PL2641101T3 - Układ detektora spinu do pomiaru komponentów wektorowych wektora spinu dominującego w strumieniu cząstek - Google Patents

Układ detektora spinu do pomiaru komponentów wektorowych wektora spinu dominującego w strumieniu cząstek

Info

Publication number
PL2641101T3
PL2641101T3 PL11788413T PL11788413T PL2641101T3 PL 2641101 T3 PL2641101 T3 PL 2641101T3 PL 11788413 T PL11788413 T PL 11788413T PL 11788413 T PL11788413 T PL 11788413T PL 2641101 T3 PL2641101 T3 PL 2641101T3
Authority
PL
Poland
Prior art keywords
spin
vector
predominating
measuring
particle beam
Prior art date
Application number
PL11788413T
Other languages
English (en)
Inventor
Oliver Schaff
Original Assignee
Specs Surface Nano Analysis Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Specs Surface Nano Analysis Gmbh filed Critical Specs Surface Nano Analysis Gmbh
Publication of PL2641101T3 publication Critical patent/PL2641101T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1284—Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Radiation (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Gyroscopes (AREA)
PL11788413T 2010-11-17 2011-11-16 Układ detektora spinu do pomiaru komponentów wektorowych wektora spinu dominującego w strumieniu cząstek PL2641101T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102010052088 2010-11-17
PCT/EP2011/070226 WO2012066024A1 (de) 2010-11-17 2011-11-16 Spindetektoranordnung zum messen der vektorkomponenten eines in einem teilchenstrahl vorherrschenden spinvektors
EP11788413.0A EP2641101B1 (de) 2010-11-17 2011-11-16 Spindetektoranordnung zum messen der vektorkomponenten eines in einem teilchenstrahl vorherrschenden spinvektors

Publications (1)

Publication Number Publication Date
PL2641101T3 true PL2641101T3 (pl) 2015-12-31

Family

ID=45047749

Family Applications (1)

Application Number Title Priority Date Filing Date
PL11788413T PL2641101T3 (pl) 2010-11-17 2011-11-16 Układ detektora spinu do pomiaru komponentów wektorowych wektora spinu dominującego w strumieniu cząstek

Country Status (10)

Country Link
US (1) US9453893B2 (pl)
EP (1) EP2641101B1 (pl)
JP (1) JP5998149B2 (pl)
KR (1) KR101820190B1 (pl)
CN (1) CN103221836B (pl)
DK (1) DK2641101T3 (pl)
HK (1) HK1183518A1 (pl)
PL (1) PL2641101T3 (pl)
RU (1) RU2579186C2 (pl)
WO (1) WO2012066024A1 (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9666406B1 (en) * 2016-02-18 2017-05-30 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam device
CN115803844A (zh) 2020-07-09 2023-03-14 大学共同利用机关法人自然科学研究机构 静电偏转会聚型能量分析仪、成像型电子光谱装置、反射成像型电子光谱装置以及自旋矢量分布成像装置
CN111693556B (zh) * 2020-07-22 2022-09-27 中国工程物理研究院核物理与化学研究所 一种用于自旋回波小角中子散射谱仪的中子极化方向翻转装置
CN113534022A (zh) * 2021-09-17 2021-10-22 中国工程物理研究院流体物理研究所 一种高精度磁场测量系统

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3287558A (en) * 1961-09-08 1966-11-22 High Voltage Engineering Corp Charged particle deflecting device consisting of sequentially positioned uniform and non-uniform magnetic field sectors
DE2646394C2 (de) * 1976-10-14 1986-12-11 Kernforschungsanlage Jülich GmbH, 5170 Jülich Vorrichtung zur Bestimmung des Spinpolarisationsgrades eines Elektronenstrahls
US4455486A (en) * 1981-08-12 1984-06-19 Carl Rau Method and apparatus for detecting magnetism by means of electron spin polarization measurements through dielectronic transition
US4760254A (en) * 1985-06-07 1988-07-26 Pierce Daniel T Apparatus and method for electron spin polarization detection
JPS61283890A (ja) * 1985-06-10 1986-12-13 Hitachi Ltd スピン検出器
JPH04206427A (ja) * 1990-11-30 1992-07-28 Hitachi Ltd スピン検出器
JPH0593106A (ja) 1991-10-02 1993-04-16 Sumitomo Bakelite Co Ltd 難燃性樹脂組成物
JPH08240697A (ja) 1995-03-06 1996-09-17 Hitachi Ltd スピン回転器
JPH08251525A (ja) 1995-03-07 1996-09-27 Matsushita Electric Ind Co Ltd 映像表示装置の冷却装置
JPH103450A (ja) 1996-06-18 1998-01-06 Brother Ind Ltd ステータス応答装置
JPH11111209A (ja) * 1997-10-08 1999-04-23 Sony Corp 偏極分析器及び解析装置
DE19842476C1 (de) 1998-09-16 2000-03-16 Max Planck Gesellschaft Vorrichtung und Verfahren zur Bestimmung des Spin-Polarisationsgrades eines Elektronenstrahls
JP3891880B2 (ja) * 2002-05-24 2007-03-14 株式会社神戸製鋼所 ２次イオン分析装置
JP2005093106A (ja) * 2003-09-12 2005-04-07 Hitachi Ltd 走査電子顕微鏡
DE102005045622B4 (de) 2005-09-23 2009-04-30 GST Gesellschaft für systembezogene Technologieentwicklung mbH Verfahren und Anordnungen zum Nachweis der Elektronen-Spinpolarisation
JP4977629B2 (ja) * 2007-03-05 2012-07-18 株式会社日立製作所 荷電粒子スピン検出器、顕微鏡、及び光電子分光装置
US7985952B2 (en) * 2007-03-05 2011-07-26 Hitachi, Ltd. Charged particle spin polarimeter, microscope, and photoelectron spectroscope
JP2010003450A (ja) * 2008-06-18 2010-01-07 Hitachi Ltd 走査電子顕微鏡
JP5222712B2 (ja) 2008-12-22 2013-06-26 株式会社日立製作所 電子スピン検出器並びにそれを用いたスピン偏極走査電子顕微鏡及びスピン分解光電子分光装置
WO2011019457A1 (en) * 2009-08-11 2011-02-17 Regents Of The University Of California Time-of-flight electron energy analyzer

Also Published As

Publication number Publication date
HK1183518A1 (zh) 2013-12-27
WO2012066024A1 (de) 2012-05-24
RU2013118987A (ru) 2014-12-27
US20130285661A1 (en) 2013-10-31
US9453893B2 (en) 2016-09-27
KR20140025315A (ko) 2014-03-04
EP2641101B1 (de) 2015-07-08
DK2641101T3 (en) 2015-10-12
CN103221836B (zh) 2015-11-25
JP5998149B2 (ja) 2016-09-28
CN103221836A (zh) 2013-07-24
KR101820190B1 (ko) 2018-01-18
JP2014503797A (ja) 2014-02-13
EP2641101A1 (de) 2013-09-25
RU2579186C2 (ru) 2016-04-10

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