SE0103279L - Förfarande för mätning av ljusspridning och geometrisk profil - Google Patents
Förfarande för mätning av ljusspridning och geometrisk profilInfo
- Publication number
- SE0103279L SE0103279L SE0103279A SE0103279A SE0103279L SE 0103279 L SE0103279 L SE 0103279L SE 0103279 A SE0103279 A SE 0103279A SE 0103279 A SE0103279 A SE 0103279A SE 0103279 L SE0103279 L SE 0103279L
- Authority
- SE
- Sweden
- Prior art keywords
- designed
- movement
- measuring system
- light source
- light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/46—Wood
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
- G01N21/8986—Wood
Landscapes
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Wood Science & Technology (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Textile Engineering (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Medicinal Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Food Science & Technology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Paper (AREA)
Priority Applications (11)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0103279A SE0103279L (sv) | 2001-10-02 | 2001-10-02 | Förfarande för mätning av ljusspridning och geometrisk profil |
EP02803136.7A EP1432961B2 (en) | 2001-10-02 | 2002-10-01 | Method and arrangement in a measuring system |
CA002456163A CA2456163C (en) | 2001-10-02 | 2002-10-01 | Method and arrangement in a measuring system |
AT02803136T ATE347683T1 (de) | 2001-10-02 | 2002-10-01 | Verfahren und anordnung in einem messsystem |
DK02803136.7T DK1432961T4 (en) | 2001-10-02 | 2002-10-01 | Method and arrangement of a measuring system |
DE60216623.3T DE60216623T3 (de) | 2001-10-02 | 2002-10-01 | Verfahren und anordnung in einem messsystem |
JP2003544416A JP2005524828A (ja) | 2001-10-02 | 2002-10-01 | 測定システムにおける方法と装置 |
ES02803136T ES2274125T5 (es) | 2001-10-02 | 2002-10-01 | Método y dispositivo de un sistema de medición |
PCT/SE2002/001791 WO2003042631A1 (en) | 2001-10-02 | 2002-10-01 | Method and arrangement in a measuring system |
CNB028180283A CN100397036C (zh) | 2001-10-02 | 2002-10-01 | 测量系统中的方法和装置 |
US10/774,948 US8923599B2 (en) | 2001-10-02 | 2004-02-10 | Method and arrangement in a measuring system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0103279A SE0103279L (sv) | 2001-10-02 | 2001-10-02 | Förfarande för mätning av ljusspridning och geometrisk profil |
Publications (2)
Publication Number | Publication Date |
---|---|
SE0103279D0 SE0103279D0 (sv) | 2001-10-02 |
SE0103279L true SE0103279L (sv) | 2003-04-03 |
Family
ID=20285521
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0103279A SE0103279L (sv) | 2001-10-02 | 2001-10-02 | Förfarande för mätning av ljusspridning och geometrisk profil |
Country Status (11)
Country | Link |
---|---|
US (1) | US8923599B2 (sv) |
EP (1) | EP1432961B2 (sv) |
JP (1) | JP2005524828A (sv) |
CN (1) | CN100397036C (sv) |
AT (1) | ATE347683T1 (sv) |
CA (1) | CA2456163C (sv) |
DE (1) | DE60216623T3 (sv) |
DK (1) | DK1432961T4 (sv) |
ES (1) | ES2274125T5 (sv) |
SE (1) | SE0103279L (sv) |
WO (1) | WO2003042631A1 (sv) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE526617C2 (sv) * | 2003-10-01 | 2005-10-18 | Sick Ivp Ab | System och metod för att avbilda ett objekts egenskaper |
US8111904B2 (en) | 2005-10-07 | 2012-02-07 | Cognex Technology And Investment Corp. | Methods and apparatus for practical 3D vision system |
US8131008B2 (en) * | 2007-01-31 | 2012-03-06 | Building Component Verification Systems, Inc. | Methods, apparatuses, and systems for image-based measurement and inspection of pre-engineered structural components |
EP1985969B1 (en) * | 2007-04-26 | 2017-10-25 | Sick IVP AB | Method and apparatus for determining the amount of scattered light in a maschine vision system |
US8126260B2 (en) * | 2007-05-29 | 2012-02-28 | Cognex Corporation | System and method for locating a three-dimensional object using machine vision |
