PT1155287E - Sensor de som com reduzido sinal de offset - Google Patents

Sensor de som com reduzido sinal de offset

Info

Publication number
PT1155287E
PT1155287E PT00904921T PT00904921T PT1155287E PT 1155287 E PT1155287 E PT 1155287E PT 00904921 T PT00904921 T PT 00904921T PT 00904921 T PT00904921 T PT 00904921T PT 1155287 E PT1155287 E PT 1155287E
Authority
PT
Portugal
Prior art keywords
sound sensor
offset signal
active area
contact electrodes
reduced offset
Prior art date
Application number
PT00904921T
Other languages
English (en)
Inventor
Josef Sauerer
Hans-Peter Hohe
Norbert Weber
Original Assignee
Fraunhofer Ges Forderung Angew
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Ges Forderung Angew filed Critical Fraunhofer Ges Forderung Angew
Publication of PT1155287E publication Critical patent/PT1155287E/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/142Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00Hall-effect devices
    • H10N52/101Semiconductor Hall-effect devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00Hall-effect devices
    • H10N52/80Constructional details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Fluid Pressure (AREA)
  • Circuit For Audible Band Transducer (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
PT00904921T 1999-02-26 2000-01-17 Sensor de som com reduzido sinal de offset PT1155287E (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19908473A DE19908473B4 (de) 1999-02-26 1999-02-26 Hall-Sensor mit reduziertem Offset-Signal

Publications (1)

Publication Number Publication Date
PT1155287E true PT1155287E (pt) 2003-01-31

Family

ID=7899039

Family Applications (1)

Application Number Title Priority Date Filing Date
PT00904921T PT1155287E (pt) 1999-02-26 2000-01-17 Sensor de som com reduzido sinal de offset

Country Status (13)

