KR940001987U - 프로브카드 - Google Patents
프로브카드Info
- Publication number
- KR940001987U KR940001987U KR2019920009769U KR920009769U KR940001987U KR 940001987 U KR940001987 U KR 940001987U KR 2019920009769 U KR2019920009769 U KR 2019920009769U KR 920009769 U KR920009769 U KR 920009769U KR 940001987 U KR940001987 U KR 940001987U
- Authority
- KR
- South Korea
- Prior art keywords
- probe card
- probe
- card
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92009769U KR950006439Y1 (ko) | 1992-06-03 | 1992-06-03 | 프로브카드 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92009769U KR950006439Y1 (ko) | 1992-06-03 | 1992-06-03 | 프로브카드 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940001987U true KR940001987U (ko) | 1994-01-03 |
KR950006439Y1 KR950006439Y1 (ko) | 1995-08-10 |
Family
ID=19334235
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR92009769U KR950006439Y1 (ko) | 1992-06-03 | 1992-06-03 | 프로브카드 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR950006439Y1 (ko) |
-
1992
- 1992-06-03 KR KR92009769U patent/KR950006439Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR950006439Y1 (ko) | 1995-08-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20060720 Year of fee payment: 12 |
|
EXPY | Expiration of term |