US9734419B1 (en) | 2008-12-30 | 2017-08-15 | Cognex Corporation | System and method for validating camera calibration in a vision system |
US9533418B2 (en) | 2009-05-29 | 2017-01-03 | Cognex Corporation | Methods and apparatus for practical 3D vision system |
US9393694B2 (en) | 2010-05-14 | 2016-07-19 | Cognex Corporation | System and method for robust calibration between a machine vision system and a robot |
US8670029B2 (en) * | 2010-06-16 | 2014-03-11 | Microsoft Corporation | Depth camera illuminator with superluminescent light-emitting diode |
US9124873B2 (en) | 2010-12-08 | 2015-09-01 | Cognex Corporation | System and method for finding correspondence between cameras in a three-dimensional vision system |
EE05696B1 (et) | 2011-01-20 | 2013-12-16 | Visiometric Oü | Liinilaseril p?hinevate skannerite töö parandamise tehniline lahendus ja meetod selle teostamiseks |
EP2985992A1 (en) | 2014-08-13 | 2016-02-17 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Apparatus and method for providing an image |
DE102016106994A1 (de) | 2016-04-15 | 2017-10-19 | ATB Blank GmbH | Laserscanvorrichtung zur optischen Qualitätsbeurteilung und Vermessung von Objekten im Quertransport |
US10274311B2 (en) | 2016-10-19 | 2019-04-30 | Columbia Insurance Company | Three dimensional laser measurement device for quality control measurements |
US10445893B2 (en) * | 2017-03-10 | 2019-10-15 | Microsoft Technology Licensing, Llc | Dot-based time of flight |
CN110220479A (zh) * | 2019-07-16 | 2019-09-10 | 深圳数马电子技术有限公司 | 非接触式钥匙齿形学习的方法及系统 |
DE102021116495A1 (de) | 2021-06-25 | 2022-12-29 | Ford Global Technologies, Llc | Verfahren und Vorrichtung zum Überprüfen einer Verbindung während eines Laser-basierten Verbindungsverfahrens |
Family Cites Families (33)
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JPS5034431B1 (sv) * | 1969-03-01 | 1975-11-08 | ||
US4209852A (en) * | 1974-11-11 | 1980-06-24 | Hyatt Gilbert P | Signal processing and memory arrangement |
GB1488841A (en) * | 1974-01-18 | 1977-10-12 | Plessey Co Ltd | Optical detection apparatus |
US4188544A (en) * | 1977-08-22 | 1980-02-12 | Weyerhaeuser Company | Method and apparatus for automatically processing a workpiece employing calibrated scanning |
US4168489A (en) * | 1978-02-13 | 1979-09-18 | Lexitron Corp. | Full page mode system for certain word processing devices |
IT1204492B (it) * | 1986-03-21 | 1989-03-01 | Cremona Lorenzo | Sistema per il rilevamento e l'eliminazione di difetti presenti in manufatti in lavorazione,in particolare pannelli di legno con cricche e ripieghi che devono essere stuccati |
US4826299A (en) * | 1987-01-30 | 1989-05-02 | Canadian Patents And Development Limited | Linear deiverging lens |
SE466420B (sv) | 1989-11-14 | 1992-02-10 | Svenska Traeforskningsinst | Foerfarande och anordning foer detektering av bark samt bestaemning av barkningsgrad paa ved eller i flis |
JP2523222B2 (ja) | 1989-12-08 | 1996-08-07 | ゼロックス コーポレーション | 画像縮小/拡大方法及び装置 |
US5233191A (en) * | 1990-04-02 | 1993-08-03 | Hitachi, Ltd. | Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process |
US5327254A (en) * | 1992-02-19 | 1994-07-05 | Daher Mohammad A | Method and apparatus for compressing and decompressing image data |
JP3231383B2 (ja) | 1992-03-18 | 2001-11-19 | キヤノン株式会社 | 棒状超音波モーターおよびモーター保持固定装置 |
GB2274181B (en) * | 1993-01-09 | 1997-04-02 | Digital Equipment Int | Summation unit |
US5347311A (en) * | 1993-05-28 | 1994-09-13 | Intel Corporation | Method and apparatus for unevenly encoding error images |
SE501650C2 (sv) † | 1994-03-08 | 1995-04-03 | Soliton Elektronik Ab | Anordning och förfarande för detektering av defekter i virke |
NZ270892A (en) * | 1994-08-24 | 1997-01-29 | Us Natural Resources | Detecting lumber defects utilizing optical pattern recognition algorithm |
US5831748A (en) * | 1994-12-19 | 1998-11-03 | Minolta Co., Ltd. | Image processor |
US5644392A (en) * | 1995-09-12 | 1997-07-01 | U.S. Natural Resources, Inc. | Scanning system for lumber |
