DE3586361D1 - Verfahren und vorrichtung zum verbesserten nachweis von elektromagnetischen signalen. - Google Patents

Verfahren und vorrichtung zum verbesserten nachweis von elektromagnetischen signalen.

Info

Publication number
DE3586361D1
DE3586361D1 DE8585301725T DE3586361T DE3586361D1 DE 3586361 D1 DE3586361 D1 DE 3586361D1 DE 8585301725 T DE8585301725 T DE 8585301725T DE 3586361 T DE3586361 T DE 3586361T DE 3586361 D1 DE3586361 D1 DE 3586361D1
Authority
DE
Germany
Prior art keywords
electromagnetic signals
improved detection
particle detection
detected
periodicity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585301725T
Other languages
English (en)
Other versions
DE3586361T2 (de
Inventor
Jonathan Briggs
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Syntex USA LLC
Original Assignee
Syntex USA LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Syntex USA LLC filed Critical Syntex USA LLC
Application granted granted Critical
Publication of DE3586361D1 publication Critical patent/DE3586361D1/de
Publication of DE3586361T2 publication Critical patent/DE3586361T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/48—Laser speckle optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE8585301725T 1984-03-13 1985-03-13 Verfahren und vorrichtung zum verbesserten nachweis von elektromagnetischen signalen. Expired - Fee Related DE3586361T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/589,183 US4560881A (en) 1984-03-13 1984-03-13 Method and apparatus for enhanced detection of electromagnetic signals

Publications (2)

Publication Number Publication Date
DE3586361D1 true DE3586361D1 (de) 1992-08-27
DE3586361T2 DE3586361T2 (de) 1993-03-11

Family

ID=24356963

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585301725T Expired - Fee Related DE3586361T2 (de) 1984-03-13 1985-03-13 Verfahren und vorrichtung zum verbesserten nachweis von elektromagnetischen signalen.

Country Status (8)

Country Link
US (1) US4560881A (de)
EP (1) EP0155813B1 (de)
JP (1) JP2625098B2 (de)
AT (1) ATE78585T1 (de)
AU (1) AU579143B2 (de)
CA (1) CA1242094A (de)
DE (1) DE3586361T2 (de)
NZ (1) NZ211421A (de)

