SE518710C2 - Förfarande för att förbättra transistorprestanda samt transistoranordning och integrerad krets - Google Patents
Förfarande för att förbättra transistorprestanda samt transistoranordning och integrerad kretsInfo
- Publication number
- SE518710C2 SE518710C2 SE0002389A SE0002389A SE518710C2 SE 518710 C2 SE518710 C2 SE 518710C2 SE 0002389 A SE0002389 A SE 0002389A SE 0002389 A SE0002389 A SE 0002389A SE 518710 C2 SE518710 C2 SE 518710C2
- Authority
- SE
- Sweden
- Prior art keywords
- layer
- transistor
- doped
- antimony
- collector
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 34
- 229910001439 antimony ion Inorganic materials 0.000 claims abstract description 11
- 238000004519 manufacturing process Methods 0.000 claims abstract description 11
- 239000004065 semiconductor Substances 0.000 claims abstract description 6
- 239000000758 substrate Substances 0.000 claims abstract description 6
- 229910052787 antimony Inorganic materials 0.000 claims description 10
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 7
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 239000010703 silicon Substances 0.000 claims description 7
- 238000000151 deposition Methods 0.000 claims description 6
- 238000005468 ion implantation Methods 0.000 claims description 5
- 238000002513 implantation Methods 0.000 claims description 4
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 3
- 239000013078 crystal Substances 0.000 claims description 2
- 238000009413 insulation Methods 0.000 claims description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical class O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 229910052796 boron Inorganic materials 0.000 claims 1
- 238000011065 in-situ storage Methods 0.000 claims 1
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
- 238000002955 isolation Methods 0.000 abstract description 2
- 230000001133 acceleration Effects 0.000 description 18
- 230000008569 process Effects 0.000 description 12
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 8
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 7
- 229920005591 polysilicon Polymers 0.000 description 7
- 230000009977 dual effect Effects 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000000137 annealing Methods 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66234—Bipolar junction transistors [BJT]
- H01L29/66242—Heterojunction transistors [HBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/0821—Collector regions of bipolar transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
- H01L29/737—Hetero-junction transistors
- H01L29/7371—Vertical transistors
- H01L29/7378—Vertical transistors comprising lattice mismatched active layers, e.g. SiGe strained layer transistors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Bipolar Transistors (AREA)
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE0002389A SE518710C2 (sv) | 2000-06-26 | 2000-06-26 | Förfarande för att förbättra transistorprestanda samt transistoranordning och integrerad krets |
| TW089117381A TW504842B (en) | 2000-06-26 | 2000-08-28 | Transistor device and fabrication method thereof |
| EP01944020A EP1303872B1 (en) | 2000-06-26 | 2001-06-19 | High frequency transistor device with antimony implantation and fabrication method thereof |
| CNB01811833XA CN1244142C (zh) | 2000-06-26 | 2001-06-19 | 具有锑注入的高频晶体管器件及其制造方法 |
| AU2001266469A AU2001266469A1 (en) | 2000-06-26 | 2001-06-19 | High frequency transistor device with antimony implantation and fabrication method thereof |
| KR1020027017546A KR100770060B1 (ko) | 2000-06-26 | 2001-06-19 | 안티몬이 주입된 고주파 트랜지스터 장치 및 그 제조방법 |
| PCT/SE2001/001385 WO2002001623A1 (en) | 2000-06-26 | 2001-06-19 | High frequency transistor device with antimony implantation and fabrication method thereof |
| JP2002505670A JP2004502300A (ja) | 2000-06-26 | 2001-06-19 | アンチモニ注入による高周波トランジスタ装置及び製造方法 |
| US09/887,037 US6579773B2 (en) | 2000-06-26 | 2001-06-25 | Transistor device and fabrication method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE0002389A SE518710C2 (sv) | 2000-06-26 | 2000-06-26 | Förfarande för att förbättra transistorprestanda samt transistoranordning och integrerad krets |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| SE0002389D0 SE0002389D0 (sv) | 2000-06-26 |
