PH30835A - Multilayer magnetoresistive sensor. - Google Patents

Multilayer magnetoresistive sensor.

Info

Publication number
PH30835A
PH30835A PH49556A PH49556A PH30835A PH 30835 A PH30835 A PH 30835A PH 49556 A PH49556 A PH 49556A PH 49556 A PH49556 A PH 49556A PH 30835 A PH30835 A PH 30835A
Authority
PH
Philippines
Prior art keywords
magnetoresistive
sensing element
layers
elements
ferromagnetic
Prior art date
Application number
PH49556A
Other languages
English (en)
Inventor
Kevin R Coffey
Todd L Hylton
Robert E Fontana
James K Howard
Michael A Parker
Ching H Tsong
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of PH30835A publication Critical patent/PH30835A/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • G01R33/093Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00Galvanomagnetic devices
    • H10N50/80Constructional details
    • H10N50/85Materials of the active region
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B2005/3996Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
  • Magnetic Heads (AREA)
  • Thin Magnetic Films (AREA)
PH49556A 1993-12-23 1994-12-14 Multilayer magnetoresistive sensor. PH30835A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/173,590 US5452163A (en) 1993-12-23 1993-12-23 Multilayer magnetoresistive sensor

Publications (1)

Publication Number Publication Date
PH30835A true PH30835A (en) 1997-11-03

Family

ID=22632713

Family Applications (1)

Application Number Title Priority Date Filing Date
PH49556A PH30835A (en) 1993-12-23 1994-12-14 Multilayer magnetoresistive sensor.

Country Status (13)

Country Link
US (1) US5452163A (enExample)
EP (1) EP0660127B1 (enExample)
JP (1) JP2784461B2 (enExample)
KR (1) KR0146012B1 (enExample)
CN (1) CN1068689C (enExample)
AT (1) ATE221999T1 (enExample)
BR (1) BR9405159A (enExample)
CA (1) CA2134711A1 (enExample)
DE (1) DE69431149T2 (enExample)
MY (1) MY116219A (enExample)
PH (1) PH30835A (enExample)
SG (1) SG42849A1 (enExample)
TW (1) TW277132B (enExample)

