SE514309C2 - Förfarande för att bestämma ytstruktur - Google Patents

Förfarande för att bestämma ytstruktur

Info

Publication number
SE514309C2
SE514309C2 SE9901978A SE9901978A SE514309C2 SE 514309 C2 SE514309 C2 SE 514309C2 SE 9901978 A SE9901978 A SE 9901978A SE 9901978 A SE9901978 A SE 9901978A SE 514309 C2 SE514309 C2 SE 514309C2
Authority
SE
Sweden
Prior art keywords
surface texture
profile
parameters
parameter
surface structure
Prior art date
Application number
SE9901978A
Other languages
English (en)
Swedish (sv)
Other versions
SE9901978D0 (sv
SE9901978L (sv
Inventor
Fredrik Palmquist
Matti Siivola
Bengt-Goeran Rosen
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE9901978A priority Critical patent/SE514309C2/sv
Publication of SE9901978D0 publication Critical patent/SE9901978D0/xx
Priority to JP2001500187A priority patent/JP2003500677A/ja
Priority to AU51185/00A priority patent/AU5118500A/en
Priority to DE10084637T priority patent/DE10084637T1/de
Priority to CN00808124.7A priority patent/CN1352741A/zh
Priority to PCT/SE2000/000935 priority patent/WO2000073733A1/en
Priority to MYPI20002121A priority patent/MY125929A/en
Priority to US09/577,477 priority patent/US6435014B1/en
Publication of SE9901978L publication Critical patent/SE9901978L/xx
Publication of SE514309C2 publication Critical patent/SE514309C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
SE9901978A 1999-05-28 1999-05-28 Förfarande för att bestämma ytstruktur SE514309C2 (sv)

Priority Applications (8)

Application Number Priority Date Filing Date Title
SE9901978A SE514309C2 (sv) 1999-05-28 1999-05-28 Förfarande för att bestämma ytstruktur
JP2001500187A JP2003500677A (ja) 1999-05-28 2000-05-11 表面テクスチャの測定方法
AU51185/00A AU5118500A (en) 1999-05-28 2000-05-11 Method for determination of surface texture
DE10084637T DE10084637T1 (de) 1999-05-28 2000-05-11 Verfahren zum Bestimmen von Oberflächentextur
CN00808124.7A CN1352741A (zh) 1999-05-28 2000-05-11 用于确定表面纹理的方法
PCT/SE2000/000935 WO2000073733A1 (en) 1999-05-28 2000-05-11 Method for determination of surface texture
MYPI20002121A MY125929A (en) 1999-05-28 2000-05-15 Method for determination of surface texture
US09/577,477 US6435014B1 (en) 1999-05-28 2000-05-25 Method for determination of surface texture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9901978A SE514309C2 (sv) 1999-05-28 1999-05-28 Förfarande för att bestämma ytstruktur

Publications (3)

Publication Number Publication Date
SE9901978D0 SE9901978D0 (sv) 1999-05-31
SE9901978L SE9901978L (sv) 2000-11-29
SE514309C2 true SE514309C2 (sv) 2001-02-05

Family

ID=20415807

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9901978A SE514309C2 (sv) 1999-05-28 1999-05-28 Förfarande för att bestämma ytstruktur

Country Status (8)

Country Link
US (1) US6435014B1 (ja)
JP (1) JP2003500677A (ja)
CN (1) CN1352741A (ja)
AU (1) AU5118500A (ja)
DE (1) DE10084637T1 (ja)
MY (1) MY125929A (ja)
SE (1) SE514309C2 (ja)
WO (1) WO2000073733A1 (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3632153B2 (ja) * 2000-11-06 2005-03-23 株式会社東京精密 粗さ測定方法及び粗さ測定装置
ES2235608B1 (es) * 2003-07-15 2006-11-01 Consejo Sup. De Invest. Cientificas Metodo optico y dispositivo para la cuantificacion de la textura en celulas fotovoltaicas.
JP4529562B2 (ja) * 2004-07-06 2010-08-25 横浜ゴム株式会社 接触特性の評価方法及び接触状態の評価用コンピュータプログラム
CN100480619C (zh) * 2005-10-31 2009-04-22 致茂电子股份有限公司 正交表面形貌图中任意截线方向形成截面轮廓的方法
FR2948764B1 (fr) * 2009-07-28 2011-08-26 Michelin Soc Tech Procede de prevision d'un bruit de roulement d'un pneumatique
FR2948765B1 (fr) 2009-07-28 2013-10-18 Michelin Soc Tech Procede de prevision d'un effet physique d'interaction entre un pneumatique et un revetement routier
JP5297546B1 (ja) * 2012-04-23 2013-09-25 三井金属鉱業株式会社 電極箔及び電子デバイス
JP6134317B2 (ja) * 2012-07-27 2017-05-24 三井金属鉱業株式会社 金属箔及び電子デバイス
JP6062533B2 (ja) 2013-03-29 2017-01-18 株式会社牧野フライス製作所 ワークの加工面評価方法、制御装置および工作機械
KR20160111512A (ko) * 2014-01-24 2016-09-26 도쿄엘렉트론가부시키가이샤 전방측 패터닝에 대한 조정을 결정하기 위한 후방측 기판 텍스처 맵을 발생시키는 시스템 및 방법
CN108036727A (zh) * 2017-12-12 2018-05-15 首钢集团有限公司 一种测量热镀锌板表面锌花尺寸的方法及装置
DE102019210476A1 (de) * 2019-07-16 2021-01-21 AUDI HUNGARIA Zrt. Verfahren zur Qualitätsbewertung eines Zahnrads und Steuereinrichtung
CN114812486B (zh) * 2022-05-13 2023-07-25 武汉理工大学 一种加工工件表面粗糙度的获取方法、装置及电子设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3112642A (en) * 1960-05-06 1963-12-03 Republic Steel Corp Apparatus for measuring surface roughness
US3505861A (en) * 1968-03-04 1970-04-14 Alloy Casting Inst Cast surface comparison standard
EP0518609A3 (en) * 1991-06-11 1993-02-03 Imperial Chemical Industries Plc Polymeric film
JPH07259000A (ja) * 1994-03-22 1995-10-09 Mitsubishi Paper Mills Ltd 印刷用積層シート及びそれに使用するクーリングロール
US5599393A (en) * 1995-04-25 1997-02-04 Macmillan Bloedel Limited Metering rod coaters
US5955654A (en) 1997-08-07 1999-09-21 Vlsi Standards, Inc. Calibration standard for microroughness measuring instruments

Also Published As

Publication number Publication date
AU5118500A (en) 2000-12-18
JP2003500677A (ja) 2003-01-07
CN1352741A (zh) 2002-06-05
WO2000073733A1 (en) 2000-12-07
SE9901978D0 (sv) 1999-05-31
SE9901978L (sv) 2000-11-29
DE10084637T1 (de) 2002-06-20
MY125929A (en) 2006-08-30
US6435014B1 (en) 2002-08-20

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