DE69525429D1 - Testen von Daten - Google Patents

Testen von Daten

Info

Publication number
DE69525429D1
DE69525429D1 DE69525429T DE69525429T DE69525429D1 DE 69525429 D1 DE69525429 D1 DE 69525429D1 DE 69525429 T DE69525429 T DE 69525429T DE 69525429 T DE69525429 T DE 69525429T DE 69525429 D1 DE69525429 D1 DE 69525429D1
Authority
DE
Germany
Prior art keywords
testing data
testing
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69525429T
Other languages
English (en)
Other versions
DE69525429T2 (de
Inventor
Malcolm Reeves
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Mobility Ltd
Original Assignee
Westinghouse Brake and Signal Co Ltd
Westinghouse Brake and Signal Holdings Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Brake and Signal Co Ltd, Westinghouse Brake and Signal Holdings Ltd filed Critical Westinghouse Brake and Signal Co Ltd
Application granted granted Critical
Publication of DE69525429D1 publication Critical patent/DE69525429D1/de
Publication of DE69525429T2 publication Critical patent/DE69525429T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/1629—Error detection by comparing the output of redundant processing systems
    • G06F11/1633—Error detection by comparing the output of redundant processing systems using mutual exchange of the output between the redundant processing components
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing
DE69525429T 1994-12-02 1995-11-23 Testen von Daten Expired - Fee Related DE69525429T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9424605A GB2295700B (en) 1994-12-02 1994-12-02 Data testing

Publications (2)

Publication Number Publication Date
DE69525429D1 true DE69525429D1 (de) 2002-03-21
DE69525429T2 DE69525429T2 (de) 2002-09-12

Family

ID=10765502

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69525429T Expired - Fee Related DE69525429T2 (de) 1994-12-02 1995-11-23 Testen von Daten

Country Status (11)

Country Link
US (1) US5682388A (de)
EP (1) EP0715260B1 (de)
AU (1) AU697281B2 (de)
CA (1) CA2163470C (de)
DE (1) DE69525429T2 (de)
DK (1) DK0715260T3 (de)
ES (1) ES2172560T3 (de)
GB (1) GB2295700B (de)
HK (1) HK1000376A1 (de)
NO (1) NO954730L (de)
PT (1) PT715260E (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3937034B2 (ja) * 2000-12-13 2007-06-27 株式会社日立製作所 半導体集積回路のテスト方法及びテストパターン発生回路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
JPS58103045A (ja) * 1981-12-15 1983-06-18 Sony Tektronix Corp 信号発生順序検出回路
US4683532A (en) * 1984-12-03 1987-07-28 Honeywell Inc. Real-time software monitor and write protect controller
US5132974A (en) * 1989-10-24 1992-07-21 Silc Technologies, Inc. Method and apparatus for designing integrated circuits for testability
IT1246467B (it) * 1990-10-22 1994-11-19 St Microelectronics Srl Macchina a stati finiti per sistemi affidabili di computazione e regolazione
US5513190A (en) * 1991-10-28 1996-04-30 Sequoia Semiconductor, Inc. Built-in self-test tri-state architecture
US5258985A (en) * 1991-11-12 1993-11-02 Motorola, Inc. Combinational data generator and analyzer for built-in self test

Also Published As

Publication number Publication date
CA2163470A1 (en) 1996-06-03
NO954730L (no) 1996-06-03
EP0715260A3 (de) 1997-12-17
GB2295700B (en) 1999-04-21
GB2295700A (en) 1996-06-05
DE69525429T2 (de) 2002-09-12
NO954730D0 (no) 1995-11-23
HK1000376A1 (en) 2000-03-24
ES2172560T3 (es) 2002-10-01
PT715260E (pt) 2002-07-31
EP0715260B1 (de) 2002-02-13
EP0715260A2 (de) 1996-06-05
DK0715260T3 (da) 2002-03-18
CA2163470C (en) 2005-04-05
GB9424605D0 (en) 1995-01-25
AU3907695A (en) 1996-06-13
AU697281B2 (en) 1998-10-01
US5682388A (en) 1997-10-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee