KR950031496U - 프로브카드 - Google Patents

프로브카드

Info

Publication number
KR950031496U
KR950031496U KR2019940008995U KR19940008995U KR950031496U KR 950031496 U KR950031496 U KR 950031496U KR 2019940008995 U KR2019940008995 U KR 2019940008995U KR 19940008995 U KR19940008995 U KR 19940008995U KR 950031496 U KR950031496 U KR 950031496U
Authority
KR
South Korea
Prior art keywords
probe card
probe
card
Prior art date
Application number
KR2019940008995U
Other languages
English (en)
Other versions
KR200194290Y1 (ko
Inventor
강성모
Original Assignee
현대반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대반도체주식회사 filed Critical 현대반도체주식회사
Priority to KR2019940008995U priority Critical patent/KR200194290Y1/ko
Publication of KR950031496U publication Critical patent/KR950031496U/ko
Application granted granted Critical
Publication of KR200194290Y1 publication Critical patent/KR200194290Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR2019940008995U 1994-04-27 1994-04-27 프로브카드 KR200194290Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940008995U KR200194290Y1 (ko) 1994-04-27 1994-04-27 프로브카드

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940008995U KR200194290Y1 (ko) 1994-04-27 1994-04-27 프로브카드

Publications (2)

Publication Number Publication Date
KR950031496U true KR950031496U (ko) 1995-11-22
KR200194290Y1 KR200194290Y1 (ko) 2000-09-01

Family

ID=19381859

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940008995U KR200194290Y1 (ko) 1994-04-27 1994-04-27 프로브카드

Country Status (1)

Country Link
KR (1) KR200194290Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007165715A (ja) * 2005-12-15 2007-06-28 Tokyo Electron Ltd プローブカードの装着方法及びこの方法に用いられるプローブカード移載補助装置

Also Published As

Publication number Publication date
KR200194290Y1 (ko) 2000-09-01

Similar Documents

Publication Publication Date Title
DE59510271D1 (de) Messfühler
DE69706890D1 (de) Vorausbezahlte karte
DE59611425D1 (de) Messfühler
DE69521042D1 (de) Kryochirurgisches instrument
DE69507948D1 (de) Kryochirurgisches instrument
DE19881035T1 (de) Sondenkarte
DE69708751D1 (de) Messfühler
NO942636D0 (no) Kolposuspensio-instrument
DE69500723T2 (de) Magen-Darm-Sonde
DE29612475U1 (de) Tastkopf
DE9407326U1 (de) Maßstab
KR950031496U (ko) 프로브카드
DE9416332U1 (de) Zugangskarte
DE9416307U1 (de) Prüfvorrichtung
FI953850A (fi) Luotainsovitus
KR960007143U (ko) 카드겸용 화투
KR960006342U (ko) 소켓부착 프로브 카드
NO954730D0 (no) Data testing
DE29506514U1 (de) Zugangskarte
KR940001987U (ko) 프로브카드
KR940004347U (ko) 프로브 카드
DE9414830U1 (de) Bedside-Testkarte
DE9415829U1 (de) Prüfvorrichtung
DE9416992U1 (de) Prüfgerät
DE9408370U1 (de) Prüfvorrichtung

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20080527

Year of fee payment: 9

EXPY Expiration of term