| SE0002389L SE0002389L (sv) | 2001-12-27 |
| SE518710C2 true SE518710C2 (sv) | 2002-11-12 |
Family
ID=20280241
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE0002389A SE518710C2 (sv) | 2000-06-26 | 2000-06-26 | Förfarande för att förbättra transistorprestanda samt transistoranordning och integrerad krets |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6579773B2 (ko) |
| EP (1) | EP1303872B1 (ko) |
| JP (1) | JP2004502300A (ko) |
| KR (1) | KR100770060B1 (ko) |
| CN (1) | CN1244142C (ko) |
| AU (1) | AU2001266469A1 (ko) |
| SE (1) | SE518710C2 (ko) |
| TW (1) | TW504842B (ko) |
| WO (1) | WO2002001623A1 (ko) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020177253A1 (en) * | 2001-05-25 | 2002-11-28 | International Business Machines Corporation | Process for making a high voltage NPN Bipolar device with improved AC performance |
| US7038298B2 (en) * | 2003-06-24 | 2006-05-02 | International Business Machines Corporation | High fT and fmax bipolar transistor and method of making same |
| CN100433340C (zh) * | 2003-12-31 | 2008-11-12 | 天津大学 | 与深亚微米射频工艺兼容的硅光电探测器 |
| US9105677B2 (en) | 2013-10-22 | 2015-08-11 | International Business Machines Corporation | Base profile of self-aligned bipolar transistors for power amplifier applications |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH065677B2 (ja) * | 1984-04-16 | 1994-01-19 | ロ−ム株式会社 | 半導体装置の製造方法 |
| JPS61161761A (ja) * | 1985-01-10 | 1986-07-22 | Nec Corp | 半導体装置 |
| US4669179A (en) * | 1985-11-01 | 1987-06-02 | Advanced Micro Devices, Inc. | Integrated circuit fabrication process for forming a bipolar transistor having extrinsic base regions |
| JP2590236B2 (ja) * | 1987-10-07 | 1997-03-12 | 株式会社日立製作所 | 半導体装置 |
| JPH02234422A (ja) * | 1989-03-08 | 1990-09-17 | Sony Corp | オートドーピング抑制方法 |
| WO1993016494A1 (en) * | 1992-01-31 | 1993-08-19 | Analog Devices, Inc. | Complementary bipolar polysilicon emitter devices |
| US5581115A (en) * | 1994-10-07 | 1996-12-03 | National Semiconductor Corporation | Bipolar transistors using isolated selective doping to improve performance characteristics |
| US5719082A (en) * | 1995-08-25 | 1998-02-17 | Micron Technology, Inc. | Angled implant to improve high current operation of bipolar transistors |
| DE19617030C2 (de) * | 1996-04-27 | 1999-11-18 | Daimler Chrysler Ag | Si/SiGe-Heterobipolartransistor mit hochdotiertem SiGe-Spacer |
| JP3562611B2 (ja) * | 1996-11-05 | 2004-09-08 | ソニー株式会社 | 半導体装置及びその製造方法 |
| KR100253340B1 (ko) * | 1997-10-29 | 2000-04-15 | 김영환 | 모스 트랜지스터 제조방법 |
| FR2779573B1 (fr) * | 1998-06-05 | 2001-10-26 | St Microelectronics Sa | Transistor bipolaire vertical comportant une base extrinseque de rugosite reduite, et procede de fabrication |
| JP3727482B2 (ja) * | 1998-06-05 | 2005-12-14 | セイコーインスツル株式会社 | 半導体装置の製造方法 |
| FR2779571B1 (fr) * | 1998-06-05 | 2003-01-24 | St Microelectronics Sa | Procede de dopage selectif du collecteur intrinseque d'un transistor bipolaire vertical a base epitaxiee |
-
2000
- 2000-06-26 SE SE0002389A patent/SE518710C2/sv not_active IP Right Cessation
- 2000-08-28 TW TW089117381A patent/TW504842B/zh not_active IP Right Cessation
-
2001
- 2001-06-19 EP EP01944020A patent/EP1303872B1/en not_active Expired - Lifetime
- 2001-06-19 AU AU2001266469A patent/AU2001266469A1/en not_active Abandoned
- 2001-06-19 CN CNB01811833XA patent/CN1244142C/zh not_active Expired - Fee Related
- 2001-06-19 KR KR1020027017546A patent/KR100770060B1/ko not_active IP Right Cessation
- 2001-06-19 WO PCT/SE2001/001385 patent/WO2002001623A1/en active Application Filing
- 2001-06-19 JP JP2002505670A patent/JP2004502300A/ja active Pending
- 2001-06-25 US US09/887,037 patent/US6579773B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US20010055893A1 (en) | 2001-12-27 |
| JP2004502300A (ja) | 2004-01-22 |
| KR20030028490A (ko) | 2003-04-08 |
| EP1303872B1 (en) | 2012-12-19 |
| CN1439171A (zh) | 2003-08-27 |
| WO2002001623A1 (en) | 2002-01-03 |
| KR100770060B1 (ko) | 2007-10-24 |
| AU2001266469A1 (en) | 2002-01-08 |
| US6579773B2 (en) | 2003-06-17 |
| CN1244142C (zh) | 2006-03-01 |
| TW504842B (en) | 2002-10-01 |
| EP1303872A1 (en) | 2003-04-23 |
| SE0002389L (sv) | 2001-12-27 |
| SE0002389D0 (sv) | 2000-06-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| NUG | Patent has lapsed | ||
| NUG | Patent has lapsed |