Country Link
US (1) US6639290B1 (pt)
EP (1) EP1155287B1 (pt)
JP (1) JP4340439B2 (pt)
AT (1) ATE224040T1 (pt)
CA (1) CA2363504C (pt)
CZ (1) CZ301988B6 (pt)
DE (2) DE19908473B4 (pt)
DK (1) DK1155287T3 (pt)
ES (1) ES2179808T3 (pt)
HU (1) HU229006B1 (pt)
PL (1) PL193791B1 (pt)
PT (1) PT1155287E (pt)
WO (1) WO2000052424A1 (pt)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10158836B4 (de) * 2001-11-30 2007-06-06 Infineon Technologies Ag Verfahren und Vorrichtung zur Kalibrierung eines Sensorsystems
DE10244096B4 (de) * 2002-09-23 2015-05-28 Robert Bosch Gmbh Spinning-Current-Hallsensor mit homogener Raumladungszone
EP1710877B1 (en) * 2003-12-22 2010-12-01 Panasonic Corporation Surface-emitting laser and laser projector
WO2006028426A1 (fr) * 2004-09-08 2006-03-16 Inessa Antonovna Bolshakova Capteur de mesure de champ magnetique
EP2234185B1 (en) * 2009-03-24 2012-10-10 austriamicrosystems AG Vertical Hall sensor and method of producing a vertical Hall sensor
JP5815986B2 (ja) * 2010-07-05 2015-11-17 セイコーインスツル株式会社 ホールセンサ
US8357983B1 (en) * 2011-08-04 2013-01-22 Allegro Microsystems, Inc. Hall effect element having a wide cross shape with dimensions selected to result in improved performance characteristics
JP2013080792A (ja) * 2011-10-03 2013-05-02 Seiko Instruments Inc ホール素子
KR102019514B1 (ko) 2013-06-28 2019-11-15 매그나칩 반도체 유한회사 반도체 기반의 홀 센서
DE102013224409B4 (de) 2013-11-28 2022-12-22 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und verfahren zur erfassung einer position eines positionsgebers
DE102014109208A1 (de) * 2014-07-01 2016-01-07 Infineon Technologies Austria Ag Ladungskompensationsvorrichtung und ihre herstellung
WO2016063510A1 (ja) * 2014-10-21 2016-04-28 旭化成エレクトロニクス株式会社 ホール素子
JP6483418B2 (ja) * 2014-11-27 2019-03-13 エイブリック株式会社 ホールセンサおよびホールセンサの温度によるオフセットの補償方法
KR102177431B1 (ko) 2014-12-23 2020-11-11 주식회사 키 파운드리 반도체 소자
US9638764B2 (en) 2015-04-08 2017-05-02 Allegro Microsystems, Llc Electronic circuit for driving a hall effect element with a current compensated for substrate stress
US10107873B2 (en) 2016-03-10 2018-10-23 Allegro Microsystems, Llc Electronic circuit for compensating a sensitivity drift of a hall effect element due to stress
US20170288131A1 (en) * 2016-03-29 2017-10-05 Globalfoundries Singapore Pte. Ltd. Integrated hall effect sensors with voltage controllable sensitivity
US10162017B2 (en) 2016-07-12 2018-12-25 Allegro Microsystems, Llc Systems and methods for reducing high order hall plate sensitivity temperature coefficients
JP6929675B2 (ja) * 2016-11-18 2021-09-01 旭化成エレクトロニクス株式会社 ホール素子
JP7015087B2 (ja) * 2017-03-23 2022-02-02 旭化成エレクトロニクス株式会社 ホール素子
US10520559B2 (en) 2017-08-14 2019-12-31 Allegro Microsystems, Llc Arrangements for Hall effect elements and vertical epi resistors upon a substrate
CN107765197B (zh) * 2017-11-21 2020-07-07 上海南麟电子股份有限公司 一种霍尔传感器
CN112259679A (zh) * 2020-10-21 2021-01-22 佛山中科芯蔚科技有限公司 一种霍尔传感器及其制作方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1518957A (en) * 1975-11-25 1978-07-26 Standard Telephones Cables Ltd Hall effect device
JPS57128086A (en) * 1981-01-30 1982-08-09 Toshiba Corp Magneto-electric transducer element
JPS5842282A (ja) * 1981-09-04 1983-03-11 Seiko Instr & Electronics Ltd ホ−ル素子
JPS59129483A (ja) * 1983-01-14 1984-07-25 Matsushita Electric Ind Co Ltd ホ−ル素子
JPS62260375A (ja) * 1986-05-07 1987-11-12 Koa Corp ホ−ル素子およびその製造方法
JPS6370583A (ja) * 1986-09-12 1988-03-30 Asahi Glass Co Ltd ガリウム砒素ホ−ル素子
JPH01162386A (ja) 1987-12-18 1989-06-26 Matsushita Electron Corp ホール素子
JPH03211778A (ja) 1990-01-16 1991-09-17 Fujitsu Ltd ホール素子
JPH08102563A (ja) * 1994-08-02 1996-04-16 Toshiba Corp 半導体ホール素子
JPH10223940A (ja) 1997-02-07 1998-08-21 Toshiba Corp 半導体磁気センサ
DE59912726D1 (de) * 1998-03-30 2005-12-08 Sentron Ag Zug Magnetfeldsensor

Also Published As

Publication number Publication date
CA2363504A1 (en) 2000-09-08
DK1155287T3 (da) 2002-11-18
EP1155287A1 (de) 2001-11-21
CZ301988B6 (cs) 2010-08-25
HUP0200050A2 (en) 2002-05-29
DE50000488D1 (de) 2002-10-17
CA2363504C (en) 2004-04-06
JP4340439B2 (ja) 2009-10-07
ES2179808T3 (es) 2003-02-01
CZ20012746A3 (cs) 2001-12-12
DE19908473B4 (de) 2004-01-22
ATE224040T1 (de) 2002-09-15
PL193791B1 (pl) 2007-03-30
PL349279A1 (en) 2002-07-15
WO2000052424A1 (de) 2000-09-08
JP2004519870A (ja) 2004-07-02
US6639290B1 (en) 2003-10-28
DE19908473A1 (de) 2000-09-07
WO2000052424A8 (de) 2001-05-10
HU229006B1 (en) 2013-07-29
EP1155287B1 (de) 2002-09-11

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