NL142826B - Voor mechanische spanning gevoelig halfgeleiderelement. - Google Patents

Voor mechanische spanning gevoelig halfgeleiderelement.

Info

Publication number
NL142826B
NL142826B NL696911529A NL6911529A NL142826B NL 142826 B NL142826 B NL 142826B NL 696911529 A NL696911529 A NL 696911529A NL 6911529 A NL6911529 A NL 6911529A NL 142826 B NL142826 B NL 142826B
Authority
NL
Netherlands
Prior art keywords
semi
conductor element
mechanical tension
element sensitive
sensitive
Prior art date
Application number
NL696911529A
Other languages
English (en)
Dutch (nl)
Other versions
NL6911529A (xx
Original Assignee
Matsushita Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Ind Co Ltd filed Critical Matsushita Electric Ind Co Ltd
Publication of NL6911529A publication Critical patent/NL6911529A/xx
Publication of NL142826B publication Critical patent/NL142826B/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/84Types of semiconductor device ; Multistep manufacturing processes therefor controllable by variation of applied mechanical force, e.g. of pressure
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/18Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Pressure Sensors (AREA)
  • Measuring Fluid Pressure (AREA)
NL696911529A 1968-07-29 1969-07-28 Voor mechanische spanning gevoelig halfgeleiderelement. NL142826B (nl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP5415068 1968-07-29
JP8574968 1968-11-20
JP3181969 1969-04-17

Publications (2)

Publication Number Publication Date
NL6911529A NL6911529A (xx) 1970-02-02
NL142826B true NL142826B (nl) 1974-07-15

Family

ID=27287480

Family Applications (1)

Application Number Title Priority Date Filing Date
NL696911529A NL142826B (nl) 1968-07-29 1969-07-28 Voor mechanische spanning gevoelig halfgeleiderelement.

Country Status (5)

Country Link
US (1) US3699405A (xx)
DE (1) DE1938316B2 (xx)
FR (1) FR2014764B1 (xx)
GB (1) GB1220436A (xx)
NL (1) NL142826B (xx)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004033457B4 (de) 2004-07-05 2007-12-20 Visteon Global Technologies, Inc., Dearborn Verbundwerkstoff aus einer hochfesten Aluminiumlegierung
DE102005059309A1 (de) * 2005-12-09 2007-11-22 Hydro Aluminium Mandl&Berger Gmbh Aus mindestens zwei vorgegossenen Abschnitten zusammengesetztes Bauteil und Verfahren zu seiner Herstellung
CN100561153C (zh) * 2007-12-24 2009-11-18 中国水电顾问集团中南勘测设计研究院 摩阻力计及其测试方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3215568A (en) * 1960-07-18 1965-11-02 Bell Telephone Labor Inc Semiconductor devices
FR1354527A (fr) * 1962-04-14 1964-03-06 Toko Radio Coil Kenkyusho Kk Filtre électro-mécanique
NL6700819A (xx) * 1966-03-14 1967-09-15
US3550094A (en) * 1968-04-01 1970-12-22 Gen Electric Semiconductor data storage apparatus with electron beam readout
US3532910A (en) * 1968-07-29 1970-10-06 Bell Telephone Labor Inc Increasing the power output of certain diodes

Also Published As

Publication number Publication date
FR2014764A1 (xx) 1970-04-17
FR2014764B1 (xx) 1974-05-03
DE1938316A1 (de) 1970-09-24
GB1220436A (en) 1971-01-27
NL6911529A (xx) 1970-02-02
US3699405A (en) 1972-10-17
DE1938316B2 (de) 1971-06-24

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Legal Events

Date Code Title Description
V1 Lapsed because of non-payment of the annual fee
NL80 Information provided on patent owner name for an already discontinued patent

Owner name: MATSUSHITA ELEC