PH12013502137A1 - Silicon ingot having uniform multiple dopants and method and apparatus for producing same - Google Patents

Silicon ingot having uniform multiple dopants and method and apparatus for producing same

Info

Publication number
PH12013502137A1
PH12013502137A1 PH1/2013/502137A PH12013502137A PH12013502137A1 PH 12013502137 A1 PH12013502137 A1 PH 12013502137A1 PH 12013502137 A PH12013502137 A PH 12013502137A PH 12013502137 A1 PH12013502137 A1 PH 12013502137A1
Authority
PH
Philippines
Prior art keywords
silicon
crucible
silicon ingot
dopant material
multiple dopants
Prior art date
Application number
PH1/2013/502137A
Other languages
English (en)
Inventor
John P Deluca
Bayard K Johnson
William L Luter
Original Assignee
Gtat Ip Holding Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gtat Ip Holding Llc filed Critical Gtat Ip Holding Llc
Publication of PH12013502137A1 publication Critical patent/PH12013502137A1/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/02Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
    • C30B15/04Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt adding doping materials, e.g. for n-p-junction
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/002Continuous growth
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/10Crucibles or containers for supporting the melt
    • C30B15/12Double crucible methods
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F19/00Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • H10F71/1221The active layers comprising only Group IV materials comprising polycrystalline silicon
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/546Polycrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1024Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032Seed pulling
    • Y10T117/1052Seed pulling including a sectioned crucible [e.g., double crucible, baffle]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1024Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032Seed pulling
    • Y10T117/1056Seed pulling including details of precursor replenishment

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
PH1/2013/502137A 2011-04-14 2012-04-13 Silicon ingot having uniform multiple dopants and method and apparatus for producing same PH12013502137A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161475351P 2011-04-14 2011-04-14
PCT/US2012/033593 WO2012142463A2 (en) 2011-04-14 2012-04-13 Silicon ingot having uniform multiple dopants and method and apparatus for producing same

Publications (1)

Publication Number Publication Date
PH12013502137A1 true PH12013502137A1 (en) 2014-01-13

Family

ID=47010006

Family Applications (1)

Application Number Title Priority Date Filing Date
PH1/2013/502137A PH12013502137A1 (en) 2011-04-14 2012-04-13 Silicon ingot having uniform multiple dopants and method and apparatus for producing same

Country Status (9)

Country Link
US (1) US10202705B2 (https=)
EP (1) EP2697412B1 (https=)
JP (2) JP2014511146A (https=)
KR (1) KR20140097971A (https=)
CN (1) CN103608496B (https=)
MY (1) MY173316A (https=)
PH (1) PH12013502137A1 (https=)
TW (1) TWI618678B (https=)
WO (1) WO2012142463A2 (https=)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2994982B1 (fr) * 2012-09-04 2016-01-08 Commissariat Energie Atomique Procede de fabrication d'une plaquette en silicium monolithique a multi-jonctions verticales.
WO2014185572A1 (ko) * 2013-05-16 2014-11-20 (주)에스테크 잉곳 원료 공급시스템
US9822466B2 (en) 2013-11-22 2017-11-21 Corner Star Limited Crystal growing systems and crucibles for enhancing heat transfer to a melt
US10724148B2 (en) * 2014-01-21 2020-07-28 Infineon Technologies Ag Silicon ingot and method of manufacturing a silicon ingot
DE102014107590B3 (de) 2014-05-28 2015-10-01 Infineon Technologies Ag Halbleitervorrichtung, Siliziumwafer und Verfahren zum Herstellen eines Siliziumwafers
JP6299543B2 (ja) * 2014-09-18 2018-03-28 信越半導体株式会社 抵抗率制御方法及び追加ドーパント投入装置
US10337117B2 (en) * 2014-11-07 2019-07-02 Infineon Technologies Ag Method of manufacturing a silicon ingot and silicon ingot
CN104499048A (zh) * 2014-12-07 2015-04-08 海安县石油科研仪器有限公司 一种连续加料的单晶硅生长工艺
WO2018012654A1 (ko) * 2016-07-14 2018-01-18 포토멕 주식회사 실리콘 반도체 잉곳 제조용 투입장치 및 도핑방법
US10920337B2 (en) 2016-12-28 2021-02-16 Globalwafers Co., Ltd. Methods for forming single crystal silicon ingots with improved resistivity control
US20190078231A1 (en) * 2017-09-08 2019-03-14 Corner Star Limited Hybrid crucible assembly for czochralski crystal growth
SG11202103547UA (en) * 2018-10-12 2021-05-28 Globalwafers Co Ltd Dopant concentration control in silicon melt to enhance the ingot quality
CN113825862B (zh) 2019-04-11 2024-12-10 环球晶圆股份有限公司 后段主体长度具有减小变形的锭的制备工艺
SG11202111451WA (en) 2019-04-18 2021-11-29 Globalwafers Co Ltd Methods for growing a single crystal silicon ingot using continuous czochralski method
EP4245895A3 (en) * 2019-09-13 2023-11-15 GlobalWafers Co., Ltd. Method for growing a nitrogen doped single crystal silicon ingot using continuous czochralski method and a single crystal silicon ingot grown by this method
US11111597B2 (en) 2019-09-13 2021-09-07 Globalwafers Co., Ltd. Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method
US11111596B2 (en) 2019-09-13 2021-09-07 Globalwafers Co., Ltd. Single crystal silicon ingot having axial uniformity
TWI784689B (zh) 2020-09-29 2022-11-21 日商Sumco股份有限公司 矽單結晶的製造方法
US11499245B2 (en) * 2020-12-30 2022-11-15 Globalwafers Co., Ltd. Additive feed systems, ingot puller apparatus and methods for forming a single crystal silicon ingot with use of such additive feed systems
US12588445B2 (en) * 2022-08-24 2026-03-24 Semiconductor Components Industries, Llc Methods of manufacturing semiconductor devices and semiconductor devices
US12546028B2 (en) 2023-05-25 2026-02-10 Globalwafers Co., Ltd. Ingot puller apparatus having dopant feeders for adding a plurality of dopant batches