JPH09190372A (ja) | 1995-09-29 | 1997-07-22 | Sony Corp | 情報管理装置および方法 |
US6382515B1 (en) * | 1995-12-18 | 2002-05-07 | Metrologic Instruments, Inc. | Automated system and method for identifying and measuring packages transported through a laser scanning tunnel |
US20020014533A1 (en) * | 1995-12-18 | 2002-02-07 | Xiaxun Zhu | Automated object dimensioning system employing contour tracing, vertice detection, and forner point detection and reduction methods on 2-d range data maps |
US6064747A (en) * | 1997-05-13 | 2000-05-16 | Axxess Technologies, Inc. | Method and apparatus for using light to identify a key |
US6037579A (en) * | 1997-11-13 | 2000-03-14 | Biophotonics Information Laboratories, Ltd. | Optical interferometer employing multiple detectors to detect spatially distorted wavefront in imaging of scattering media |
US6094269A (en) * | 1997-12-31 | 2000-07-25 | Metroptic Technologies, Ltd. | Apparatus and method for optically measuring an object surface contour |
US6097849A (en) * | 1998-08-10 | 2000-08-01 | The United States Of America As Represented By The Secretary Of The Navy | Automated image enhancement for laser line scan data |
US6934420B1 (en) * | 1999-12-22 | 2005-08-23 | Trident Systems Incorporated | Wave image compression |
CA2335784A1 (en) † | 2000-02-14 | 2001-08-14 | Marcel Lizotte | Wood differentiating system |
US7344082B2 (en) * | 2002-01-02 | 2008-03-18 | Metrologic Instruments, Inc. | Automated method of and system for dimensioning objects over a conveyor belt structure by applying contouring tracing, vertice detection, corner point detection, and corner point reduction methods to two-dimensional range data maps of the space above the conveyor belt captured by an amplitude modulated laser scanning beam |
US7508961B2 (en) * | 2003-03-12 | 2009-03-24 | Eastman Kodak Company | Method and system for face detection in digital images |
US7282180B2 (en) * | 2003-07-02 | 2007-10-16 | Immunivest Corporation | Devices and methods to image objects |
US7587064B2 (en) * | 2004-02-03 | 2009-09-08 | Hrl Laboratories, Llc | Active learning system for object fingerprinting |
EP1985969B1 (en) † | 2007-04-26 | 2017-10-25 | Sick IVP AB | Method and apparatus for determining the amount of scattered light in a maschine vision system |
JP5503990B2 (ja) | 2010-02-02 | 2014-05-28 | ローム株式会社 | 位相ロックループ回路およびそれを用いた電子機器 |
-
2001
- 2001-10-02 SE SE0103279A patent/SE0103279L/sv not_active Application Discontinuation
-
2002
- 2002-10-01 AT AT02803136T patent/ATE347683T1/de active
- 2002-10-01 JP JP2003544416A patent/JP2005524828A/ja active Pending
- 2002-10-01 CN CNB028180283A patent/CN100397036C/zh not_active Expired - Fee Related
- 2002-10-01 CA CA002456163A patent/CA2456163C/en not_active Expired - Lifetime
- 2002-10-01 DK DK02803136.7T patent/DK1432961T4/en active
- 2002-10-01 WO PCT/SE2002/001791 patent/WO2003042631A1/en active IP Right Grant
- 2002-10-01 EP EP02803136.7A patent/EP1432961B2/en not_active Expired - Lifetime
- 2002-10-01 DE DE60216623.3T patent/DE60216623T3/de not_active Expired - Lifetime
- 2002-10-01 ES ES02803136T patent/ES2274125T5/es not_active Expired - Lifetime
-
2004
- 2004-02-10 US US10/774,948 patent/US8923599B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CA2456163A1 (en) | 2003-05-22 |
SE0103279D0 (sv) | 2001-10-02 |
ES2274125T5 (es) | 2016-05-23 |
WO2003042631A1 (en) | 2003-05-22 |
EP1432961A1 (en) | 2004-06-30 |
JP2005524828A (ja) | 2005-08-18 |
DE60216623T2 (de) | 2007-09-27 |
DK1432961T4 (en) | 2016-05-30 |
ATE347683T1 (de) | 2006-12-15 |
EP1432961B1 (en) | 2006-12-06 |
DE60216623T3 (de) | 2016-07-21 |
EP1432961B2 (en) | 2016-03-02 |
DE60216623D1 (de) | 2007-01-18 |
CA2456163C (en) | 2009-08-04 |
DK1432961T3 (da) | 2007-03-05 |
CN1555480A (zh) | 2004-12-15 |
ES2274125T3 (es) | 2007-05-16 |
US20040234118A1 (en) | 2004-11-25 |
CN100397036C (zh) | 2008-06-25 |
US8923599B2 (en) | 2014-12-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NAV | Patent application has lapsed |