SE440415B - Forfarande och anordning for kalibrering av ett positioneringssystem - Google Patents

Forfarande och anordning for kalibrering av ett positioneringssystem

Info

Publication number
SE440415B
SE440415B SE8306347A SE8306347A SE440415B SE 440415 B SE440415 B SE 440415B SE 8306347 A SE8306347 A SE 8306347A SE 8306347 A SE8306347 A SE 8306347A SE 440415 B SE440415 B SE 440415B
Authority
SE
Sweden
Prior art keywords
detectors
control device
positioning device
sensor
actual value
Prior art date
Application number
SE8306347A
Other languages
English (en)
Swedish (sv)
Other versions
SE8306347L (sv
SE8306347D0 (sv
Inventor
G L Stridsberg
Original Assignee
Mydata Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mydata Ab filed Critical Mydata Ab
Priority to SE8306347A priority Critical patent/SE440415B/sv
Publication of SE8306347D0 publication Critical patent/SE8306347D0/xx
Priority to NO844482A priority patent/NO844482L/no
Priority to EP84850355A priority patent/EP0148138B1/de
Priority to FI844467A priority patent/FI844467A7/fi
Priority to AT84850355T priority patent/ATE36079T1/de
Priority to DE8484850355T priority patent/DE3473058D1/de
Priority to US06/671,685 priority patent/US4660981A/en
Priority to DK543884A priority patent/DK543884A/da
Priority to JP59242217A priority patent/JPS60169911A/ja
Priority to CA000467979A priority patent/CA1232658A/en
Priority to KR1019840007203A priority patent/KR890003031B1/ko
Publication of SE8306347L publication Critical patent/SE8306347L/
Publication of SE440415B publication Critical patent/SE440415B/sv

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D3/00—Control of position or direction
    • G05D3/12—Control of position or direction using feedback
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Position Or Direction (AREA)
  • Paper (AREA)
  • Vehicle Body Suspensions (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Automatic Control Of Machine Tools (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Control Of Turbines (AREA)
  • Earth Drilling (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Numerical Control (AREA)
SE8306347A 1983-11-17 1983-11-17 Forfarande och anordning for kalibrering av ett positioneringssystem SE440415B (sv)

Priority Applications (11)

Application Number Priority Date Filing Date Title
SE8306347A SE440415B (sv) 1983-11-17 1983-11-17 Forfarande och anordning for kalibrering av ett positioneringssystem
NO844482A NO844482L (no) 1983-11-17 1984-11-09 Fremgangsmaate og anordning for kalibrering av et posisjoneringssystem.
DE8484850355T DE3473058D1 (en) 1983-11-17 1984-11-14 Method and apparatus for calibrating a positioning system
AT84850355T ATE36079T1 (de) 1983-11-17 1984-11-14 Verfahren und anordnung zum eichen eines positioniersystems.
FI844467A FI844467A7 (fi) 1983-11-17 1984-11-14 Menetelmä ja laite asemointisysteemin kalibroimiseksi.
EP84850355A EP0148138B1 (de) 1983-11-17 1984-11-14 Verfahren und Anordnung zum Eichen eines Positioniersystems
US06/671,685 US4660981A (en) 1983-11-17 1984-11-15 Method and apparatus for calibrating a positioning system
DK543884A DK543884A (da) 1983-11-17 1984-11-15 Fremgangsmaade og anordning til kalibrering af et positioneringssystem
JP59242217A JPS60169911A (ja) 1983-11-17 1984-11-16 位置決め装置の検定法及び検定装置
CA000467979A CA1232658A (en) 1983-11-17 1984-11-16 Method and apparatus for calibrating a positioning system
KR1019840007203A KR890003031B1 (ko) 1983-11-17 1984-11-16 위치설정기의 캘리브레이팅 장치 및 그 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8306347A SE440415B (sv) 1983-11-17 1983-11-17 Forfarande och anordning for kalibrering av ett positioneringssystem

Publications (3)

Publication Number Publication Date
SE8306347D0 SE8306347D0 (sv) 1983-11-17
SE8306347L SE8306347L (sv) 1985-05-18
SE440415B true SE440415B (sv) 1985-07-29

Family

ID=20353371

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8306347A SE440415B (sv) 1983-11-17 1983-11-17 Forfarande och anordning for kalibrering av ett positioneringssystem

Country Status (11)

Country Link
US (1) US4660981A (de)
EP (1) EP0148138B1 (de)
JP (1) JPS60169911A (de)
KR (1) KR890003031B1 (de)
AT (1) ATE36079T1 (de)
CA (1) CA1232658A (de)
DE (1) DE3473058D1 (de)
DK (1) DK543884A (de)
FI (1) FI844467A7 (de)
NO (1) NO844482L (de)
SE (1) SE440415B (de)

Families Citing this family (25)