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0220174A4 (en) * 1985-05-17 1989-06-26 Schumacher Co J C SINGLE CRYSTAL SILICON INGOTS OBTAINED BY A CONTINUOUS TRACTION PROCESS.
JPS6379790A (ja) * 1986-09-22 1988-04-09 Toshiba Corp 結晶引上げ装置
JPH01138192A (ja) * 1987-11-25 1989-05-31 Sumitomo Electric Ind Ltd 単結晶の成長方法及びその装置
JP2615968B2 (ja) * 1988-02-04 1997-06-04 三菱マテリアル株式会社 単結晶の引き上げ方法
JP2755588B2 (ja) * 1988-02-22 1998-05-20 株式会社東芝 結晶引上げ方法
JPH0218377A (ja) * 1988-07-07 1990-01-22 Nkk Corp ドープ剤供給装置
FI893246A7 (fi) * 1988-07-07 1990-01-08 Nippon Kokan Kk Foerfarande och anordning foer framstaellning av kiselkristaller.
JPH0283292A (ja) * 1988-09-20 1990-03-23 Nkk Corp シリコン単結晶の製造方法及び製造装置
JPH03183686A (ja) * 1989-12-13 1991-08-09 Nippon Steel Corp 単結晶引上げにおけるドーピング方法
JP2837903B2 (ja) * 1989-12-27 1998-12-16 新日本製鐵株式会社 シリコン単結晶の製造方法
DE4106589C2 (de) * 1991-03-01 1997-04-24 Wacker Siltronic Halbleitermat Kontinuierliches Nachchargierverfahren mit flüssigem Silicium beim Tiegelziehen nach Czochralski
DE4213097A1 (de) * 1992-04-19 1993-10-21 Nippon Kokan Kk Zuführvorrichtung für Dotierungsstoffe für eine Vorrichtung zur Herstellung von Siliziumeinkristallen
US5288366A (en) * 1992-04-24 1994-02-22 Memc Electronic Materials, Inc. Method for growing multiple single crystals and apparatus for use therein
JPH0676273A (ja) 1992-08-27 1994-03-18 Hitachi Ltd 磁気ディスク及び磁気ディスクの製造方法
JPH06204150A (ja) * 1992-12-28 1994-07-22 Sumitomo Sitix Corp 半導体用シリコン単結晶基板の製造方法
JP3484870B2 (ja) * 1996-03-27 2004-01-06 信越半導体株式会社 連続チャージ法によるシリコン単結晶の製造方法およびドーパント供給装置
JP4634553B2 (ja) * 1999-06-08 2011-02-16 シルトロニック・ジャパン株式会社 シリコン単結晶ウエーハおよびその製造方法
JP2001240495A (ja) * 2000-02-29 2001-09-04 Toshiba Ceramics Co Ltd シリコン単結晶の引上げ方法
JP4723071B2 (ja) 2000-10-24 2011-07-13 信越半導体株式会社 シリコン結晶及びシリコン結晶ウエーハ並びにその製造方法
US7635414B2 (en) 2003-11-03 2009-12-22 Solaicx, Inc. System for continuous growing of monocrystalline silicon
US20070056504A1 (en) * 2005-09-12 2007-03-15 Rexor Corporation Method and apparatus to produce single crystal ingot of uniform axial resistivity
WO2009025336A1 (ja) * 2007-08-21 2009-02-26 Sumco Corporation Igbt用のシリコン単結晶ウェーハ及びigbt用のシリコン単結晶ウェーハの製造方法
FR2929960B1 (fr) * 2008-04-11 2011-05-13 Apollon Solar Procede de fabrication de silicium cristallin de qualite photovoltaique par ajout d'impuretes dopantes
US8434511B2 (en) 2009-07-08 2013-05-07 Gt Advanced Cz Llc Retractable and expandable water cooled valve gate useful for sealing a hot processing chamber

Also Published As

Publication number Publication date
JP2016179937A (ja) 2016-10-13
MY173316A (en) 2020-01-15
WO2012142463A3 (en) 2013-01-17
US10202705B2 (en) 2019-02-12
KR20140097971A (ko) 2014-08-07
EP2697412A4 (en) 2014-09-03
TW201247560A (en) 2012-12-01
TWI618678B (zh) 2018-03-21
EP2697412B1 (en) 2018-07-25
US20120301386A1 (en) 2012-11-29
EP2697412A2 (en) 2014-02-19
CN103608496A (zh) 2014-02-26
JP2014511146A (ja) 2014-05-12
WO2012142463A2 (en) 2012-10-18
CN103608496B (zh) 2017-12-26

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