NO20002601L - Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk - Google Patents
Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikkInfo
- Publication number
- NO20002601L NO20002601L NO20002601A NO20002601A NO20002601L NO 20002601 L NO20002601 L NO 20002601L NO 20002601 A NO20002601 A NO 20002601A NO 20002601 A NO20002601 A NO 20002601A NO 20002601 L NO20002601 L NO 20002601L
- Authority
- NO
- Norway
- Prior art keywords
- equipment
- optical holographic
- residual stresses
- destructive determination
- examination
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 5
- 230000001066 destructive effect Effects 0.000 title abstract 2
- 230000003287 optical effect Effects 0.000 title abstract 2
- 238000005210 holographic interferometry Methods 0.000 abstract 1
- 230000007246 mechanism Effects 0.000 abstract 1
- 238000009659 non-destructive testing Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/021—Interferometers using holographic techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Holo Graphy (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Oppfinnelsen angår en fremgangsmåte og anordning for ikke-destruktiv testing av detaljer, maskinenheter og mekanismer, forskjellige materialer, and særlig en fremgangsmåte og anordning for ikke-destruktiv bestemmelse av egenspenninger som er basert på den optiske holografiske interferometriteknikken. Først registreres et hologram av undersøkelsesområdet av objektet i sin starttilstand. Deretter gjennomføres frigjøringen av egenspenningene i et undersøkelses-punkt i undersøkelsesområdet ved eksponering av overflaten av objektet til en høy-strøm elektrisk puls med rektangulær form. Til slutt lages et interferogram av det nøyaktig samme området av objektet, og egenspenningene ved undersøkelsesområdet bestemmes fra formen og størrelsen av kantene i interferogrammet.
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20002601A NO20002601L (no) | 1999-10-29 | 2000-05-19 | Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk |
PCT/NO2000/000347 WO2001031289A1 (en) | 1999-10-29 | 2000-10-19 | Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique |
CN 00817976 CN1270160C (zh) | 1999-10-29 | 2000-10-19 | 用光学全息干涉实时无损测定物体残余应力的方法与设备 |
RU2002113768/28A RU2002113768A (ru) | 1999-10-29 | 2000-10-19 | Способ и устройство для неразрушающего определения в реальном времени остаточных напряжений с использованием технологии оптической голографической интерферометрии |
EP00975012A EP1226403A1 (en) | 1999-10-29 | 2000-10-19 | Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique |
JP2001538126A JP4623907B2 (ja) | 1999-10-29 | 2000-10-19 | 光学ホログラム干渉法による、物体中の残留応力のリアルタイム非破壊測定を行うための方法および装置 |
AU13120/01A AU1312001A (en) | 1999-10-29 | 2000-10-19 | Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique |
NO20021836A NO20021836L (no) | 1999-10-29 | 2002-04-18 | Holografiske interferometriske målinger |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO995312A NO995312D0 (no) | 1999-10-29 | 1999-10-29 | FremgangsmÕte og anordning for ikke-destruktiv bestemmelse av restspenninger i objekter ved hjelp av holografisk interferometrisk teknikk |
NO20002601A NO20002601L (no) | 1999-10-29 | 2000-05-19 | Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk |
Publications (2)
Publication Number | Publication Date |
---|---|
NO20002601D0 NO20002601D0 (no) | 2000-05-19 |
NO20002601L true NO20002601L (no) | 2001-04-30 |
Family
ID=26649010
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20002601A NO20002601L (no) | 1999-10-29 | 2000-05-19 | Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1226403A1 (no) |
JP (1) | JP4623907B2 (no) |
CN (1) | CN1270160C (no) |
AU (1) | AU1312001A (no) |
NO (1) | NO20002601L (no) |
RU (1) | RU2002113768A (no) |
WO (1) | WO2001031289A1 (no) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6765677B1 (en) | 2000-10-25 | 2004-07-20 | Holotech A.S. | Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE0300666D0 (sv) * | 2003-03-10 | 2003-03-10 | Faahraeus Holographic Technolo | Stress measurement |
JP4328349B2 (ja) | 2006-11-29 | 2009-09-09 | 株式会社日立製作所 | 残留応力測定方法及び装置 |
JP2009014606A (ja) * | 2007-07-06 | 2009-01-22 | Hitachi Ltd | 残留応力測定装置及び残留応力測定方法 |
JP4488060B2 (ja) * | 2007-11-14 | 2010-06-23 | 富士ゼロックス株式会社 | 成形不能部検出装置、成形不能部検出システム、成形不能部検出プログラムおよび成形不能部検出方法 |
JP5356894B2 (ja) * | 2009-04-06 | 2013-12-04 | ポリプラスチックス株式会社 | 残留応力算出方法及び残留応力分布導出方法 |
GB201117343D0 (en) * | 2011-10-07 | 2011-11-23 | Airbus Uk Ltd | Method and apparatus for measuring residual stresses in a component |
CN102865948A (zh) * | 2012-09-27 | 2013-01-09 | 辽宁忠旺集团有限公司 | 一种铝合金薄板对接焊焊接残余应力测定方法 |
RU2523073C1 (ru) * | 2013-03-21 | 2014-07-20 | Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) | Устройство для определения механических напряжений на поверхности металлической конструкции путем введения фиксированного количества теплоты |
EP3149767A4 (en) * | 2014-05-29 | 2018-01-24 | Brown University | Optical system and methods for the determination of stress in a substrate |
