FI844467A0 - Foerfarande och anordning foer kalibrering av ett positioneringssystem. - Google Patents

Foerfarande och anordning foer kalibrering av ett positioneringssystem.

Info

Publication number
FI844467A0
FI844467A0 FI844467A FI844467A FI844467A0 FI 844467 A0 FI844467 A0 FI 844467A0 FI 844467 A FI844467 A FI 844467A FI 844467 A FI844467 A FI 844467A FI 844467 A0 FI844467 A0 FI 844467A0
Authority
FI
Finland
Prior art keywords
positioning apparatus
positioneringssystem
kalibrering
ett
control means
Prior art date
Application number
FI844467A
Other languages
English (en)
Other versions
FI844467L (fi
Inventor
Lennart Stridsberg
Original Assignee
Mydata Ab
Uic Nordic Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mydata Ab, Uic Nordic Ab filed Critical Mydata Ab
Publication of FI844467A0 publication Critical patent/FI844467A0/fi
Publication of FI844467L publication Critical patent/FI844467L/fi

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D3/00—Control of position or direction
    • G05D3/12—Control of position or direction using feedback
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Position Or Direction (AREA)
  • Paper (AREA)
  • Automatic Control Of Machine Tools (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Vehicle Body Suspensions (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Control Of Turbines (AREA)
  • Earth Drilling (AREA)
  • Numerical Control (AREA)
FI844467A 1983-11-17 1984-11-14 Foerfarande och anordning foer kalibrering av ett positioneringssystem. FI844467L (fi)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8306347A SE440415B (sv) 1983-11-17 1983-11-17 Forfarande och anordning for kalibrering av ett positioneringssystem

Publications (2)

Publication Number Publication Date
FI844467A0 true FI844467A0 (fi) 1984-11-14
FI844467L FI844467L (fi) 1985-05-18

Family

ID=20353371

Family Applications (1)

Application Number Title Priority Date Filing Date
FI844467A FI844467L (fi) 1983-11-17 1984-11-14 Foerfarande och anordning foer kalibrering av ett positioneringssystem.

Country Status (11)

Country Link
US (1) US4660981A (fi)
EP (1) EP0148138B1 (fi)
JP (1) JPS60169911A (fi)
KR (1) KR890003031B1 (fi)
AT (1) ATE36079T1 (fi)
CA (1) CA1232658A (fi)
DE (1) DE3473058D1 (fi)
DK (1) DK543884A (fi)
FI (1) FI844467L (fi)
NO (1) NO844482L (fi)
SE (1) SE440415B (fi)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4939678A (en) * 1987-11-19 1990-07-03 Brown & Sharpe Manufacturing Company Method for calibration of coordinate measuring machine
US4867566A (en) * 1988-03-07 1989-09-19 The Gerber Scientific Instrument Company Method and apparatus for calibrating artwork from a direct imaging system
US5267013A (en) * 1988-04-18 1993-11-30 3D Systems, Inc. Apparatus and method for profiling a beam
US5059359A (en) * 1988-04-18 1991-10-22 3 D Systems, Inc. Methods and apparatus for production of three-dimensional objects by stereolithography
US5495328A (en) * 1988-04-18 1996-02-27 3D Systems, Inc. Apparatus and method for calibrating and normalizing a stereolithographic apparatus
DE68928485T2 (de) * 1988-04-18 1998-07-02 3D Systems Inc Profilierung eines Strahlungsbündels für Stereolithographie
US4918284A (en) * 1988-10-14 1990-04-17 Teradyne Laser Systems, Inc. Calibrating laser trimming apparatus
GB9004006D0 (en) * 1990-02-22 1990-04-18 Danbury Richard N Point-to-point positioning of loads
GB2273176B (en) * 1990-02-22 1994-12-14 British Tech Group Improvements in or relating to actuator control
DE4315105C1 (de) * 1993-05-06 1994-09-01 Sick Optik Elektronik Erwin Verfahren und Anordnung zum Winkeljustieren einer Linienabtastvorrichtung
US5574479A (en) * 1994-01-07 1996-11-12 Selectech, Ltd. Optical system for determining the roll orientation of a remote unit relative to a base unit
US5631731A (en) * 1994-03-09 1997-05-20 Nikon Precision, Inc. Method and apparatus for aerial image analyzer
US5959286A (en) * 1994-05-18 1999-09-28 Symbol Technologies, Inc. Method and apparatus for raster scanning of images
DE19703382C2 (de) * 1997-01-30 2000-10-05 Fraunhofer Ges Forschung Scanner zum Erfassen eines Objekts
US5986748A (en) * 1998-08-21 1999-11-16 Seh America Inc Dual beam alignment device and method
DE19918613A1 (de) * 1999-04-23 2000-11-30 Eos Electro Optical Syst Verfahren zur Kalibrierung einer Vorrichtung zum Herstellen eines dreidimensionalen Objektes, Kalibrierungsvorrichtung und Verfahren und Vorrichtung zur Herstellung eines dreidimensionalen Objektes
US9541844B2 (en) * 2009-08-09 2017-01-10 Rolls-Royce Corporation Method and apparatus for calibrating a projected image manufacturing device
BE1024052B1 (nl) 2013-12-03 2017-11-08 Layerwise N.V. Werkwijze en inrichting voor het kalibreren van meerdere energiestralen voor het additief vervaardigen van een object
CN110757796B (zh) 2014-11-24 2022-10-11 添加剂工业有限公司 用于通过增材制造生产物品的设备和方法
EP3241668B1 (en) 2016-05-04 2019-07-10 SLM Solutions Group AG Device and method for calibrating an irradiation system of an apparatus for producing a three-dimensional work piece
US10953470B2 (en) * 2016-08-31 2021-03-23 Raytheon Technologies Corporation Scanning mirror navigation apparatus and method
US11839914B1 (en) 2019-01-31 2023-12-12 Freeform Future Corp. Process monitoring and feedback for metal additive manufacturing using powder-bed fusion
DE102020122670A1 (de) 2020-08-31 2022-03-03 Jenoptik Optical Systems Gmbh Materialbearbeitungsvorrichtung und Verfahren zum Betreiben einer Materialbearbeitungsvorrichtung
DE102021103493C5 (de) 2021-02-15 2024-08-22 Novanta Europe Gmbh Verfahren für eine Scanfeldkorrektur mindestens einer Laserscannervorrichtung, Laserscannervorrichtung, Streumusterelement, Streumusterhaltevorrichtung und Scanfeldkorrektursystem

