NL1034256A1 - Spectroscopiesysteem. - Google Patents
Spectroscopiesysteem.Info
- Publication number
- NL1034256A1 NL1034256A1 NL1034256A NL1034256A NL1034256A1 NL 1034256 A1 NL1034256 A1 NL 1034256A1 NL 1034256 A NL1034256 A NL 1034256A NL 1034256 A NL1034256 A NL 1034256A NL 1034256 A1 NL1034256 A1 NL 1034256A1
- Authority
- NL
- Netherlands
- Prior art keywords
- spectroscopy system
- spectroscopy
- Prior art date
Links
- 238000004611 spectroscopical analysis Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0237—Adjustable, e.g. focussing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0262—Constructional arrangements for removing stray light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/32—Investigating bands of a spectrum in sequence by a single detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US50566106 | 2006-08-16 | ||
US11/505,661 US7397561B2 (en) | 2005-11-07 | 2006-08-16 | Spectroscopy system |
Publications (2)
Publication Number | Publication Date |
---|---|
NL1034256A1 true NL1034256A1 (nl) | 2008-02-19 |
NL1034256C2 NL1034256C2 (nl) | 2009-04-03 |
Family
ID=38955125
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL1034256A NL1034256C2 (nl) | 2006-08-16 | 2007-08-16 | Spectroscopiesysteem. |
Country Status (5)
Country | Link |
---|---|
US (1) | US7397561B2 (nl) |
JP (1) | JP2008046132A (nl) |
KR (1) | KR20080015759A (nl) |
DE (1) | DE102007039845A1 (nl) |
NL (1) | NL1034256C2 (nl) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL1034464C2 (nl) * | 2006-10-06 | 2009-04-03 | Wafermasters Inc | Raman- en fotoluminescentiespectroscopie. |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7609370B2 (en) * | 2007-01-23 | 2009-10-27 | Chemimage Corporation | Single detector based dual excitation wavelength spectra display |
EP2426470A4 (en) * | 2009-04-28 | 2015-04-01 | Imagineering Inc | SPECTROSCOPE |
US20120099102A1 (en) * | 2010-10-26 | 2012-04-26 | Bello Job M | Dual and multi-wavelength sampling probe for raman spectroscopy |
DE102010060563A1 (de) * | 2010-11-15 | 2012-05-16 | Technische Universität Dresden | Verfahren zur spektroskopischen Bestimmung der Konzentration von Inhaltsstoffen in Papieren oder Folien und Probenhalter zur Durchführung des Verfahrens |
US8823931B1 (en) * | 2011-11-11 | 2014-09-02 | Redox Biomedical, Inc. | Laser wavelength tracking via direct laser measurement and optical filters in a spectrometer |
JP5539421B2 (ja) * | 2012-02-24 | 2014-07-02 | 三菱電機株式会社 | プラスチックの識別装置とその方法 |
CN102768070B (zh) * | 2012-07-27 | 2014-11-12 | 中国科学院空间科学与应用研究中心 | 一种互补测量的单光子计数成像系统及方法 |
KR101524556B1 (ko) | 2013-04-25 | 2015-05-29 | 한국화학연구원 | 광대역 필터를 이용하여 빛의 파장을 선택할 수 있는 단색화 장치 |
US9329084B2 (en) * | 2013-11-14 | 2016-05-03 | Thermo Scientific Portable Analytical Instruments Inc. | Moving laser focus in a spectrometer |
US20230296853A9 (en) | 2015-10-08 | 2023-09-21 | Teramount Ltd. | Optical Coupling |
US10317281B2 (en) * | 2015-12-29 | 2019-06-11 | Oak Analytics | Compact spectrometer |
KR101803250B1 (ko) | 2016-01-20 | 2017-11-30 | (주)아이에스엠아이엔씨 | 광대역 필터를 이용한 분광 광도 측정 기술 및 장치 |
WO2017184109A1 (en) * | 2016-04-18 | 2017-10-26 | Hewlett-Packard Development Company, L.P. | Simultaneous detection of multiple spectra of scattered radiation |
US10705324B2 (en) | 2016-06-07 | 2020-07-07 | Andrew A. Papp | High-efficiency oblique illumination system for fluorescence excitation and detection |
GB201615612D0 (en) | 2016-09-14 | 2016-10-26 | Univ Court Of The Univ Of St Andrews The | Optical raman system |
GB2557311B (en) * | 2016-12-06 | 2021-05-12 | Rsp Systems As | Analyte Detection apparatus and method of detecting an analyte |
JP7147143B2 (ja) * | 2017-01-20 | 2022-10-05 | 株式会社リコー | 分光器および分析装置 |
KR102498122B1 (ko) * | 2017-11-21 | 2023-02-09 | 삼성전자주식회사 | 분광 장치와, 분광 방법, 및 생체신호 측정장치 |
US10337918B1 (en) * | 2018-02-20 | 2019-07-02 | Baker Hughes, A Ge Company, Llc | Spectrometer with fiber bragg grating |
US11441948B2 (en) * | 2019-03-25 | 2022-09-13 | Mks Technology, Inc. | Multi-dispersive spectrometer |
JP2022155138A (ja) * | 2021-03-30 | 2022-10-13 | キヤノン株式会社 | 識別装置 |
Family Cites Families (27)
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DE2651086B2 (de) * | 1976-11-09 | 1978-11-09 | Hewlett-Packard Gmbh, 7030 Boeblingen | Photometer |
