RU94028284A - Способ фотонной сканирующей туннельной микроскопии и фотонный сканирующий туннельный микроскоп - Google Patents

Способ фотонной сканирующей туннельной микроскопии и фотонный сканирующий туннельный микроскоп

Info

Publication number
RU94028284A
RU94028284A RU94028284/07A RU94028284A RU94028284A RU 94028284 A RU94028284 A RU 94028284A RU 94028284/07 A RU94028284/07 A RU 94028284/07A RU 94028284 A RU94028284 A RU 94028284A RU 94028284 A RU94028284 A RU 94028284A
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RU
Russia
Prior art keywords
sample
area
photon scanning
photons
sonde
Prior art date
Application number
RU94028284/07A
Other languages
English (en)
Inventor
Л.Феррелл Томас (FR)
Томас Л.Феррелл (FR), Роберт Д.Вармек (FR), Робин С.Реддик
Д.Вармек Роберт (FR)
С.Реддик Робин (FR)
Original Assignee
Сосьете Д
Сосьете Д, Инвестиссеман Дан Ля Микроскопи (СИМ С.А.)
Инвестиссеман Дан Ля Микроскопи (СИМ С.А.) (FR)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Сосьете Д, Сосьете Д, Инвестиссеман Дан Ля Микроскопи (СИМ С.А.), Инвестиссеман Дан Ля Микроскопи (СИМ С.А.) (FR) filed Critical Сосьете Д
Publication of RU94028284A publication Critical patent/RU94028284A/ru

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/103—Scanning systems having movable or deformable optical fibres, light guides or waveguides as scanning elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/26—Optical coupling means
    • G02B6/262—Optical details of coupling light into, or out of, or between fibre ends, e.g. special fibre end shapes or associated optical elements
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/862—Near-field probe

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Glass Compositions (AREA)
  • Cosmetics (AREA)
  • Seasonings (AREA)
  • Enzymes And Modification Thereof (AREA)

Abstract

Способ фотонной сканирующей туннельной микроскопии и фотонный сканирующий туннельный микроскоп предназначены для излучения образца в сканируемой зоне. Способ представляет собой генерацию ближнего поля света в зоне образца, которое имеет возрастающую интенсивность в направлении, нормальном к поверхности. Ближнее поле света проверяется зондом, получающим фотоны из этого ближнего поля, которые проходят за счет туннельного эффекта к поверхности зонда. Полученные фотоны детектируются, а детектор вырабатывает выходной сигнал, который пропорционален числу фотонов, полученных зондом. Сканирование осуществляется в зоне образца зондом по меньшей мере в одном направлении. Контроль выходного сигнала при движении зонда для определения выходной информации осуществляют по распределению интенсивности света в направлении к зоне образца. Также описан фотонный сканирующий туннельный микроскоп для осуществления указанного способа.

Claims (1)

  1. Способ фотонной сканирующей туннельной микроскопии и фотонный сканирующий туннельный микроскоп предназначены для излучения образца в сканируемой зоне. Способ представляет собой генерацию ближнего поля света в зоне образца, которое имеет возрастающую интенсивность в направлении, нормальном к поверхности. Ближнее поле света проверяется зондом, получающим фотоны из этого ближнего поля, которые проходят за счет туннельного эффекта к поверхности зонда. Полученные фотоны детектируются, а детектор вырабатывает выходной сигнал, который пропорционален числу фотонов, полученных зондом. Сканирование осуществляется в зоне образца зондом по меньшей мере в одном направлении. Контроль выходного сигнала при движении зонда для определения выходной информации осуществляют по распределению интенсивности света в направлении к зоне образца. Также описан фотонный сканирующий туннельный микроскоп для осуществления указанного способа.
RU94028284/07A 1988-10-21 1989-10-20 Способ фотонной сканирующей туннельной микроскопии и фотонный сканирующий туннельный микроскоп RU94028284A (ru)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/260,926 US5018865A (en) 1988-10-21 1988-10-21 Photon scanning tunneling microscopy
US260926 1988-10-21

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
RU4895573 Division

Publications (1)

Publication Number Publication Date
RU94028284A true RU94028284A (ru) 1996-04-10

Family

ID=22991232

Family Applications (2)

Application Number Title Priority Date Filing Date
RU94028284/07A RU94028284A (ru) 1988-10-21 1989-10-20 Способ фотонной сканирующей туннельной микроскопии и фотонный сканирующий туннельный микроскоп
SU894895573A RU2049327C1 (ru) 1988-10-21 1989-10-20 Способ определения свойств ближнего поля света в области образца на поверхности

Family Applications After (1)

Application Number Title Priority Date Filing Date
SU894895573A RU2049327C1 (ru) 1988-10-21 1989-10-20 Способ определения свойств ближнего поля света в области образца на поверхности

Country Status (12)

Country Link
US (1) US5018865A (ru)
EP (1) EP0439534B1 (ru)
JP (1) JP3095226B2 (ru)
AT (1) ATE118087T1 (ru)
AU (1) AU623703B2 (ru)
BR (1) BR8907735A (ru)
DE (1) DE68921008T2 (ru)
DK (1) DK170596B1 (ru)
FI (1) FI96990C (ru)
NO (1) NO303247B1 (ru)
RU (2) RU94028284A (ru)
WO (1) WO1990004753A1 (ru)

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Also Published As

Publication number Publication date
DE68921008D1 (de) 1995-03-16
WO1990004753A1 (en) 1990-05-03
FI911922A0 (fi) 1991-04-19
FI96990C (fi) 1996-09-25
DK170596B1 (da) 1995-11-06
US5018865A (en) 1991-05-28
EP0439534A4 (en) 1993-05-12
JPH04505653A (ja) 1992-10-01
AU4493089A (en) 1990-05-14
RU2049327C1 (ru) 1995-11-27
JP3095226B2 (ja) 2000-10-03
EP0439534A1 (en) 1991-08-07
EP0439534B1 (en) 1995-02-01
NO303247B1 (no) 1998-06-15
ATE118087T1 (de) 1995-02-15
DE68921008T2 (de) 1995-07-20
NO911563D0 (no) 1991-04-19
DK73491D0 (da) 1991-04-22
NO911563L (no) 1991-06-19
AU623703B2 (en) 1992-05-21
DK73491A (da) 1991-06-12
FI96990B (fi) 1996-06-14
BR8907735A (pt) 1991-08-20

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