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US7050329B2 (en) * 1995-04-21 2006-05-23 Johnson Mark B Magnetic spin based memory with inductive write lines
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US6741494B2 (en) * 1995-04-21 2004-05-25 Mark B. Johnson Magnetoelectronic memory element with inductively coupled write wires
US6169687B1 (en) 1995-04-21 2001-01-02 Mark B. Johnson High density and speed magneto-electronic memory for use in computing system
US6140838A (en) 1995-04-21 2000-10-31 Johnson; Mark B. High density and high speed magneto-electronic logic family
US6064083A (en) 1995-04-21 2000-05-16 Johnson; Mark B. Hybrid hall effect memory device and method of operation
US5585986A (en) * 1995-05-15 1996-12-17 International Business Machines Corporation Digital magnetoresistive sensor based on the giant magnetoresistance effect
US5701222A (en) * 1995-09-11 1997-12-23 International Business Machines Corporation Spin valve sensor with antiparallel magnetization of pinned layers
JPH09205234A (ja) * 1996-01-26 1997-08-05 Nec Corp 磁気抵抗効果素子及び磁気抵抗効果センサ
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US6166539A (en) * 1996-10-30 2000-12-26 Regents Of The University Of Minnesota Magnetoresistance sensor having minimal hysteresis problems
US5793279A (en) * 1996-08-26 1998-08-11 Read-Rite Corporation Methods and compositions for optimizing interfacial properties of magnetoresistive sensors
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US5880915A (en) 1996-10-21 1999-03-09 International Business Machines Corporation Crack resistant magnetic write head
AU6343898A (en) * 1997-02-28 1998-09-18 University And Community College System Of Nevada Magnetoresistive scanning system
US5923505A (en) * 1997-03-17 1999-07-13 Read-Rite Corporation Magnetoresistive sensor having a pinned soft magnetic layer
US6440750B1 (en) 1997-06-10 2002-08-27 Agere Systems Guardian Corporation Method of making integrated circuit having a micromagnetic device
US6191495B1 (en) * 1997-06-10 2001-02-20 Lucent Technologies Inc. Micromagnetic device having an anisotropic ferromagnetic core and method of manufacture therefor
US5867351A (en) * 1997-07-25 1999-02-02 International Business Machines Corporation Spin valve read head with low moment, high coercivity pinning layer
JPH1196515A (ja) * 1997-09-18 1999-04-09 Fujitsu Ltd Gmr磁気センサ、その製造方法、および磁気ヘッド
DE69825031T2 (de) * 1997-10-29 2005-07-21 Koninklijke Philips Electronics N.V. Magnetfeldsensor mit spin tunnelübergang
US6147900A (en) * 1997-11-06 2000-11-14 Nonvolatile Electronics, Incorporated Spin dependent tunneling memory
US6337215B1 (en) * 1997-12-01 2002-01-08 International Business Machines Corporation Magnetic particles having two antiparallel ferromagnetic layers and attached affinity recognition molecules
DE19854713B4 (de) * 1998-05-13 2005-03-10 Mitsubishi Electric Corp Magnetfeld-Erfassungselement
JP3544141B2 (ja) 1998-05-13 2004-07-21 三菱電機株式会社 磁気検出素子および磁気検出装置
US6239595B1 (en) 1998-05-13 2001-05-29 Mitsubishi Denki Kabushiki Kaisha Magnetic field sensing element
US6529114B1 (en) * 1998-05-27 2003-03-04 Honeywell International Inc. Magnetic field sensing device
DE19843349A1 (de) * 1998-09-22 2000-03-23 Bosch Gmbh Robert Magnetoresistives Sensorelement, insbesondere Winkelsensorelement
US6178074B1 (en) * 1998-11-19 2001-01-23 International Business Machines Corporation Double tunnel junction with magnetoresistance enhancement layer
US6255714B1 (en) 1999-06-22 2001-07-03 Agere Systems Guardian Corporation Integrated circuit having a micromagnetic device including a ferromagnetic core and method of manufacture therefor
US6421212B1 (en) 1999-09-21 2002-07-16 Read-Rite Corporation Thin film read head structure with improved bias magnet-to-magnetoresistive element interface and method of fabrication
US6600637B1 (en) * 1999-10-28 2003-07-29 Seagate Technology, L.L.C. Edge barrier to prevent spin valve sensor corrosion and improve long term reliability
US6404601B1 (en) 2000-01-25 2002-06-11 Read-Rite Corporation Merged write head with magnetically isolated poletip
US6307774B1 (en) 2000-03-22 2001-10-23 Mark B. Johnson Magnetoelectronic memory array
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US6885527B1 (en) * 2000-10-26 2005-04-26 Headway Technologies, Inc. Process to manufacture a top spin valve
US6724586B2 (en) * 2001-03-27 2004-04-20 Hitachi Global Storage Technologies Netherlands B.V. Bias structure for magnetic tunnel junction magnetoresistive sensor
US20020145832A1 (en) * 2001-04-04 2002-10-10 Seagate Technology Llc Perpendicular magnetic recording head with soft underlayer biasing
US6794862B2 (en) * 2001-05-08 2004-09-21 Ramot At Tel-Aviv University Ltd. Magnetic thin film sensor based on the extraordinary hall effect
US6709767B2 (en) 2001-07-31 2004-03-23 Hitachi Global Storage Technologies Netherlands B.V. In-situ oxidized films for use as cap and gap layers in a spin-valve sensor and methods of manufacture
DE10258860A1 (de) * 2002-12-17 2004-07-15 Robert Bosch Gmbh Magnetoresistives Schichtsystem und Sensorelement mit diesem Schichtsystem
KR20050084340A (ko) * 2002-12-18 2005-08-26 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 집적 회로 장치, 집적 회로 메모리 장치 및 안티-탬퍼 장치
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US7286392B2 (en) * 2003-11-24 2007-10-23 Nxp B.V. Data retention indicator for magnetic memories
JP4538614B2 (ja) * 2007-10-12 2010-09-08 株式会社東芝 磁気抵抗効果素子の設計方法及び磁気ランダムアクセスメモリの設計方法
US8093892B2 (en) * 2008-07-24 2012-01-10 Infineon Technologies Ag System with 90 degree sense layer magnetic orientation
US8907666B2 (en) * 2011-09-30 2014-12-09 HGST Netherlands B.V. Magnetic bias structure for magnetoresistive sensor having a scissor structure
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CN104900800A (zh) * 2014-03-03 2015-09-09 北京嘉岳同乐极电子有限公司 用于磁敏传感器的gmr磁性纳米多层膜
US10483320B2 (en) 2015-12-10 2019-11-19 Everspin Technologies, Inc. Magnetoresistive stack with seed region and method of manufacturing the same
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CN115265605B (zh) * 2021-12-01 2024-03-12 苏州纳芯微电子股份有限公司 传感器电路及运动数据检测装置
CN115077571A (zh) * 2021-12-09 2022-09-20 苏州纳芯微电子股份有限公司 运动数据检测装置及其传感器电路
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Also Published As

Publication number Publication date
ATE221999T1 (de) 2002-08-15
SG42849A1 (en) 1997-10-17
TW277132B (enExample) 1996-06-01
EP0660127B1 (en) 2002-08-07
CA2134711A1 (en) 1995-06-24
MY116219A (en) 2003-12-31
DE69431149D1 (de) 2002-09-12
EP0660127A3 (en) 1996-01-17
EP0660127A2 (en) 1995-06-28
KR950020420A (ko) 1995-07-24
CN1122498A (zh) 1996-05-15
JP2784461B2 (ja) 1998-08-06
DE69431149T2 (de) 2003-05-28
US5452163A (en) 1995-09-19
CN1068689C (zh) 2001-07-18
BR9405159A (pt) 1995-08-01
JPH07210832A (ja) 1995-08-11
KR0146012B1 (ko) 1998-10-15

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