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US4676640A (en) * 1984-09-12 1987-06-30 Syntex (U.S.A.) Inc. Fluctuation analysis for enhanced particle detection
AT384677B (de) * 1985-04-16 1987-12-28 Avl Verbrennungskraft Messtech Sensor zur bestimmung von elektrolytkonzentrationen
US5037207A (en) * 1986-02-12 1991-08-06 Ohio State University Research Foundation Laser imaging system
US4877966A (en) * 1986-02-12 1989-10-31 Ohio State University Research Foundation Method and apparatus for the measurement of low-level laser-induced fluorescence
US4758727A (en) * 1986-02-12 1988-07-19 Ohio State University Research Foundation Method and apparatus for the measurement of low-level laser-induced fluorescence
DE3725652A1 (de) * 1987-08-03 1989-02-16 Kadia Diamant Werkzeug zur spanabhebenden bearbeitung
GB2210163B (en) * 1987-09-18 1991-06-26 Hamamatsu Photonics Kk Apparatus for measuring the temporal correlation of fundamental particles
US5013150A (en) * 1988-04-01 1991-05-07 Syntex (U.S.A.) Inc. Method for detection of fluorescence or light scatter
US4934811A (en) * 1988-04-01 1990-06-19 Syntex (U.S.A.) Inc. Apparatus and method for detection of fluorescence or light scatter
US5278048A (en) * 1988-10-21 1994-01-11 Molecular Devices Corporation Methods for detecting the effect of cell affecting agents on living cells
JP2993982B2 (ja) * 1988-10-21 1999-12-27 モレキユラー デヴアイシズ コーポレイシヨン 生細胞に対する細胞作用剤の効果を検出するための方法及び装置
JPH02173553A (ja) * 1988-12-26 1990-07-05 Agency Of Ind Science & Technol 高濃度濁度測定法ならびに測定装置
US5274494A (en) * 1991-04-25 1993-12-28 Hughes Aircraft Company Speckle suppression illuminator
DK66992D0 (da) * 1992-05-21 1992-05-21 Faxe Kalkbrud Aktieselskabet Sensor
DE4332501A1 (de) * 1993-09-24 1995-03-30 Siemens Ag Sensorsystem für sich dynamisch ändernde Meßgrößen und zugehöriges Betriebsverfahren
DE10101467A1 (de) * 2001-01-12 2002-07-18 Zander Birgitt Leckage-Suche
JP4316818B2 (ja) * 2001-03-01 2009-08-19 大塚電子株式会社 光散乱測定プローブ
EP1535241A1 (de) 2002-08-20 2005-06-01 Cyvera Corporation Auf einem beugungsgitter basierendes optisches identifikationselement
US7164533B2 (en) 2003-01-22 2007-01-16 Cyvera Corporation Hybrid random bead/chip based microarray
US7399643B2 (en) 2002-09-12 2008-07-15 Cyvera Corporation Method and apparatus for aligning microbeads in order to interrogate the same
US7872804B2 (en) 2002-08-20 2011-01-18 Illumina, Inc. Encoded particle having a grating with variations in the refractive index
US7619819B2 (en) 2002-08-20 2009-11-17 Illumina, Inc. Method and apparatus for drug product tracking using encoded optical identification elements
US7900836B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Optical reader system for substrates having an optically readable code
US7923260B2 (en) 2002-08-20 2011-04-12 Illumina, Inc. Method of reading encoded particles
US7508608B2 (en) 2004-11-17 2009-03-24 Illumina, Inc. Lithographically fabricated holographic optical identification element
US7901630B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Diffraction grating-based encoded microparticle assay stick
US7441703B2 (en) 2002-08-20 2008-10-28 Illumina, Inc. Optical reader for diffraction grating-based encoded optical identification elements
EP1540591A1 (de) 2002-09-12 2005-06-15 Cyvera Corporation Mit hilfe eines beugungsgitters kodierte mikropartikeln für multiplex-experimente
US20100255603A9 (en) 2002-09-12 2010-10-07 Putnam Martin A Method and apparatus for aligning microbeads in order to interrogate the same
CA2498916A1 (en) 2002-09-12 2004-03-25 Cyvera Corporation Chemical synthesis using diffraction grating-based encoded optical elements
WO2004025562A1 (en) 2002-09-12 2004-03-25 Cyvera Corp. Method and apparatus for labelling using diffraction grating-based encoded optical identification elements
US7092160B2 (en) 2002-09-12 2006-08-15 Illumina, Inc. Method of manufacturing of diffraction grating-based optical identification element
US7433123B2 (en) 2004-02-19 2008-10-07 Illumina, Inc. Optical identification element having non-waveguide photosensitive substrate with diffraction grating therein
US7773070B2 (en) 2004-05-21 2010-08-10 Cypress Semiconductor Corporation Optical positioning device using telecentric imaging
WO2006055736A1 (en) 2004-11-16 2006-05-26 Illumina, Inc. And methods and apparatus for reading coded microbeads
US7604173B2 (en) 2004-11-16 2009-10-20 Illumina, Inc. Holographically encoded elements for microarray and other tagging labeling applications, and method and apparatus for making and reading the same
WO2006055735A2 (en) 2004-11-16 2006-05-26 Illumina, Inc Scanner having spatial light modulator
US7623624B2 (en) 2005-11-22 2009-11-24 Illumina, Inc. Method and apparatus for labeling using optical identification elements characterized by X-ray diffraction
US7737948B2 (en) * 2005-12-20 2010-06-15 Cypress Semiconductor Corporation Speckle navigation system
US7830575B2 (en) 2006-04-10 2010-11-09 Illumina, Inc. Optical scanner with improved scan time
US7560078B2 (en) * 2006-08-07 2009-07-14 Intercat Equipment, Inc. Vacuum powered addition system
CA2715628A1 (en) 2008-02-21 2009-08-27 Dexcom, Inc. Systems and methods for processing, transmitting and displaying sensor data
US8541727B1 (en) 2008-09-30 2013-09-24 Cypress Semiconductor Corporation Signal monitoring and control system for an optical navigation sensor
US8711096B1 (en) 2009-03-27 2014-04-29 Cypress Semiconductor Corporation Dual protocol input device
US10161924B2 (en) * 2014-03-24 2018-12-25 National Technology & Engineering Solutions Of Sandia, Llc Sensor system that uses embedded optical fibers

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Publication number Priority date Publication date Assignee Title
US3891853A (en) * 1974-03-20 1975-06-24 Baxter Laboratories Inc Energy compensated spectrofluorometer
DE2614181C3 (de) * 1976-04-02 1981-08-20 Leybold-Heraeus Gmbh, 5000 Koeln Verfahren zur Messung des optischen Absorptionsvermögens von Proben und Vorrichtung zur Durchführung des Verfahrens
JPS5928253B2 (ja) * 1976-09-10 1984-07-11 義道 米沢 血液等の凝集状態を検出する方法
US4260890A (en) * 1979-06-25 1981-04-07 Monitor Labs, Incorporated Fluorescent gas analyzer
US4407964A (en) * 1980-10-07 1983-10-04 The Regents Of The University Of California Homogeneous fluoroimmunoassay involving sensing radiation for forward and back directions
US4421860A (en) * 1980-10-07 1983-12-20 The Regents Of The University Of California Homogeneous fluoroimmunoassay involving autocorrelation processing of optically sensed signals
JPS5777945A (en) * 1980-10-31 1982-05-15 Fujitsu Ten Ltd Discriminating method for road surface condition
AU565787B2 (en) * 1981-03-31 1987-10-01 Commonwealth Scientific And Industrial Research Organisation Optical fibre probes
US4500204A (en) * 1981-04-21 1985-02-19 Agency Of Industrial Science & Technology Scanning-type lithographic and image-pickup device using optical fiber
US4564598A (en) * 1982-07-12 1986-01-14 Syntex (U.S.A.) Inc. Limited volume method for particle counting

Also Published As

Publication number Publication date
AU579143B2 (en) 1988-11-17
US4560881A (en) 1985-12-24
ATE78585T1 (de) 1992-08-15
JP2625098B2 (ja) 1997-06-25
NZ211421A (en) 1989-01-27
EP0155813A2 (de) 1985-09-25
CA1242094A (en) 1988-09-20
EP0155813A3 (en) 1987-07-29
DE3586361T2 (de) 1993-03-11
EP0155813B1 (de) 1992-07-22
JPS60233534A (ja) 1985-11-20
AU3988285A (en) 1985-09-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee