KR940004347U - 프로브 카드 - Google Patents
프로브 카드Info
- Publication number
- KR940004347U KR940004347U KR2019920012782U KR920012782U KR940004347U KR 940004347 U KR940004347 U KR 940004347U KR 2019920012782 U KR2019920012782 U KR 2019920012782U KR 920012782 U KR920012782 U KR 920012782U KR 940004347 U KR940004347 U KR 940004347U
- Authority
- KR
- South Korea
- Prior art keywords
- probe card
- probe
- card
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019920012782U KR0124961Y1 (ko) | 1992-07-11 | 1992-07-11 | 프로브 카드 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019920012782U KR0124961Y1 (ko) | 1992-07-11 | 1992-07-11 | 프로브 카드 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940004347U true KR940004347U (ko) | 1994-02-24 |
KR0124961Y1 KR0124961Y1 (ko) | 1999-02-18 |
Family
ID=19336520
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019920012782U KR0124961Y1 (ko) | 1992-07-11 | 1992-07-11 | 프로브 카드 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0124961Y1 (ko) |
-
1992
- 1992-07-11 KR KR2019920012782U patent/KR0124961Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0124961Y1 (ko) | 1999-02-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20060522 Year of fee payment: 9 |
|
EXPY | Expiration of term |