NL1036305A1 - Grating for EUV-radiation, method for manufacturing the grating and wavefront measurement system. - Google Patents

Grating for EUV-radiation, method for manufacturing the grating and wavefront measurement system. Download PDF

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Publication number
NL1036305A1
NL1036305A1 NL1036305A NL1036305A NL1036305A1 NL 1036305 A1 NL1036305 A1 NL 1036305A1 NL 1036305 A NL1036305 A NL 1036305A NL 1036305 A NL1036305 A NL 1036305A NL 1036305 A1 NL1036305 A1 NL 1036305A1
Authority
NL
Netherlands
Prior art keywords
grating
manufacturing
measurement system
euv radiation
wavefront measurement
Prior art date
Application number
NL1036305A
Other languages
English (en)
Inventor
Borgert Kruizinga
Martijn Gerard Dominique Wehrens
Michiel David Nijkerk
Kornelis Frits Feenstra
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of NL1036305A1 publication Critical patent/NL1036305A1/nl

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1847—Manufacturing methods
    • G02B5/1857—Manufacturing methods using exposure or etching means, e.g. holography, photolithography, exposure to electron or ion beams
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1861—Reflection gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70316—Details of optical elements, e.g. of Bragg reflectors, extreme ultraviolet [EUV] multilayer or bilayer mirrors or diffractive optical elements
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70591—Testing optical components
    • G03F7/706—Aberration measurement
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Manufacturing & Machinery (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
NL1036305A 2007-12-21 2008-12-11 Grating for EUV-radiation, method for manufacturing the grating and wavefront measurement system. NL1036305A1 (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US857307P 2007-12-21 2007-12-21

Publications (1)

Publication Number Publication Date
NL1036305A1 true NL1036305A1 (nl) 2009-06-23

Family

ID=40459247

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1036305A NL1036305A1 (nl) 2007-12-21 2008-12-11 Grating for EUV-radiation, method for manufacturing the grating and wavefront measurement system.

Country Status (6)

Country Link
US (1) US8559108B2 (nl)
JP (1) JP5401470B2 (nl)
KR (1) KR101551342B1 (nl)
CN (1) CN101903808B (nl)
NL (1) NL1036305A1 (nl)
WO (1) WO2009082224A1 (nl)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011076011A1 (de) * 2011-05-18 2012-11-22 Carl Zeiss Smt Gmbh Reflektives optisches Element und optisches System für die EUV-Lithographie
WO2013040748A1 (zh) * 2011-09-20 2013-03-28 中国科学院微电子研究所 亚波长极紫外金属透射光栅及其制作方法
US9519224B2 (en) * 2011-10-20 2016-12-13 Asml Netherlands B.V. Lithographic apparatus and method
US8765331B2 (en) 2012-08-17 2014-07-01 International Business Machines Corporation Reducing edge die reflectivity in extreme ultraviolet lithography
US9335206B2 (en) * 2012-08-30 2016-05-10 Kla-Tencor Corporation Wave front aberration metrology of optics of EUV mask inspection system
US9151881B2 (en) * 2012-11-12 2015-10-06 Kla-Tencor Corporation Phase grating for mask inspection system
KR101849978B1 (ko) 2012-12-18 2018-04-19 삼성전자 주식회사 극자외선 광 발생 장치 및 방법
DE102013202948A1 (de) * 2013-02-22 2014-09-11 Carl Zeiss Smt Gmbh Beleuchtungssystem für eine EUV-Lithographievorrichtung und Facettenspiegel dafür
US9529249B2 (en) * 2013-11-15 2016-12-27 Taiwan Semiconductor Manufacturing Company, Ltd. Extreme ultraviolet lithography process and mask
NL2017692A (en) * 2015-11-19 2017-06-02 Asml Netherlands Bv Euv source chamber and gas flow regime for lithographic apparatus, multi-layer mirror and lithographic apparatus
DE102017200428B3 (de) 2017-01-12 2018-06-21 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage sowie Verfahren zum Vermessen eines Abbildungsfehlers
DE102017217251A1 (de) 2017-09-27 2019-03-28 Carl Zeiss Smt Gmbh Verfahren und Anordnung zur Analyse der Wellenfrontwirkung eines optischen Systems
NL2021357A (en) * 2018-01-31 2018-08-16 Asml Netherlands Bv Two-dimensional diffraction grating
EP4095573A1 (en) * 2021-05-27 2022-11-30 ASML Netherlands B.V. Diffraction grating for measurements in euv-exposure apparatuses

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05134385A (ja) 1991-11-11 1993-05-28 Nikon Corp 反射マスク
JP3219502B2 (ja) 1992-12-01 2001-10-15 キヤノン株式会社 反射型マスクとその製造方法、並びに露光装置と半導体デバイス製造方法
US6392792B1 (en) * 2000-12-05 2002-05-21 The Regents Of The University Of California Method of fabricating reflection-mode EUV diffraction elements
EP1231514A1 (en) * 2001-02-13 2002-08-14 Asm Lithography B.V. Measurement of wavefront aberrations in a lithographic projection apparatus
US6660935B2 (en) 2001-05-25 2003-12-09 Gelcore Llc LED extrusion light engine and connector therefor
DE60309238T2 (de) * 2002-03-08 2007-06-06 Asml Netherlands B.V. Lithographische Maske, lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
US7002747B2 (en) * 2003-01-15 2006-02-21 Asml Holding N.V. Diffuser plate and method of making same
US6867846B2 (en) * 2003-01-15 2005-03-15 Asml Holding Nv Tailored reflecting diffractor for EUV lithographic system aberration measurement
US7268891B2 (en) 2003-01-15 2007-09-11 Asml Holding N.V. Transmission shear grating in checkerboard configuration for EUV wavefront sensor
JP4154375B2 (ja) 2003-08-29 2008-09-24 エーエスエムエル ホールディング エヌ．ブイ． スペックル低減方法およびｅｕｖ干渉法のためのシステム
CN100395565C (zh) * 2004-12-16 2008-06-18 中国工程物理研究院激光聚变研究中心 量子点阵衍射光栅
JP4817702B2 (ja) 2005-04-14 2011-11-16 キヤノン株式会社 光学装置及びそれを備えた露光装置
JP5009649B2 (ja) * 2007-02-28 2012-08-22 Ｈｏｙａ株式会社 マスクブランク、露光用マスクの製造方法、反射型マスクの製造方法、及びインプリント用テンプレートの製造方法
JP5295553B2 (ja) * 2007-12-07 2013-09-18 株式会社東芝 反射型マスク

Also Published As

Publication number Publication date
US20100284064A1 (en) 2010-11-11
KR101551342B1 (ko) 2015-09-08
US8559108B2 (en) 2013-10-15
CN101903808A (zh) 2010-12-01
WO2009082224A1 (en) 2009-07-02
KR20100099743A (ko) 2010-09-13
CN101903808B (zh) 2014-02-26
JP5401470B2 (ja) 2014-01-29
JP2011510480A (ja) 2011-03-31

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