ATE36079T1 - Verfahren und anordnung zum eichen eines positioniersystems. - Google Patents

Verfahren und anordnung zum eichen eines positioniersystems.

Info

Publication number
ATE36079T1
ATE36079T1 AT84850355T AT84850355T ATE36079T1 AT E36079 T1 ATE36079 T1 AT E36079T1 AT 84850355 T AT84850355 T AT 84850355T AT 84850355 T AT84850355 T AT 84850355T AT E36079 T1 ATE36079 T1 AT E36079T1
Authority
AT
Austria
Prior art keywords
positioning apparatus
control means
actual value
value signal
operating area
Prior art date
Application number
AT84850355T
Other languages
English (en)
Inventor
Lennart Stridsberg
Original Assignee
Mydata Ab
Uic Nordic Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mydata Ab, Uic Nordic Ab filed Critical Mydata Ab
Application granted granted Critical
Publication of ATE36079T1 publication Critical patent/ATE36079T1/de

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D3/00—Control of position or direction
    • G05D3/12—Control of position or direction using feedback
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Position Or Direction (AREA)
  • Paper (AREA)
  • Vehicle Body Suspensions (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Automatic Control Of Machine Tools (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Control Of Turbines (AREA)
  • Earth Drilling (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Numerical Control (AREA)
AT84850355T 1983-11-17 1984-11-14 Verfahren und anordnung zum eichen eines positioniersystems. ATE36079T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE8306347A SE440415B (sv) 1983-11-17 1983-11-17 Forfarande och anordning for kalibrering av ett positioneringssystem
EP84850355A EP0148138B1 (de) 1983-11-17 1984-11-14 Verfahren und Anordnung zum Eichen eines Positioniersystems

Publications (1)

Publication Number Publication Date
ATE36079T1 true ATE36079T1 (de) 1988-08-15

Family

ID=20353371

Family Applications (1)

Application Number Title Priority Date Filing Date
AT84850355T ATE36079T1 (de) 1983-11-17 1984-11-14 Verfahren und anordnung zum eichen eines positioniersystems.

Country Status (11)

Country Link
US (1) US4660981A (de)
EP (1) EP0148138B1 (de)
JP (1) JPS60169911A (de)
KR (1) KR890003031B1 (de)
AT (1) ATE36079T1 (de)
CA (1) CA1232658A (de)
DE (1) DE3473058D1 (de)
DK (1) DK543884A (de)
FI (1) FI844467A7 (de)
NO (1) NO844482L (de)
SE (1) SE440415B (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4939678A (en) * 1987-11-19 1990-07-03 Brown & Sharpe Manufacturing Company Method for calibration of coordinate measuring machine
US4867566A (en) * 1988-03-07 1989-09-19 The Gerber Scientific Instrument Company Method and apparatus for calibrating artwork from a direct imaging system
US5059359A (en) * 1988-04-18 1991-10-22 3 D Systems, Inc. Methods and apparatus for production of three-dimensional objects by stereolithography
US5267013A (en) * 1988-04-18 1993-11-30 3D Systems, Inc. Apparatus and method for profiling a beam
US5495328A (en) * 1988-04-18 1996-02-27 3D Systems, Inc. Apparatus and method for calibrating and normalizing a stereolithographic apparatus
ATE208702T1 (de) * 1988-04-18 2001-11-15 3D Systems Inc Profilierung eines strahlungsbündels für stereolithographie
US4918284A (en) * 1988-10-14 1990-04-17 Teradyne Laser Systems, Inc. Calibrating laser trimming apparatus
GB9004006D0 (en) * 1990-02-22 1990-04-18 Danbury Richard N Point-to-point positioning of loads
GB2273176B (en) * 1990-02-22 1994-12-14 British Tech Group Improvements in or relating to actuator control
DE4315105C1 (de) * 1993-05-06 1994-09-01 Sick Optik Elektronik Erwin Verfahren und Anordnung zum Winkeljustieren einer Linienabtastvorrichtung
US5574479A (en) * 1994-01-07 1996-11-12 Selectech, Ltd. Optical system for determining the roll orientation of a remote unit relative to a base unit
US5631731A (en) * 1994-03-09 1997-05-20 Nikon Precision, Inc. Method and apparatus for aerial image analyzer
US5959286A (en) * 1994-05-18 1999-09-28 Symbol Technologies, Inc. Method and apparatus for raster scanning of images
DE19703382C2 (de) * 1997-01-30 2000-10-05 Fraunhofer Ges Forschung Scanner zum Erfassen eines Objekts
US5986748A (en) * 1998-08-21 1999-11-16 Seh America Inc Dual beam alignment device and method
DE19918613A1 (de) * 1999-04-23 2000-11-30 Eos Electro Optical Syst Verfahren zur Kalibrierung einer Vorrichtung zum Herstellen eines dreidimensionalen Objektes, Kalibrierungsvorrichtung und Verfahren und Vorrichtung zur Herstellung eines dreidimensionalen Objektes
WO2011019669A1 (en) * 2009-08-09 2011-02-17 Rolls-Royce Corporation Method and apparatus for calibrating a projected image manufacturing device
BE1024052B1 (nl) * 2013-12-03 2017-11-08 Layerwise N.V. Werkwijze en inrichting voor het kalibreren van meerdere energiestralen voor het additief vervaardigen van een object
EP3461622A1 (de) 2014-11-24 2019-04-03 Additive Industries B.V. Vorrichtung und verfahren zur herstellung eines objekts mittels generativer fertigung
EP3241668B1 (de) 2016-05-04 2019-07-10 SLM Solutions Group AG Vorrichtung und verfahren zur kalibrierung eines bestrahlungssystems einer vorrichtung zur herstellung eines dreidimensionalen werkstücks
US10953470B2 (en) * 2016-08-31 2021-03-23 Raytheon Technologies Corporation Scanning mirror navigation apparatus and method
US12151309B1 (en) 2019-01-31 2024-11-26 Freeform Future Corp. Clustered laser-beam steering for metal additive manufacturing using powder-bed fusion
JP7165603B2 (ja) * 2019-03-04 2022-11-04 三菱重工業株式会社 積層体成形装置の校正部材、積層体成形装置及び積層体成形方法
DE102020122670A1 (de) 2020-08-31 2022-03-03 Jenoptik Optical Systems Gmbh Materialbearbeitungsvorrichtung und Verfahren zum Betreiben einer Materialbearbeitungsvorrichtung
DE102021103493C5 (de) 2021-02-15 2024-08-22 Novanta Europe Gmbh Verfahren für eine Scanfeldkorrektur mindestens einer Laserscannervorrichtung, Laserscannervorrichtung, Streumusterelement, Streumusterhaltevorrichtung und Scanfeldkorrektursystem