JPS6318250A (ja) * | 1986-07-10 | 1988-01-26 | Kiso Kaiseki Kenkyusho:Kk | 半導体結晶中の不純物評価方法及びその装置 |
US4810091A (en) * | 1987-12-30 | 1989-03-07 | Hewlett-Packard Company | Apparatus and method for adjusting focus of a multi-element optical detector |
JPH0595035A (ja) * | 1991-10-01 | 1993-04-16 | Tadahiro Omi | 分析装置 |
JPH0650889A (ja) * | 1992-07-31 | 1994-02-25 | Shimadzu Corp | 近赤外分析装置 |
DE69330969T2 (de) * | 1992-12-28 | 2002-08-29 | Michele Hinnrichs | Multispektrale bildanalyse |
US5421339A (en) * | 1993-05-12 | 1995-06-06 | Board Of Regents, The University Of Texas System | Diagnosis of dysplasia using laser induced fluoroescence |
US5886784A (en) * | 1993-09-08 | 1999-03-23 | Leica Lasertechink Gmbh | Device for the selection and detection of at least two spectral regions in a beam of light |
JP3568626B2 (ja) * | 1994-05-24 | 2004-09-22 | オリンパス株式会社 | 走査型光学顕微鏡 |
GB9410395D0 (en) * | 1994-05-24 | 1994-07-13 | Renishaw Plc | Spectroscopic apparatus |
US5713364A (en) * | 1995-08-01 | 1998-02-03 | Medispectra, Inc. | Spectral volume microprobe analysis of materials |
DE19654211C2 (de) * | 1996-12-24 | 2000-07-06 | Leica Microsystems | Konfokales Mikroskop |
DE19707967A1 (de) | 1997-02-27 | 1998-09-03 | Basf Ag | Verfahren und Vorrichtung zur Ermittlung des Vernetzungsgrads von vernetzten Haftklebstoffschichten |
EP1055144B1 (de) * | 1998-02-19 | 2015-01-14 | Leica Microsystems CMS GmbH | Optische anordnung mit spektral selektivem element |
US5986758A (en) * | 1998-08-18 | 1999-11-16 | The United States Of America As Represented By The Secretary Of The Air Force | Diffractive optic image spectrometer (DOIS) |
GB9825267D0 (en) * | 1998-11-19 | 1999-01-13 | Medical Res Council | Scanning confocal optical microscope system |
DE10006800A1 (de) * | 2000-02-15 | 2001-08-16 | Leica Microsystems | Vorrichtung zur Selektion und Detektion mindestens eines Spektralbereichs eines spektral aufgefächerten Lichtstrahls |
DE10038049A1 (de) * | 2000-08-02 | 2002-02-14 | Leica Microsystems | Optische Anordnung zur Selektion und Detektion des Spektalbereichs eines Lichtstrahls |
DE10039520A1 (de) * | 2000-08-08 | 2002-02-21 | Leica Microsystems | Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten |
JP2002168694A (ja) * | 2000-12-04 | 2002-06-14 | Inst Of Physical & Chemical Res | 分光器 |
DE10126286A1 (de) * | 2001-05-30 | 2002-12-19 | Leica Microsystems | Verfahren und Vorrichtung zum Punktweisen scannen einer Probe |
JP4939703B2 (ja) * | 2001-08-21 | 2012-05-30 | オリンパス株式会社 | 走査型レーザー顕微鏡 |
AU2002236343A1 (en) | 2002-02-28 | 2003-09-09 | Erasmus Universiteit Rotterdam | Depth selective ph measurement and uv exposure measurement |
DE10213187A1 (de) * | 2002-03-23 | 2003-10-09 | Leica Microsystems | Verfahren zur Spektralanlanalyse und Scanmikroskop |
DE10243449B4 (de) * | 2002-09-19 | 2014-02-20 | Leica Microsystems Cms Gmbh | CARS-Mikroskop und Verfahren zur CARS-Mikroskopie |
JP2005121574A (ja) * | 2003-10-20 | 2005-05-12 | Nippon Telegr & Teleph Corp <Ntt> | 近赤外分光装置 |
WO2006083316A2 (en) * | 2004-06-30 | 2006-08-10 | Chemimage Corporation | Multipoint method for identifying hazardous agents |
-
2006
- 2006-08-16 US US11/505,661 patent/US7397561B2/en not_active Expired - Fee Related
-
2007
- 2007-08-16 NL NL1034256A patent/NL1034256C2/nl not_active IP Right Cessation
- 2007-08-16 JP JP2007212499A patent/JP2008046132A/ja active Pending
- 2007-08-16 KR KR1020070082424A patent/KR20080015759A/ko not_active Application Discontinuation
- 2007-08-16 DE DE102007039845A patent/DE102007039845A1/de not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL1034464C2 (nl) * | 2006-10-06 | 2009-04-03 | Wafermasters Inc | Raman- en fotoluminescentiespectroscopie. |
Also Published As
Publication number | Publication date |
---|---|
NL1034256C2 (nl) | 2009-04-03 |
US20070103682A1 (en) | 2007-05-10 |
US7397561B2 (en) | 2008-07-08 |
JP2008046132A (ja) | 2008-02-28 |
DE102007039845A1 (de) | 2008-02-21 |
KR20080015759A (ko) | 2008-02-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AD1A | A request for search or an international type search has been filed | ||
PD2B | A search report has been drawn up | ||
V1 | Lapsed because of non-payment of the annual fee |
Effective date: 20110301 |