ES2274125T5 - Método y dispositivo de un sistema de medición - Google Patents

Método y dispositivo de un sistema de medición

Info

Publication number
ES2274125T5
ES2274125T5 ES02803136T ES02803136T ES2274125T5 ES 2274125 T5 ES2274125 T5 ES 2274125T5 ES 02803136 T ES02803136 T ES 02803136T ES 02803136 T ES02803136 T ES 02803136T ES 2274125 T5 ES2274125 T5 ES 2274125T5
Authority
ES
Spain
Prior art keywords
designed
movement
measuring system
light source
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES02803136T
Other languages
English (en)
Other versions
ES2274125T3 (es
Inventor
Anders Aaström
Erik Aastrand
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sick IVP AB
Original Assignee
Sick IVP AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20285521&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ES2274125(T5) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Sick IVP AB filed Critical Sick IVP AB
Publication of ES2274125T3 publication Critical patent/ES2274125T3/es
Application granted granted Critical
Publication of ES2274125T5 publication Critical patent/ES2274125T5/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8986—Wood
ES02803136T 2001-10-02 2002-10-01 Método y dispositivo de un sistema de medición Expired - Lifetime ES2274125T5 (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE0103279A SE0103279L (sv) 2001-10-02 2001-10-02 Förfarande för mätning av ljusspridning och geometrisk profil
SE0103279 2001-10-02
PCT/SE2002/001791 WO2003042631A1 (en) 2001-10-02 2002-10-01 Method and arrangement in a measuring system

Publications (2)

Publication Number Publication Date
ES2274125T3 ES2274125T3 (es) 2007-05-16
ES2274125T5 true ES2274125T5 (es) 2016-05-23

Family

ID=20285521

Family Applications (1)

Application Number Title Priority Date Filing Date
ES02803136T Expired - Lifetime ES2274125T5 (es) 2001-10-02 2002-10-01 Método y dispositivo de un sistema de medición

Country Status (11)

Country Link
US (1) US8923599B2 (es)
EP (1) EP1432961B2 (es)
JP (1) JP2005524828A (es)
CN (1) CN100397036C (es)
AT (1) ATE347683T1 (es)
CA (1) CA2456163C (es)
DE (1) DE60216623T3 (es)
DK (1) DK1432961T4 (es)
ES (1) ES2274125T5 (es)
SE (1) SE0103279L (es)
WO (1) WO2003042631A1 (es)

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SE526617C2 (sv) * 2003-10-01 2005-10-18 Sick Ivp Ab System och metod för att avbilda ett objekts egenskaper
US8111904B2 (en) 2005-10-07 2012-02-07 Cognex Technology And Investment Corp. Methods and apparatus for practical 3D vision system
US8131008B2 (en) * 2007-01-31 2012-03-06 Building Component Verification Systems, Inc. Methods, apparatuses, and systems for image-based measurement and inspection of pre-engineered structural components
ES2648217T3 (es) * 2007-04-26 2017-12-29 Sick Ivp Ab Método y aparato para determinar la cantidad de luz dispersada en un sistema de visión artificial
US8126260B2 (en) * 2007-05-29 2012-02-28 Cognex Corporation System and method for locating a three-dimensional object using machine vision
US9734419B1 (en) 2008-12-30 2017-08-15 Cognex Corporation System and method for validating camera calibration in a vision system
US9533418B2 (en) 2009-05-29 2017-01-03 Cognex Corporation Methods and apparatus for practical 3D vision system
US9393694B2 (en) 2010-05-14 2016-07-19 Cognex Corporation System and method for robust calibration between a machine vision system and a robot
US8670029B2 (en) * 2010-06-16 2014-03-11 Microsoft Corporation Depth camera illuminator with superluminescent light-emitting diode
US9124873B2 (en) 2010-12-08 2015-09-01 Cognex Corporation System and method for finding correspondence between cameras in a three-dimensional vision system
EE05696B1 (et) 2011-01-20 2013-12-16 Visiometric Oü Liinilaseril p?hinevate skannerite töö parandamise tehniline lahendus ja meetod selle teostamiseks
EP2985992A1 (en) 2014-08-13 2016-02-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Apparatus and method for providing an image
DE102016106994A1 (de) 2016-04-15 2017-10-19 ATB Blank GmbH Laserscanvorrichtung zur optischen Qualitätsbeurteilung und Vermessung von Objekten im Quertransport
US10274311B2 (en) 2016-10-19 2019-04-30 Columbia Insurance Company Three dimensional laser measurement device for quality control measurements
US10445893B2 (en) * 2017-03-10 2019-10-15 Microsoft Technology Licensing, Llc Dot-based time of flight
CN110220479A (zh) * 2019-07-16 2019-09-10 深圳数马电子技术有限公司 非接触式钥匙齿形学习的方法及系统
DE102021116495A1 (de) 2021-06-25 2022-12-29 Ford Global Technologies, Llc Verfahren und Vorrichtung zum Überprüfen einer Verbindung während eines Laser-basierten Verbindungsverfahrens

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US4168489A (en) * 1978-02-13 1979-09-18 Lexitron Corp. Full page mode system for certain word processing devices
IT1204492B (it) * 1986-03-21 1989-03-01 Cremona Lorenzo Sistema per il rilevamento e l'eliminazione di difetti presenti in manufatti in lavorazione,in particolare pannelli di legno con cricche e ripieghi che devono essere stuccati
US4826299A (en) * 1987-01-30 1989-05-02 Canadian Patents And Development Limited Linear deiverging lens
SE466420B (sv) † 1989-11-14 1992-02-10 Svenska Traeforskningsinst Foerfarande och anordning foer detektering av bark samt bestaemning av barkningsgrad paa ved eller i flis
JP2523222B2 (ja) 1989-12-08 1996-08-07 ゼロックス コーポレーション 画像縮小／拡大方法及び装置
US5233191A (en) * 1990-04-02 1993-08-03 Hitachi, Ltd. Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process
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JP3231383B2 (ja) 1992-03-18 2001-11-19 キヤノン株式会社 棒状超音波モーターおよびモーター保持固定装置
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US6934420B1 (en) * 1999-12-22 2005-08-23 Trident Systems Incorporated Wave image compression
CA2335784A1 (en) † 2000-02-14 2001-08-14 Marcel Lizotte Wood differentiating system
US7344082B2 (en) * 2002-01-02 2008-03-18 Metrologic Instruments, Inc. Automated method of and system for dimensioning objects over a conveyor belt structure by applying contouring tracing, vertice detection, corner point detection, and corner point reduction methods to two-dimensional range data maps of the space above the conveyor belt captured by an amplitude modulated laser scanning beam
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ES2648217T3 (es) † 2007-04-26 2017-12-29 Sick Ivp Ab Método y aparato para determinar la cantidad de luz dispersada en un sistema de visión artificial
JP5503990B2 (ja) 2010-02-02 2014-05-28 ローム株式会社 位相ロックループ回路およびそれを用いた電子機器

Also Published As

Publication number Publication date
EP1432961A1 (en) 2004-06-30
DE60216623T2 (de) 2007-09-27
DE60216623T3 (de) 2016-07-21
US8923599B2 (en) 2014-12-30
ES2274125T3 (es) 2007-05-16
CA2456163A1 (en) 2003-05-22
DK1432961T3 (da) 2007-03-05
SE0103279L (sv) 2003-04-03
JP2005524828A (ja) 2005-08-18
WO2003042631A1 (en) 2003-05-22
SE0103279D0 (sv) 2001-10-02
CN1555480A (zh) 2004-12-15
EP1432961B2 (en) 2016-03-02
CA2456163C (en) 2009-08-04
EP1432961B1 (en) 2006-12-06
CN100397036C (zh) 2008-06-25
ATE347683T1 (de) 2006-12-15
US20040234118A1 (en) 2004-11-25
DE60216623D1 (de) 2007-01-18
DK1432961T4 (en) 2016-05-30

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