CN104697467B (zh) * | 2015-02-12 | 2017-05-24 | 中北大学 | 基于线激光扫描的焊缝外观形状及表面缺陷检测方法 |
CN108181032B (zh) * | 2017-12-21 | 2020-11-03 | 重庆市铜梁区华亿来铝材加工厂 | 一种残余应力检测方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4249423A (en) * | 1979-05-11 | 1981-02-10 | General Electric Company | Semi-nondestructive residual stress measurement |
WO1985003123A1 (en) * | 1984-01-05 | 1985-07-18 | Industrial Holographics, Inc. | Apparatus for the practice of double exposure interferometric non-destructive testing |
SU1758419A1 (ru) | 1990-05-30 | 1992-08-30 | Институт Физико-Технических Проблем Севера Со Ан Ссср | Способ определени остаточных напр жений |
JPH04186106A (ja) * | 1990-11-21 | 1992-07-02 | Kowa Co | 光学測定方法および装置 |
JPH04223208A (ja) * | 1990-12-25 | 1992-08-13 | Nippon Telegr & Teleph Corp <Ntt> | 実時間変形・形状解析方法及び装置 |
US5432595A (en) * | 1993-07-13 | 1995-07-11 | Pechersky; Martin J. | Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison |
AU4834993A (en) * | 1993-10-05 | 1995-05-01 | Kabushikigaisya Hutech | Non-destructive inspection method for mechanical behaviour of article |
US6040900A (en) * | 1996-07-01 | 2000-03-21 | Cybernet Systems Corporation | Compact fiber-optic electronic laser speckle pattern shearography |
US5920017A (en) * | 1997-10-30 | 1999-07-06 | Westinghouse Savannah River Company | Thermal input control and enhancement for laser based residual stress measurements using liquid temperature indicating coatings |
-
2000
- 2000-05-19 NO NO20002601A patent/NO20002601L/no not_active Application Discontinuation
- 2000-10-19 CN CN 00817976 patent/CN1270160C/zh not_active Expired - Fee Related
- 2000-10-19 AU AU13120/01A patent/AU1312001A/en not_active Abandoned
- 2000-10-19 JP JP2001538126A patent/JP4623907B2/ja not_active Expired - Fee Related
- 2000-10-19 EP EP00975012A patent/EP1226403A1/en not_active Withdrawn
- 2000-10-19 RU RU2002113768/28A patent/RU2002113768A/ru unknown
- 2000-10-19 WO PCT/NO2000/000347 patent/WO2001031289A1/en active Application Filing
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6765677B1 (en) | 2000-10-25 | 2004-07-20 | Holotech A.S. | Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
Also Published As
Publication number | Publication date |
---|---|
AU1312001A (en) | 2001-05-08 |
WO2001031289A1 (en) | 2001-05-03 |
JP4623907B2 (ja) | 2011-02-02 |
RU2002113768A (ru) | 2004-01-27 |
CN1270160C (zh) | 2006-08-16 |
EP1226403A1 (en) | 2002-07-31 |
CN1415066A (zh) | 2003-04-30 |
NO20002601D0 (no) | 2000-05-19 |
JP2003514247A (ja) | 2003-04-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
NO20002601L (no) | Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk | |
TW253029B (en) | Non-destructive flex testing method and means | |
EP1360513A4 (en) | DESIGN SYSTEM FOR TESTING MULTIPLE CATCHES TO DETECT OR LOCATE CROSS-CLOCK DOMAIN ERRORS DURING AUTOMATIC TESTING OR SCANNING TEST | |
DK0888522T3 (da) | Fremgangsmåde og apparatur til måling af formen af genstande | |
DK380488A (da) | Fremgangsmaade samt apparat til afproevning for gaslaekage gennem en genstand | |
GB9903638D0 (en) | A measurement method and measurement apparatus | |
IL152213A0 (en) | Spatial and spectral wavefront analysis and measurement | |
CY1111377T1 (el) | Μια μεθοδος για την παραγωγη ελαττωματων και εφελκυστικων εναπομενουσων τασεων | |
WO2007008265A8 (en) | Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry | |
NO912428L (no) | Fremgangsmaate ved maaling av hydraulisk sprekkpropagering i sann tid. | |
WO2001007885A3 (en) | Phase-shifting point diffraction interferometer focus-aid enhanced mask | |
DE69026212D1 (de) | Wechselstromvorrichtung zum Prüfen eines IC-Testgerätes | |
Quan et al. | Application of the holographic carrier fringe and FFT technique for deformation measurement | |
SE0300666D0 (sv) | Stress measurement | |
BR9407504A (pt) | Dispositivo de teste para ensaio kit para realizar um ensaio e processo para determinar a presença de um anólito em um individuo em teste | |
FI19992849A (fi) | Menetelmä ja laitteisto paperikoneen toimintalaitteen kohdistuksen identifioimiseksi | |
NO995312D0 (no) | FremgangsmÕte og anordning for ikke-destruktiv bestemmelse av restspenninger i objekter ved hjelp av holografisk interferometrisk teknikk | |
JPS54105967A (en) | Defect test system for pattern featuring directivity | |
DE59407929D1 (de) | Verfahren zum test eines objektorientierten programms | |
JPS5322370A (en) | Inspecting method of semiconductor device | |
RU2639578C1 (ru) | Способ измерения частичных разрядов | |
NO20005376L (no) | Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter | |
Fuzessy et al. | Error factors of comparison in difference holographic interferometry | |
DK83284A (da) | Apparat til bestemmelse af en ukendt egenskab hos en gas- eller dampproeve | |
NO147813C (no) | Fremgangsmaate og utstyr for testing av de tapsendringer som opptrer i en optisk fiber under en produksjonsprosess |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FC2A | Withdrawal, rejection or dismissal of laid open patent application |