AU1312001A - Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique - Google Patents

Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique

Info

Publication number
AU1312001A
AU1312001A AU13120/01A AU1312001A AU1312001A AU 1312001 A AU1312001 A AU 1312001A AU 13120/01 A AU13120/01 A AU 13120/01A AU 1312001 A AU1312001 A AU 1312001A AU 1312001 A AU1312001 A AU 1312001A
Authority
AU
Australia
Prior art keywords
objects
real time
residual stresses
time non
optical holographic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU13120/01A
Other languages
English (en)
Inventor
Sergei Gavrilovich Andrushchenko
Irina Evgenievna Fjeldstad
John Petter Fjeldstad
Peter Dmitrievich Krotenko
Vladimir Petrovich Kushniruk
Nikolai Georgievich Kuvshinsky
Leonid Mikhailovich Lobanov
Vladimir Petrovich Loginov
Valery Aleandrovich Pavlov
Vyacheslav Antonomovich Pivtorak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HoloTech AS
Original Assignee
HoloTech AS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from NO995312A external-priority patent/NO995312D0/no
Application filed by HoloTech AS filed Critical HoloTech AS
Publication of AU1312001A publication Critical patent/AU1312001A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Holo Graphy (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AU13120/01A 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique Abandoned AU1312001A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
NO995312A NO995312D0 (no) 1999-10-29 1999-10-29 FremgangsmÕte og anordning for ikke-destruktiv bestemmelse av restspenninger i objekter ved hjelp av holografisk interferometrisk teknikk
NO19995312 1999-10-29
NO20002601A NO20002601L (no) 1999-10-29 2000-05-19 Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk
NO20002601 2000-05-19
PCT/NO2000/000347 WO2001031289A1 (en) 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique

Publications (1)

Publication Number Publication Date
AU1312001A true AU1312001A (en) 2001-05-08

Family

ID=26649010

Family Applications (1)

Application Number Title Priority Date Filing Date
AU13120/01A Abandoned AU1312001A (en) 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique

Country Status (7)

Country Link
EP (1) EP1226403A1 (no)
JP (1) JP4623907B2 (no)
CN (1) CN1270160C (no)
AU (1) AU1312001A (no)
NO (1) NO20002601L (no)
RU (1) RU2002113768A (no)
WO (1) WO2001031289A1 (no)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO20005376L (no) * 2000-10-25 2002-04-26 Holo Tech As Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter
SE0300666D0 (sv) * 2003-03-10 2003-03-10 Faahraeus Holographic Technolo Stress measurement
JP4328349B2 (ja) 2006-11-29 2009-09-09 株式会社日立製作所 残留応力測定方法及び装置
JP2009014606A (ja) * 2007-07-06 2009-01-22 Hitachi Ltd 残留応力測定装置及び残留応力測定方法
JP4488060B2 (ja) * 2007-11-14 2010-06-23 富士ゼロックス株式会社 成形不能部検出装置、成形不能部検出システム、成形不能部検出プログラムおよび成形不能部検出方法
JP5356894B2 (ja) * 2009-04-06 2013-12-04 ポリプラスチックス株式会社 残留応力算出方法及び残留応力分布導出方法
GB201117343D0 (en) * 2011-10-07 2011-11-23 Airbus Uk Ltd Method and apparatus for measuring residual stresses in a component
CN102865948A (zh) * 2012-09-27 2013-01-09 辽宁忠旺集团有限公司 一种铝合金薄板对接焊焊接残余应力测定方法
RU2523073C1 (ru) * 2013-03-21 2014-07-20 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Устройство для определения механических напряжений на поверхности металлической конструкции путем введения фиксированного количества теплоты
EP3149767A4 (en) * 2014-05-29 2018-01-24 Brown University Optical system and methods for the determination of stress in a substrate
CN104697467B (zh) * 2015-02-12 2017-05-24 中北大学 基于线激光扫描的焊缝外观形状及表面缺陷检测方法
CN108181032B (zh) * 2017-12-21 2020-11-03 重庆市铜梁区华亿来铝材加工厂 一种残余应力检测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4249423A (en) * 1979-05-11 1981-02-10 General Electric Company Semi-nondestructive residual stress measurement
WO1985003123A1 (en) * 1984-01-05 1985-07-18 Industrial Holographics, Inc. Apparatus for the practice of double exposure interferometric non-destructive testing
SU1758419A1 (ru) 1990-05-30 1992-08-30 Институт Физико-Технических Проблем Севера Со Ан Ссср Способ определени остаточных напр жений
JPH04186106A (ja) * 1990-11-21 1992-07-02 Kowa Co 光学測定方法および装置
JPH04223208A (ja) * 1990-12-25 1992-08-13 Nippon Telegr & Teleph Corp <Ntt> 実時間変形・形状解析方法及び装置
US5432595A (en) * 1993-07-13 1995-07-11 Pechersky; Martin J. Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison
AU4834993A (en) * 1993-10-05 1995-05-01 Kabushikigaisya Hutech Non-destructive inspection method for mechanical behaviour of article
US6040900A (en) * 1996-07-01 2000-03-21 Cybernet Systems Corporation Compact fiber-optic electronic laser speckle pattern shearography
US5920017A (en) * 1997-10-30 1999-07-06 Westinghouse Savannah River Company Thermal input control and enhancement for laser based residual stress measurements using liquid temperature indicating coatings

Also Published As

Publication number Publication date
WO2001031289A1 (en) 2001-05-03
JP4623907B2 (ja) 2011-02-02
RU2002113768A (ru) 2004-01-27
NO20002601L (no) 2001-04-30
CN1270160C (zh) 2006-08-16
EP1226403A1 (en) 2002-07-31
CN1415066A (zh) 2003-04-30
NO20002601D0 (no) 2000-05-19
JP2003514247A (ja) 2003-04-15

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase