NO911563D0 - Avsoekende foton-tunneleringsmikroskopi. - Google Patents

Avsoekende foton-tunneleringsmikroskopi.

Info

Publication number
NO911563D0
NO911563D0 NO1991911563A NO911563A NO911563D0 NO 911563 D0 NO911563 D0 NO 911563D0 NO 1991911563 A NO1991911563 A NO 1991911563A NO 911563 A NO911563 A NO 911563A NO 911563 D0 NO911563 D0 NO 911563D0
Authority
NO
Norway
Prior art keywords
field
probe
photons
sample area
sample
Prior art date
Application number
NO1991911563A
Other languages
English (en)
Other versions
NO911563L (no
NO303247B1 (no
Inventor
Thomas R Ferrell
Robert J Warmack
Robin C Reddick
Original Assignee
Spiral Rech & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Spiral Rech & Dev filed Critical Spiral Rech & Dev
Publication of NO911563D0 publication Critical patent/NO911563D0/no
Publication of NO911563L publication Critical patent/NO911563L/no
Publication of NO303247B1 publication Critical patent/NO303247B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/103—Scanning systems having movable or deformable optical fibres, light guides or waveguides as scanning elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/26—Optical coupling means
    • G02B6/262—Optical details of coupling light into, or out of, or between fibre ends, e.g. special fibre end shapes or associated optical elements
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/862—Near-field probe
NO911563A 1988-10-21 1991-04-19 Avs÷kende optisk nµrfeltsmikroskopi NO303247B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/260,926 US5018865A (en) 1988-10-21 1988-10-21 Photon scanning tunneling microscopy
PCT/US1989/004725 WO1990004753A1 (en) 1988-10-21 1989-10-20 Photon scanning tunneling microscopy

Publications (3)

Publication Number Publication Date
NO911563D0 true NO911563D0 (no) 1991-04-19
NO911563L NO911563L (no) 1991-06-19
NO303247B1 NO303247B1 (no) 1998-06-15

Family

ID=22991232

Family Applications (1)

Application Number Title Priority Date Filing Date
NO911563A NO303247B1 (no) 1988-10-21 1991-04-19 Avs÷kende optisk nµrfeltsmikroskopi

Country Status (12)

Country Link
US (1) US5018865A (no)
EP (1) EP0439534B1 (no)
JP (1) JP3095226B2 (no)
AT (1) ATE118087T1 (no)
AU (1) AU623703B2 (no)
BR (1) BR8907735A (no)
DE (1) DE68921008T2 (no)
DK (1) DK170596B1 (no)
FI (1) FI96990C (no)
NO (1) NO303247B1 (no)
RU (2) RU2049327C1 (no)
WO (1) WO1990004753A1 (no)

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Also Published As

Publication number Publication date
RU94028284A (ru) 1996-04-10
DE68921008D1 (de) 1995-03-16
JP3095226B2 (ja) 2000-10-03
DK170596B1 (da) 1995-11-06
DK73491A (da) 1991-06-12
US5018865A (en) 1991-05-28
AU623703B2 (en) 1992-05-21
FI911922A0 (fi) 1991-04-19
RU2049327C1 (ru) 1995-11-27
JPH04505653A (ja) 1992-10-01
EP0439534A4 (en) 1993-05-12
NO911563L (no) 1991-06-19
NO303247B1 (no) 1998-06-15
FI96990C (fi) 1996-09-25
AU4493089A (en) 1990-05-14
ATE118087T1 (de) 1995-02-15
BR8907735A (pt) 1991-08-20
DE68921008T2 (de) 1995-07-20
EP0439534A1 (en) 1991-08-07
EP0439534B1 (en) 1995-02-01
FI96990B (fi) 1996-06-14
WO1990004753A1 (en) 1990-05-03
DK73491D0 (da) 1991-04-22

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Legal Events

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MM1K Lapsed by not paying the annual fees

Free format text: LAPSED IN APRIL 2002