SE0103279L - Förfarande för mätning av ljusspridning och geometrisk profil - Google Patents

Förfarande för mätning av ljusspridning och geometrisk profil

Info

Publication number
SE0103279L
SE0103279L SE0103279A SE0103279A SE0103279L SE 0103279 L SE0103279 L SE 0103279L SE 0103279 A SE0103279 A SE 0103279A SE 0103279 A SE0103279 A SE 0103279A SE 0103279 L SE0103279 L SE 0103279L
Authority
SE
Sweden
Prior art keywords
designed
movement
measuring system
light source
light
Prior art date
Application number
SE0103279A
Other languages
English (en)
Swedish (sv)
Other versions
SE0103279D0 (sv
Inventor
Erik Aastrand
Anders Aastroem
Original Assignee
Integrated Vision Prod
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20285521&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SE0103279(L) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Integrated Vision Prod filed Critical Integrated Vision Prod
Priority to SE0103279A priority Critical patent/SE0103279L/
Publication of SE0103279D0 publication Critical patent/SE0103279D0/xx
Priority to CA002456163A priority patent/CA2456163C/en
Priority to DE60216623.3T priority patent/DE60216623T3/de
Priority to JP2003544416A priority patent/JP2005524828A/ja
Priority to AT02803136T priority patent/ATE347683T1/de
Priority to DK02803136.7T priority patent/DK1432961T4/en
Priority to ES02803136T priority patent/ES2274125T5/es
Priority to CNB028180283A priority patent/CN100397036C/zh
Priority to PCT/SE2002/001791 priority patent/WO2003042631A1/en
Priority to EP02803136.7A priority patent/EP1432961B2/en
Publication of SE0103279L publication Critical patent/SE0103279L/
Priority to US10/774,948 priority patent/US8923599B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8986—Wood

Landscapes

  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Wood Science & Technology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Medicinal Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Food Science & Technology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Paper (AREA)
SE0103279A 2001-10-02 2001-10-02 Förfarande för mätning av ljusspridning och geometrisk profil SE0103279L (sv)

Priority Applications (11)

Application Number Priority Date Filing Date Title
SE0103279A SE0103279L (sv) 2001-10-02 2001-10-02 Förfarande för mätning av ljusspridning och geometrisk profil
EP02803136.7A EP1432961B2 (en) 2001-10-02 2002-10-01 Method and arrangement in a measuring system
PCT/SE2002/001791 WO2003042631A1 (en) 2001-10-02 2002-10-01 Method and arrangement in a measuring system
JP2003544416A JP2005524828A (ja) 2001-10-02 2002-10-01 測定システムにおける方法と装置
DE60216623.3T DE60216623T3 (de) 2001-10-02 2002-10-01 Verfahren und anordnung in einem messsystem
CA002456163A CA2456163C (en) 2001-10-02 2002-10-01 Method and arrangement in a measuring system
AT02803136T ATE347683T1 (de) 2001-10-02 2002-10-01 Verfahren und anordnung in einem messsystem
DK02803136.7T DK1432961T4 (en) 2001-10-02 2002-10-01 Method and arrangement of a measuring system
ES02803136T ES2274125T5 (es) 2001-10-02 2002-10-01 Método y dispositivo de un sistema de medición
CNB028180283A CN100397036C (zh) 2001-10-02 2002-10-01 测量系统中的方法和装置
US10/774,948 US8923599B2 (en) 2001-10-02 2004-02-10 Method and arrangement in a measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0103279A SE0103279L (sv) 2001-10-02 2001-10-02 Förfarande för mätning av ljusspridning och geometrisk profil

Publications (2)

Publication Number Publication Date
SE0103279D0 SE0103279D0 (sv) 2001-10-02
SE0103279L true SE0103279L (sv) 2003-04-03

Family

ID=20285521

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0103279A SE0103279L (sv) 2001-10-02 2001-10-02 Förfarande för mätning av ljusspridning och geometrisk profil

Country Status (11)