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Publication number Priority date Publication date Assignee Title
US2143011A (en) * 1936-10-07 1939-01-10 Juhasz Kalman John De Optical indicator
US2880512A (en) * 1953-05-26 1959-04-07 Mullard Radio Valve Co Ltd Measuring apparatus
US3727055A (en) * 1970-09-24 1973-04-10 Gen Electric Optical positioning system
US4082463A (en) * 1977-01-06 1978-04-04 Systems Research Laboratories, Inc. Calibrated optical micrometer
JPS5430854A (en) * 1977-08-12 1979-03-07 Canon Inc Two-dimensional scanner
JPS5858681B2 (ja) * 1978-04-22 1983-12-27 ファナック株式会社 位置誤差補正方式
US4216378A (en) * 1978-10-10 1980-08-05 The Mead Corporation Optical scanner
JPS5596917A (en) * 1979-01-17 1980-07-23 Canon Inc Two-dimensional scanner
JPS5619025A (en) * 1979-07-26 1981-02-23 Fuji Photo Film Co Ltd Correcting device for scanning line interval in light beam recorder
JPS5744122A (en) * 1980-08-28 1982-03-12 Mitsubishi Electric Corp Liquid-crystal injection device
GB2088086B (en) * 1980-11-19 1984-05-10 Marconi Co Ltd Apparatus for accurately moving a body in accordance with a predetermined motion
DE3046584C2 (de) * 1980-12-11 1984-03-15 Dr.-Ing. Rudolf Hell Gmbh, 2300 Kiel Optisch-mechanischer Abtaster
JPS58155410A (ja) * 1982-03-12 1983-09-16 Hitachi Ltd 数値制御装置

Also Published As

Publication number Publication date
SE8306347L (sv) 1985-05-18
KR850003803A (ko) 1985-06-26
NO844482L (no) 1985-05-20
EP0148138B1 (de) 1988-07-27
FI844467L (fi) 1985-05-18
JPS60169911A (ja) 1985-09-03
DK543884A (da) 1985-05-18
DK543884D0 (da) 1984-11-15
CA1232658A (en) 1988-02-09
EP0148138A1 (de) 1985-07-10
SE8306347D0 (sv) 1983-11-17
KR890003031B1 (ko) 1989-08-19
FI844467A0 (fi) 1984-11-14
FI844467A7 (fi) 1985-05-18
DE3473058D1 (en) 1988-09-01
US4660981A (en) 1987-04-28
SE440415B (sv) 1985-07-29

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