PL2002471T3 - Wzajemne połączenie pomiędzy urządzeniami elektronicznymi z podniesionymi doprowadzeniami - Google Patents

Wzajemne połączenie pomiędzy urządzeniami elektronicznymi z podniesionymi doprowadzeniami

Info

Publication number
PL2002471T3
PL2002471T3 PL07726978T PL07726978T PL2002471T3 PL 2002471 T3 PL2002471 T3 PL 2002471T3 PL 07726978 T PL07726978 T PL 07726978T PL 07726978 T PL07726978 T PL 07726978T PL 2002471 T3 PL2002471 T3 PL 2002471T3
Authority
PL
Poland
Prior art keywords
substrate
leads
electronic devices
interconnection
main surface
Prior art date
Application number
PL07726978T
Other languages
English (en)
Inventor
Marco Balucani
Original Assignee
Eles Semiconductor Equipment S P A
Rise Tech S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eles Semiconductor Equipment S P A, Rise Tech S R L filed Critical Eles Semiconductor Equipment S P A
Publication of PL2002471T3 publication Critical patent/PL2002471T3/pl

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/01—Manufacture or treatment
    • H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
    • H10W70/093—Connecting or disconnecting other interconnections thereto or therefrom, e.g. connecting bond wires or bumps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages

Landscapes

  • Weting (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Communication Cables (AREA)
  • Combinations Of Printed Boards (AREA)
  • Conductive Materials (AREA)
  • Manufacturing Of Printed Wiring (AREA)
PL07726978T 2006-03-16 2007-03-16 Wzajemne połączenie pomiędzy urządzeniami elektronicznymi z podniesionymi doprowadzeniami PL2002471T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
IT000478A ITMI20060478A1 (it) 2006-03-16 2006-03-16 Sistema per contattare dispositivim elettronici e relativo metodo di produzione basato su filo conduttore annegato in materiale isolante
PCT/EP2007/052497 WO2007104799A1 (en) 2006-03-16 2007-03-16 Interconnection of electronic devices with raised leads
EP20070726978 EP2002471B1 (en) 2006-03-16 2007-03-16 Interconnection of electronic devices with raised leads

Publications (1)

Publication Number Publication Date
PL2002471T3 true PL2002471T3 (pl) 2011-05-31

Family

ID=36939154

Family Applications (1)

Application Number Title Priority Date Filing Date
PL07726978T PL2002471T3 (pl) 2006-03-16 2007-03-16 Wzajemne połączenie pomiędzy urządzeniami elektronicznymi z podniesionymi doprowadzeniami

Country Status (10)

Country Link
US (1) US7892954B2 (pl)
EP (1) EP2002471B1 (pl)
JP (1) JP5043870B2 (pl)
CN (1) CN101405852B (pl)
AT (1) ATE484846T1 (pl)
DE (1) DE602007009810D1 (pl)
ES (1) ES2359919T3 (pl)
IT (1) ITMI20060478A1 (pl)
PL (1) PL2002471T3 (pl)
WO (1) WO2007104799A1 (pl)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1395336B1 (it) 2009-01-20 2012-09-14 Rise Technology S R L Dispositivo di contatto elastico per componenti elettronici a colonne collassanti
DE102009008152A1 (de) * 2009-02-09 2010-08-19 Nb Technologies Gmbh Siliziumsolarzelle
US8278748B2 (en) 2010-02-17 2012-10-02 Maxim Integrated Products, Inc. Wafer-level packaged device having self-assembled resilient leads
ITMI20100407A1 (it) * 2010-03-12 2011-09-13 Rise Technology S R L Cella foto-voltaica con regioni di semiconduttore poroso per ancorare terminali di contatto
US8940616B2 (en) 2012-07-27 2015-01-27 Globalfoundries Singapore Pte. Ltd. Bonding method using porosified surfaces for making stacked structures
US8679902B1 (en) 2012-09-27 2014-03-25 International Business Machines Corporation Stacked nanowire field effect transistor
US9126452B2 (en) * 2013-07-29 2015-09-08 Xerox Corporation Ultra-fine textured digital lithographic imaging plate and method of manufacture
CN107710504B (zh) * 2015-04-20 2021-03-05 交互数字麦迪逊专利控股公司 竖直朝向的电子设备、构建方法及建构子组件的方法
EP4270479A4 (en) 2021-01-28 2024-07-10 Huawei Technologies Co., Ltd. CONNECTION ASSEMBLY, BOARD LEVEL ARCHITECTURE AND COMPUTER DEVICE
US12105136B2 (en) * 2021-09-09 2024-10-01 Kla Corporation Method for determining material parameters of a multilayer test sample

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2119567C2 (de) 1970-05-05 1983-07-14 International Computers Ltd., London Elektrische Verbindungsvorrichtung und Verfahren zu ihrer Herstellung
US4937653A (en) 1988-07-21 1990-06-26 American Telephone And Telegraph Company Semiconductor integrated circuit chip-to-chip interconnection scheme
US5989936A (en) * 1994-07-07 1999-11-23 Tessera, Inc. Microelectronic assembly fabrication with terminal formation from a conductive layer
US5518964A (en) * 1994-07-07 1996-05-21 Tessera, Inc. Microelectronic mounting with multiple lead deformation and bonding
US5763941A (en) * 1995-10-24 1998-06-09 Tessera, Inc. Connection component with releasable leads
EP0985231A1 (en) * 1997-05-15 2000-03-15 Formfactor, Inc. Lithographically defined microelectronic contact structures
JP2000077477A (ja) * 1998-09-02 2000-03-14 Shinko Electric Ind Co Ltd 半導体装置及びその製造方法並びにこれに用いる金属基板
US6405429B1 (en) 1999-08-26 2002-06-18 Honeywell Inc. Microbeam assembly and associated method for integrated circuit interconnection to substrates
US6461892B2 (en) * 2000-01-26 2002-10-08 Tessera, Inc. Methods of making a connection component using a removable layer
JP2001291850A (ja) * 2000-04-10 2001-10-19 Hitachi Cable Ltd 結晶シリコン薄膜の製造方法
US6589819B2 (en) 2000-09-29 2003-07-08 Tessera, Inc. Microelectronic packages having an array of resilient leads and methods therefor
US6632733B2 (en) 2001-03-14 2003-10-14 Tessera, Inc. Components and methods with nested leads

Also Published As

Publication number Publication date
ATE484846T1 (de) 2010-10-15
JP5043870B2 (ja) 2012-10-10
CN101405852A (zh) 2009-04-08
DE602007009810D1 (de) 2010-11-25
EP2002471A1 (en) 2008-12-17
ITMI20060478A1 (it) 2007-09-17
CN101405852B (zh) 2011-04-13
EP2002471B1 (en) 2010-10-13
WO2007104799A1 (en) 2007-09-20
ES2359919T3 (es) 2011-05-30
JP2009530800A (ja) 2009-08-27
US7892954B2 (en) 2011-02-22
US20090309098A1 (en) 2009-12-17

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