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US4939678A (en) * 1987-11-19 1990-07-03 Brown & Sharpe Manufacturing Company Method for calibration of coordinate measuring machine
US4867566A (en) * 1988-03-07 1989-09-19 The Gerber Scientific Instrument Company Method and apparatus for calibrating artwork from a direct imaging system
US5059359A (en) * 1988-04-18 1991-10-22 3 D Systems, Inc. Methods and apparatus for production of three-dimensional objects by stereolithography
US5267013A (en) * 1988-04-18 1993-11-30 3D Systems, Inc. Apparatus and method for profiling a beam
US5495328A (en) * 1988-04-18 1996-02-27 3D Systems, Inc. Apparatus and method for calibrating and normalizing a stereolithographic apparatus
ATE208702T1 (de) * 1988-04-18 2001-11-15 3D Systems Inc Profilierung eines strahlungsbündels für stereolithographie
US4918284A (en) * 1988-10-14 1990-04-17 Teradyne Laser Systems, Inc. Calibrating laser trimming apparatus
GB9004006D0 (en) * 1990-02-22 1990-04-18 Danbury Richard N Point-to-point positioning of loads
GB2273176B (en) * 1990-02-22 1994-12-14 British Tech Group Improvements in or relating to actuator control
DE4315105C1 (de) * 1993-05-06 1994-09-01 Sick Optik Elektronik Erwin Verfahren und Anordnung zum Winkeljustieren einer Linienabtastvorrichtung
US5574479A (en) * 1994-01-07 1996-11-12 Selectech, Ltd. Optical system for determining the roll orientation of a remote unit relative to a base unit
US5631731A (en) * 1994-03-09 1997-05-20 Nikon Precision, Inc. Method and apparatus for aerial image analyzer
US5959286A (en) * 1994-05-18 1999-09-28 Symbol Technologies, Inc. Method and apparatus for raster scanning of images
DE19703382C2 (de) * 1997-01-30 2000-10-05 Fraunhofer Ges Forschung Scanner zum Erfassen eines Objekts
US5986748A (en) * 1998-08-21 1999-11-16 Seh America Inc Dual beam alignment device and method
DE19918613A1 (de) * 1999-04-23 2000-11-30 Eos Electro Optical Syst Verfahren zur Kalibrierung einer Vorrichtung zum Herstellen eines dreidimensionalen Objektes, Kalibrierungsvorrichtung und Verfahren und Vorrichtung zur Herstellung eines dreidimensionalen Objektes
WO2011019669A1 (en) * 2009-08-09 2011-02-17 Rolls-Royce Corporation Method and apparatus for calibrating a projected image manufacturing device
BE1024052B1 (nl) * 2013-12-03 2017-11-08 Layerwise N.V. Werkwijze en inrichting voor het kalibreren van meerdere energiestralen voor het additief vervaardigen van een object
EP3461622A1 (de) 2014-11-24 2019-04-03 Additive Industries B.V. Vorrichtung und verfahren zur herstellung eines objekts mittels generativer fertigung
EP3241668B1 (de) 2016-05-04 2019-07-10 SLM Solutions Group AG Vorrichtung und verfahren zur kalibrierung eines bestrahlungssystems einer vorrichtung zur herstellung eines dreidimensionalen werkstücks
US10953470B2 (en) * 2016-08-31 2021-03-23 Raytheon Technologies Corporation Scanning mirror navigation apparatus and method
US12151309B1 (en) 2019-01-31 2024-11-26 Freeform Future Corp. Clustered laser-beam steering for metal additive manufacturing using powder-bed fusion
JP7165603B2 (ja) * 2019-03-04 2022-11-04 三菱重工業株式会社 積層体成形装置の校正部材、積層体成形装置及び積層体成形方法
DE102020122670A1 (de) 2020-08-31 2022-03-03 Jenoptik Optical Systems Gmbh Materialbearbeitungsvorrichtung und Verfahren zum Betreiben einer Materialbearbeitungsvorrichtung
DE102021103493C5 (de) 2021-02-15 2024-08-22 Novanta Europe Gmbh Verfahren für eine Scanfeldkorrektur mindestens einer Laserscannervorrichtung, Laserscannervorrichtung, Streumusterelement, Streumusterhaltevorrichtung und Scanfeldkorrektursystem

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2143011A (en) * 1936-10-07 1939-01-10 Juhasz Kalman John De Optical indicator
US2880512A (en) * 1953-05-26 1959-04-07 Mullard Radio Valve Co Ltd Measuring apparatus
US3727055A (en) * 1970-09-24 1973-04-10 Gen Electric Optical positioning system
US4082463A (en) * 1977-01-06 1978-04-04 Systems Research Laboratories, Inc. Calibrated optical micrometer
JPS5430854A (en) * 1977-08-12 1979-03-07 Canon Inc Two-dimensional scanner
JPS5858681B2 (ja) * 1978-04-22 1983-12-27 ファナック株式会社 位置誤差補正方式
US4216378A (en) * 1978-10-10 1980-08-05 The Mead Corporation Optical scanner
JPS5596917A (en) * 1979-01-17 1980-07-23 Canon Inc Two-dimensional scanner
JPS5619025A (en) * 1979-07-26 1981-02-23 Fuji Photo Film Co Ltd Correcting device for scanning line interval in light beam recorder
JPS5744122A (en) * 1980-08-28 1982-03-12 Mitsubishi Electric Corp Liquid-crystal injection device
GB2088086B (en) * 1980-11-19 1984-05-10 Marconi Co Ltd Apparatus for accurately moving a body in accordance with a predetermined motion
DE3046584C2 (de) * 1980-12-11 1984-03-15 Dr.-Ing. Rudolf Hell Gmbh, 2300 Kiel Optisch-mechanischer Abtaster
JPS58155410A (ja) * 1982-03-12 1983-09-16 Hitachi Ltd 数値制御装置

Also Published As

Publication number Publication date
SE8306347L (sv) 1985-05-18
KR850003803A (ko) 1985-06-26
NO844482L (no) 1985-05-20
EP0148138B1 (de) 1988-07-27
FI844467L (fi) 1985-05-18
JPS60169911A (ja) 1985-09-03
DK543884A (da) 1985-05-18
DK543884D0 (da) 1984-11-15
CA1232658A (en) 1988-02-09
EP0148138A1 (de) 1985-07-10
SE8306347D0 (sv) 1983-11-17
KR890003031B1 (ko) 1989-08-19
FI844467A0 (fi) 1984-11-14
FI844467A7 (fi) 1985-05-18
DE3473058D1 (en) 1988-09-01
US4660981A (en) 1987-04-28
ATE36079T1 (de) 1988-08-15

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