JP4233523B2 - 永久状態偏差を感知する方法及び装置 - Google Patents

永久状態偏差を感知する方法及び装置 Download PDF

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JP4233523B2
JP4233523B2 JP2004515286A JP2004515286A JP4233523B2 JP 4233523 B2 JP4233523 B2 JP 4233523B2 JP 2004515286 A JP2004515286 A JP 2004515286A JP 2004515286 A JP2004515286 A JP 2004515286A JP 4233523 B2 JP4233523 B2 JP 4233523B2
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Prior art keywords
band
coil
amorphous
deviation
sensing
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Japanese (ja)
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JP2005530173A5 (OSRAM
JP2005530173A (ja
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セデル，トルド
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コビアル デバイス アーベー
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0885—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by magnetostrictive pick-up
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H11/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties
    • G01H11/02—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by magnetic means, e.g. reluctance
    • G01H11/04—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by magnetic means, e.g. reluctance using magnetostrictive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/24—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/12—Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00—Manufacture or treatment of nanostructures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2004515286A 2002-06-20 2003-05-28 永久状態偏差を感知する方法及び装置 Expired - Lifetime JP4233523B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0201927A SE523321C2 (sv) 2002-06-20 2002-06-20 Sätt och anordning för avkänning och indikering av akustisk emission
PCT/SE2003/000871 WO2004001353A1 (en) 2002-06-20 2003-05-28 Sensor

Publications (3)

Publication Number Publication Date
JP2005530173A JP2005530173A (ja) 2005-10-06
JP2005530173A5 JP2005530173A5 (OSRAM) 2006-10-26
JP4233523B2 true JP4233523B2 (ja) 2009-03-04

Family

ID=20288285

Family Applications (1)

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JP2004515286A Expired - Lifetime JP4233523B2 (ja) 2002-06-20 2003-05-28 永久状態偏差を感知する方法及び装置

Country Status (14)

Country Link
US (1) US7282822B2 (OSRAM)
EP (1) EP1514082A1 (OSRAM)
JP (1) JP4233523B2 (OSRAM)
KR (1) KR101046539B1 (OSRAM)
CN (1) CN100489471C (OSRAM)
BR (1) BR0312434A (OSRAM)
CA (1) CA2489171C (OSRAM)
EA (1) EA009475B1 (OSRAM)
IL (1) IL165774A0 (OSRAM)
MX (1) MXPA04012921A (OSRAM)
NO (1) NO329969B1 (OSRAM)
SE (1) SE523321C2 (OSRAM)
WO (1) WO2004001353A1 (OSRAM)
ZA (1) ZA200409956B (OSRAM)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004078367A1 (en) * 2003-03-03 2004-09-16 Adaptive Materials Technology Oy A damping and actuating apparatus comprising magnetostrictive material, a vibration dampening device and use of said apparatus
KR101592950B1 (ko) * 2009-02-27 2016-02-11 연세대학교 산학협력단 자성체를 함유하는 구조물의 변형률 측정용 도료, 이를 포함하는 테이프 및 이를 이용한 구조물의 변형률 측정방법
CN101650217B (zh) * 2009-09-23 2011-02-02 上海交通大学 非接触式共轴磁弹性传感器
CN104316225B (zh) * 2014-11-07 2016-04-20 山东科技大学 一种磁流变弹性体压力传感器
ITUA20162508A1 (it) * 2016-04-12 2017-10-12 Safecertifiedstructure Ingegneria S R L Metodo e dispositivo d’indagine per la misurazione di tensioni in una struttura di agglomerato
CN107063073B (zh) * 2017-04-12 2020-03-20 爱德森（厦门）电子有限公司 一种物体形变电磁监测装置及方法
CN109900793B (zh) * 2019-04-16 2021-04-27 中国特种设备检测研究院 一种铁磁性金属构件蠕变损伤的磁致声发射检测方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4463610A (en) * 1982-02-18 1984-08-07 Allied Corporation Tuned vibration detector
JPH01189971A (ja) * 1988-01-26 1989-07-31 Toshiba Corp トルクセンサ
JP2800347B2 (ja) * 1990-02-07 1998-09-21 株式会社豊田自動織機製作所 磁歪式トルクセンサ
DE4008644C1 (OSRAM) * 1990-03-17 1991-05-29 Mercedes-Benz Aktiengesellschaft, 7000 Stuttgart, De
JPH0442004A (ja) 1990-06-07 1992-02-12 Toshiba Corp ひずみセンサおよびその製造方法
DE4309413C2 (de) * 1993-03-19 1996-03-07 Holger Kabelitz Magnetoelastische Dehnungsmeßeinheit zur Erfassung von Dehnungen auf einer Bauteiloberfläche
JP3541996B2 (ja) * 1995-09-26 2004-07-14 Ｔｄｋ株式会社 磁歪装置
GB9806994D0 (en) * 1998-04-02 1998-06-03 New Transducers Ltd Acoustic device
GB9818959D0 (en) * 1998-09-02 1998-10-21 New Transducers Ltd Panelform loudspeaker
DE19653428C1 (de) * 1996-12-20 1998-03-26 Vacuumschmelze Gmbh Verfahren zum Herstellen von Bandkernbändern sowie induktives Bauelement mit Bandkern
US6018296A (en) * 1997-07-09 2000-01-25 Vacuumschmelze Gmbh Amorphous magnetostrictive alloy with low cobalt content and method for annealing same
JPH11194158A (ja) * 1998-01-05 1999-07-21 Alps Electric Co Ltd 方位センサ
US6542342B1 (en) * 1998-11-30 2003-04-01 Nec Corporation Magnetoresistive effect transducer having longitudinal bias layer directly connected to free layer
JP3643823B2 (ja) * 2002-09-30 2005-04-27 株式会社東芝 磁気抵抗効果素子
JP3835447B2 (ja) * 2002-10-23 2006-10-18 ヤマハ株式会社 磁気センサ、同磁気センサの製造方法及び同製造方法に適したマグネットアレイ
JP2006245275A (ja) * 2005-03-03 2006-09-14 Alps Electric Co Ltd 磁気検出素子

Also Published As

Publication number Publication date
EP1514082A1 (en) 2005-03-16
NO20045350D0 (no) 2004-12-07
SE0201927D0 (sv) 2002-06-20
US20050242806A1 (en) 2005-11-03
US7282822B2 (en) 2007-10-16
EA009475B1 (ru) 2008-02-28
IL165774A0 (en) 2006-01-15
JP2005530173A (ja) 2005-10-06
KR20050016602A (ko) 2005-02-21
AU2003238987A1 (en) 2004-01-06
SE523321C2 (sv) 2004-04-13
CA2489171A1 (en) 2003-12-31
SE0201927L (sv) 2003-12-21
EA200401567A1 (ru) 2005-08-25
NO20045350L (no) 2005-02-04
NO329969B1 (no) 2011-01-31
KR101046539B1 (ko) 2011-07-06
MXPA04012921A (es) 2005-07-26
CN1662795A (zh) 2005-08-31
ZA200409956B (en) 2006-07-26
BR0312434A (pt) 2005-04-19
CN100489471C (zh) 2009-05-20
WO2004001353A1 (en) 2003-12-31
CA2489171C (en) 2011-12-13

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