NO20005376L - Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter - Google Patents

Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter

Info

Publication number
NO20005376L
NO20005376L NO20005376A NO20005376A NO20005376L NO 20005376 L NO20005376 L NO 20005376L NO 20005376 A NO20005376 A NO 20005376A NO 20005376 A NO20005376 A NO 20005376A NO 20005376 L NO20005376 L NO 20005376L
Authority
NO
Norway
Prior art keywords
holographic
probe
investigation area
coherent light
plane
Prior art date
Application number
NO20005376A
Other languages
English (en)
Other versions
NO20005376D0 (no
Inventor
John Petter Fjeldstad
Irina Evgenievna Fjeldstad
Leonid Michailovich Lobanov
Vjacheslav Avtonomovi Pivtorak
Nikolay Georgievich Kuvshinsky
Nikolay Aleksandrovi Davidenko
Sergey Gavrilovi Andrushchenko
Valeriy Aleksandrovich Pavlov
Galina Ivanovna Tkachuk
Irina Vladislavovna Kijanets
Original Assignee
Holo Tech As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Holo Tech As filed Critical Holo Tech As
Priority to NO20005376A priority Critical patent/NO20005376L/no
Publication of NO20005376D0 publication Critical patent/NO20005376D0/no
Priority to US09/717,306 priority patent/US6765677B1/en
Priority to PCT/NO2001/000424 priority patent/WO2002035180A1/en
Priority to EP01981178A priority patent/EP1337804A1/en
Priority to AU2002212837A priority patent/AU2002212837A1/en
Publication of NO20005376L publication Critical patent/NO20005376L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

This invention relates to a method and device for performing non-destructive measurements of residual stresses in an investigation area of an object based on use of optical holographic interferometry technique. The holographic interferometer is divided into a holographic probe which contains means for illuminating the investigation area of the object by coherent light, collecting the coherent light that scatters off this investigation area and means for performing a non- destructive dislocation release pulse of the residual stresses in a small region of the investigation area by exposing the object to an electric high currency, and a holographic camera which contains means for formation, registration, and development of a hologram and for formation of an interferogram of the investigation area of the object. The object coherent light is sent from the light source to the probe by a single-mode light guidance cable, from the probe to the holographic camera by an other single-mode light guidance cable, and the reference coherent light from the light source to the holographic camera in a third single-mode light guidance cable. In this way, one is allowed to measure residual stresses on surfaces of an object with high curvatures, in hardly accessible places, and under many weather conditions by a simple hand-held manual positioning of the holographic probe during the measurements.
NO20005376A 2000-10-25 2000-10-25 Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter NO20005376L (no)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NO20005376A NO20005376L (no) 2000-10-25 2000-10-25 Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter
US09/717,306 US6765677B1 (en) 2000-10-25 2000-11-22 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects
PCT/NO2001/000424 WO2002035180A1 (en) 2000-10-25 2001-10-23 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects
EP01981178A EP1337804A1 (en) 2000-10-25 2001-10-23 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects
AU2002212837A AU2002212837A1 (en) 2000-10-25 2001-10-23 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO20005376A NO20005376L (no) 2000-10-25 2000-10-25 Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter

Publications (2)

Publication Number Publication Date
NO20005376D0 NO20005376D0 (no) 2000-10-25
NO20005376L true NO20005376L (no) 2002-04-26

Family

ID=19911722

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20005376A NO20005376L (no) 2000-10-25 2000-10-25 Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter

Country Status (5)

Country Link
US (1) US6765677B1 (no)
EP (1) EP1337804A1 (no)
AU (1) AU2002212837A1 (no)
NO (1) NO20005376L (no)
WO (1) WO2002035180A1 (no)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO20002948L (no) * 2000-06-08 2001-12-10 Holo Tech As Fremgangsmåte og anordning for registrering av hologrammer på amorfe molekyl¶re halvlederfilmer
SE0300666D0 (sv) * 2003-03-10 2003-03-10 Faahraeus Holographic Technolo Stress measurement
CN101251472B (zh) * 2008-03-19 2010-06-02 中国科学院上海光学精密机械研究所 双光束在线实时测量光学薄膜应力的装置及其测量方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3960448A (en) 1975-06-09 1976-06-01 Trw Inc. Holographic instrument for measuring stress in a borehole wall
FR2593288B1 (fr) 1986-01-20 1989-09-01 Aerospatiale Dispositif de controle non-destructif d'une piece par holographie optique
US5339152A (en) 1992-04-24 1994-08-16 Grumman Aerospace Corporation Holographic inspection system with integral stress inducer
US6094260A (en) * 1998-08-12 2000-07-25 General Electric Company Holographic interferometry for monitoring and controlling laser shock peening
NO20002601L (no) 1999-10-29 2001-04-30 Holo Tech As Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk
NO20002724L (no) 1999-10-29 2001-04-30 Holo Tech As Metode og utstyr for ikke-destruktiv inspeksjon av objekter basert på halografisk interferometri
NO995311D0 (no) * 1999-10-29 1999-10-29 Holo Tech As FremgangsmÕte og anordning for ikke-destruktiv inspeksjon av objekter ved hjelp av optisk holografisk interferometer

Also Published As

Publication number Publication date
AU2002212837A1 (en) 2002-05-06
US6765677B1 (en) 2004-07-20
WO2002035180A1 (en) 2002-05-02
EP1337804A1 (en) 2003-08-27
NO20005376D0 (no) 2000-10-25

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