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2143011A (en) * 1936-10-07 1939-01-10 Juhasz Kalman John De Optical indicator
US2880512A (en) * 1953-05-26 1959-04-07 Mullard Radio Valve Co Ltd Measuring apparatus
US3727055A (en) * 1970-09-24 1973-04-10 Gen Electric Optical positioning system
US4082463A (en) * 1977-01-06 1978-04-04 Systems Research Laboratories, Inc. Calibrated optical micrometer
JPS5430854A (en) * 1977-08-12 1979-03-07 Canon Inc Two-dimensional scanner
JPS5858681B2 (ja) * 1978-04-22 1983-12-27 ファナック株式会社 位置誤差補正方式
US4216378A (en) * 1978-10-10 1980-08-05 The Mead Corporation Optical scanner
JPS5596917A (en) * 1979-01-17 1980-07-23 Canon Inc Two-dimensional scanner
JPS5619025A (en) * 1979-07-26 1981-02-23 Fuji Photo Film Co Ltd Correcting device for scanning line interval in light beam recorder
JPS5744122A (en) * 1980-08-28 1982-03-12 Mitsubishi Electric Corp Liquid-crystal injection device
GB2088086B (en) * 1980-11-19 1984-05-10 Marconi Co Ltd Apparatus for accurately moving a body in accordance with a predetermined motion
DE3046584C2 (de) * 1980-12-11 1984-03-15 Dr.-Ing. Rudolf Hell Gmbh, 2300 Kiel Optisch-mechanischer Abtaster
JPS58155410A (ja) * 1982-03-12 1983-09-16 Hitachi Ltd 数値制御装置

Also Published As

Publication number Publication date
SE8306347D0 (sv) 1983-11-17
ATE36079T1 (de) 1988-08-15
NO844482L (no) 1985-05-20
CA1232658A (en) 1988-02-09
KR850003803A (ko) 1985-06-26
DE3473058D1 (en) 1988-09-01
KR890003031B1 (ko) 1989-08-19
SE8306347L (sv) 1985-05-18
US4660981A (en) 1987-04-28
EP0148138A1 (en) 1985-07-10
FI844467L (fi) 1985-05-18
SE440415B (sv) 1985-07-29
JPS60169911A (ja) 1985-09-03
EP0148138B1 (en) 1988-07-27
DK543884A (da) 1985-05-18
DK543884D0 (da) 1984-11-15

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Legal Events

Date Code Title Description
FD Application lapsed

Owner name: UIC NORDIC AB

Owner name: MYDATA AB