NO954730L - Data testing - Google Patents

Data testing

Info

Publication number
NO954730L
NO954730L NO954730A NO954730A NO954730L NO 954730 L NO954730 L NO 954730L NO 954730 A NO954730 A NO 954730A NO 954730 A NO954730 A NO 954730A NO 954730 L NO954730 L NO 954730L
Authority
NO
Norway
Prior art keywords
testing
output signal
stored data
data elements
dependent
Prior art date
Application number
NO954730A
Other languages
English (en)
Other versions
NO954730D0 (no
Inventor
Malcolm Reeves
Original Assignee
Westinghouse Brake & Signal
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Brake & Signal filed Critical Westinghouse Brake & Signal
Publication of NO954730D0 publication Critical patent/NO954730D0/no
Publication of NO954730L publication Critical patent/NO954730L/no

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/1629—Error detection by comparing the output of redundant processing systems
    • G06F11/1633—Error detection by comparing the output of redundant processing systems using mutual exchange of the output between the redundant processing components
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Input From Keyboards Or The Like (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

Det beskrives et system for testing av et antall testplateelementer. Systemet omfatter minneanordning for lagring av et antall lagrede dataelementer og, som respons til et innmatingssignal som identifiserer et av de lagrede dataelementer, frembringelse av et utmatingssignal som avhenger av vedkommende lagrede dataelement. Innmatingssignalet er avhengig av et av testdataelementene og av et tilbakeføringssignal som omfatter minst en del av det utmatingssignal som er frembrakt ved testing av et tidligere testdataelement, idet minst en del av utmatingssignalet frembringer en indikasjon på resultatet av testingen.
NO954730A 1994-12-02 1995-11-23 Data testing NO954730L (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9424605A GB2295700B (en) 1994-12-02 1994-12-02 Data testing

Publications (2)

Publication Number Publication Date
NO954730D0 NO954730D0 (no) 1995-11-23
NO954730L true NO954730L (no) 1996-06-03

Family

ID=10765502

Family Applications (1)

Application Number Title Priority Date Filing Date
NO954730A NO954730L (no) 1994-12-02 1995-11-23 Data testing

Country Status (11)

Country Link
US (1) US5682388A (no)
EP (1) EP0715260B1 (no)
AU (1) AU697281B2 (no)
CA (1) CA2163470C (no)
DE (1) DE69525429T2 (no)
DK (1) DK0715260T3 (no)
ES (1) ES2172560T3 (no)
GB (1) GB2295700B (no)
HK (1) HK1000376A1 (no)
NO (1) NO954730L (no)
PT (1) PT715260E (no)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3937034B2 (ja) * 2000-12-13 2007-06-27 株式会社日立製作所 半導体集積回路のテスト方法及びテストパターン発生回路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
JPS58103045A (ja) * 1981-12-15 1983-06-18 Sony Tektronix Corp 信号発生順序検出回路
US4683532A (en) * 1984-12-03 1987-07-28 Honeywell Inc. Real-time software monitor and write protect controller
US5132974A (en) * 1989-10-24 1992-07-21 Silc Technologies, Inc. Method and apparatus for designing integrated circuits for testability
IT1246467B (it) * 1990-10-22 1994-11-19 St Microelectronics Srl Macchina a stati finiti per sistemi affidabili di computazione e regolazione
US5513190A (en) * 1991-10-28 1996-04-30 Sequoia Semiconductor, Inc. Built-in self-test tri-state architecture
US5258985A (en) * 1991-11-12 1993-11-02 Motorola, Inc. Combinational data generator and analyzer for built-in self test

Also Published As

Publication number Publication date
GB2295700B (en) 1999-04-21
DE69525429T2 (de) 2002-09-12
AU3907695A (en) 1996-06-13
CA2163470A1 (en) 1996-06-03
ES2172560T3 (es) 2002-10-01
DK0715260T3 (da) 2002-03-18
HK1000376A1 (en) 2000-03-24
EP0715260B1 (en) 2002-02-13
EP0715260A2 (en) 1996-06-05
US5682388A (en) 1997-10-28
AU697281B2 (en) 1998-10-01
EP0715260A3 (en) 1997-12-17
GB2295700A (en) 1996-06-05
DE69525429D1 (de) 2002-03-21
CA2163470C (en) 2005-04-05
PT715260E (pt) 2002-07-31
NO954730D0 (no) 1995-11-23
GB9424605D0 (en) 1995-01-25

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