Country Link
US (1) US8923599B2 ( )
EP (1) EP1432961B2 ( )
JP (1) JP2005524828A ( )
CN (1) CN100397036C ( )
AT (1) ATE347683T1 ( )
CA (1) CA2456163C ( )
DE (1) DE60216623T3 ( )
DK (1) DK1432961T4 ( )
ES (1) ES2274125T5 ( )
SE (1) SE0103279L ( )
WO (1) WO2003042631A1 ( )

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US8111904B2 (en) 2005-10-07 2012-02-07 Cognex Technology And Investment Corp. Methods and apparatus for practical 3D vision system
US8131008B2 (en) * 2007-01-31 2012-03-06 Building Component Verification Systems, Inc. Methods, apparatuses, and systems for image-based measurement and inspection of pre-engineered structural components
ES2648217T3 (es) 2007-04-26 2017-12-29 Sick Ivp Ab Método y aparato para determinar la cantidad de luz dispersada en un sistema de visión artificial
US8126260B2 (en) * 2007-05-29 2012-02-28 Cognex Corporation System and method for locating a three-dimensional object using machine vision
US9734419B1 (en) 2008-12-30 2017-08-15 Cognex Corporation System and method for validating camera calibration in a vision system
US9533418B2 (en) 2009-05-29 2017-01-03 Cognex Corporation Methods and apparatus for practical 3D vision system
US9393694B2 (en) 2010-05-14 2016-07-19 Cognex Corporation System and method for robust calibration between a machine vision system and a robot
US8670029B2 (en) * 2010-06-16 2014-03-11 Microsoft Corporation Depth camera illuminator with superluminescent light-emitting diode
US9124873B2 (en) 2010-12-08 2015-09-01 Cognex Corporation System and method for finding correspondence between cameras in a three-dimensional vision system
EE05696B1 (et) 2011-01-20 2013-12-16 Visiometric Oü Liinilaseril p?hinevate skannerite töö parandamise tehniline lahendus ja meetod selle teostamiseks
EP2985992A1 (en) 2014-08-13 2016-02-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Apparatus and method for providing an image
DE102016106994A1 (de) 2016-04-15 2017-10-19 ATB Blank GmbH Laserscanvorrichtung zur optischen Qualitätsbeurteilung und Vermessung von Objekten im Quertransport
US10274311B2 (en) 2016-10-19 2019-04-30 Columbia Insurance Company Three dimensional laser measurement device for quality control measurements
US10445893B2 (en) * 2017-03-10 2019-10-15 Microsoft Technology Licensing, Llc Dot-based time of flight
CN110220479A (zh) * 2019-07-16 2019-09-10 深圳数马电子技术有限公司 非接触式钥匙齿形学习的方法及系统
DE102021116495A1 (de) 2021-06-25 2022-12-29 Ford Global Technologies, Llc Verfahren und Vorrichtung zum Überprüfen einer Verbindung während eines Laser-basierten Verbindungsverfahrens

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Also Published As

Publication number Publication date
SE0103279D0 (sv) 2001-10-02
ES2274125T5 (es) 2016-05-23
ES2274125T3 (es) 2007-05-16
EP1432961A1 (en) 2004-06-30
CN1555480A (zh) 2004-12-15
CA2456163C (en) 2009-08-04
ATE347683T1 (de) 2006-12-15
DK1432961T4 (en) 2016-05-30
EP1432961B2 (en) 2016-03-02
DE60216623T2 (de) 2007-09-27
JP2005524828A (ja) 2005-08-18
DE60216623T3 (de) 2016-07-21
US20040234118A1 (en) 2004-11-25
WO2003042631A1 (en) 2003-05-22
US8923599B2 (en) 2014-12-30
DK1432961T3 (da) 2007-03-05
DE60216623D1 (de) 2007-01-18
CN100397036C (zh) 2008-06-25
CA2456163A1 (en) 2003-05-22
EP1432961B1 (en) 2006-12-06

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