793B (zh) * 2019-04-16 2021-04-27 中国特种设备检测研究院 一种铁磁性金属构件蠕变损伤的磁致声发射检测方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4463610A (en) * 1982-02-18 1984-08-07 Allied Corporation Tuned vibration detector
JPH01189971A (ja) * 1988-01-26 1989-07-31 Toshiba Corp トルクセンサ
JP2800347B2 (ja) * 1990-02-07 1998-09-21 株式会社豊田自動織機製作所 磁歪式トルクセンサ
DE4008644C1 (OSRAM) * 1990-03-17 1991-05-29 Mercedes-Benz Aktiengesellschaft, 7000 Stuttgart, De
JPH0442004A (ja) 1990-06-07 1992-02-12 Toshiba Corp ひずみセンサおよびその製造方法
DE4309413C2 (de) * 1993-03-19 1996-03-07 Holger Kabelitz Magnetoelastische Dehnungsmeßeinheit zur Erfassung von Dehnungen auf einer Bauteiloberfläche
JP3541996B2 (ja) * 1995-09-26 2004-07-14 Ｔｄｋ株式会社 磁歪装置
GB9806994D0 (en) * 1998-04-02 1998-06-03 New Transducers Ltd Acoustic device
GB9818959D0 (en) * 1998-09-02 1998-10-21 New Transducers Ltd Panelform loudspeaker
DE19653428C1 (de) * 1996-12-20 1998-03-26 Vacuumschmelze Gmbh Verfahren zum Herstellen von Bandkernbändern sowie induktives Bauelement mit Bandkern
US6018296A (en) * 1997-07-09 2000-01-25 Vacuumschmelze Gmbh Amorphous magnetostrictive alloy with low cobalt content and method for annealing same
JPH11194158A (ja) * 1998-01-05 1999-07-21 Alps Electric Co Ltd 方位センサ
US6542342B1 (en) * 1998-11-30 2003-04-01 Nec Corporation Magnetoresistive effect transducer having longitudinal bias layer directly connected to free layer
JP3643823B2 (ja) * 2002-09-30 2005-04-27 株式会社東芝 磁気抵抗効果素子
JP3835447B2 (ja) * 2002-10-23 2006-10-18 ヤマハ株式会社 磁気センサ、同磁気センサの製造方法及び同製造方法に適したマグネットアレイ
JP2006245275A (ja) * 2005-03-03 2006-09-14 Alps Electric Co Ltd 磁気検出素子

Also Published As

Publication number Publication date
EP1514082A1 (en) 2005-03-16
NO20045350D0 (no) 2004-12-07
SE0201927D0 (sv) 2002-06-20
US20050242806A1 (en) 2005-11-03
US7282822B2 (en) 2007-10-16
EA009475B1 (ru) 2008-02-28
IL165774A0 (en) 2006-01-15
JP2005530173A (ja) 2005-10-06
KR20050016602A (ko) 2005-02-21
AU2003238987A1 (en) 2004-01-06
JP4233523B2 (ja) 2009-03-04
CA2489171A1 (en) 2003-12-31
SE0201927L (sv) 2003-12-21
EA200401567A1 (ru) 2005-08-25
NO20045350L (no) 2005-02-04
NO329969B1 (no) 2011-01-31
KR101046539B1 (ko) 2011-07-06
MXPA04012921A (es) 2005-07-26
CN1662795A (zh) 2005-08-31
ZA200409956B (en) 2006-07-26
BR0312434A (pt) 2005-04-19
CN100489471C (zh) 2009-05-20
WO2004001353A1 (en) 2003-12-31
CA2489171C (en) 2011-12-13

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